Batch loading and unloading device and method for burn-in apparatus

Abstract

The present invention relates to the technical field of automation apparatuses. Provided are a batch loading and unloading device and method for a burn-in apparatus. The batch loading and unloading device for a burn-in apparatus comprises a tray loading and unloading assembly, a board loading and unloading assembly, a cover opening assembly, a cover closing assembly, a pre-testing assembly and a transfer assembly. The device is used in the batch loading and unloading method for a burn-in apparatus, and by means of the tray loading and unloading assembly, the board loading and unloading assembly, the cover opening assembly, the cover closing assembly, the pre-testing assembly and the transfer assembly, a full-process closed-loop operation of the automatic loading and unloading of chips and boards, cover opening and closing, pre-testing and abnormality handling is realized, and the fully automatic operation of the batch loading and unloading of the burn-in apparatus is realized, thereby improving the batch loading and unloading efficiency of the burn-in apparatus. The pre-testing assembly can promptly detect a fault of a chip and a tool on a board, can specifically determine whether the chip or the tool is abnormal by means of an exchange structure, and promptly handles the abnormal chip or tool, thereby preventing the abnormal chip or tool from being subjected to a burn-in test, and thus improving the efficiency of burn-in testing.

Description

A batch loading and unloading device and method for aging equipment Technical Field

[0001] This invention relates to the field of automation equipment technology, and in particular to a batch loading and unloading device and method for aging equipment. Background Technology

[0002] In the chip manufacturing process, aging tests accelerate the exposure of potential defects by simulating extreme conditions such as high temperature and high pressure. This effectively screens out early-failure products and predicts lifespan, thereby improving the reliability of chips in critical applications such as automotive and medical fields. However, the loading and unloading processes of current aging equipment still rely on traditional manual or semi-automated operations, which suffer from problems such as low chip positioning accuracy and long fixture switching time. This results in insufficient equipment utilization during large-scale testing, making it difficult to meet the high throughput requirements of advanced process chips. Summary of the Invention

[0003] In a first aspect, the present invention provides a batch loading and unloading device for aging equipment, including a pallet loading and unloading assembly, a board loading and unloading assembly, a cover opening assembly, a cover closing assembly, a pre-testing assembly, and a transfer assembly;

[0004] The pallet loading and unloading assembly is used to receive and store pallets, which include loading pallets, unloading pallets and abnormal pallets. The loading pallets, unloading pallets and abnormal pallets respectively carry chips to be tested, chips that have completed aging tests and chips that are about to be tested and are abnormal.

[0005] The board loading and unloading assembly is used to receive and store boards. The boards are equipped with multiple fixtures, each of which includes a cover that can be opened and closed. When the boards are in the board loading and unloading assembly, the cover is in the closed state.

[0006] The lid opening assembly is used to extract the circuit board from the circuit board loading and unloading assembly and open the lid of the box; the lid closing assembly is used to close the lid of the box.

[0007] The pre-testing component includes a pre-testing mechanism and a replacement mechanism. The pre-testing mechanism is used to pre-test the chips on the board, and the replacement mechanism is used to open, replace chips, and close the covers of the fixtures that have failed pre-testing on the aged board and their adjacent fixtures that have passed pre-testing.

[0008] The transfer assembly is used to transfer trays, boards, and chips between tray loading / unloading assemblies, board loading / unloading assemblies, cover opening assemblies, cover closing assemblies, and pre-testing assemblies.

[0009] In an optional implementation, the pallet loading / unloading assembly includes:

[0010] The hopper assembly includes a loading hopper, a unloading hopper, and an abnormal sorting hopper, which are used to store loading pallets, unloading pallets, and abnormal pallets, respectively.

[0011] The depalletizing and stacking mechanism is used to perform depalletizing and stacking operations on pallets in the hopper assembly. The depalletizing operation removes the loading pallet from the loading hopper, and the stacking operation stores the unloading pallet and the abnormal pallet into the unloading hopper and the abnormal sorting hopper, respectively.

[0012] The transfer assembly includes a pallet transfer mechanism for receiving loading pallets from the depalletizing and stacking mechanism and transferring them to the loading station, and for transferring unloading pallets and defective pallets from the unloading station to the depalletizing and stacking mechanisms at the unloading bin and defective sorting bin, respectively.

[0013] In an optional implementation, the board loading / unloading assembly includes:

[0014] Multi-layer board storage bins, each layer of board storage bins is used to store at least one board;

[0015] The lifting mechanism is used to adjust the height of the multi-layer plate hopper.

[0016] The detection sensors monitor the empty / full status of the material bins on each layer of the pallet in real time.

[0017] In an optional embodiment, the cover opening assembly includes an X-axis moving module, a Z-axis lifting module, and a pull-plate finger. The pull-plate finger is used to connect to the board, and the X-axis moving module and the Z-axis lifting module are used to drive the pull-plate finger.

[0018] In an optional embodiment, the tooling lid includes a pull rod, and the lid opening assembly includes:

[0019] The X-axis moving module is used to drive the Z-axis lifting module to move horizontally.

[0020] Z-axis lifting module, used to drive the fingers for opening the cover to move vertically up and down;

[0021] The opening finger has two states: closed and open. When closed, the opening finger can grip the pull rod. The Z-axis lifting module drives the opening finger to move upward, and the opening finger moves the pull rod to open the lid. When open, the opening finger separates from the pull rod.

[0022] In an optional embodiment, the tooling lid includes a pull rod, and the lid closing assembly includes:

[0023] The X-axis displacement module is used to drive the Z-axis pressing module to move horizontally.

[0024] The Z-axis pressing module drives the push-cover finger to press down vertically to close the lid.

[0025] In an optional implementation, the pre-testing facility includes:

[0026] Pre-test equipment, including ports for connecting to boards;

[0027] The crimping module is used to crimp the ports of the board to the ports of the pre-test machine.

[0028] In an optional embodiment, the tooling lid includes a pull rod, and the changing mechanism includes:

[0029] The opening finger has both a closed and an open state. When the opening finger is closed, it can grip the lever. When the opening finger is open, it is detached from the lever.

[0030] The suction nozzle can be used to pick up and release chips from the tooling;

[0031] A three-axis motion module is used to drive the opening finger and the suction nozzle.

[0032] In an optional implementation, the transplanting assembly includes:

[0033] The circuit board transfer mechanism is used to transfer circuit boards between the pallet loading / unloading assembly, the cover opening assembly, the cover closing assembly, the pre-testing assembly, and the circuit board loading / unloading assembly.

[0034] A chip transfer mechanism is used to transfer chips between a tray and a tooling.

[0035] Secondly, the present invention provides a method for batch loading and unloading of aging equipment, employing a batch loading and unloading device for aging equipment as described in any of the foregoing embodiments, comprising the following steps:

[0036] Using the transfer assembly, tray loading and unloading assembly, board loading and unloading assembly, cover opening assembly and cover closing assembly, the chip to be tested is transferred from the loading tray to the board fixture. After closing the cover, the board is transferred to the pre-test assembly.

[0037] The pre-testing unit performs the first round of pre-testing on the board. If an abnormal result is found, the replacement unit opens the cover, replaces the chip, and closes the cover of the fixture with the abnormal result and its adjacent fixture with normal result on the aged board. The second round of pre-testing is then performed. If the same fixture is abnormal in both the first and second rounds of pre-testing, the corresponding fixture is evaluated as abnormal and is blocked. If the same chip is abnormal in both the first and second rounds of pre-testing, the corresponding chip is evaluated as abnormal, and the transfer unit transfers the chip evaluated as abnormal to the abnormal tray.

[0038] The transfer mechanism transfers the pre-tested boards from the pre-test assembly to the board loading / unloading assembly;

[0039] Remove the board from the board loading / unloading assembly for aging test, and return the board that has completed the aging test to the board loading / unloading assembly;

[0040] Using the transfer assembly, tray loading and unloading assembly, board loading and unloading assembly, cover opening assembly, and cover closing assembly, the chips inside the board that has completed the aging test are transferred to the unloading tray in the tray loading and unloading assembly.

[0041] The batch loading and unloading device for aging equipment provided by this invention has the following beneficial effects:

[0042] 1. This invention achieves a closed-loop operation of automatic loading and unloading of chips and circuit boards, opening and closing of covers, pre-testing and anomaly handling through a tray loading and unloading assembly, a board loading and unloading assembly, a cover opening assembly, a cover closing assembly, a pre-testing assembly and a transfer assembly, thereby realizing fully automated operation of batch loading and unloading of aging equipment and improving the efficiency of batch loading and unloading of aging equipment.

[0043] 2. The pre-test component can promptly detect faults in the tooling on the chip or board, and can confirm the specific abnormality of the chip or tooling by changing the structure, so as to deal with the abnormal chip or tooling in a timely manner, avoid performing aging tests on the abnormal chip or tooling, and improve the efficiency of aging tests.

[0044] The batch loading and unloading method for aging equipment provided by this invention has the following beneficial effects:

[0045] 1. This invention can automatically transfer chips from the tray to the board, then perform pre-testing, promptly handle abnormal chips or tooling, and then automatically feed them into the board loading and unloading assembly for the next step of aging test. After the aging test is completed, the chips can also be automatically moved from the board to the tray for subsequent production processes.

[0046] 2. When using the pre-test component for pre-testing, not only can abnormalities in specific tooling on the board be detected, but the chip in the abnormal tooling and its adjacent tooling can also be swapped through the swapping mechanism. This confirms that the chip or tooling is abnormal, so that the chip can be sorted out in time or the tooling can be shielded, thus improving the efficiency of aging test. Attached Figure Description

[0047] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0048] Figure 1 is a schematic diagram of the overall structure of the batch loading and unloading device for the aging equipment provided in an embodiment of the present invention;

[0049] Figure 2 is a top view of a portion of the structure of the batch loading and unloading device for the aging equipment provided in an embodiment of the present invention.

[0050] Figure 3 is a three-dimensional schematic diagram of a portion of the structure of the batch loading and unloading device for the aging equipment provided in an embodiment of the present invention.

[0051] Figure 4 is a three-dimensional schematic diagram of the pallet loading and unloading assembly of the batch loading and unloading device for aging equipment provided in an embodiment of the present invention;

[0052] Figure 5 is a side view of the pallet loading and unloading assembly of the batch loading and unloading device for aging equipment provided in an embodiment of the present invention;

[0053] Figure 6 is a three-dimensional schematic diagram of the board loading and unloading assembly of the batch loading and unloading device for aging equipment provided in an embodiment of the present invention;

[0054] Figure 7 is a side view of the board loading and unloading assembly of the batch loading and unloading device for aging equipment provided in an embodiment of the present invention;

[0055] Figure 8 is a three-dimensional schematic diagram of the opening assembly of the batch loading and unloading device for the aging equipment provided in an embodiment of the present invention;

[0056] Figure 9 is a partial structural schematic diagram of the opening component of the batch loading and unloading device for aging equipment provided in an embodiment of the present invention;

[0057] Figure 10 is a three-dimensional structural schematic diagram of the cover closing component of the batch loading and unloading device for aging equipment provided in an embodiment of the present invention;

[0058] Figure 11 is a side view of the pre-test component of the batch loading and unloading device for aging equipment provided in an embodiment of the present invention;

[0059] Figure 12 is a schematic diagram of the structure of the switching mechanism of the batch loading and unloading device for the aging equipment provided in an embodiment of the present invention;

[0060] Figure 13 is a schematic diagram of the chip transfer mechanism of the batch loading and unloading device for aging equipment provided in an embodiment of the present invention.

[0061] Figure 14 is a schematic diagram of the plate transfer mechanism of the batch loading and unloading device for aging equipment provided in an embodiment of the present invention.

[0062] Icons: 100 - Chip; 200 - Pallet loading / unloading assembly; 211 - Loading bin; 212 - Unloading bin; 213 - Abnormal sorting bin; 221 - Loading pallet; 222 - Unloading pallet; 223 - Abnormal pallet; 230 - Depalletizing / palletizing mechanism; 300 - Circuit board loading / unloading assembly; 310 - Circuit board hopper; 320 - Lifting mechanism; 330 - Circuit board; 331 - Tooling; 332 - Pull rod; 400 - Opening assembly; 410 - X 420-Z-axis moving module; 430-Pull plate finger; 440-Opening finger; 500-Closing assembly; 510-Pushing finger; 600-Pre-test assembly; 610-Pre-test mechanism; 611-Pre-test machine; 612-Crimping module; 613-Three-axis moving module; 620-Exchange mechanism; 621-Nozzle; 710-Tray transfer mechanism; 720-Board transfer mechanism; 730-Chip transfer mechanism. Detailed Implementation

[0063] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. The components of the embodiments of the present invention described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0064] Therefore, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention. All other embodiments obtained by those skilled in the art based on the embodiments of the invention without inventive effort are within the scope of protection of the invention.

[0065] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0066] In the description of this invention, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship commonly used when the product of this invention is in use. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this invention. In addition, the terms "first," "second," "third," etc., are only used to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0067] Furthermore, terms such as "horizontal," "vertical," and "sag" do not imply that components must be absolutely horizontal or suspended, but rather that they can be slightly tilted. For example, "horizontal" simply means that its direction is more horizontal relative to "vertical," and does not mean that the structure must be completely horizontal, but can be slightly tilted.

[0068] In the description of this invention, it should also be noted that, unless otherwise explicitly specified and limited, the terms "set," "install," "connect," and "link" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances.

[0069] The following detailed description of some embodiments of the present invention is provided in conjunction with the accompanying drawings. Unless otherwise specified, the following embodiments and features can be combined with each other.

[0070] A batch loading and unloading device for aging equipment

[0071] This embodiment provides a batch loading and unloading device for an aging equipment, as shown in Figures 1 to 14, including a pallet loading and unloading assembly 200, a board loading and unloading assembly 300, a cover opening assembly 400, a cover closing assembly 500, a pre-testing assembly 600, and a transplanting assembly 700.

[0072] The pallet loading and unloading assembly 200 is used to receive and store pallets. The pallets include loading pallets 221, unloading pallets 222 and abnormal pallets 223. The loading pallets 221, unloading pallets 222 and abnormal pallets 223 respectively carry the chip 100 to be tested, the chip 100 that has completed the aging test and the chip 100 that is about to be tested abnormal.

[0073] The board loading / unloading assembly 300 is used to receive and store the board 330. The board 330 is provided with multiple tooling 331. Each tooling 331 includes a cover that can be opened and closed. When in the board loading / unloading assembly 300, the cover is in the closed state.

[0074] The lid opening assembly 400 is used to extract the board 330 from the board loading and unloading assembly 300 and open the lid; the lid closing assembly 500 is used to close the lid.

[0075] The pre-test component 600 includes a pre-test mechanism 610 and a replacement mechanism 620. The pre-test mechanism 610 is used to pre-test the chip 100 on the board 330. The replacement mechanism 620 is used to open the cover, replace the chip 100, and close the cover of the fixture 331 with pre-test failure on the aged board 330 and its adjacent fixture 331 with normal pre-test.

[0076] The transfer assembly 700 is used to transfer the tray, board 330 and chip 100 between the tray loading / unloading assembly 200, the board loading / unloading assembly 300, the cover opening assembly 400, the cover closing assembly 500 and the pre-test assembly 600.

[0077] Figure 1 is a schematic diagram of the overall structure of the batch loading and unloading device for the aging equipment provided in this embodiment, including the outer frame of the equipment, and particularly showing the pallet loading and unloading assembly 200, the board loading and unloading assembly 300, the cover opening assembly 400, and the cover closing assembly 500. As shown in Figure 1, the pallet loading and unloading assembly 200 and the board loading and unloading assembly 300 can be respectively located at opposite ends of the equipment, and the cover opening assembly 400 and the cover closing assembly 500 can be located between the pallet loading and unloading assembly 200 and the board loading and unloading assembly 300.

[0078] Figure 2 is a top view of a portion of the structure of the batch loading and unloading device for the aging equipment provided in this embodiment. The external frame of the equipment and the board loading and unloading assembly 300 are hidden. The pallet loading and unloading assembly 200, the lid opening assembly 400, the lid closing assembly 500, and the pre-testing assembly 600 are shown in particular.

[0079] Figure 3 is a three-dimensional schematic diagram of a portion of the structure of the batch loading and unloading device for the aging equipment provided in this embodiment. Similar to Figure 2, the external frame of the equipment and the board loading and unloading assembly 300 are hidden. The pallet loading and unloading assembly 200, the lid opening assembly 400, the lid closing assembly 500, and the pre-testing assembly 600 are shown in particular.

[0080] Figure 4 is a perspective view of the pallet loading / unloading assembly 200 of the batch loading / unloading device for aging equipment provided in this embodiment, and Figure 5 is a side view of the pallet loading / unloading assembly 200 of the batch loading / unloading device for aging equipment provided in this embodiment. As shown in Figures 4 and 5, the pallet includes a loading pallet 221, a unloading pallet 222, and an abnormal pallet 223. The pallets are stored in a stacked manner, and each type of pallet can have multiple stacks. Specifically, the pallet can be removed from the stack by the transfer assembly 700, thereby making the stack of a certain pallet empty.

[0081] Figure 6 is a perspective view of the board loading and unloading assembly 300 of the batch loading and unloading device for aging equipment provided in this embodiment, and Figure 7 is a side view of the board loading and unloading assembly 300 of the batch loading and unloading device for aging equipment provided in this embodiment. The external frame and part of the tray are hidden in Figures 6 and 7 to show the internal structure more clearly.

[0082] Figure 11 is a side view of the pre-test component 600 of the batch loading and unloading device for aging equipment provided in this embodiment, and Figure 12 is a structural schematic diagram of the switching mechanism 620 of the batch loading and unloading device for aging equipment provided in this embodiment.

[0083] The batch loading and unloading device for aging equipment provided in this embodiment has the following beneficial effects:

[0084] 1. This device, through the tray loading / unloading assembly 200, board loading / unloading assembly 300, cover opening assembly 400, cover closing assembly 500, pre-testing assembly 600 and transfer assembly 700, realizes the closed-loop operation of the entire process of automatic loading / unloading of chip 100 and board 330, cover opening / closing, pre-testing and anomaly handling, realizing the fully automated operation of batch loading / unloading of aging equipment and improving the efficiency of batch loading / unloading of aging equipment;

[0085] 2. The pre-test component 600 can promptly detect faults in the chip 100 or the tooling 331 on the board 330, and can confirm the specific abnormality of the chip 100 or tooling 331 by changing the structure, and promptly handle the abnormal chip 100 or tooling 331, avoiding the abnormal chip 100 or tooling 331 from undergoing aging test, thus improving the efficiency of aging test.

[0086] In some embodiments, as shown in Figures 4 and 5, the pallet loading / unloading assembly 200 includes:

[0087] The hopper assembly includes a loading hopper 211, a discharging hopper 212, and an abnormal sorting hopper 213, which are used to store the loading pallet 221, the discharging pallet 222, and the abnormal pallet 223, respectively.

[0088] The destacking and stacking mechanism 230 is used to perform destacking and stacking operations on the pallets in the hopper assembly. The destacking operation removes the loading pallet 221 from the loading hopper 211, and the stacking operation stores the unloading pallet 222 and the abnormal pallet 223 into the unloading hopper 212 and the abnormal sorting hopper 213, respectively.

[0089] The transfer assembly 700 includes a pallet transfer mechanism 710, which is used to receive the loading pallet 221 from the depalletizing and stacking mechanism 230 and transfer it to the loading station, and to transfer the unloading pallet 222 and the abnormal pallet 223 from the unloading station to the depalletizing and stacking mechanism 230 at the unloading bin 212 and the abnormal sorting bin 213, respectively.

[0090] Multiple loading bins 211, unloading bins 212, and abnormal sorting bins 213 can be set up to facilitate temporary storage of pallets and reduce the need for pallet transfer.

[0091] The loading bin 211, unloading bin 212, and abnormal sorting bin 213 can be arranged in a straight line. The pallet transfer mechanism 710 can adopt a linear movement module, as shown in Figures 4 and 5. The pallet transfer effect can be achieved simply by linear movement. The loading station and unloading station can also be set at a certain position between the loading bin 211, unloading bin 212, and abnormal sorting bin 213, as shown in Figures 4 and 5. Multiple loading bins 211 and unloading bins 212 are arranged adjacently and discontinuously with the abnormal sorting bin 213, forming empty spaces between them to serve as loading and unloading stations. This structural arrangement also facilitates the storage of incoming pallets into the equipment and the retrieval of unloading pallets 222 from the equipment. The equipment can be equipped with more concentrated loading and unloading windows.

[0092] Each of the feeding bins 211, unloading bins 212, and abnormal sorting bins 213 can be equipped with a depalletizing and palletizing mechanism 230, or the depalletizing and palletizing mechanism 230 can also be a movable mechanism. The depalletizing and palletizing mechanism 230 for pallets is conventional technology, and this application does not limit the specific structure of the depalletizing and palletizing mechanism 230.

[0093] In some embodiments, as shown in Figures 6 and 7, the board loading / unloading assembly 300 includes:

[0094] Multi-layer board storage bin 310, each layer of board storage bin 310 is used to store at least one board 330;

[0095] The lifting mechanism 320 is used to adjust the height of the multi-layer plate hopper 310;

[0096] The detection sensor monitors the empty / full status of each layer of the material hopper 310 in real time.

[0097] The multi-layer board hopper 310 improves equipment space utilization. After the detection sensor detects whether the board hopper 310 is empty or full, the lifting mechanism 320 can lift it according to this status. When the board loading / unloading assembly 300 needs to receive boards 330, such as after pre-testing or aging tests, the empty board hopper 310 reaches the receiving position. When the board loading / unloading assembly 300 needs to supply boards 330, such as when removing boards 330 for aging tests or when the cover opening assembly 400 needs to open the cover, the full board hopper 310 reaches the receiving position. The receiving position can be specifically set for different mechanisms, and the lifting mechanism 320 can be adjusted according to the status of the board hopper 310.

[0098] In some embodiments, as shown in Figures 1, 2, 8 and 9, the cover opening assembly 400 includes an X-axis moving module 410, a Z-axis lifting module 420 and a pull-plate finger 430. The pull-plate finger 430 is used to connect to the board 330, and the X-axis moving module 410 and the Z-axis lifting module 420 are used to drive the pull-plate finger 430.

[0099] Figure 8 is a perspective view of the opening assembly 400 of the batch loading and unloading device for aging equipment provided in this embodiment, and Figure 9 is a partial structural view of the opening assembly 400 of the batch loading and unloading device for aging equipment provided in this embodiment.

[0100] As shown in Figure 1, the cover opening assembly 400 and the board loading / unloading assembly 300 are arranged adjacent to each other, with the direction of their adjacent arrangement defined as the X-axis. The X-axis movement module 410 drives the pull-plate finger 430 to move into the board loading / unloading assembly 300, and the Z-axis lifting module 420 can drive the pull-plate finger 430 to move up and down. For example, before the pull-plate finger 430 moves into the board loading / unloading assembly 300, the pull-plate finger 430 is in a higher position. After the pull-plate finger 430 moves into the board loading / unloading assembly 300, the Z-axis lifting module 420 drives the pull-plate finger 430 to descend, and the pull-plate finger 430 engages with the board 330. Afterward, the X-axis movement module 410 drives the pull-plate finger 430 to return to its original position, thereby realizing the operation of removing the board 330 from the board loading / unloading assembly 300. The action logic of the opening component 400 to remove the board 330 is not limited to this. Depending on the specific structure of the board 330 and the specific structure of the pull-out fingers 430, various cooperation methods and operation methods can be flexibly set. This invention does not limit this.

[0101] In some embodiments, as shown in Figures 6, 8, and 9, the lid of the tooling 331 includes a pull rod 332, and the lid opening assembly 400 includes: an X-axis moving module 410 for driving a Z-axis lifting module 420 to move horizontally; a Z-axis lifting module 420 for driving a lid opening finger 440 to move vertically; the lid opening finger 440 includes a closed state and an open state. In the closed state, the lid opening finger 440 can clamp the pull rod 332. The Z-axis lifting module 420 drives the lid opening finger 440 to move upward, and the lid opening finger 440 drives the pull rod 332 to open the lid. In the open state, the lid opening finger 440 is separated from the pull rod 332.

[0102] On board 330, chip 100 is placed in fixture 331, and the cover of fixture 331 is used to protect chip 100. When board 330 is in board loading / unloading assembly 300, the cover is closed. The opening finger 440 can open the lid by cooperating with the lid lever 332. The specific operating logic is as follows: the X-axis movement module 410 drives the Z-axis lifting module 420 to move horizontally until the opening finger 440 is vertically aligned with the lever 332. During this movement, the Z-axis lifting module 420 positions the opening finger 440 at a relatively high position. After alignment, the Z-axis lifting module 420 lowers the opening finger 440 until it is horizontally aligned with the lever 332. The opening finger 440 then closes, clamping the lever 332. The Z-axis lifting module 420 then drives the opening finger 440 upwards, which in turn moves the lever 332 to open the lid. During this process, the X-axis movement module 410 can also move synchronously to achieve compound movement. After the lid is fully opened, the opening finger 440 opens, and the X-axis movement module 410 and the Z-axis lifting module 420 drive the opening finger 440 to move away.

[0103] As shown in Figure 9, the opening fingers 440 can be set in pairs. The paired opening fingers 440 move towards each other to achieve a closed state and move away from each other to achieve an open state. The movement of the opening fingers 440 can be driven by a cylinder or a servo motor.

[0104] Within the lid opening assembly 400, multiple lid opening fingers 440 can be configured to enable batch lid opening. As shown in Figure 6, the fixture 331 on the board 330 can be arranged in multiple rows and columns. After setting multiple lid opening fingers 440, the lids of one row or one column can be opened at once, improving operational efficiency.

[0105] In some embodiments, as shown in Figures 6 and 10, the lid of the tooling 331 includes a pull rod 332, and the lid closing assembly 500 includes: an X-axis displacement module for driving the Z-axis pressing module to move horizontally; and a Z-axis pressing module for driving the push-cover finger 510 to press down vertically to close the lid.

[0106] Figure 10 is a three-dimensional structural diagram of the closing assembly 500 of the batch loading and unloading device for the aging equipment provided in this embodiment. As shown in Figure 10, the lower end of the push-lid finger 510 can also be equipped with a roller or other structure, so that the push-lid finger 510 and the lid can make rolling contact, reducing damage to the lid. As shown in Figure 10, the closing assembly 500 can also be equipped with an opening finger 440. The opening finger 440 can cooperate with the pull rod 332. After the lid is closed, the pull rod 332 can further enhance the effect of the lid, while reducing damage to the lid. The opening finger 440 moves through the X-axis displacement module and the Z-axis pressing module. The opening or closing operation of the opening finger 440 can be similar to that in the above embodiment.

[0107] In some embodiments, as shown in Figures 11 and 12, the pre-testing mechanism 610 includes: a pre-testing machine 611, including a port for connecting to the board 330; and a crimping module 612 for crimping the port of the board 330 to the port of the pre-testing machine 611. The crimping module 612 can fix the board 330, thereby ensuring that the port of the board 330 is crimped to the port of the pre-testing machine 611. The crimping module 612 may include a linear movement mechanism, such as a linear servo motor drive, to drive the board 330 to connect to the pre-testing machine 611.

[0108] In some embodiments, as shown in Figures 11 and 12, the lid of the fixture 331 includes a pull rod 332, and the switching mechanism 620 includes: an opening finger 440, which has a closed state and an open state. In the closed state, the opening finger 440 can clamp the pull rod 332; in the open state, the opening finger 440 disengages from the pull rod 332. A suction nozzle 621 is used to pick up and release the chip 100 within the fixture 331. A three-axis movement module 613 is used to drive the opening finger 440 and the suction nozzle 621 to move. The opening fingers 440 can be arranged in pairs, and their opening or closing operation can be similar to that in the embodiments described above. The suction nozzle 621 can be provided with an additional Z-axis movement distance, as shown in Figure 12, so that the suction nozzle 621 does not interfere with the lid during the operation of the opening finger 440. After opening, the suction nozzle 621 moves downward a longer distance beyond the lower end of the opening finger 440, thereby picking up the chip 100 within the fixture 331. Two sets of suction nozzles 621 and cap-opening fingers 440 can be set to simultaneously open the caps and pick up the chips 100 from the two tooling 331, improving operational efficiency. The switching mechanism 620 can also be equipped with a cap-pushing finger 510, the structure and control method of which can be similar to those in the above embodiments.

[0109] In some embodiments, as shown in Figures 13 and 14, the transfer assembly 700 includes: a board transfer mechanism 720 for transferring the board 330 between the tray loading / unloading assembly 200, the cover opening assembly 400, the cover closing assembly 500, the pre-test assembly 600, and the board loading / unloading assembly 300; and a chip transfer mechanism 730 for transferring the chip 100 between the tray and the tooling 331.

[0110] Figure 13 is a schematic diagram of the chip transfer mechanism 730 of the batch loading and unloading device for aging equipment provided in this embodiment, and Figure 14 is a schematic diagram of the board transfer mechanism 720 of the batch loading and unloading device for aging equipment provided in this embodiment.

[0111] Specifically, after the opening assembly 400 opens the board 330, the board transfer mechanism 720 can remove the board 330 from the opening assembly 400 and transfer it to the loading station. The chip transfer mechanism 730 then transfers the chip 100 from the tray to the board 330 at the loading station. As shown in Figure 13, the chip transfer mechanism 730 can be equipped with multiple suction nozzles 621 to simultaneously pick up multiple chips 100. The chip transfer mechanism 730 can also be equipped with a pitch-changing mechanism to change the spacing between the multiple chips 100, thereby adapting to different arrangements of the chips 100 on the tray and board 330. The pitch-changing mechanism can be in the form of a multi-stage cylinder, a multi-stage motor, or a pitch-changing guide groove, etc., and the pitch-changing effect is achieved by adjusting the positions of the multiple suction nozzles 621.

[0112] A method for batch loading and unloading of aging equipment

[0113] This embodiment provides a method for batch loading and unloading of aging equipment, using a batch loading and unloading device for aging equipment as described in any of the foregoing embodiments, including the following steps:

[0114] Using the transfer component 700, the tray loading and unloading component 200, the board loading and unloading component 300, the cover opening component 400, and the cover closing component 500, the chip 100 to be tested is transferred from the loading tray 221 to the tooling 331 of the board 330. After closing the cover, the board 330 is transferred to the pre-test component 600.

[0115] The pre-testing mechanism 610 performs the first round of pre-testing on the board 330. If an abnormal result is found in the pre-test, the replacement mechanism 620 opens the cover, replaces the chip 100, and closes the cover of the fixture 331 with the abnormal pre-test and its adjacent fixture 331 with normal pre-test on the aged board 330 to perform the second round of pre-testing. If the same fixture 331 is abnormal in both the first and second rounds of pre-testing, the corresponding fixture 331 is evaluated as abnormal and the corresponding fixture 331 is shielded. If the same chip 100 is abnormal in both the first and second rounds of pre-testing, the corresponding chip 100 is evaluated as abnormal, and the transfer mechanism transfers the chip 100 evaluated as abnormal to the abnormal tray 223.

[0116] The transfer mechanism transfers the pre-tested board 330 from the pre-test assembly 600 to the board loading / unloading assembly 300;

[0117] The board 330 is taken out from the board loading and unloading assembly 300 for aging test, and the board 330 that has completed the aging test is sent back to the board loading and unloading assembly 300.

[0118] Using the transfer component 700, the tray loading / unloading component 200, the board loading / unloading component 300, the cover opening component 400, and the cover closing component 500, the chip 100 in the board 330 that has completed the aging test is transferred to the unloading tray 222 in the tray loading / unloading component 200.

[0119] The batch loading and unloading method for aging equipment provided in this embodiment has the following beneficial effects:

[0120] 1. The present invention can automatically transfer the chip 100 from the tray to the board 330, then perform pre-testing, and promptly handle abnormal chips 100 or tooling 331. After that, it is automatically sent to the board loading and unloading assembly 300 for the next step of aging test. After the aging test is completed, the chip 100 can also be automatically moved from the board 330 to the tray for subsequent production.

[0121] 2. When using the pre-test component 600 for pre-testing, not only can abnormalities in specific fixtures 331 on the board 330 be detected, but also the abnormal fixture 331 and the chip 100 in its adjacent fixtures 331 can be swapped through the swapping mechanism 620. This confirms that the chip 100 or fixture 331 is abnormal, so that the chip 100 can be sorted out in time or the fixture 331 can be shielded, thus improving the efficiency of aging test.

[0122] This method involves multiple components that can operate synchronously without interference, thereby improving operational efficiency.

[0123] In the pre-test, if the second round of interpretation results are normal, it is determined that a misoperation such as placement deviation occurred during the first round of testing, and there is no need to classify chip 100 and fixture 331 as abnormal. If both fixtures 331 are abnormal in the second round of testing, both fixtures 331 and chip 100 can be classified as abnormal, the two fixtures 331 are disabled, and the abnormal chip 100 is moved to the abnormal tray 223.

[0124] The specific operation of transferring the faulty chip 100 to the faulty tray 223 can be as follows: the board transfer mechanism 720 transfers the board 330 from the pre-test mechanism 610 to the loading and unloading station, and the chip transfer mechanism 730 transfers the chip 100 to the faulty tray 223 at the loading and unloading station.

[0125] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A batch loading and unloading device for an aging equipment, characterized in that, The system includes a tray loading / unloading assembly (200), a board loading / unloading assembly (300), a cover opening assembly (400), a cover closing assembly (500), a pre-test assembly (600), and a transfer assembly (700). The tray loading / unloading assembly (200) is used to receive and store trays, which include a loading tray (221), a unloading tray (222), and an abnormal tray (223). The loading tray (221), unloading tray (222), and abnormal tray (223) respectively carry a chip (100) to be tested, a chip (100) that has completed aging tests, and a chip (100) that has failed pre-tests. The board loading / unloading assembly (300) is used to receive and store boards (330). The boards (330) are provided with multiple fixtures (331), each of which includes a cover that can be opened and closed. When in the board loading / unloading assembly (300), the cover is in the closed state. The cover opening assembly (400), 400) is used to extract the board (330) from the board loading / unloading assembly (300) and open the lid; the lid closing assembly (500) is used to close the lid; the pre-test assembly (600) includes a pre-test mechanism (610) and a replacement mechanism (620); the pre-test mechanism (610) is used to pre-test the chips (100) on the board (330); the replacement mechanism (620) is used to replace the aged board. (330) The pre-test abnormal tooling (331) and its adjacent pre-test normal tooling (331) are opened, chip (100) is replaced and closed; the transfer component (700) is used to transfer the tray, board (330) and chip (100) between the tray loading and unloading component (200), board loading and unloading component (300), opening component (400), closing component (500) and pre-test component (600).

2. The batch loading and unloading device for aging equipment according to claim 1, characterized in that, The pallet loading / unloading assembly (200) includes: a hopper assembly, including a loading hopper (211), a unloading hopper (212), and an abnormal sorting hopper (213), which are used to store the loading pallet (221), the unloading pallet (222), and the abnormal pallet (223), respectively; and a destacking and stacking mechanism (230), which is used to perform destacking and stacking operations on the pallets in the hopper assembly, wherein the destacking operation removes the loading pallet from the loading hopper (211), and the stacking operation removes the unloading pallet from the loading hopper (211). (222) and abnormal pallet (223) are stored in the unloading bin (212) and abnormal sorting bin (213) respectively; the transfer assembly (700) includes a pallet transfer mechanism (710), which is used to receive the loading pallet from the depalletizing and stacking mechanism (230) and transfer it to the loading station, and to transfer the unloading pallet (222) and abnormal pallet (223) from the unloading station to the depalletizing and stacking mechanism (230) at the unloading bin (212) and abnormal sorting bin (213) respectively.

3. The batch loading and unloading device for aging equipment according to claim 1, characterized in that, The board loading and unloading assembly (300) includes: a multi-layer board hopper (310), each layer of board hopper (310) is used to store at least one board (330); a lifting mechanism (320) is used to adjust the height of the multi-layer board hopper (310); and a detection sensor to monitor the empty and full status of each layer of board hopper (310) in real time.

4. The batch loading and unloading device for aging equipment according to claim 1, characterized in that, The opening assembly (400) includes an X-axis moving module (410), a Z-axis lifting module (420), and a pull plate finger (430). The pull plate finger (430) is used to connect to the board (330), and the X-axis moving module (410) and the Z-axis lifting module (420) are used to drive the pull plate finger (430).

5. The batch loading and unloading device for aging equipment according to claim 1, characterized in that, The tooling (331) includes a pull rod (332) for the lid. The lid opening assembly (400) includes: an X-axis moving module (410) for driving the Z-axis lifting module (420) to move horizontally; a Z-axis lifting module (420) for driving the lid opening finger (440) to move vertically; the lid opening finger (440) includes a closed state and an open state. In the closed state, the lid opening finger (440) can clamp the pull rod (332). The Z-axis lifting module (420) drives the lid opening finger (440) to move upward. The lid opening finger (440) drives the pull rod (332) to open the lid. In the open state, the lid opening finger (440) separates from the pull rod (332).

6. The batch loading and unloading device for aging equipment according to claim 1, characterized in that, The tooling (331) includes a pull rod (332) for the lid, and the lid closing assembly (500) includes: an X-axis displacement module for driving the Z-axis pressing module to move horizontally; and a Z-axis pressing module for driving the lid pusher finger (510) to press down vertically to close the lid.

7. The batch loading and unloading device for aging equipment according to claim 1, characterized in that, The pre-testing mechanism (610) includes: a pre-testing machine (611) including a port for connecting to the board (330); and a crimping module (612) for crimping the port of the board (330) to the port of the pre-testing machine (611).

8. The batch loading and unloading device for aging equipment according to claim 7, characterized in that, The lid of the fixture (331) includes a pull rod (332), and the switching mechanism (620) includes: a lid-opening finger (440), which has a closed state and an open state. In the closed state, the lid-opening finger (440) can clamp the pull rod (332), and in the open state, the lid-opening finger (440) is disengaged from the pull rod (332); a suction nozzle (621), which can be used to pick up and release the chip (100) in the fixture (331); and a three-axis moving module (613), which is used to drive the lid-opening finger (440) and the suction nozzle (621) to move.

9. The batch loading and unloading device for aging equipment according to claim 1, characterized in that, The transfer assembly (700) includes: a board transfer mechanism (720) for transferring boards (330) between a tray loading / unloading assembly (200), a cover opening assembly (400), a cover closing assembly (500), a pre-test assembly (600), and a board loading / unloading assembly (300); and a chip transfer mechanism (730) for transferring chips (100) between a tray and a tooling (331).

10. A method for batch loading and unloading of materials in an aging equipment, characterized in that, The batch loading and unloading device for aging equipment as described in any one of claims 1-9 includes the following steps: using the transfer assembly (700), tray loading and unloading assembly (200), board loading and unloading assembly (300), cover opening assembly (400), and cover closing assembly (500), the chip (100) to be tested is transferred from the loading tray (221) to the fixture (331) of the board (330); after closing the cover, the board (330) is transferred to the pre-test assembly (500). 600); The pre-testing mechanism (610) performs the first round of pre-testing on the board (330). When an abnormal result is found in the pre-test, the replacement mechanism (620) performs the opening, chip replacement (100) and closing operations on the fixture (331) with abnormal pre-testing on the aged board (330) and its adjacent fixture (331) with normal pre-testing, and performs the second round of pre-testing. When the same fixture (331) is abnormal in both the first and second rounds of pre-testing, the corresponding fixture (330) is replaced. 1) Assessing as abnormal and shielding the corresponding tooling (331); when the same chip (100) is abnormal in both the first and second rounds of pre-testing, the corresponding chip (100) is assessed as abnormal, and the transfer component (700) transfers the chip (100) assessed as abnormal to the abnormal tray (223); the transfer component (700) transfers the pre-tested board (330) from the pre-test component (600) to the board loading / unloading component (300); from the board loading / unloading component... The component (300) takes out the board (330) for aging test, and sends the board (330) after aging test to the board loading and unloading assembly (300); using the transfer assembly (700), tray loading and unloading assembly (200), board loading and unloading assembly (300), cover opening assembly (400) and cover closing assembly (500), the chip (100) in the board (330) after aging test is transferred to the unloading tray (222) in the tray loading and unloading assembly (200).

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