Method of forming image sensor including air grid
A multi-step process forms an air gap grid in image sensors using controlled deposition techniques to enhance light transmission and reduce crosstalk, improving reliability and geometry in CMOS image sensors.
Patent Information
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- APPLIED MATERIALS INC
- Filing Date
- 2025-12-08
- Publication Date
- 2026-06-18
AI Technical Summary
Existing image sensors, such as CMOS image sensors, face issues with light transmission due to metal or oxide grids causing crosstalk between pixels, especially with smaller pixel sizes, and existing air gap grids suffer from non-ideal geometry, low reliability, and high cost.
A multi-step lithography and fill material deposition process is used to form an air gap grid with precise geometry control, utilizing low-temperature oxide deposition and plasma-enhanced atomic layer deposition to create voids and seal trenches, enhancing structural integrity and reliability.
The method achieves improved light transmission and reduced crosstalk between pixels while maintaining precise geometry and reliability, addressing the limitations of existing air gap grids.
Smart Images

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