Probe pin for integrated circuit testing

USD1144238SActive Publication Date: 2026-08-25HICON CO LTD +2
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Patent Information

Application Number
US35/525879
Authority / Receiving Office
US · United States
Patent Type
Designs(United States)
Current Assignee / Owner
Priority Date
2024-01-18
Filing Date
2024-07-17
Publication Date
2026-08-25
Estimated Expiration
2041-08-25

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Description

[0001] 1.1 : Perspective

[0002] 1.2 : Front

[0003] 1.3 : Back

[0004] 1.4 : Left

[0005] 1.5 : Right

[0006] 1.6 : Top

[0007] 1.7 : Bottom

Claims

The ornamental design for a probe pin for integrated circuit testing as shown and described.

Citation Information

Patent Citations

  • IC test probes

    TWD237595S

  • Probe for IC testing

    TWD238556S

  • Self-retained slider contact pin

    US11387587B1

  • Contact probe pin for wafer probing apparatus

    US20020113612A1

  • MEMS Interconnection Pins Fabrication on a Reusable Substrate for Probe Card Application

    US20100207654A1