Probe pin for integrated circuits testing

USD1140868SActive Publication Date: 2026-08-11HICON CO LTD +2
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Patent Information

Authority / Receiving Office
US · United States
Patent Type
Designs(United States)
Current Assignee / Owner
Filing Date
2024-07-17
Publication Date
2026-08-11

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Description

[0001] FIG. 1.1 is a perspective view of a probe pin for integrated circuits testing, showing my new design;

[0002] FIG. 1.2 is a front view thereof;

[0003] FIG. 1.3 is a rear view thereof;

[0004] FIG. 1.4 is a left-side view thereof;

[0005] FIG. 1.5 is a right-side view thereof;

[0006] FIG. 1.6 is a top plan view thereof; and

[0007] FIG. 1.7 is a bottom plan thereof.

Claims

The ornamental design for a probe pin for integrated circuits testing as shown and described.

Citation Information

Patent Citations

  • continuity test probe pin

    KR300894670S

  • IC test probe

    TWD234609S

  • IC test probes

    TWD237596S

  • Electrical probe with a probe head and contacting pins

    US10254310B2

  • Self-retained slider contact pin

    US11387587B1