Multifunctional wireless test platform

Abstract

Disclosed in the present application is a multifunctional wireless test platform, comprising: a multi-probe arc-shaped clamp which clamps a plurality of probe antennas, the probe antennas being configured to receive electric field data acquired from an object to be tested; a robotic arm configured to drive the multi-probe arc-shaped clamp to perform on said object spherical scanning by taking said object as a spherical center; a said-object motion system configured for the mounting of said object and to drive said object to perform a predetermined motion so as to complete the spherical scanning; and a control system configured to determine spherical scanning parameters and perform sampling analysis on the electric field data acquired from said object so as to obtain the performance parameters of said object. The present application can implement various wireless tests on the same apparatus, thereby significantly saving on the testing space and time cost.

Description

Multifunctional Wireless Test Platform Technical Field

[0001] This application relates to wireless testing, specifically to a multifunctional wireless testing platform. Background Technology

[0002] In communication networks, antennas are an indispensable part of wireless connectivity products. The performance of an antenna directly affects the quality of the product and even the entire communication system. Therefore, during the design phase of wireless circuits, it is necessary to conduct separate radiation performance tests on the antenna. Secondly, before a product is put into use, its electromagnetic compatibility (EMC) characteristics need to be tested to assess whether the product will interfere with communication systems operating at other frequencies. Traditional antenna test platforms only have radiation performance testing capabilities, while testing EMC characteristics requires an additional anechoic chamber. Summary of the Invention

[0003] This application provides a multifunctional wireless testing platform, including: a multi-probe arc-shaped clamp holding multiple probe antennas, wherein the probe antennas are used to receive electric field data emitted by the object under test; and a robotic arm for driving the multi-probe arc-shaped clamp to perform spherical scanning of the object under test with the object under test as the center.

[0004] A motion system for installing and driving the object under test to perform a predetermined motion in order to complete the spherical scanning; and a control system for determining spherical scanning parameters and sampling and analyzing the electric field data emitted by the object under test to obtain the performance parameters of the object under test.

[0005] In some embodiments of this application, the test object motion system includes a test object clamp for holding the test object, a turntable device for carrying the test object clamp and driving the test object to rotate horizontally around the center of the turntable, and a lifting platform for carrying the turntable device and driving the turntable device to move vertically.

[0006] In some embodiments of this application, the motion system of the object under test is a detachable motion system of the object under test.

[0007] In some embodiments of this application, the control system determines the spherical scanning parameters by: determining the size and shape of the object to be tested, calculating and analyzing the required scanning area and scanning space size, and determining the test mode and test range.

[0008] In some embodiments of this application, the probe antenna includes multiple dual-polarized sampling probe antennas, and the multi-probe arc fixture includes a 22.5-157.5 degree annular fixture. The dual-polarized sampling probe antennas are evenly distributed along the circumference of the 22.5-157.5 degree annular fixture and face the center of the 22.5-157.5 degree annular fixture.

[0009] In some embodiments of this application, a radio frequency switch is provided on the multi-probe arc fixture, the radio frequency switch has multiple output ports, and the multiple dual-polarized sampling probe antennas are connected to the multiple output ports in a one-to-one correspondence.

[0010] In some embodiments of this application, the radio frequency switch is a single-pole eight-throw radio frequency switch.

[0011] In some embodiments of this application, the robotic arm is a multi-axis robotic arm terminal, and the multi-probe arc-shaped clamp is nested and connected to the multi-axis robotic arm terminal.

[0012] In some embodiments of this application, the multi-probe arc-shaped clamp is hollowed out and covered with microwave absorbing material.

[0013] In some embodiments of this application, the multifunctional wireless test platform further includes a vector network analyzer for performing vector network analysis.

[0014] This application enables wireless testing of multiple functions on a single device, thereby significantly saving testing space and time costs. Attached Figure Description

[0015] To make the technical problems solved by this invention, the technical means adopted, and the technical effects achieved clearer, specific embodiments of this invention will be described in detail below with reference to the accompanying drawings. However, it should be noted that the drawings described below are merely drawings of exemplary embodiments of this invention. Those skilled in the art can obtain drawings of other embodiments based on these drawings without any creative effort.

[0016] Figure 1 shows a schematic diagram of the planar scanning test principle according to an embodiment of this application.

[0017] Figure 2 shows a schematic diagram of the spherical scanning test principle according to an embodiment of this application.

[0018] Figure 3 shows a schematic diagram of the spherical scanning test principle according to an embodiment of this application.

[0019] Figure 4 shows the structure of the antenna test system according to an embodiment of this application.

[0020] Figure 5 shows a schematic diagram of the working principle of the antenna test system according to an embodiment of this application.

[0021] Figure 6 shows a design principle diagram of an embodiment of this application. Detailed Implementation

[0022] Exemplary embodiments of the invention will now be described more fully with reference to the accompanying drawings. While these exemplary embodiments can be implemented in various specific ways, they should not be construed as limiting the invention to the embodiments set forth herein. Rather, these exemplary embodiments are provided to make the content of the invention more complete and to facilitate a full communication of the inventive concept to those skilled in the art. Structures, performance, effects, or other features described in a particular embodiment, while consistent with the inventive concept, may be combined in any suitable manner with one or more other embodiments.

[0023] In the description of specific embodiments, detailed descriptions of structures, performance, effects, or other features are provided to enable those skilled in the art to fully understand the embodiments. However, this does not preclude those skilled in the art from implementing the present invention with technical solutions that do not contain the aforementioned structures, performance, effects, or other features under specific circumstances.

[0024] The same reference numerals in the accompanying drawings denote the same or similar elements, components, or parts, and therefore, repeated descriptions of the same or similar elements, components, or parts may be omitted below. It should also be understood that although terms such as first, second, third, etc., indicating numbers may be used herein to describe various devices, elements, components, or parts, these devices, elements, components, or parts should not be limited by these terms. That is, these terms are only used to distinguish one from another. For example, a first device may also be referred to as a second device, without departing from the essential technical solution of the invention. Furthermore, the terms "and / or" and "and / or" refer to all combinations including any one or more of the listed items.

[0025] This application relates to a multi-functional wireless test platform based on multi-probe scanning. This test platform can utilize robotic arm scanning and a self-developed near-field to far-field conversion algorithm to perform multiple wireless tests on a single device, such as switching between antenna radiation performance testing and electromagnetic compatibility testing, thereby significantly saving test space and time costs.

[0026] Figure 1 illustrates a schematic diagram of the planar scanning test principle according to an embodiment of this application. As shown in Figure 1, the test probe can perform planar sampling on the product under test (in this application, the term "test object" and "test subject" are used interchangeably to refer to the same thing), for example, in a scanning plane with a total length LH and a total width LW. Where LH = DH + PH + 2Ztanθ, LW = DW + PW + 2Ztanθ. DH is the side length of the product under test, DW is the side width of the product under test, PH is the length of the test probe, PW is the width of the test probe, Z is the distance between the product under test and the test probe in the normal direction of the sampling plane, and θ is the angle between the test probe and the normal direction of the sampling plane.

[0027] Figure 2 shows a schematic diagram of the spherical scanning test principle according to an embodiment of this application. Figure 3 shows a schematic diagram of the spherical scanning test principle according to an embodiment of this application. Figure 2 shows spherical far-field cutting sampling, and Figure 3 shows multi-probe spherical near-field cutting sampling. It can be seen that the product under test can be placed in a spherical field and can rotate horizontally. The test probe can be placed on the spherical surface and move along the surface. The test probe can be a single probe as shown in Figure 2, or multiple probes as shown in Figure 3.

[0028] Figure 4 illustrates the structure of an antenna test system according to an embodiment of this application. Figure 5 illustrates the working principle diagram of an antenna test system according to an embodiment of this application. As shown in Figures 4 and 5, the test system may include:

[0029] 1. Probe fixture: used to hold the test probe. The test probe may be equipped with a power receiver to receive the electric field data emitted by the object under test.

[0030] 2. Product Under Test (DUT) fixture, used to hold the product under test.

[0031] 3. Robotic Arm: Used to move the test probe holder.

[0032] 4. Controller: Used to control the operation of the entire testing system.

[0033] 5. Robotic Arm Stand: Used to support the robotic arm.

[0034] 6. Lift Station: Used to lift and lower the fixture of the product to be tested.

[0035] 7. Rotary table, used to rotate the fixture of the product to be measured.

[0036] 8. Vector Network Analyzer (VNA), used for vector network analysis during the testing process.

[0037] 9. The supporting software (Software Subsystem) is the software that supports the hardware of the entire test system. It is used to support the corresponding operation of each hardware component. That is, it can serve as the control system of the entire test system. For example, it can be used to determine the spherical scanning parameters and to sample and analyze the electric field data emitted by the object under test to obtain the performance parameters of the object under test.

[0038] 10. Single-pole eight-throw (SP8T) RF switch circuit (1-to-8Switch) is used to switch the operation of each test probe and acquire data from the test probe.

[0039] As shown in Figures 1-5, the multi-functional wireless testing platform based on multi-probe scanning of this application includes a multi-probe sampling system, a detachable object-to-test (DUT) motion system, a near-field and far-field measurement system, and control software. The multi-probe sampling system consists of multiple probe antennas capable of receiving dual-polarized electric fields mounted on a 22.5-157.5 degree annular fixture (arc-shaped fixture) 1 centered on the DUT. The dual-polarized sampling probe antennas are evenly distributed along the circumference of the fixture and face the center of the fixture 1. The robotic arm 3 drives the fixture 1, equipped with probe antennas, to perform a semi-annular trajectory scan in space with the DUT as the center, to receive the radiated electric field data. The multi-probe sampling system may include a radio frequency (RF) switch 10, which may have output ports, and each dual-polarized sampling probe antenna is connected to one of the multiple output ports. The annular fixture 1 can be nested with a multi-axis robotic arm terminal. The annular fixture 1 may be hollowed out and can be covered with absorbing material.

[0040] The detachable test object motion system can be used to mount the test object, i.e., the product to be tested, and can drive the test object (via the lifting platform 6) to move up and down in the vertical direction so that the test object is at the center of the arc-shaped fixture 1. A turntable device (i.e., a rotating platform 7) drives the test object to rotate around the center of the turntable, which works in conjunction with the multi-probe fixture 1 to complete the spherical trajectory scanning. In addition, it has a simple nesting device to facilitate the disassembly and installation of other types of test object platforms. The detachable test object motion system and the robotic arm base 5 can be provided with a nesting device to facilitate the loading and unloading of the test object placement platform. In other words, the detachable test object motion system can be used to mount and drive the test object to perform a predetermined movement to cooperate in completing the spherical scanning of the test object with the test object as the center by the multi-probe arc-shaped fixture driven by the robotic arm.

[0041] Near-field and far-field measurement systems can be used to sample and analyze signals radiated by an object under test (AUT) to obtain its performance parameters. A near-field and far-field measurement system may include a total power measurement subsystem, which may include a power receiver and an RF switch mounted on the probe.

[0042] The control software (accompanying program 9) can be configured to determine the size and shape of the object under test, calculate and analyze the required scanning area and scanning space, and recommend test modes and test ranges to the tester based on the simulation results, thereby avoiding collisions and damage to the test parts during the scanning process.

[0043] Figure 6 shows a design schematic diagram of an embodiment of this application, which includes:

[0044] S10) Estimate the scanning range of the receiving probe for the product under test based on the frequency band of the target under test.

[0045] In this step, the required test frequency band for the product under test is first determined, and the corresponding electromagnetic wave wavelength range is calculated. This allows for the estimation of the spherical scanning radius and planar scanning distance of the receiving probe on the product under test (generally 5-7 times the wavelength of that frequency band). This part determines the radius of curvature of the fixture used to fix the multiple probes, the scanning time, and the test accuracy.

[0046] S20) Select a suitable robotic arm model and design a platform to support the robotic arm to meet the scanning stepping accuracy requirements and scanning range of the required frequency band.

[0047] S30) Design a rotating lifting platform for placing the product under test. The size and height of the lifting platform are designed according to the size requirements of the product under test in the required frequency band, so that products under test of different sizes can be placed within the scanning range of the robotic arm.

[0048] In steps S20 and S30, a suitable robotic arm can be selected based on the size of the scanning range. The size of the product under test can also be estimated based on its frequency range, allowing for the design of a rotating and lifting platform component. The lifting height can be designed according to the scanning range, ensuring that different products within that frequency band can be placed within the robotic arm's scanning range by adjusting the platform height.

[0049] The subsequent work can be divided into two parts: software and hardware, which will be carried out simultaneously. The software part may include:

[0050] S41) Add a rotating lifting platform, the product under test, and a receiving probe to the robotic arm simulation software to simulate the scanning path of the probe on the product under test, such as spherical scanning and planar scanning.

[0051] S42) Develop software for adjusting scanning parameters, allowing test users to select parameters such as test mode, test range, test frequency, and test step angle, and provide recommended test range and test mode based on the simulation results of the simulator.

[0052] S43) Integrate the control functions of the rotation motor and the lifting motor of the rotary lifting table into the software to achieve the linkage control of the robotic arm and the rotary lifting table within the software, and cooperate to complete the scanning method suitable for product testing.

[0053] In the hardware part, it may include:

[0054] S51) Design 4 test probes according to the required test frequency band and test the performance of the test probes.

[0055] S52) Design an arc-shaped fixture that can integrate multiple probes according to the required scanning range and install it at the end of the robotic arm.

[0056] S53) Design a single-pole eight-throw (SP8T) RF switch circuit to quickly obtain the data of the 8 test ports of the 4 test probes.

[0057] It can be seen that in the software part, components such as a rotary lifting table, a product sample to be tested, and a receiving probe are added to the robotic arm simulation software to simulate the scanning path of the probe for the product to be tested, and the forms of spherical scanning and planar scanning are designed. The purpose of this process is to avoid damage to the test components. Because in the real test scanning environment, all test probes and the products to be tested are connected to the vector network analyzer through coaxial cables with a limited length. If the scanning range exceeds a certain limit, the cables will become entangled, resulting in component damage. Therefore, by simulating and observing the actions of the robotic arm in the simulator in advance, the risk of component scrapping can be reduced. Then develop a control software that allows customers to independently select test parameters, and the interface of this software can provide parameters such as test mode, test range, test frequency, test step angle, etc. for customers to choose, and recommend testable modes and test ranges to the testers according to the results simulated by the simulator, so as to avoid collisions and damage of the test components during the scanning process. Finally, integrate the control functions of the rotation motor and the lifting motor in the rotary lifting table into the software, and perform linkage control with the control of the robotic arm to cooperate to complete the scanning action suitable for product testing. In terms of hardware, first, four dual-polarized test probes need to be designed and the performance of the test probes needs to be tested to ensure that they can meet the requirements of electromagnetic calculations. Then, design a circular arc fixture that can integrate 4 test probes according to the scanning range required by the product to be tested and install it at the end of the robotic arm. In order to quickly obtain the test information of the four probes, a single-pole eight-throw (SP8T) RF switch circuit needs to be designed.

[0058] After the software and hardware design are completed, the process continues to include:

[0059] S60) The outlet of the RF switch is connected to the vector network analyzer through an RF coaxial cable, and the other ports are respectively connected to the 8 ports of the test probes through coaxial cables. The RF port of the product to be tested fixed on the lifting table is connected to another port of the vector network analyzer.

[0060] S70) Input parameters into the software interface according to the required operating frequency band and scanning range, so that the test probe can perform a set scan of the product under test within a predetermined radius, and obtain the radiation electric field data of each scanning frequency band and scanning position from the vector network analyzer.

[0061] S80) displays the electric field data during scanning in real time. After the scan is completed, the obtained data is converted into near-field and far-field data and visualized, and then converted into three-dimensional and two-dimensional images. The data is also stored as an output text document.

[0062] As can be seen, after completing the hardware and software design, the radio frequency (RF) connections are required. The output of the RF switch is connected to the vector network analyzer via an RF coaxial cable, and the other ports are connected to the eight ports of the test probe via coaxial cables. The RF input port of the product under test (DUT), fixed on the lifting platform, is connected to another port of the vector network analyzer. To accommodate probe platform testing and antenna-in-package (AiP) testing available on the market, the rotating lifting platform can be designed as a detachable component, allowing users to replace the DUT as needed. Then, parameters are input into the software interface according to the required operating frequency band and scanning range, allowing the test probe to scan the DUT within a predetermined radius. The radiated electric field data for each scanning frequency band and position is acquired from the vector network analyzer and displayed in real-time in the software. After the scan is complete, the obtained near-field data is converted to far-field data to obtain the required far-field data for testing. This data is then visualized, converting it into 3D and 2D images, and stored as an outputtable text document.

[0063] In general, this application relates to a testing system for testing antenna radiation performance and electromagnetic compatibility (EMC) performance. It consists of both hardware and software. The hardware mainly includes a robotic arm, a detachable rotating platform, a test probe composed of multiple receiving antennas, an RF switching circuit, and a vector network analyzer. The software functions include test calculation algorithms and mechanical control software, such as motor control of the robotic arm and rotating platform, test scene settings, near-field data to far-field conversion algorithms, and graphical display of test results. The system can control the probe on the robotic arm to scan the product under test (DUT) on the rotating platform along specific spherical and planar trajectories, converting the acquired data into far-field data using near-field and far-field algorithms. By replacing the receiving antennas with EMC receiving probes, the control software can determine the size and shape of the DUT, calculate and analyze to determine the required scanning area and scanning space, and then perform spherical and planar scanning on the DUT, converting the electric field radiated from the DUT into EMC change data.

[0064] The main purpose of this application is to test the radiated electric field of wireless products. It receives the near-field electric field close to the product under test and converts it into the far-field radiated electric field in practical applications. This allows wireless product designers and electromagnetic compatibility assessment agencies to use the data as reference to evaluate the radiation performance of the product under test, such as electric field strength, maximum radiation direction, radiation efficiency, antenna gain, electromagnetic interference, etc.

[0065] Technically, this application uses a robotic arm for automatic scanning to receive and calculate the radiated electric field of the device under test. However, unlike previous robotic arm testing platforms, this application adds a rotatable lifting platform (a rotating lifting platform, i.e., the combined name of lifting platform 6 and rotating platform 7) and a device for easily disassembling the rotating lifting platform to increase the scanning range of the robotic arm. It also utilizes a multi-probe receiving method and fixtures to reduce testing time. When performing scanning tests using traditional robotic arm-based testing technology, the robotic arm is not flexible enough. When it needs to perform large-angle scanning, such as using a single probe to scan the object under test at nearly 165 degrees, it will be unable to scan beyond 90 degrees due to the large scanning radius. Alternatively, although it can exceed 90 degrees, the direction of the probe will change and cannot be kept consistent with the orientation of the object under test. Therefore, the scanning radius limits the existing technology to perform near-field scanning within a certain frequency band. This application uses a rotating lifting platform and an arc-shaped multi-probe fixture to increase the scanning range. Each time the rotating platform rotates a certain horizontal angle, it can scan the object under test to a range of 165 to 170 degrees, thereby achieving a more complete spherical scan. This not only broadens the measurable frequency range, but also enables the testing of more parameters that require a complete spherical surface, such as electromagnetic compatibility (EMC), total radiated power (TRP), and equivalent isotropic radiated power (EIRP).

[0066] This application presents a robotic arm-based antenna radiation and electromagnetic compatibility testing platform. Compared to traditional antenna testing platforms, it is at least one-third smaller and has three-quarters fewer probes, resulting in a two-thirds reduction in cost. This makes it more commercially competitive and reduces R&D costs for companies developing related products. Furthermore, the combination of multiple probes and a rapid switching algorithm ensures consistent testing time. Due to its flexibility in scanning space, storage space, and scanning functions, this application is suitable for full-band wireless testing from 2.45GHz to 300GHz terahertz in Wi-Fi. It is applicable to radiation testing of products used in 5G communications, autonomous driving, the Internet of Things, and even future 6G and satellite communications, contributing to technological advancements in the electronics and communications industries.

[0067] More specifically, the advantages of this application include:

[0068] 1. The test platform for placing the device under test can not only be raised and lowered, but also disassembled and installed with other test platforms. It is equipped with positioning and locking devices to ensure that the device under test is raised and lowered on a stable horizontal surface. The range of scanning radius can be increased and decreased. Near-field scanning calculation can be used for low-frequency devices, and far-field scanning calculation can be used for high-frequency devices.

[0069] 2. This application uses a four-probe dual-polarization receiving method, which reduces the testing time by 3 / 4 compared to the traditional single-probe receiving method;

[0070] 3. The multi-probe approach can simultaneously support different test modules, enabling the test platform to support parameters other than the antenna radiated electric field, such as electromagnetic compatibility (EMC), total radiated power (TRP), and equivalent isotropic radiated power (EIRP).

[0071] The above embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit it. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

[0072] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A multifunctional wireless testing platform, characterized in that, include: A multi-probe arc-shaped clamp holding multiple probe antennas, wherein the probe antennas are used to receive electric field data emitted by the object under test; A robotic arm used to drive the multi-probe arc-shaped fixture to perform spherical scanning of the object under test with the object under test as the center; A motion system for installing and driving the object under test to perform a predetermined motion in order to complete the spherical scanning; as well as The control system is used to determine the spherical scanning parameters and to sample and analyze the electric field data emitted by the object under test to obtain the performance parameters of the object under test.

2. The multifunctional wireless testing platform as described in claim 1, characterized in that, The test object motion system includes a test object clamp for holding the test object, a turntable device for carrying the test object clamp and driving the test object to rotate horizontally around the center of the turntable, and a lifting platform for carrying the turntable device and driving the turntable device to move vertically.

3. The multifunctional wireless testing platform as described in claim 1, characterized in that, The motion system of the object under test is a detachable motion system.

4. The multifunctional wireless testing platform as described in claim 1, characterized in that, The control system determines the spherical scanning parameters by: judging the size and shape of the object to be tested, calculating and analyzing the required scanning area and scanning space size, and determining the test mode and test range.

5. The multifunctional wireless testing platform as described in claim 1, characterized in that, The probe antenna includes multiple dual-polarized sampling probe antennas, and the multi-probe arc fixture includes a 22.5-157.5 degree annular fixture. The dual-polarized sampling probe antennas are evenly distributed along the circumference of the 22.5-157.5 degree annular fixture and face the center of the 22.5-157.5 degree annular fixture.

6. The multifunctional wireless testing platform as described in claim 5, characterized in that, The multi-probe arc fixture is equipped with an RF switch, which has multiple output ports. The multiple dual-polarized sampling probe antennas are connected to the multiple output ports in a one-to-one correspondence.

7. The multifunctional wireless testing platform as described in claim 6, characterized in that, The radio frequency switch is a single-pole eight-throw radio frequency switch.

8. The multifunctional wireless testing platform as described in claim 1, characterized in that, The robotic arm is a multi-axis robotic arm terminal, and the multi-probe arc-shaped clamp is nested and connected to the multi-axis robotic arm terminal.

9. The multifunctional wireless testing platform as described in claim 1, characterized in that, The multi-probe arc-shaped fixture is hollowed out and covered with microwave absorbing material.

10. The multifunctional wireless testing platform as described in claim 1, characterized in that, Also includes: Vector network analyzer used for performing vector network analysis.

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