Electron microscope
Patent Information
- Authority / Receiving Office
- US · United States
- Patent Type
- Designs(United States)
- Current Assignee / Owner
- JEOL LTD
- Filing Date
- 2024-08-05
- Publication Date
- 2026-07-21
Smart Images

Figure USD1135985-D00000_ABST
Description
[0001] FIG. 1 is a frontward perspective view of a left side of an electron microscope showing my new design;
[0002] FIG. 2 is a frontward perspective view of a right side thereof;
[0003] FIG. 3 is another perspective view thereof, showing the electron microscope in an opened position;
[0004] FIG. 4 is a front elevational view thereof;
[0005] FIG. 5 is a rear elevational view thereof;
[0006] FIG. 6 is a right side elevational view thereof;
[0007] FIG. 7 is a left side elevational view thereof;
[0008] FIG. 8 is a top plan view thereof;
[0009] FIG. 9 is an enlarged bottom plan view thereof;
[0010] FIG. 10 is a cross-sectional view thereof taken along lines A-A in FIG. 4; and,
[0011] FIG. 11 is an enlarged view thereof showing details enclosed by lines B-B and C-C in FIG. 10.
[0012] The broken lines in FIG. 9 depict portions of the electron microscope that form no part of the claimed design.
[0013] Portions of the electron microscope shown in dashed lines in FIG. 11 depict unclaimed portions of the electron microscope that are included for illustrative purposes showing boundaries of the enlarged view of FIG. 11.
Claims
The ornamental design for an electron microscope, as shown and described.