Integrated apparatus comprising solid-state source polarimeter and solid-state source interferometer for nuclear fusion experimental apparatus
By using a polarization interferometer integrated device with fixed-frequency and frequency-modulated terahertz solid-state sources, the problems of large space occupation and poor output stability of traditional gas lasers in nuclear fusion experimental devices have been solved. This device enables high-precision multi-channel plasma electron density measurement and Faraday rotation angle calculation, supports remote control, and is suitable for nuclear fusion experimental devices.
Patent Information
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- HEFEI INSTITUTE OF PHYSICAL SCIENCE CHINESE ACADEMY OF SCIENCES
- Filing Date
- 2025-04-18
- Publication Date
- 2026-07-23
AI Technical Summary
Traditional gas laser systems in nuclear fusion experimental devices suffer from problems such as large space occupation, poor output stability, low time resolution, and high operating costs, which limit the efficiency and accuracy of electron density measurement.
The system employs a fixed-frequency and two frequency-tuned terahertz solid-state sources, combined with a polarization interferometer optical path system and corner mirrors, to achieve beam combining and multi-channel measurement of optical signals. The plasma electron density and Faraday rotation angle are calculated in real time through a field-effect transistor detector. A remote control module is also provided to improve the system's flexibility and reliability.
It achieves a compact structural design, supports multi-channel measurement, improves measurement accuracy and system flexibility, reduces operating costs, and can monitor plasma parameters in real time, making it suitable for complex experimental environments.
Smart Images
Figure CN2025089707_23072026_PF_FP_ABST
Abstract
Description
An integrated device for a solid-state source polarization interferometer used in nuclear fusion experimental devices Technical Field
[0001] This invention relates to the field of optical technology, and in particular to an integrated device for a solid-state source polarization interferometer used in nuclear fusion experimental apparatus. Background Technology
[0002] In magnetic confinement fusion experimental devices and space plasma experimental simulation and research devices, plasma electron density is one of the key physical parameters. Since current density distribution is closely related to plasma stability and confinement, the measurement and feedback control of current distribution play a crucial role in tokamas and future fusion reactors. To quickly and accurately measure this parameter in experiments, numerous laboratories have embarked on years of exploration. After years of development, interferometry has been established as a reliable method for measuring electron density and has been applied in other fusion experimental devices.
[0003] Traditionally, far-infrared (FIR) lasers have been chosen as the detection source for typical interferometer and polarimeter systems, providing the necessary power output for operation in high-temperature plasmas. For example, the HCN laser used in the EAST tokamak experimental device is widely used in interferometer systems. While providing relatively stable output, it is bulky, occupies a large experimental space, and its low difference-frequency signal modulated by the rotating grating limits the system's time resolution. Meanwhile, the polarization interferometer system developed on the EAST tokamak experimental device uses three carbon dioxide-pumped formic acid lasers. Although this system improves power output stability and time resolution, the entire laser system requires a large laser cleanroom with constant temperature, humidity, and vibration damping. Furthermore, the difference-frequency output of this system, which uses a dual-laser principle, needs to be adjusted by personnel during experimentation, increasing operating costs. These traditional gas laser systems have limitations in terms of space occupation, output stability, and time resolution. Summary of the Invention
[0004] Based on the technical problems existing in the background technology, this invention proposes an integrated device for a solid-state source polarization interferometer for nuclear fusion experimental devices. It has a compact structure and can monitor in real time, achieving diverse frequency adjustment, multi-channel measurement capability and high fault response.
[0005] The present invention proposes an integrated device for a solid-state source polarization interferometer for a nuclear fusion experimental device, comprising a fixed-frequency solid-state source, a first frequency-modulated solid-state source and a second frequency-modulated solid-state source, a polarization interferometer optical path system, a corner mirror, a reference channel detector and a probe channel detector;
[0006] The optical signal transmitted by the fixed-frequency solid-state source is sent to the reference channel detector and the probe channel detector respectively through the beam splitting and reflection operations in the optical path system of the polarization interferometer.
[0007] A portion of the optical signal transmitted by the first frequency-modulated solid-state source undergoes a change in polarization direction in the optical path system of the polarization interferometer, and is combined and collinear with the optical signal transmitted by the second frequency-modulated solid-state source in the optical path system of the polarization interferometer. The collinear light is converted into circularly polarized light, which passes through the plasma and is transported to the corner mirror. After passing through the corner mirror, it enters the detector of the detection channel.
[0008] The other portion of the optical signals from the first and second frequency-modulated solid-state sources enters the reference channel detector through the polarization interferometer optical path system;
[0009] Furthermore, the reference channel detector is used to detect the optical signals transmitted by the fixed-frequency solid-state source, the first frequency-modulated solid-state source, and the second frequency-modulated solid-state source;
[0010] The detector is used to detect the optical signals sent by the fixed-frequency solid-state source, the first frequency-modulated solid-state source, and the second frequency-modulated solid-state source, so that the solid-state source polarization interferometer integrated device can calculate the plasma electron density and Faraday rotation angle based on the combined signal.
[0011] Furthermore, the polarization interferometer optical path system includes a reference path optical path and a probe path optical path, and the reference path optical path and the probe path optical path share some optical structures;
[0012] The reference optical path includes a first condenser lens, a second condenser lens, a third condenser lens, a half-wave plate, a polarizing beam splitter, a second beam splitter, a third beam splitter, a third reflecting mirror, and a sixth beam splitter.
[0013] The optical signal transmitted by the fixed-frequency solid-state source passes sequentially through the first focusing lens, the second beam splitter, and the third beam splitter before entering the reference channel detector.
[0014] The optical signal transmitted by the first frequency-modulated solid-state source passes sequentially through the second focusing lens, the half-wave plate, the polarizing beam splitter, and the third beam splitter before entering the reference channel detector.
[0015] The optical signal transmitted by the second frequency-modulated solid-state source passes sequentially through the third focusing lens, the third reflecting mirror, the sixth beam splitter, the polarizing beam splitter, and the third beam splitter before entering the reference channel detector.
[0016] Furthermore, the detection optical path includes a second reflecting mirror, a fourth beam splitter, a first reflecting mirror, a fifth beam splitter, a quarter-wave plate, a telescope system, a fourth reflecting mirror, and a seventh beam splitter;
[0017] The optical signal transmitted by the fixed-frequency solid-state source passes sequentially through the first focusing lens, the second beam splitter, the second reflecting mirror, and the fourth beam splitter before entering the detector channel.
[0018] The optical signal transmitted by the first frequency-modulated solid source passes sequentially through the second focusing lens, polarizing beam splitter, first reflecting mirror, fifth beam splitter, quarter wave plate, telescope system, fourth reflecting mirror, and seventh beam splitter before passing through the plasma and being transported to the corner mirror. After being reflected by the corner mirror, it passes sequentially through the seventh beam splitter and fourth beam splitter before entering the detector channel.
[0019] The optical signal transmitted by the second frequency-modulated solid source passes sequentially through the third focusing lens, the third reflecting mirror, the sixth beam splitter, the fifth beam splitter, the quarter wave plate, the telescope system, the fourth reflecting mirror, and the seventh beam splitter before passing through the plasma and being transported to the corner mirror. After being reflected by the corner mirror, it passes sequentially through the seventh beam splitter and the fourth beam splitter before entering the detector channel.
[0020] Furthermore, the optical signals transmitted by the first frequency-modulated solid-state source and the second frequency-modulated solid-state source are combined after passing through a polarizing beam splitter, and then become circularly polarized signals after passing through a quarter-wave plate.
[0021] Furthermore, the fixed-frequency solid-state source is a fixed-frequency 650GHz solid-state source, and the frequencies of the first frequency-modulated solid-state source and the second frequency-modulated solid-state source are different from each other. The difference between the first frequency-modulated solid-state source and the fixed-frequency solid-state source is +0.850MHz, and the difference between the second frequency-modulated solid-state source and the fixed-frequency solid-state source is -1.275MHz.
[0022] Furthermore, part of the data collected by the reference channel detector and the probe channel detector is fed into the phase comparator to calculate the plasma electron density and Faraday rotation angle in real time and output it. The other part is fed into the spectrum analyzer to obtain three different intermediate frequency signals. Then, the intermediate frequency signals and power signals are transmitted to the host computer terminal.
[0023] Furthermore, the frequency of the frequency-modulated solid-state source is adjusted via the frequency control module of the host computer.
[0024] Furthermore, the reference channel detector and the probe channel detector are field-effect transistor detectors.
[0025] The advantages of the solid-state source interferometer integrated device for nuclear fusion experimental devices provided by this invention are: compact structure and real-time monitoring capabilities; diverse frequency adjustment, multi-channel measurement capabilities, and high fault tolerance, greatly enhancing the system's flexibility, reliability, and measurement accuracy. This system is particularly suitable for high-precision, high-efficiency plasma electron density measurement, providing strong technical support for accurate monitoring in complex experimental environments. The three-channel setup introduces polarization signals, enabling not only the acquisition of Faraday rotation angle data but also the deduction of the magnitude of the external magnetic field and disturbances during the fusion experiment, which is crucial for the stable operation of the experiment. The compactness and stability of the device are achieved through a small, stable 650GHz solid-state source and a rationally designed optical path. An angle reflector fixed to the window flange ensures the return of the probe optical path, avoiding the use of large supports. This integrated device supports both vertical and horizontal position measurements and can be expanded into a multi-channel system to achieve multi-channel line integral electron density measurement. Meanwhile, the integrated device is also equipped with a remote control and monitoring module. Operators can remotely adjust the host module, detector phase comparator module, and frequency control module through the control terminal to control the system's operating parameters. Finally, the data recording module can monitor all system parameters in real time, improving operational efficiency. Attached Figure Description
[0026] Figure 1 is a schematic diagram of the structure of the present invention;
[0027] Figure 2 is a schematic diagram of the extended structure of the integrated device when the corner reflector is fixed to a horizontal window;
[0028] Figure 3 is a schematic diagram of the optical path system of the interferometer;
[0029] Figure 4 is a schematic diagram of the control structure of the integrated device;
[0030] Among them, 1-fixed frequency solid-state source, 2-first frequency-tuned solid-state source, 3-second frequency-tuned solid-state source, 4-1-first condenser lens, 4-2-second condenser lens, 4-3-third condenser lens, 5-second beam splitter, 6-third beam splitter, 7-reference channel detector, 8-polarizing beam splitter, 9-first reflecting mirror, 10-fifth beam splitter, 11-convex lens, 12-concave lens, 13-fourth reflecting mirror, 14-seventh beam splitter, 15-corner reflecting mirror, 16-detector channel detector, 17-second reflecting mirror, 18-fourth beam splitter, 19-sixth beam splitter, 20-third reflecting mirror, 21-tablet optical path, 22-half-wave plate, 23-quarter-wave plate. Embodiments of the present invention
[0031] The technical solution of the present invention will now be described in detail through specific embodiments. Many specific details are set forth in the following description to provide a thorough understanding of the invention. However, the present invention can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of the invention. Therefore, the present invention is not limited to the specific embodiments disclosed below.
[0032] The recent rapid development of terahertz technology has made solid-state sources a viable solution to these problems. This technology has been applied to several tokamak devices, such as the KTX and DIII-D. This embodiment uses a 650 GHz terahertz solid-state source to build a polarization interferometer system. Compared with traditional gas lasers, terahertz solid-state sources have the advantages of small size, compact structure, and stable output signal. Their maximum output power can reach 10 mW, and the difference frequency output is stable. By employing corner mirrors to achieve a dual optical path design, this type of system no longer relies on large optical supports, significantly reducing the space occupied by the system. Furthermore, the system can provide accurate measurements in the plasma density range of 1 × 10^17 m^-3 to 1 × 10^19 m^-3, making it particularly suitable for density measurements at the boundary of tokamak experimental devices and applications in space plasma experimental simulation and research facilities. Solid-state sources have a more stable inter-frequency (IF) and can generate lower density noise, which is beneficial for low-density measurements. By employing nonlinear electronics to extend the conventional microwave frequency range, solid-state sources offer several advantages, including compact size, stable IF for continuous heterodyne measurements, moderate power output, and relatively low cost. The system's lifetime depends on the degradation of the planar diodes. These diodes typically operate under low or no current conditions and have a reasonable lifetime. The multiplier can be replaced individually for maintenance if necessary. This embodiment, based on the design of a terahertz solid-state source and a polarization interferometer optical path system, introduces polarization signals. This not only allows for the acquisition of Faraday rotation angle data but also enables the deduction of the magnitude and perturbation of the external magnetic field during the fusion experiment, which is crucial for the stable operation of the experiment.
[0033] As shown in Figures 1 to 4, the solid-state source interferometer integrated device for nuclear fusion experimental apparatus proposed in this invention includes a fixed-frequency solid-state source 1, a first frequency-modulated solid-state source 2 and a second frequency-modulated solid-state source 3, an interferometer optical path system, a corner mirror 15, a reference channel detector 7 and a probe channel detector 16.
[0034] The optical signal emitted by the fixed-frequency solid-state source 1 is split and reflected in the interferometer optical path system and then sent to the reference channel detector 7 and the probe channel detector 16, respectively. A portion of the optical signal emitted by the first frequency-modulated solid-state source 2 undergoes a polarization change in the polarization interferometer optical path system and is combined and collinear with the optical signal emitted by the second frequency-modulated solid-state source 3 in the polarization interferometer optical path system. The collinear light is converted into circularly polarized light, which passes through the plasma and is sent to the corner mirror 15. After passing through the corner mirror 15, it enters the probe channel detector 16. The remaining optical signal emitted by the frequency-modulated solid-state source 2... A portion of the optical signal passes through the polarization interferometer optical path system, and another portion of the optical signal from the second frequency-modulated solid-state source 3 passes through the polarization interferometer optical path system, both entering the reference channel detector 7. The reference channel detector 7 is used to detect the optical signals sent by the fixed-frequency solid-state source 1, the first frequency-modulated solid-state source 2, and the second frequency-modulated solid-state source 3. The detection channel detector 16 is used to detect the optical signals sent by the fixed-frequency solid-state source 1, the first frequency-modulated solid-state source 2, and the second frequency-modulated solid-state source 3, so that the solid-state source polarization interferometer integrated device can calculate the plasma electron density and Faraday rotation angle based on the beam combining signal.
[0035] In this embodiment, the fixed-frequency solid-state source 1 is a fixed-frequency 650GHz solid-state source. The frequencies of the first frequency-modulated solid-state source 2 and the second frequency-modulated solid-state source 3 are different from each other. The difference between the first frequency-modulated solid-state source 2 and the fixed-frequency solid-state source 1 is +0.850MHz, and the difference between the second frequency-modulated solid-state source 3 and the fixed-frequency solid-state source 1 is -1.275MHz. By using the multi-laser method, the difference frequency between the frequency-modulated solid-state source and the fixed-frequency solid-state source 1 can be arbitrarily adjusted within the megahertz range to achieve high time resolution measurement.
[0036] The polarization interferometer optical path system of this application includes a reference optical path and a probe optical path. The reference optical path and the probe optical path share some optical structures. Based on the setting of some optical structures, the number of optical components used is reduced, which provides a basis for the miniaturization of solid-state source polarization interferometer integrated devices.
[0037] The reference detector 7 and the probe detector 16 are AlGaN / GaN-HEMT field-effect transistor detectors, which are small in size and can be used at room temperature. Furthermore, the corner reflector 15 is directly fixed to the upper or horizontal window of the measuring device, allowing the probe light path to return along its original path, reducing the number of optical components used and eliminating the need for large support brackets. Depending on the measurement requirements, both vertical and horizontal measurement schemes can be achieved. As shown in Figure 2, when the corner reflector 15 is fixed to the horizontal window, and a necessary optical reflector is added to the other side, with the solid-state source interferometer optical platform and stage optical path 21 placed on the side of the device, horizontal measurement can be achieved.
[0038] Except for the corner reflector 15, which is fixed by a support mechanism fixed to the optical platform, all other optical structures are compactly fixed to the optical platform.
[0039] The polarization interferometer optical path system employs the heterodyne measurement principle. By adjusting the frequency of a tunable 650 GHz solid-state source, a megahertz-level frequency difference is generated between it and a fixed 650 GHz solid-state source 1. When the beams from the fixed-frequency solid-state source 1, the first tunable solid-state source 2, and the second tunable solid-state source 3 are combined and enter the detectors (reference channel detector 7 and probe channel detector 16), a megahertz-level beat frequency signal is generated, providing a basis for high time resolution measurements. The optical path design includes two paths (reference channel optical path and probe channel optical path): the probe channel optical path passes through the plasma region as the probe channel, while the reference channel optical path does not pass through the plasma region and serves as the reference channel. After plasma generation, the beam in the probe channel optical path undergoes a phase shift. By heterodyne comparing the signal from the probe channel with the signal from the reference channel, the phase change caused by the beam propagating in the plasma can be calculated, thereby calculating the electron density and Faraday rotation angle of the plasma.
[0040] By adjusting the frequencies of the first frequency-modulated solid-state source 2 and the second frequency-modulated solid-state source 3, a frequency difference on the order of megahertz is generated between the three solid-state sources (fixed-frequency solid-state source 1, first frequency-modulated solid-state source 2, and second frequency-modulated solid-state source 3). The laser beams output from the fixed-frequency solid-state source 1, first frequency-modulated solid-state source 2, and second frequency-modulated solid-state source 3 have a small beam waist and significant divergence. Therefore, in the interferometer optical path system, they need to pass through condenser lenses (i.e., first condenser lens 4-1, second condenser lens 4-2, and third condenser lens 4-3) to change the beam waist to a suitable size.
[0041] The optical signal emitted by the fixed-frequency solid-state source 1 passes sequentially through the first condenser lens 4-1, the second beam splitter 5, and the third beam splitter 6 before entering the reference channel detector 7. The optical signal emitted by the first frequency-modulated solid-state source 2 passes sequentially through the second condenser lens 4-2, the half-wave plate 22, the polarizing beam splitter 8, and the third beam splitter 6 before entering the reference channel detector 7. The optical signal emitted by the second frequency-modulated solid-state source 3 passes sequentially through the third condenser lens 4-3, the third reflector 20, the sixth beam splitter 19, the polarizing beam splitter 8, and the third beam splitter 6 before entering the reference channel detector 7. This generates three reference channel beat frequency signals.
[0042] The optical signal transmitted by the fixed-frequency solid-state source 1 passes sequentially through the first focusing lens 4-1, the second beam splitter 5, the second reflecting mirror 17, and the fourth beam splitter 18 before entering the detector 16. The optical signal transmitted by the first frequency-modulated solid-state source 2 passes sequentially through the second focusing lens 4-2, the polarizing beam splitter 8, the first reflecting mirror 9, the fifth beam splitter 10, the quarter-wave plate 23, the telescope system, the fourth reflecting mirror 13, and the seventh beam splitter 14 before passing through the plasma and being transported to the corner reflector 15. After being reflected by the corner reflector 15, it passes sequentially through the seventh beam splitter 14 and the fourth beam splitter 18 before entering the detector 16. The second frequency-modulated solid-state source 2... The optical signal emitted by the frequency-modulated solid-state source 3 passes sequentially through the third focusing lens 4-3, the third reflecting mirror 20, the sixth beam splitter 19, the fifth beam splitter 10, the quarter-wave plate 23, the telescope system, the fourth reflecting mirror 13, and the seventh beam splitter 14 before passing through the plasma and being transported to the corner reflector 15. After being reflected by the corner reflector 15, it passes sequentially through the seventh beam splitter 14 and the fourth beam splitter 18 before entering the detector 16. The optical signals emitted by the first frequency-modulated solid-state source 2 and the second frequency-modulated solid-state source 3 are combined after passing through the polarization beam splitter 8, and become circularly polarized signals after passing through the quarter-wave plate 23.
[0043] Understandably, the laser, after passing through the telescope system, is incident perpendicularly by the 45-degree angle mirror, passes through the plasma after passing through the seventh beam splitter 14, and is then returned along its original path by the angle mirror 15 directly fixed to the top flange of the device. This allows the light signals emitted by the first frequency-modulated solid source 2 and the second frequency-modulated solid source 3 to enter the detector channel 16, thereby causing the detector channel 16 to generate three detector channel beat frequency signals.
[0044] The telescope system specifically includes a convex lens 11 and a concave lens 12. The two frequency-modulated solid-state sources have a wavelength of 462 micrometers and diverge rapidly. The telescope system can keep the laser beam small in diameter as it propagates over a long distance into the device, thus avoiding excessive power loss.
[0045] The light signals emitted by the two frequency-modulated solid-state sources are combined after passing through the polarization beam splitter 8. The combined light only needs to pass through the seventh beam splitter 14 along a single optical path, reducing the optical path structure setup. At the same time, after passing through the plasma, the combined beam is vertically reflected by the corner reflector 15 and then reflected by the seventh beam splitter 14 before entering the detector 16. This avoids the deviation of the two beams during vertical reflection, thereby ensuring the stability of the beam entering the detector 16.
[0046] This embodiment sets up two frequency-modulated solid-state sources (first frequency-modulated solid-state source 2 and second frequency-modulated solid-state source 3), which together with the fixed-frequency solid-state source 1 form a solid-state source interferometer integrated device. Compared with the existing device that uses a single frequency-modulated solid-state source and a fixed-frequency solid-state source 1, it has the following advantages (a1) to (a5):
[0047] (a1) Increased measurement parameters: Compared with the original two-channel measurement, three difference frequency signals can be obtained by three-channel measurement. This means that in the fusion experiment, not only density parameters can be obtained by calculation, but also Faraday rotation angle parameters, providing higher integrity for experimental data.
[0048] (a2) Provides verification for experimental data: The construction of the three channels introduces polarization signals, which can not only obtain Faraday rotation angle data, but also deduce the magnitude and disturbance of the external magnetic field during the fusion experiment, which is of great significance for whether the experiment can run stably.
[0049] (a3) Multiple difference frequency adjustment: The three solid sources can be adjusted in pairs to allow for more precise difference frequency distribution. If the experiment requires experiments on higher density plasmas, a higher difference frequency can be set to improve measurement accuracy and thus obtain higher temporal and spatial resolution.
[0050] (a4) Enhanced system reliability: When one frequency-modulated solid-state source fails unexpectedly, the entire system can still operate normally by relying on the remaining two solid-state sources, reducing system downtime.
[0051] (a5) Supports more measurement modes: The three solid source systems can run different measurement modes simultaneously or independently, such as placing any of the solid sources in the horizontal and vertical directions for measurement, which is very useful for fusion experiments in complex environments.
[0052] As shown in Figure 3, the signals generated by laser 1, the first frequency-modulated solid-state source 2, and the second frequency-modulated solid-state source 3 pass through the optical system, are combined, and then enter the reference channel detector 7 and the detection channel detector 16. Part of the acquired signal is fed into a phase comparator to calculate the plasma electron density and Faraday rotation angle in real time and output the result. The other part is processed by a spectrum analyzer to obtain three different intermediate frequency (IF) signals (0.850 MHz, 1.275 MHz, and 2.125 MHz). The IF signals and power signals are then transmitted to the host computer terminal. If the frequency difference between the fixed-frequency solid-state source 1, the first frequency-modulated solid-state source 2, and the second frequency-modulated solid-state source 3 does not meet the requirements, the frequencies of the first and second frequency-modulated solid-state sources 2 and 3 can be adjusted through the frequency control module of the host computer. The host computer can also periodically start and stop the main control module and the detector phase comparator module, while recording data. This facilitates feedback on erroneous data and allows for timely adjustments.
[0053] Modular Control Introduction: This embodiment uses the ESP8266 module as the remote module carrier to achieve remote communication and communicate with the user terminal via the HTTP protocol to receive remote control commands. Relay Module: Used to control the switching of electrical equipment, connected to and controlling the power supply of the equipment via the ESP8266's GPIO pins. Current Sensor Module: Used to detect whether the equipment is running, using an ACS712 current sensor connected to the ESP8266 via an analog input pin to provide feedback on the equipment's current value, thereby determining whether the equipment is running. Web Server Module: The ESP8266 internally builds a web server, providing a user interface that displays the current status of the equipment via a webpage and allows users to perform remote control operations. Control Terminal: The host accesses the ESP8266's IP address through a browser to realize equipment switching control and operation status query.
[0054] Solution: By implementing a simple web server and control logic on the ESP8266, combined with relay and current sensor modules, remote control and status monitoring of the equipment can be achieved. Its working principle and implementation method are as follows:
[0055] Network connectivity: During system initialization, the ESP8266 connects to the user's local area network, obtains network connectivity, and is assigned an IP address. The device's IP address is output via serial port, allowing the user to access and control it through a web browser.
[0056] Control command reception and execution: The user sends an HTTP request via a web page. Upon receiving the control request, the ESP8266 controls the relay's switch via GPIO pins, thereby controlling the on / off state of the solid-state power supply. Relay control is achieved by setting a high level (device on) or a low level (device off).
[0057] Device status detection: The ESP8266 continuously collects the device's current value using the ACS712 current sensor. By setting appropriate voltage, current, or power thresholds, the ESP8266 determines whether the device is in operation. Based on the detected data, the ESP8266 returns the device's operating status to the web server.
[0058] Web page display and feedback: The web server dynamically displays the device's current status (on / off) and running status (running / not running) on the web page. Users can view the device's status in real time and remotely control it through the control buttons on the page.
[0059] System control flow:
[0060] (b1) The user accesses the IP address of ESP8266 through a browser and opens a web page.
[0061] (b2) The web page displays the current status and operating status of the device and provides control buttons.
[0062] (b3) When the user clicks the “Start Device” button, the ESP8266 controls the relay module to switch on and off, starts the device, and provides feedback on the device status.
[0063] (b4) When the user clicks the “Shut down device” button, the ESP8266 controls the relay module to shut down the device and provides feedback on the device status.
[0064] (b5) The system periodically reads the value of the current sensor and determines whether the equipment is running, and returns the status to the user.
[0065] Figure 4 shows a simplified connection diagram. ESP8266: As the core control unit, it connects to the relay and current sensor. GPIO pin D1 is used to control the relay, and GPIO pin A0 is used to read data from the current sensor. Relay module: Used to switch the solid-state laser. The relay module's "IN" pin receives the control signal from the ESP8266 (pin D1). The relay's normally open contact (NO) and common contact (COM) are used to control the power supply of the load device. Current sensor (ACS712): Used to detect the current of the load device and outputs current data to the analog input terminal (pin A0) of the ESP8266. This current value is used to determine whether the load is running.
[0066] This embodiment achieves system compactness and stability through a small, stable 650GHz solid-state source and a rationally designed optical path. A corner reflector fixed to the window flange ensures the probe optical path returns along its original path, avoiding the need for large supports. This integrated device supports both vertical and horizontal position measurements and can be expanded into a multi-channel system to achieve multi-channel line integral electron density and Faraday rotation angle measurements. Furthermore, the integrated device is equipped with a remote control and monitoring module. Operators can remotely adjust the host module, detector phase comparator module, and frequency control module via a control terminal to control system operating parameters. Finally, a data logging module monitors all system parameters in real time, improving operational efficiency.
[0067] The above description is only a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in the present invention, based on the technical solution and inventive concept of the present invention, should be covered within the scope of protection of the present invention.
Claims
1. An integrated device for a solid-state source polarization interferometer used in a nuclear fusion experimental apparatus, characterized in that, It includes a fixed-frequency solid-state source (1), a first frequency-modulated solid-state source (2) and a second frequency-modulated solid-state source (3), a polarization interferometer optical path system, a corner mirror (15), a reference channel detector (7) and a probe channel detector (16); The optical signal transmitted by the fixed-frequency solid source (1) is transmitted to the reference channel detector (7) and the probe channel detector (16) respectively through the polarization interferometer optical path system. A portion of the optical signal transmitted by the first frequency-modulated solid source (2) undergoes a change in polarization direction in the optical path system of the polarization interferometer, and is combined and collinear with the optical signal transmitted by the second frequency-modulated solid source (3) in the optical path system of the polarization interferometer. The collinear light is converted into circularly polarized light, which passes through the plasma and is transported to the corner mirror (15). After passing through the corner mirror (15), it enters the detector (16) of the detection channel. The other part of the optical signal sent by the first frequency-modulated solid source (2) and the second frequency-modulated solid source (3) enters the reference channel detector (7) through the polarization interferometer optical path system.
2. The integrated device for a solid-state source polarization interferometer for a nuclear fusion experimental apparatus according to claim 1, characterized in that, The reference channel detector (7) is used to detect the optical signals sent by the fixed frequency solid source (1), the first frequency-modulated solid source (2), and the second frequency-modulated solid source (3); The detector (16) is used to detect the optical signals sent by the fixed-frequency solid source (1), the first frequency-modulated solid source (2), and the second frequency-modulated solid source (3), so that the solid source polarization interferometer integrated device can calculate the plasma electron density and Faraday rotation angle based on the combined signal.
3. The integrated device for a solid-state source polarization interferometer for a nuclear fusion experimental apparatus according to claim 2, characterized in that, The polarization interferometer optical path system includes a reference path optical path and a probe path optical path, and the reference path optical path and the probe path optical path share some optical structures.
4. The integrated device for a solid-state source polarization interferometer for a nuclear fusion experimental apparatus according to claim 3, characterized in that, The reference path optical path includes a first condenser lens (4-1), a second condenser lens (4-2), a third condenser lens (4-3), a half-wave plate (22), a polarizing beam splitter (8), a second beam splitter (5), a third beam splitter (6), a third reflecting mirror (20), and a sixth beam splitter (19). The optical signal sent by the fixed-frequency solid-state source (1) passes through the first focusing lens (4-1), the second beam splitter (5), and the third beam splitter (6) in sequence and enters the reference channel detector (7); The optical signal transmitted by the first frequency-modulated solid source (2) passes through the second focusing lens (4-2), the half-wave plate (22), the polarizing beam splitter (8), and the third beam splitter (6) in sequence before entering the reference channel detector (7). The optical signal sent by the second frequency-modulated solid source (3) passes through the third focusing lens (4-3), the third reflecting mirror (20), the sixth beam splitter (19), the polarizing beam splitter (8), and the third beam splitter (6) in sequence before entering the reference channel detector (7).
5. The integrated device for a solid-state source polarization interferometer for a nuclear fusion experimental apparatus according to claim 4, characterized in that, The detection path includes a second reflector (17), a fourth beam splitter (18), a first reflector (9), a fifth beam splitter (10), a quarter wave plate (23), a telescope system, a fourth reflector (13), and a seventh beam splitter (14). The optical signal sent by the fixed-frequency solid source (1) passes through the first focusing lens (4-1), the second beam splitter (5), the second reflector (17), and the fourth beam splitter (18) in sequence and enters the detector (16). The optical signal sent by the first frequency-modulated solid source (2) passes through the second focusing lens (4-2), polarizing beam splitter (8), first reflecting mirror (9), fifth beam splitter (10), quarter wave plate (23), telescope system, fourth reflecting mirror (13), and seventh beam splitter (14) in sequence, and then passes through the plasma to the corner reflector (15). After being reflected by the corner reflector (15), it passes through the seventh beam splitter (14) and fourth beam splitter (18) in sequence and enters the detector (16). The optical signal sent by the second frequency-modulated solid source (3) passes through the third focusing lens (4-3), the third reflecting mirror (20), the sixth beam splitter (19), the fifth beam splitter (10), the quarter wave plate (23), the telescope system, the fourth reflecting mirror (13), and the seventh beam splitter (14) in sequence, and then passes through the plasma to the corner reflector (15). After being reflected by the corner reflector (15), it passes through the seventh beam splitter (14) and the fourth beam splitter (18) in sequence and enters the detector (16).
6. The integrated device for a solid-state source polarization interferometer for a nuclear fusion experimental apparatus according to claim 5, characterized in that, The optical signals transmitted by the first frequency-modulated solid-state source (2) and the second frequency-modulated solid-state source (3) are combined after passing through the polarizing beam splitter (8) and become circularly polarized signals after passing through the quarter-wave plate (23).
7. The integrated device for a solid-state source polarization interferometer for a nuclear fusion experimental apparatus according to claim 1, characterized in that, The fixed-frequency solid-state source (1) is a fixed-frequency 650GHz solid-state source. The frequencies of the first frequency-modulated solid-state source (2) and the second frequency-modulated solid-state source (3) are different from each other. The difference between the first frequency-modulated solid-state source (2) and the fixed-frequency solid-state source (1) is +0.850MHz, and the difference between the second frequency-modulated solid-state source (3) and the fixed-frequency solid-state source (1) is -1.275MHz.
8. The integrated device for a solid-state source polarization interferometer for a nuclear fusion experimental apparatus according to claim 1, characterized in that, The data collected by the reference channel detector (7) and the probe channel detector (16) are partly fed into the phase comparator to calculate the plasma electron density and Faraday rotation angle in real time and output. The other part is fed into the spectrum analyzer to obtain three different intermediate frequency signals. Then the intermediate frequency signal and the power signal are transmitted to the host computer terminal.
9. The integrated device for a solid-state source polarization interferometer for a nuclear fusion experimental apparatus according to claim 8, characterized in that, The frequency of the frequency-modulated solid-state source is adjusted via the frequency control module of the host computer.
10. The integrated device for a solid-state source polarization interferometer for a nuclear fusion experimental apparatus according to claim 1, characterized in that, The reference channel detector (7) and the probe channel detector (16) are field-effect transistor detectors.