Method of determining degradation on a fiducial

WO2026021719A1PCT designated stage Publication Date: 2026-01-29ASML NETHERLANDS BV
View PDF 17 Cites 0 Cited by

Patent Information

Application Number
PCT/EP2025/064564
Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-07-26
Filing Date
2025-05-27
Publication Date
2026-01-29

Smart Images

  • Figure EP2025064564_29012026_PF_FP_ABST
    Figure EP2025064564_29012026_PF_FP_ABST
Patent Text Reader

Abstract

Disclosed is a method of determining a degradation level of a coating on a fiducial, the method comprising: determining a first mathematical model from a first set of measurements of the fiducial, said first set of measurements comprising measurements of a first measurement area of the fiducial; determining a second mathematical model from a second set of measurements of the fiducial, said second set of measurements comprising measurements of a second measurement area of the fiducial, said second measurement area being different to said first measurement area; and determining a degradation level of the coating based on the first mathematical model and the second mathematical model.
Need to check novelty before this filing date? Find Prior Art

Citation Information

Patent Citations

  • Method and apparatus for angular-resolved spectroscopic lithography characterization

    US20060033921A1

  • Method and apparatus for angular-resolved spectroscopic lithography characterization

    US20060066855A1

  • Inspection Apparatus, Lithographic Apparatus, Lithographic Processing Cell and Inspection Method

    US20100201963A1

  • Methods and Scatterometers, Lithographic Systems, and Lithographic Processing Cells

    US20110027704A1

  • Metrology Method and Apparatus, Lithographic Apparatus, Device Manufacturing Method and Substrate

    US20110043791A1