Control unit, operating method, and semiconductor light source
Patent Information
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- AMS OSRAM INT GMBH
- Filing Date
- 2025-12-18
- Publication Date
- 2026-07-30
Smart Images
Figure EP2025087988_30072026_PF_FP_ABST
Abstract
Description
[0001] 2024PF01722 December 18, 2025
[0002] P2024, 1176 WO N - 1 -
[0003] Description
[0004] CONTROL UNIT, OPERATING PROCEDURE AND SEMI-CONDUCT LIGHT SOURCE
[0005] A control unit is specified. Furthermore, an operating procedure for such a control unit is described. Finally, a semiconductor light source with such a control unit is specified.
[0006] Documents US 7 878 103 Bl and US 2014 / 0 152 180 Al concern LED circuits.
[0007] A semiconductor light source and a measuring method are known from the publication DE 10 2023 119 778 Al .
[0008] One task to be solved is to specify a control unit that can reliably detect faults in a connected circuit, such as a semiconductor light source.
[0009] This task is accomplished, among other things, by a control unit, an operating method, and a semiconductor light source with the features of the independent patent claims. Preferred embodiments are the subject of the dependent claims.
[0010] According to at least one embodiment, the control unit comprises one or more comparator modules. The at least one comparator module can be implemented in hardware or software. The comparator module is configured to compare at least one value measured by or with the control unit, or at least one value difference determined by or with the control unit, with at least one value stored in the control unit or obtained externally. 2024PF01722 18 December 2025
[0011] P2024, 1176 WO N - 2 -
[0012] The value supplied to the control unit is compared. The measured, determined, and / or supplied values can each be numerical values, in particular numerical values of one or more physical quantities, such as voltages, which are dimensionless, for example, expressed in the relevant SI unit. The measured, determined, and / or supplied values are preferably given in digital form, but an analogous specification of the values, for example, based on a voltage level or a current, is also possible in principle.
[0013] According to at least one embodiment, the control unit comprises one or more current sources. The at least one current source can be a constant current source.
[0014] For example, at least one current source is controlled using pulse width modulation (PWM), so that in the case of a constant current source, it always outputs a specific current when switched on and is otherwise switched off. In the following, only the term "current source" will be used. However, equivalent systems, such as current sinks, are also considered current sources; therefore, for simplicity, only the term "current source" will be used in the following. Pulse width modulation can be abbreviated as PWM. Other modulation methods are equally possible, such as pulse amplitude modulation (PAM), pulse frequency modulation (PFM), pulse phase modulation (PPM), and / or pulse coding modulation (PGM).
[0015] According to at least one embodiment, the control unit comprises several output channels. The output channels are for powering external devices not belonging to the control unit. 2024PF01722 December 18, 2025
[0016] P2024, 1176 WO N - 3 -
[0017] Components are set up using at least one power source. In the case of multiple power sources, a one-to-one mapping between the output channels and the power sources is possible.
[0018] According to at least one embodiment, the control unit comprises one or more reference value determination components. The at least one reference value determination component is configured to record a reference limit value for at least one electrical parameter for each of the output channels.
[0019] For example, at least one electrical parameter is a measured voltage or a measured voltage difference, and the reference limit in this example is then a predetermined voltage or a predetermined voltage difference. Other examples of electrical parameters include, in particular, electrical currents, capacitances, inductances, response times, and their respective differences, such as current differences, and so on. A response time, for example, is the duration it takes for a voltage, current, capacitance, and / or inductance to stabilize at a specific value.
[0020] According to at least one implementation, the control unit comprises one or more measurement systems. The at least one measurement system is, for example, an analog-to-digital converter (ADC). It is also possible that the measurement system is a transducer, such as a current sensor IC, or that it is a current sensor IC. All measurement systems in the control unit can be of the same type; alternatively, 2024PF01722 December 18, 2025
[0021] P2024, 1176 WO N - 4 -
[0022] Several different types of measuring systems can be combined together in the control unit.
[0023] In a first variant, each output channel has its own measurement system. In a second variant, each of several groups of output channels has its own measurement system; the groups are, in particular, pairs, i.e., groups of exactly two output channels. It is possible, in principle, for there to be only a single group, but preferably there are multiple groups. In a third variant, at least some of the output channels share a common measurement system; in particular, all output channels share a common measurement system. It is possible for at least three or at least five output channels to be assigned to the common measurement system. It is also possible for hybrid forms of the three variants mentioned above to exist.This means, for example, that for a first subset of the output channels the first variant applies, for a second variant of the output channels the second variant applies, and / or for a third variant of the output channels the third variant applies.
[0024] According to at least one implementation, the individual measurement systems or at least one shared measurement system are configured to record at least one electrical parameter of the assigned output channels and / or groups. In the first two variants, the individual measurement systems are permanently assigned to the relevant output channels and / or groups of output channels. In the case of the third variant, the at least one electrical parameter of the assigned output channels can be recorded by the shared measurement system using a time-division multiplexing method. 2024PF01722 December 18, 2025
[0025] P2024, 1176 WO N - 5 -
[0026] According to at least one implementation, the comparison module is configured to compare at least one electrical parameter with the reference limit and to issue an error message if the reference limit is exceeded or not met. The error message can be sent to another, particularly higher-level, electronic entity, for example, a computer or a terminal device such as a smartphone, in which case the computer or terminal device makes the error message accessible to a user and / or a control algorithm. Alternatively or additionally, the error message can be sent directly from the control unit to a user, for example, by means of a visual and / or audible signal. For example, the computer could be a computer in a vehicle that monitors vehicle components, such as headlights or brake lights, for proper functioning.
[0027] In at least one version, the control unit includes a comparison module,
[0028] - at least one power source,
[0029] - multiple output channels for powering external components not belonging to the control unit using at least one power source,
[0030] - a comparative value determination component designed to capture a comparative limit value for at least one electrical parameter for each of the output channels, and
[0031] - a separate measurement system, such as an analog-to-digital converter, for each of the output channels or for each of several groups of output channels, set up to record at least one electrical parameter of the assigned output channels and / or groups and / or a common measurement system, such as an analog-to-digital converter, for at least 2024PF01722 18 December 2025
[0032] P2024, 1176 WO N - 6 -
[0033] some of the output channels are configured to detect at least one electrical parameter of the assigned output channels using a time-division multiplexing method, wherein the comparison module is configured to compare the at least one electrical parameter with the comparison limit and to output an error message if the comparison limit is exceeded or fallen below.
[0034] In particular, a dedicated driver IC for single-LED fault detection for semiconductor light sources is specified.
[0035] For example, the control unit is a driver IC for controlling LED strings, for example in display elements, design elements, operating elements, white goods, signal lighting or position lights in the automotive sector.
[0036] This allows for the implementation of a dedicated driver IC that is intrinsically suitable for single-LED fault detection in larger LED segments, independent of environmental influences such as temperature or aging. The detected fault can be a short circuit or an open circuit.
[0037] In some LED applications, particularly in the automotive industry, the failure of individual light-emitting diodes (LEDs) within a luminaire is undesirable, as it could compromise safety and / or design. Therefore, fault detection of individual short-circuited or open LEDs is necessary. 2024PF01722 December 18, 2025
[0038] P2024, 1176 WO N - 7 -
[0039] In larger luminaires with high LED density, series or parallel connection of LEDs is common, making electronic monitoring of a single LED difficult. When multiple LEDs are connected in series or parallel, fault detection of a short circuit or open circuit becomes increasingly difficult with increasing string length or number of parallel strings. Short circuits or open connections in LED circuits are detected, for example, by measuring the forward voltage and comparing the value with a corresponding reference value.In series and / or parallel circuits of LEDs, the variations in forward voltages, for example due to binning, temperature and / or aging of the individual LEDs, add up in the worst case to such an extent that the cumulative variation exceeds the signal to be measured, such as the voltage change caused by a short circuit or an open contact of a single LED.
[0040] The control unit described here, which can be a driver IC, is capable of operating individual lighting strings, for example in pairs, in the same way using individual driver channels. The control unit also features a comparator module that can measure and internally compare relevant characteristic parameters such as the voltage drop of the driver channels relative to ground or a supply voltage. If the comparison parameter deviates from a permissible value, the integrated comparator module can forward an error message to a higher-level unit. Thus, lighting devices can be controlled using a driver IC with an integrated comparator module. 2024PF01722 December 18, 2025
[0041] P2024, 1176 WO N - 8 -
[0042] to implement features that allow for fault detection, for example of individual LEDs in the device, whereby disturbances such as temperature influences and / or aging behavior can be compensated.
[0043] Thus, the control unit described here is specifically a driver IC capable of measuring characteristic parameters at the outputs of the IC's driver channels and comparing them internally. The characteristic parameter could, for example, be the voltage drop across the driver channel relative to ground, which corresponds to the voltage drop across an external load on the respective driver channel.
[0044] Using, for example, an integrated high-resolution ADC, even the smallest voltage differences can be measured. If threshold values for the difference are defined for various predefined channels, such as groups of channels operating identically, and the measured difference exceeds the specified limit, the control unit can send an error signal. These difference values can be defined differently for the various groups. Such a driver IC can be used in semiconductor light sources containing a large number of LEDs, where a requirement is the detection of individual LED failures, including both short circuits and open circuits, to meet legal requirements, for example, in the automotive sector for safety-critical applications.
[0045] For example, the control unit is a driver IC configured to drive a large number of driver channels, with the current setting of the 2024PF01722 December 18, 2025
[0046] P2024, 1176 WO N - 9 -
[0047] Driver channels can be configured with an accuracy of, for example, + / -0.25%, + / -2%, or + / -5%.
[0048] For example, the control unit is designed so that the driver channels can be operated in groups with the same current settings. A group can be defined as two, three, or more driver channels.
[0049] For example, the control unit is designed to include a comparator module capable of measuring characteristic parameters, such as a voltage drop on the output side of each driver channel relative to ground or an internal voltage drop of each driver channel relative to ground or a supply voltage, with an accuracy of + / - 50 mV or less or + / - 100 mV or less or + / - 200 mV or less.
[0050] For example, the control unit is able to compare the individual measurement parameters within the group. If a difference deviates from a reference value and / or threshold value, the control unit outputs an error signal. This error signal can be an I / O signal from the driver or an error code that can be transmitted to a higher-level instance via a communication protocol.
[0051] For example, a voltage drop across the individual driver channels can be measured using ADCs integrated into the control unit.
[0052] For example, a voltage difference between the first and second and / or third strands at the individual driver channels can be determined using a comparator. 2024PF01722 December 18, 2025
[0053] P2024, 1176 WO N - 10 -
[0054] The voltage difference can then be additionally digitized via an ADC, allowing the error decision to be made via firmware.
[0055] For example, the voltage drop across individual driver channels can be measured after a characteristic time, i.e., after a time interval x ps following the activation of the shortest possible PWM pulse that a driver channel can output. The measurement can be triggered by an external or internal clock signal. It is important to note that measurements for all driver channels within a group should be performed under identical conditions to minimize external interference.
[0056] For example, the control unit is designed so that it can also communicate with a downstream driver IC in a master-slave principle.
[0057] For example, the control unit is designed to receive reference values and / or thresholds and to perform comparisons against these reference values and / or thresholds. For instance, 0-hour reference values can be stored for voltage comparisons if the load varies across the driver channels. This is relevant, for example, when using LED strings with the same length but different binnings, or LEDs with different emitter colors such as red, green, blue, yellow, and super-red, which would exhibit different voltage differences in the event of a short circuit. The "0 h" time value refers to the operating time of the strings in question. This means the reference values and / or thresholds can be set at the beginning of the operating period.
[0058] P2024, 1176 WO N - 11 -
[0059] The operating parameters of the relevant channels are determined and / or specified, for example during a test phase of the relevant channels.
[0060] For example, the control unit is designed so that the reference value and / or threshold for the different channels of a group is recorded during the initial zero measurement, specifically at an operating time of 0 hours. This initial value does not have to be close to zero, but can also have an offset xO, i.e., xO + / - dx. The error value dx can differ for the different channels in the case of a positive and / or negative error. For example: Different string lengths are connected to the two driver channels, such as Channel 1: 8 LEDs and Channel 2: 10 LEDs. This results in an offset xO of the forward voltage of 2 LEDs during the initial measurement. When using, for example, LEDs from different binnings, this can result in different offset limits in negative and / or positive voltage relative to the reference value / threshold, also known as asymmetric limits.In general terms for the control unit: A fault condition is triggered if the following limits are exceeded [xO + dxl ; xO - dx2 ] , where dxl is not equal to dx2; x can denote a voltage value or another electrical parameter.
[0061] For example, the driver channels are designed to be able to output different maximum currents for different channels.
[0062] For example, the driver channels are designed so that the output signal of each driver channel can be controlled by pulse width modulation, so that 2024PF01722 December 18, 2025
[0063] P2024, 1176 WO N - 12 -
[0064] This allows for adjustment of the average current of the output channel and, for example, luminance control when operating LED light strings.
[0065] For example, the control unit is operated in or with a semiconductor light source that includes several LED strings.
[0066] For example, the semiconductor light source is operated in such a way that at least two LED strings and / or LED segments are operated with the same operating currents by means of the control unit.
[0067] For example, the semiconductor light source is operated such that the voltage drop of each individual LED string / segment is measured by the control unit using an integrated ADC, and the measurement results are compared using a comparator module integrated into the control unit. If the difference deviates from the reference value, an error signal can be returned to the higher-level control unit.
[0068] The control unit described here fully retains the advantages of a single-LED fault detection principle:
[0069] - Due to similar environmental conditions of the strings, voltage-altering influences such as temperature, humidity, and corrosion affect the LED segments being compared equally. These disturbances affect the segments being compared equally and are eliminated or substantially eliminated in the comparative measurement, allowing larger segments to be tested for defects. 2024PF01722 December 18, 2025
[0070] P2024, 1176 WO N - 13 -
[0071] - By grouping the channels, the bus load in the control of the IC can be reduced.
[0072] - Direct measurement of voltage differences, for example with a subtractor, allows for very high resolution measurements over small voltage ranges. For instance, an 8-bit measurement of a voltage with an absolute value of 3 V yields higher accuracy when the voltage applied to the subtractor is only in the range of 0.3 V. - Flexible, individual operation of the LED segments being compared is possible if fault detection is not required. Temporary individual powering in applications other than those using a conventional driver IC is possible with twice the number of individual outputs compared to continuous individual powering. This means that the fault detection capability is not mandatory.
[0073] - No extra measuring line or component is required on the LED module for fault detection.
[0074] - It allows for greater design freedom.
[0075] - Individually defined and / or non-volatile memory initial voltages and / or reference values offer the possibility of flexible adaptation of the control unit to different LED systems. For example, individual initialization can be programmed without any hardware changes. Resetting to a new initial value is also programmable.
[0076] - Individual, stored limit values, for example in non-volatile memory, offer the possibility of flexible adaptation to different LED systems without requiring any change to the hardware.
[0077] - An initial comparative measurement is possible with 100% functioning LED strings to enable initial calibration on a measuring line, to 2024PF01722 December 18, 2025
[0078] P2024, 1176 WO N - 14 -
[0079] To be able to take potential voltage differences into account, a higher reliability of fault detection can be achieved.
[0080] The control unit described here can be used, for example, as an LED driver. Possible applications include LEDs on film, light in glass, etc.
[0081] Rear lights, taillights, vehicle lighting.
[0082] Possible fields of application for the control unit and semiconductor light source described here include, for example, the automotive sector, safety-relevant applications, transport, signaling systems, and architectural lighting.
[0083] According to at least one embodiment, the control unit is configured to operate the output channels identically with respect to current duration and / or current intensity from the at least one current source. This means, for example, that the integrated current duration and / or current intensity of the channels is equal or nearly equal. For example:
[0084]
[0085] where Ij_ is a time-dependent current intensity of an i-th of the output channels and Ij is a time-dependent current intensity of a j-th of the output channels with i
[0086]
[0087] j , and A < 1.10 or A < 1.05 or A < 1.02.
[0088] This can hold for all unequal pairs of i and j with 1 < i < N and 1 < j < N, where i and j are natural numbers and N is the number of values to be compared. 2024PF01722 December 18, 2025
[0089] P2024, 1176 WO N - 15 -
[0090] output channels and N is a natural number greater than or equal to two.
[0091] According to at least one implementation, the control unit comprises several of the current sources, with a one-to-one mapping between the current sources and the output channels. That is, each of the output channels is uniquely assigned to one of the current sources.
[0092] According to at least one implementation, the first variant applies with regard to the ADCs. This means that each of the relevant output channels is assigned its own ADC. A one-to-one mapping can exist between these ADCs and the respective output channels.
[0093] According to at least one implementation, the second variant applies with regard to the ADCs. That is, each group of the relevant output channels, in particular each pair of the relevant output channels, is assigned its own ADC. Preferably, this assignment is one-to-one.
[0094] According to at least one embodiment, the control unit comprises one or more comparators. In particular, each pair of output channels is assigned to exactly one of the unit's own measurement systems; that is, the second variant is possible. In this case, the at least one comparator is electrically connected between the two assigned output channels and the assigned input of the unit's own measurement systems.
[0095] According to at least one implementation, the control unit comprises one or more comparators. In particular, the third variant is present here. Each of the relevant 2024PF01722 18 December 2025
[0096] P2024, 1176 WO N - 16 -
[0097] The output channels are connected to an input of the common measurement system.
[0098] According to at least one implementation, the control unit is configured to simultaneously acquire at least one electrical parameter for output channels to be compared. This applies in particular to the first and second variants. "Simultaneously" means, for example, at the same time within the temporal resolution possible for the control unit. "Simultaneously" means, for example, within the same clock cycle or within two or three directly consecutive clock cycles. This can be particularly relevant when control is achieved using a modulation method such as PWM.
[0099] According to at least one implementation, the control unit is configured to repeatedly measure at least one electrical parameter for the assigned output channels. This repeated measurement can be performed alternately, for example, if the third variant is present.
[0100] It is therefore also possible that at least one electrical parameter for the relevant output channels is not measured simultaneously, but with a time delay, for example in different modulation cycles, such as PWM cycles, and thus in different clock cycles. PWM cycles have a longer duration than clock cycles.
[0101] According to at least one implementation, the comparison value determination component comprises writable or persistent memory and / or an immutable logic gate in which at least one comparison limit value is stored. The comparison module is 2024PF01722, dated December 18, 2025.
[0102] P2024, 1176 WO N - 17 -
[0103] This is configured to access the memory and / or the logic gate. In other words, the comparison limit or a list of comparison limits is stored in the comparison value determination component, and the relevant comparison limit is output to or read from the comparison module.
[0104] According to at least one implementation, the reference value determination component includes an input line configured to receive the reference limit or to determine the reference limit based on at least one input value at the input line. This means that the reference limit to be applied can originate from outside the control unit, for example, from an external memory, a higher-level instance, or a resistor network connected to the control unit, and thus, in particular, to the reference value determination component.
[0105] According to at least one implementation, the comparison value determination component is electrically connected to the comparison module. For example, a data line exists between these components.
[0106] In the simplest case, the comparison value determination component can be an interface by which the control unit is connected to an external component, such as the external memory, the higher-level instance, or the resistor network.
[0107] Thus, it is possible that the comparative value determination component merely provides connectivity to the external component. It is 2024PF01722, December 18, 2025.
[0108] P2024, 1176 WO N - 18 -
[0109] It is possible that in this case, the comparison value determination component passes the comparison value unchanged to the comparison module. Alternatively, the comparison value determination component can be a standalone component, such as a memory, or it can include a memory. Furthermore, it is possible that the comparison value determination component determines the correct comparison value, for example, using a table that contains additional values, such as the type of connected external components.
[0110] According to at least one implementation, the comparison module is configured for pairwise, rolling comparison of at least one electrical parameter of at least three of the output channels. For example, if the three output channels A, B, and C are present, then in a rolling comparison, A is compared with B, A with C, and B with C; with four output channels A, B, C, and D, A is compared with B, A with C, A with D, B with C, B with D, and C with D, and so on.
[0111] According to at least one implementation, the control unit is a single, monolithic semiconductor chip. Alternatively, the control unit can be composed of several separate electrical subcomponents.
[0112] According to at least one embodiment, the control unit is designed for an electrical voltage of no more than 120 V, or no more than 60 V, or no more than 30 V. This means the control unit operates at comparatively low voltages. These voltages may be the control unit's supply voltages. (2024PF01722, December 18, 2025)
[0113] P2024, 1176 WO N 19
[0114] It is possible that the supply voltages are DC voltages.
[0115] According to at least one embodiment, the control unit is designed for an electrical power consumption of no more than 150 W, or no more than 50 W, or no more than 20 W.
[0116] According to at least one embodiment, the control unit comprises at least two, at least three, at least four, or at least six output channels. Alternatively or additionally, the number of output channels is at most 256, at most 128, at most 96, at most 50, at most 32, or at most 16.
[0117] Furthermore, an operating procedure for a control unit, as described in connection with one or more of the above-mentioned implementation forms, is specified.
[0118] Features of the control unit are therefore also disclosed for the operating procedure and vice versa.
[0119] In at least one implementation form, the operating procedure comprises the following steps, in particular in the specified order or in cyclical sequence:
[0120] - Capturing the comparison limit value by the comparison value determination component,
[0121] - Acquiring at least one electrical parameter for each of the output channels by at least one measurement system, such as an analog-to-digital converter, and
[0122] - Comparing at least one electrical parameter with the reference limit value using the reference module .2024PF01722 18 December 2025
[0123] P2024, 1176 WO N 20
[0124] Furthermore, a semiconductor light source is specified, comprising at least one control unit as described in connection with one or more of the aforementioned embodiments. Features of the control unit are therefore also disclosed for the semiconductor light source and vice versa.
[0125] In at least one embodiment, the semiconductor light source comprises a control unit and several light strings, which are grouped together in one or more light groups.
[0126] where
[0127] - each of the lighting strings comprises several optoelectronic semiconductor chips for light generation,
[0128] - each of the light strings is connected to one of the output channels, and
[0129] - the control unit is set up to operate all lighting strings within each of the at least one lighting group in the same electrical manner.
[0130] According to at least one embodiment, the semiconductor light source comprises several luminaire strings. Each of the luminaire strings comprises one or more optoelectronic semiconductor chips. The semiconductor chips are configured for radiation generation, in particular for the generation of visible light. The visible light can be generated directly in a semiconductor layer sequence of the optoelectronic semiconductor chip in question, or the optoelectronic semiconductor chip in question may be associated with at least one phosphor that converts at least part of the radiation emitted directly by the optoelectronic semiconductor chip in question into radiation of a different wavelength. 2024PF01722 December 18, 2025
[0131] P2024, 1176 WO N - 21 -
[0132] Several types of optoelectronic semiconductor chips can be combined in the lighting circuits. The term 'types' refers, for example, to different emission colors. It is possible that the optoelectronic semiconductor chips are the sole light source of the semiconductor light source.
[0133] According to at least one implementation, the lighting strings are operated in a similar manner. For example, the optoelectronic semiconductor chips of the respective lighting strings are subject to the same environmental conditions, such as temperature and humidity, and / or are operated synchronously with each other, for example with the same current intensities.
[0134] According to at least one embodiment, some or all of the optoelectronic semiconductor chips within some or all of the lighting strings are electrically connected in series. This means that there can be pure series circuits or mixtures of series and parallel circuits. For example, the number of parallel circuits is at most 50%, 30%, or 15% of the number of optoelectronic semiconductor chips in the respective lighting string.
[0135] According to at least one implementation, some or all of the light strands are mounted on a common substrate. This common substrate is, for example, a circuit board, such as a printed circuit board or a metal-core circuit board, or even a film.
[0136] According to at least one version, some or all of the lighting strings are designed to operate simultaneously. 2024PF01722 December 18, 2025
[0137] P2024, 1176 WO N - 22 -
[0138] to be operated. This means that when one lighting string is operated, all other assigned lighting strings are also operated. In other words, the assigned lighting strings have the same or approximately the same operating times. Only lighting strings assigned to a comparison unit need to be operated simultaneously. Other lighting strings can be operated independently.
[0139] According to at least one embodiment, the operating lifetimes of the corresponding lighting strings differ from each other by a factor of no more than 1.2, 1.1, or 1.05. This applies alternatively or additionally to the optoelectronic semiconductor chips of the respective lighting strings.
[0140] According to at least one embodiment, the temperatures of the corresponding lighting strings differ from each other by a maximum of 10 °C, or by a maximum of 5 °C, or by a maximum of 2 °C. This means, for example, that all optoelectronic semiconductor chips of the respective lighting strings have the same or approximately the same temperature during operation of the semiconductor light source.
[0141] According to at least one implementation, the relative humidity of the ambient air in the corresponding lighting strings differs from each other by no more than ten percentage points, or by no more than five percentage points, or by no more than two percentage points. This means, for example, that all optoelectronic semiconductor chips in the respective lighting strings are operated at the same or approximately the same relative humidity. 2024PF01722 December 18, 2025
[0142] P2024, 1176 WO N - 23 -
[0143] Thus, the corresponding lighting strings are specifically designed to be operated in such a uniform manner that the operating temperature, the
[0144] Operating air humidity and / or the operating time or aging are the same or approximately the same.
[0145] Optionally, the associated lighting strings are located close to each other. This means, for example, that the distance between adjacent lighting strings is at most 10 cm, or at most 1 cm, or at most 4 mm, or at most 2 mm. These distances can also apply to adjacent optoelectronic semiconductor chips within the lighting strings. The distance between the adjacent lighting strings is, for example, the distance between the supports of the respective lighting strings and / or the distance between optoelectronic semiconductor chips of the respective lighting strings.
[0146] According to at least one implementation, the same threshold values apply to identically constructed lighting strings. Therefore, for fault analysis purposes, these lighting strings can be treated identically.
[0147] According to at least one embodiment, some or all of the lighting strings are constructed differently. This means, for example, that these lighting strings have different numbers of optoelectronic semiconductor chips and / or different compositions of optoelectronic semiconductor chips, i.e., in particular, differing ensembles of emission colors of the optoelectronic semiconductor chips. 2024PF01722 December 18, 2025
[0148] P2024, 1176 WO N 24
[0149] According to at least one implementation, different threshold values apply to the differently constructed lighting strings. This makes it possible to extend the fault analysis to differently constructed lighting strings.
[0150] According to at least one implementation, some or all of the lighting strings are identical in construction. Identical construction means, for example, that these lighting strings have the same number and / or composition of optoelectronic semiconductor chips. For instance, these lighting strings each have a specific number of LED chips A for a first color, a specific number of LED chips B for a second color, and optionally a specific number of LED chips C for a third color, and optionally a specific number of LED chips D for a fourth color. Identical construction can also mean that the same other active electrical components are present, such as sensors or diodes for protection against electrostatic discharge.
[0151] According to at least one implementation, the comparison module is configured to record the time course of at least one electrical parameter. This means, for example, that the relevant numerical values are recorded multiple times. The recording can be periodic or aperiodic. For example, a recording frequency of at least once per hour, at least once per minute, at least 1 Hz, at least 10 Hz, or at least 50 Hz may be observed. Alternatively or additionally, this frequency may be at most 1 kHz or at most 0.1 kHz. 2024PF01722 December 18, 2025
[0152] P2024, 1176 WO N 25
[0153] According to at least one embodiment, some or all of the lighting strings comprise at least two, at least four, at least five, at least eight, or at least ten optoelectronic semiconductor chips. Alternatively or additionally, this number is at most 200, at most 100, or at most 50.
[0154] According to at least one embodiment, the semiconductor light source comprises at least three, four, six, or ten luminaire strings. Alternatively or additionally, this number is at most 300, 100, or 50.
[0155] According to at least one implementation, the control unit is configured to compare the numerical values of the lighting circuits assigned to it in pairs. For example, if the three numerical values VI, V2, and V3 are available for the forward voltage, then VI is compared with V2, VI with V2, and V2 with V3. In other words, a rolling comparison can be performed.
[0156] Alternatively, it is possible to compare the numerical values with an average of the numerical values.
[0157] According to at least one implementation, the lighting strings are grouped into several groups of at least two strings each. It is possible that the lighting strings within some or all of the groups have the same configuration. This allows for efficient comparison between the lighting strings within the groups. 2024PF01722 December 18, 2025
[0158] P2024, 1176 WO N - 26 -
[0159] The groups can also be referred to as segments. The groups are thus formed from the individual light strings, which are then compared with each other. Several light strings therefore form a segment, i.e., a light group or simply a group.
[0160] According to at least one implementation, there is a separate control unit for each group. Alternatively, all groups are assigned to one control unit, or there is at least one control unit to which more than one group is assigned.
[0161] According to at least one implementation, the at least one control unit is configured to perform the error analysis for each group individually. This means that the error analysis is carried out at the group level. Whether an error exists within one group can therefore be determined independently of the other groups.
[0162] According to at least one implementation, some or all of the optoelectronic semiconductor chips are micro-LEDs. A micro-LED is, for example, any light-emitting diode (LED), and specifically not a laser, with a particularly small size. It is possible that a growth substrate is removed in micro-LEDs, so that the height of such micro-LEDs is, for example, in the range of 1.5 pm to 10 pm. Such micro-LEDs can be provided on wafers with non-destructively removable mounting structures.
[0163] In principle, a micro-LED does not necessarily have to have a rectangular emission surface. For example, a micro-LED can have an emission surface that, when viewed from above, is in every 2024PF01722 18 December 2025
[0164] P2024, 1176 WO N - 27 -
[0165] lateral extent of the radiation emission area is less than or equal to 100 gm or less than or equal to 70 gm.
[0166] For example, in rectangular micro-LEDs, the edge length, especially when viewed from above, is less than or equal to 70 gm or less than or equal to 50 gm.
[0167] Currently, the primary applications for micro-LEDs are displays. Micro-LEDs form pixels or subpixels and emit light of a defined color. Due to their small pixel size and high density with close spacing, micro-LEDs are suitable for small monolithic displays for augmented reality (AR) applications, particularly for smart glasses. Further applications are also being developed, especially in data communication and pixelated lighting applications. Various notations for micro-LED can be found in the literature, such as gLED, g-LED, uLED, u-LED, or Micro Light Emitting Diode.
[0168] Furthermore, a computer program and a computer-readable storage medium are specified. The computer program and the storage medium comprise instructions which, when executed by a computer, cause it to perform the operating procedure as specified in conjunction with at least one of the execution forms mentioned above.
[0169] The following section provides a more detailed explanation of a control unit, an operating procedure, and a semiconductor light source described herein, with reference to the drawing and illustrated by exemplary embodiments. Identical reference numerals indicate identical elements in the individual figures. However, no 2024PF01722 18 December 2025
[0170] P2024, 1176 WO N 28
[0171] The images are not shown to scale; rather, individual elements may be exaggerated to be larger for better understanding.
[0172] They show:
[0173] Figures 1 to 3 are schematic block diagrams of exemplary embodiments of the control units described here.
[0174] Figures 4 to 6 are schematic block diagrams of exemplary implementations of comparison value determination components for the control units described here.
[0175] Figures 7 to 10 are schematic circuit diagrams of exemplary embodiments of the control units described here.
[0176] Figure 11 shows a schematic circuit diagram of an embodiment of a semiconductor light source with a control unit described here.
[0177] Figures 12 and 13 are schematic illustrations of an exemplary embodiment of an operating procedure for the control units described here.
[0178] Figures 14 and 15 are schematic circuit diagrams of exemplary embodiments of semiconductor light sources with the control units described here. 2024PF01722 December 18, 2025
[0179] P2024, 1176 WO N - 29 -
[0180] Figures 16 to 19 are schematic top views of exemplary embodiments of lighting strings for the Haibleir ter light sources described here.
[0181] Figures 20 to 22 are schematic block diagrams of exemplary embodiments of the control units described herein, and
[0182] Figure 23 shows a schematic block diagram of an exemplary embodiment of an operating procedure for control units described here.
[0183] Figure 1 schematically illustrates a control unit 3. The control unit 3 comprises a comparator module 31, a current source 33, several output channels 61, 62, 63, 64 for supplying current to external components not belonging to the control unit 3 via the current source 33, a comparator value determination component 37, and several measuring systems. For illustrative purposes only, the measuring systems are analog-to-digital converters 71, 72, 73, 74, although other types of measuring instruments can also be used.
[0184] According to a first variant, each of the output channels 61, 62, 63, 64 is uniquely assigned to one of the analog-to-digital converters 71, 72, 73, 74. Figure 1 shows only four of the output channels 61, 62, 63, 64 by way of example; however, there may also be fewer or more output channels. Equivalent systems, such as current sinks, are also considered equivalent to a current source 33; therefore, for the sake of simplicity, only the term "current source" is used in the following, whereby current sinks and similar systems are always included. 2024PF01722 December 18, 2025
[0185] P2024, 1176 WO N - 30 -
[0186] The power source 33 can operate the output channels 61, 62, 63, 64 individually, for example by means of a time-division multiplexing method, or all output channels 61, 62, 63, 64 can be operated in the same way.
[0187] The comparison value determination component 37 is configured to determine a comparison limit value T for an electrical parameter P for each of the output channels 61, 62, 63, 64. For example, the electrical parameter P is a forward voltage measured by the control unit 3 at the assigned output channel 61, 62, 63, 64. The comparison limit value T is, for example, a threshold voltage up to which the measured forward voltage is classified as originating from a fault-free output channel 61, 62, 63, 64.
[0188] Thus, a separate analog-to-digital converter 71, 72, 73, 74 is provided for each of the output channels 61, 62, 63, 64. The analog-to-digital converters 71, 72, 73, 74 are configured to acquire at least one electrical parameter P of the assigned output channels 61, 62, 63, 64. The comparator module 31 is configured to compare the at least one measured electrical parameter P with the comparison limit value T. If the comparison limit value T is exceeded or not reached, the comparator module 31 is configured to output an error message.
[0189] The output channels 61, 62, 63, 64 are preferably configured to be operated in the same manner, i.e., in particular with the same currents and / or the same operating times. Furthermore, the external components, not shown in Figure 1, are preferably located close together, so that the 2024PF01722 December 18, 2025
[0190] P2024, 1176 WO N - 31 -
[0191] External components are subjected to the same environmental conditions, such as temperature fluctuations, solar radiation, rainfall, mechanical stresses, and / or humidity fluctuations. This means that the relevant output channels 61, 62, 63, 64 preferably have identical operating conditions, both with regard to external environmental influences and operation by the control unit 3. Consequently, the external components involved age uniformly at the relevant output channels 61, 62, 63, 64, and voltage changes associated with aging can be eliminated or largely eliminated by calculating a difference in the measured electrical parameter P, for example, by observing a forward voltage difference between the relevant output channels 61, 62, 63, 64. This improves fault detection accuracy.
[0192] Optionally, the control unit 3 includes one or more control modules 32. The at least one control module 32 is configured to control the power source 33 and to energize the output channels 61, 62, 63, 64 as desired. For this purpose, the at least one control module 32 can have a data input and receive control data from outside the control unit 3. The control data can be transmitted wired or wirelessly. It is possible that the at least one control module 32 processes the control data and / or converts it into control commands for the power source 33. Such a control module 32 can also be present in all other examples of the control unit 3. If no control module 32 is present, its functions can be taken over, for example, by the comparator module 31. 2024PF01722 December 18, 2025
[0193] P2024, 1176 WO N - 32 -
[0194] Figure 2 illustrates another example of the control unit 3. In this example, the output channels 61, 62, 63, 64 are grouped into two groups, although there can also be more groups or just a single group. Each group, for example, comprises exactly two of the output channels 61, 62, 63, 64. According to a second variant, each group is assigned exactly one of the analog-to-digital converters 71, 73, so that each group has its own analog-to-digital converter 71, 73.
[0195] Furthermore, Figure 2 shows that several of the current sources 33, 34, 35, 36 are present. For example, there is a one-to-one correspondence between the output channels 61, 62, 63, 64 and the current sources 33, 34, 35, 36. A corresponding configuration is also possible in the first variant of Figure 1.
[0196] Furthermore, the statements regarding Figure 1 apply equally to Figure 2, and vice versa.
[0197] According to Figure 3, a third variant includes a common analog-to-digital converter 7 for all output channels 61, 62, 63. The common analog-to-digital converter 7 can be operated using a time-division multiplexing method to address the output channels 61, 62, 63 individually.
[0198] Unlike what is shown in Figure 3, it is just as possible, as in Figure 2, that multiple power sources are present.
[0199] Furthermore, the statements relating to Figures 1 and 2 apply equally to Figure 3, and vice versa. 2024PF01722 December 18, 2025
[0200] P2024, 1176 WO N - 33 -
[0201] The three variants of figures 1 to 3 can optionally also be implemented in mixed form for subsets of the output channels in a single control unit 3.
[0202] Figures 4 to 6 illustrate several examples of comparison value determination components 37 that can be used in the examples of control units 3. According to Figure 4, the comparison value determination component 37 includes a memory 81, such as a writable memory.
[0203] Alternatively or additionally, an unchanging logic gate 82 may be present. At least one comparison limit value T is stored in memory 81 and / or in logic gate 82. The comparison module 31 is configured to access memory 81 and / or logic gate 82.
[0204] According to Figures 5 and 6, the reference value determination component 37 has an input line 83. According to Figure 5, an external reference limit determination unit 85, which is, for example, a resistor network, is connected to the input line 83. This allows at least one reference limit T to be specified externally and changed by modifying the reference limit determination unit 85.
[0205] In contrast, Figure 6 shows that the input line 83 is connected to an external data line 84. This makes it possible for at least one comparison limit value T to be flexibly transmitted externally to the control unit 3, for example by a higher-level authority or by a user. It is optionally possible for the memory 81 to also be available.
[0206] P2024, 1176 WO N - 34 -
[0207] is such that at least one comparison limit T can be stored from the received data.
[0208] The comparative value determination component 37 is electrically connected to the comparative module 31. Thus, the comparative module 31 can be supplied with at least one comparative limit value T.
[0209] Furthermore, the statements relating to Figures 1 to 3 apply equally to Figures 4 to 6, and vice versa.
[0210] Figures 7 to 10 show electrical circuit diagrams of the control unit 3. In these examples, the control unit 3 is designed as a driver IC. This allows the control unit 3 to be designed as a single, monolithic semiconductor chip.
[0211] Figures 7 and 8 each show the first variant, where each of the channels 61, 62, 63, 64 is assigned its own ADC 71, 72. For the sake of simplicity, only the ADCs 71, 72 for the two channels 61, 62 are shown, not the ADCs for the other channels. Each of the channels 61, 62, 63, 64 is powered by its own power source 33, 34, 35, 36.
[0212] The comparison module 31, the control module 32, and the comparison value determination component 37 can, for example, be integrated into a common hardware unit. The hardware unit is optionally connected to the external data input 84 to output messages to a higher-level instance (not shown) and / or to receive control commands from the higher-level instance. The power sources 33, 34, 35, 36 and the ADCs 71, 72 are connected to an2024PF01722 18 December 2025
[0213] P2024, 1176 WO N - 35 -
[0214] Supply voltage lines 86, 87 are connected.
[0215] For example, line 86 provides a positive potential V+ and line 87 is at earth potential, GND, or vice versa.
[0216] Channels 61, 62 and 63, 64 are optionally grouped into pairs, also referred to as groups 5. A differential voltage dV is determined using the two ADCs of each pair. This differential voltage dV is compared to the reference limit T. Depending on the result of the comparison, an error message is generated. Since, according to Figures 7 and 8, each of the channels 61, 62, 63, 64 is assigned one of the ADCs 71, 72, pairing can also be defined by programming in the comparison module 31. This allows several different dV values to be compared with each other. In particular, rolling comparisons are possible.
[0217] According to Figure 7, the parameter P, dV is determined via channel outputs of channels 61, 62, 63, 64. In contrast, according to Figure 8, the parameter P, dV is determined relative to a driver stage in the hardware unit, for example, relative to a FET stage (not shown).
[0218] Furthermore, the statements relating to Figures 1 to 6 apply equally to Figures 7 and 8, and vice versa.
[0219] According to Figure 9, the control unit 3 includes a comparator 75 for each group 5 of channels 61, 62, 63, 64, which can in turn be pairs. Thus, there is only one ADC 71 per pair of channels 61, 62 or 63, 64; in Figure 8, the comparator 75 and the ADC 2024PF01722 are shown for simplification. December 18, 2025
[0220] P2024, 1176 WO N - 36 -
[0221] 71 is drawn only for the pair of channels 61, 62, but not for the other channels 63, 64.
[0222] Unlike Figures 7 and 8, Figure 9 allows for a reduction in the number of ADCs required, and the hardware unit needs fewer input channels for ADCs. Furthermore, the pairing—that is, which channels 61, 62, 63, and 64 are to be compared—can be essentially fixed at the hardware level. Alternatively, the pairing can be varied and / or adapted to an application by software-addressable switches, for example, in the comparison module, such as an IC.
[0223] As shown in Figure 9, the voltage measurement is carried out analogously to Figure 7 with respect to the supply voltage line 86. Similarly, a measurement with respect to the hardware component is also possible analogously to Figure 8.
[0224] Furthermore, the statements relating to Figures 1 to 8 apply equally to Figure 9, and vice versa.
[0225] In the example shown in Figure 10, there is only a single common ADC 7 for all assigned channels 61, 62, 63, 64. The electrical parameters of channels 61, 62, 63, 64 can be measured in a time-division multiplexing method via several switches 88, which are controlled by the comparator module 31.
[0226] As shown in Figure 10, the voltage measurement is performed across the supply voltage line 86, analogous to Figure 7. Similarly, a measurement across the hardware component is also possible, analogous to Figure 8. 2024PF01722 December 18, 2025
[0227] P2024, 1176 WO N - 37 -
[0228] Furthermore, the statements relating to Figures 1 to 9 apply equally to Figure 10, and vice versa.
[0229] Figure 11 illustrates an example of a semiconductor light source 1. The semiconductor light source 1 comprises several light strings 2, each with several optoelectronic semiconductor chips 21. The semiconductor chips 21 are, for example, electrically connected in series. Two of the light strings 2 are shown as an example, although more than two light strings 2 may be present. The two light strings 2 are grouped together as a unit 5 and connected to the control unit 3. This allows the control unit 3 to be dual-channel. The two identically operated light strings 2 can therefore be compared with each other in the control unit 3, in particular by calculating the differential voltage dV from the two voltages VI and V2 applied to the light strings 2.
[0230] The control unit 3 is only shown in simplified form in Figure 11 and is constructed, for example, according to one of the examples in Figures 1 to 10.
[0231] In one of the lighting strings 2, a defective optoelectronic semiconductor chip 22 is present. This semiconductor chip 22 changes the voltage V2 and thus the voltage difference dV. If the voltage difference dV exceeds the limit value T, the error message is displayed.
[0232] This is illustrated using the example of a PWM in Figures 12 and 13. In Figure 12, the duty cycle is higher than in Figure 13. For example, the duty cycle in Figure 12 is 50%, while in Figure 13 it is only 20%. A PWM frequency is, for example, 200 Hz, where the 2024PF01722 December 18, 2025
[0233] P2024, 1176 WO N 38
[0234] The PWM frequency can alternatively be anywhere in the range of 20 Hz to 5 kHz. A clock signal, not shown, is, for example, 2 -n-fold of the PWM frequency, for example with n = 8 or with n = 10 or with n = 16. In the first measurements in Figures 12 and 13, the determined voltage difference dV between the voltages VI, V2 of channels 61, 62 from Figure 2 is in each case below the limit value T, whereas in the second measurements, for example, it is in each case above it.
[0235] Fault detection is therefore possible regardless of the duty cycle. Preferably, the measurement is performed at the same time within a PWM cycle; for example, a measurement time tm is a certain time interval after the beginning or before the end of the respective PWM cycle. With appropriate control, it is possible to determine the voltages VI, V2, and thus dV even if the relevant channels 61 and 62 are currently operating with different duty cycles.
[0236] As shown in Figures 12 and 13, the voltages VI and V2 are measured simultaneously. This is particularly possible in the first and second variants, see, for example, Figures 1, 2, 7, 8, and 9. If a time-division multiplexing (TDM) method is used, as shown in Figures 3 or 10, the voltages VI and V2 must be measured sequentially. Here, too, a fixed measurement time tm within the PWM cycles is preferably used, analogous to Figures 12 and 13. To reduce measurement errors, averaging over several individual measurements can be performed, and the voltages VI and V2 can optionally be measured alternately several times. 2024PF01722 December 18, 2025
[0237] P2024, 1176 WO N - 39 -
[0238] Furthermore, the statements relating to Figures 1 to 10 apply equally to Figures 11 to 13, and vice versa.
[0239] Figure 14 shows an example of the semiconductor light source 1 in which several of the control units 3 are present. The control units 3 can operate different numbers of channels. For example, control units 3 for two channels and for three channels are present in combination. It is possible for the different groups 5 of lighting strings 2 to be evaluated independently of one another.
[0240] In Figure 14, the control units 3 are only shown in a simplified form. For example, the control units 3 according to Figures 1 to 10 can be used, whereby different types of control units 3 can be combined with each other, or all control units 3 can be of the same type, for example, based on the same variant.
[0241] Unlike the illustration in Figure 14, it is also possible for the individual control units 3 to be combined into a single, common control unit 3. This allows for optional mixed operation of the three operating variants mentioned above. The same applies to all other examples.
[0242] Furthermore, the statements relating to Figures 1 to 13 apply equally to Figure 14, and vice versa.
[0243] Figure 15 illustrates that combined series and parallel circuits of semiconductor chips 21 can be present within the lighting strings 2. It is 2024PF01722 18 December 2025
[0244] P2024, 1176 WO N - 40 -
[0245] It is possible that the lighting strings 2 within a group 5 are operated with the same current to enable reliable fault analysis. Such a design is also possible in all other examples.
[0246] As in all other examples, differently configured lighting strings 2 can be combined within a group 5. The minimum threshold value for the difference dV must be set accordingly. It is possible that the minimum threshold value can also be programmed during operation and not only at the factory, for example, only after the lighting strings 2 have been installed. The lighting strings 2 to be compared differ, for example, in their number of semiconductor chips 2, emission colors, and / or number of parallel-connected sub-strings.
[0247] The lighting strings 2 to be compared are optionally located on a common support 4, such as a circuit board or a heat sink. This ensures that the lighting strings 2 to be compared are spatially close to each other and, in addition to identical operating conditions, preferably also experience identical or nearly identical environmental influences.
[0248] Furthermore, the statements relating to Figures 1 to 14 apply equally to Figure 15, and vice versa.
[0249] Figures 16 to 19 show several examples of the light strings 2. According to Figure 16, a total of seven optoelectronic semiconductor chips 21 are present, for example in an alternating arrangement. [The following appears to be unrelated and possibly a separate document fragment: erste2024PF01722 18. Dezember 2025]
[0250] P2024, 1176 WO N 41
[0251] Semiconductor chips 21A emit green light and second semiconductor chips 21B emit red light. All semiconductor chips 21A and 21B can be arranged in a linear configuration on the common support 4.
[0252] Furthermore, as in all other examples, it is possible that the first semiconductor chips 21A are assigned to a first lighting string 2 and the second semiconductor chips 21B to a second lighting string. Thus, the semiconductor chips 21A and 21B of different lighting strings 2 can be arranged in a linearly regular alternating pattern, in a linearly randomly alternating pattern, or in a two-dimensionally mixed pattern, for example, on a common substrate 4. The semiconductor chips 21A, 21B, 21C, 21D, and 21E, illustrated with different emission colors in Figures 16 to 19, can therefore also symbolize different lighting strings 2. For the sake of simplicity, an electrical circuit diagram is not shown.
[0253] Figure 17 shows that five third and five fourth semiconductor chips 21C and 21D are each present, arranged in their own row. The semiconductor chips 21C and 21D can each be arranged in their own series, and these two series circuits can be connected in parallel. For example, the semiconductor chips 21C are configured to emit blue light and the semiconductor chips 21D to emit violet or ultraviolet light, and phosphors (not shown) can be assigned to the semiconductor chips 21D.
[0254] As shown in Figure 18, the lighting string 2 is divided among several of the carriers 4. Each of the carriers 4 can be triple or 2024PF01722 18 December 2025
[0255] P2024, 1176 WO N - 42 -
[0256] Quadruples of semiconductor chips 21 are included, for example, semiconductor chips 21A for green light, semiconductor chips 21B for red light, and semiconductor chips 21C for blue light, as well as optionally semiconductor chips 21E for white light. The carriers 4 can be connected to each other by means of an electrical connecting line 42. Furthermore, as in Figures 16 and 17, an electrical connection 41 for connecting to the control unit 3 can be provided, for example in the form of a plug connection or a clamp connection.
[0257] In the example shown in Figure 19, several different types of semiconductor chips 21A, 21B, 21C, 21D are combined on the common substrate 4. As in Figures 16 to 18, the semiconductor chips 21A, 21B, 21C, 21D can optionally be grouped into similarly colored emitting strands 2. The distances D between the adjacent strands 2 are approximately 1 mm. A maximum distance D between the strands 2 is, for example, 1 cm.
[0258] The light strands 2 of figures 11, 14 and / or 15 can, for example, be constructed as illustrated in connection with figures 16 to 19, whereby mixtures of the construction forms of figures 16 to 19 can also be realized.
[0259] Furthermore, the statements relating to Figures 1 to 15 apply equally to Figures 16 to 19, and vice versa.
[0260] Figures 20 to 22 show further examples of the control units 3. In these examples, the control units 3 are modular and do not need to be implemented as a monolithic semiconductor chip, although this is possible. For the sake of simplicity, only the first variant, 2024PF01722, December 18, 2025, is shown.
[0261] P2024, 1176 WO N - 43 -
[0262] approximately as shown in Figure 1, used in Figures 20 to 22, whereby the second and third variants can be used equally.
[0263] As shown in Figure 20, there are two separate modules: in a first module the control module 32 and the current sources 33, 34, 35 are combined, in a second module the ADCs 71, 72, 73 as well as the comparison module 31 and the comparison value determination component 37. In principle, this allows the fault analysis and the operation of the external components 2 to be separated from each other, and the circuit can be flexibly designed and adapted to the respective conditions.
[0264] Figure 21 illustrates that for each group 5 of channels 61, 62, 63, 64 there is a submodule in which all the ADCs 71, 72, 73, 74 and current sources 33, 34, 35, 36 assigned to the respective group 5 are combined.
[0265] This allows for the efficient combination of different channel counts for external components, for example.
[0266] The comparison module 31, the control module 32, and the comparison value determination component 37 are integrated into a further, shared component. This allows the control process to be efficiently separated from the actual operation with the current sources 33, 34, 35, 36 and from the measurement of at least one electrical parameter P.
[0267] Finally, Figure 22 illustrates that the ADCs 71, 72, 73, 74 on the one hand, and the current sources 33, 34, 35, 36 with the output channels 61, 62, 63, 64 on the other, are designed as separate submodules for groups 5. Likewise, the control module 32 and the comparator module 31,2024PF01722 18 December 2025
[0268] P2024, 1176 WO N - 44 -
[0269] optionally, together with the comparative value determination component 37, as separate components.
[0270] Combinations of the configurations of figures 20 to 22 are also possible.
[0271] Furthermore, the statements relating to Figures 1 to 19 apply equally to Figures 20 to 22, and vice versa.
[0272] Figure 23 illustrates an operating procedure for the control units 3. The operating procedure includes a step Sl in which the comparison value determination component 37 detects at least one comparison limit value T. This can be done as explained, for example, in conjunction with Figures 4 to 6.
[0273] In step S2, at least one electrical parameter P is detected for each of the output channels 61, 62, 63, 64 by the at least one analog-to-digital converter 7, 71, 72, 73, 74.
[0274] Finally, in step S3, the comparison module 31 compares at least one electrical parameter P with at least one comparison limit value T.
[0275] Steps S2 and S3 are repeated continuously or at regular intervals and / or after a specific event, such as a power-on process. This enables reliable fault detection. Furthermore, step S1 can also be performed multiple times, not just once. A frequency can be set. (2024PF01722 December 18, 2025)
[0276] P2024, 1176 WO N - 45 -
[0277] The value with which step S1 is repeated should be lower than for steps S2 and / or S3.
[0278] Furthermore, the statements relating to Figures 1 to 22 apply equally to Figure 23, and vice versa.
[0279] Furthermore, the statements relating to Figures 1 to 6 apply equally to Figure 7, and vice versa.
[0280] The components shown in the figures preferably follow one another in the specified order, and in particular are electrically directly connected to one another, unless otherwise described. Components that do not touch each other in the figures preferably have a distance between them or are not electrically connected. Furthermore, the relative positions of the components shown may be accurately represented in the figures unless otherwise stated.
[0281] The invention described here is not limited by the description using the exemplary embodiments.
[0282] Rather, the invention encompasses every new feature as well as every combination of features, which in particular includes every combination of features in the patent claims, even if this feature or combination itself is not explicitly specified in the patent claims or embodiments.
[0283] The fault detection can be carried out as described in publication DE 10 2023 119 778 A1. Likewise, the semiconductor light source can be constructed as described in publication DE 10 2023 119 778 A1. The disclosure content of 2024PF01722, December 18, 2025
[0284] P2024, 1176 WO N - 46 -
[0285] Publication DE 10 2023 119 778 Al is therefore included by reference.
[0286] This patent application claims priority from German patent application 10 2025 102 039.6, the disclosure content of which is hereby incorporated by reference. 2024PF01722 December 18, 2025
[0287] P2024, 1176 WO N - 47 -
[0288] Reference symbol list
[0289] 1 Semiconductor light source
[0290] 2 external component / lighting string
[0291] 21 optoelectronic semiconductor chip
[0292] 22 defective optoelectronic semiconductor chip
[0293] 3 Control unit
[0294] 31 Comparison module
[0295] 32 Control module
[0296] 33 first power source
[0297] 34 second power source
[0298] 35 third power source
[0299] 36 fourth power source
[0300] 37 Comparative value determination component
[0301] 4 carriers
[0302] 41 electrical connection
[0303] 42 electrical connecting cable
[0304] 5 Group of output channels / lighting group
[0305] 61 first output channel
[0306] 62 second output channel
[0307] 63 third output channel
[0308] 64 fourth output channel
[0309] 7 common measuring system (analog-to-digital converter) 71 first own measuring system (analog-to-digital converter) 72 second own measuring system (analog-to-digital converter) 73 third own measuring system (analog-to-digital converter) 74 fourth own measuring system (analog-to-digital converter) 75 comparator
[0310] 81 writable memory
[0311] 82 logic gates
[0312] 83 Entrance line
[0313] 84 external data lines
[0314] 85 External comparison limit determination unit 2024PF01722 18 December 2025
[0315] P2024, 1176 WO N - 48 -
[0316] 86 first supply voltage line
[0317] 87 second supply voltage line
[0318] 88 switches
[0319] D Distance between adjacent light strings P Electrical parameter
[0320] S process step
[0321] t time
[0322] tm Measurement time
[0323] T comparison limit
[0324] U electrical voltage
Claims
2024PF01722 December 18, 2025 P2024, 1176 WO N - 49 - Patent claims 1. Control unit (3) with - a comparison module (31) ) - at least one power source (33, 34, 35, 36) , - several output channels ( 61, 62, 63, 64 ) for powering external components (2) not belonging to the control unit (3) by means of the at least one power source (33, 34, 35, 36) , - a comparison value determination component (37) which is configured to determine a comparison limit value (T) for at least one electrical parameter (P) for each of the output channels (61, 62, 63, 64), and - a separate measuring system (71, 72, 73, 74) for each of the output channels (61, 62, 63, 64) or for each of several groups (5) of the output channels (61, 62, 63, 64), configured to record at least one electrical parameter (P) of the assigned output channels (61, 62, 63, 64) and / or groups (5) and / or a common measuring system (7) for at least some of the output channels (61, 62, 63, 64), configured to record at least one electrical parameter (P) of the assigned output channels (61, 62, 63, 64) using a time-division multiplexing method, wherein the comparison module (31 ) is configured to compare at least one electrical parameter (P) with the comparison limit (T) and to issue an error message if the comparison limit (T) is exceeded or fallen below.
2. Control unit (3) according to the preceding claim, which is configured to control the output channels ( 61, 62, 63, 64 ) with respect to a current duration and a 2024PF01722 December 18, 2025 P2024, 1176 WO N - 50 - Current strength through which at least one current source (33, 34, 35, 36) is operated in the same way.
3. Control unit (3) according to one of the preceding claims, comprising several of the current sources (33, 34, 35, 36), wherein there is a one-to-one mapping between the current sources (33, 34, 35, 36) and the output channels (61, 62, 63, 64).
4. Control unit (3) according to one of the preceding claims, wherein a one-to-one mapping exists between the output channels ( 61, 62, 63, 64 ) and the unit's own measuring systems (71, 72, 73, 74 ).
5. Control unit (3) according to one of claims 1 to 3, further comprising at least one comparator (75) , in which two of the output channels ( 61, 62, 63, 64 ) are assigned to one of the own measuring systems (71, 72, 73, 74 ), wherein the at least one comparator (75) is electrically connected between the two assigned output channels ( 61, 62, 63, 64 ) and the assigned ones of the own measuring systems (71, 72, 73, 74 ).
6. Control unit (3) according to claim 4 or 5, designed to simultaneously measure at least one electrical parameter (P) for output channels ( 61, 62, 63, 64) to be compared.
7. Control unit (3) according to one of claims 1 to 3, further comprising at least one comparator (75) , where each of the output channels (61, 62, 63, 64) is connected to an input of the common measurement system (7). 2024PF01722 December 18, 2025 P2024, 1176 WO N - 51 - 8. Control unit (3) according to the preceding claim, configured to measure the at least one electrical parameter (P) for the associated output channels ( 61, 62, 63, 64) several times and alternately.
9. Control unit (3) according to one of the preceding claims, configured to operate the output channels ( 61, 62, 63, 64 ) by means of pulse width modulation.
10. Control unit (3) according to one of the preceding claims, wherein the comparison value determination component (37 ) comprises a writable memory ( 81 ) or an immutable logic gate ( 82 ) in which the comparison limit value (T) is stored, wherein the comparator module (31 ) is configured to access the memory ( 81 ) and / or the logic gate ( 82 ).
11. Control unit (3) according to one of the preceding claims, wherein the comparison value determination component (37 ) comprises an input line ( 83) which is configured to receive the comparison limit value (T) or to determine it from at least one input value at the input line ( 83), wherein the comparison value determination component (37 ) is electrically connected to the comparison module (31 ).
12. Control unit (3) according to one of the preceding claims, wherein the comparison module (31) is configured for pairwise, rolling comparison of at least one electrical parameter (P) of at least three of the output channels (61, 62, 63, 64). 2024PF01722 18 December 2025 P2024, 1176 WO N - 52 - 13. Control unit (3) according to one of the preceding claims, which is a single, monolithic semiconductor chip.
14. Control unit (3) according to one of claims 1 to 12, which is composed of several separate electrical subcomponents .
15. Control unit (3) according to one of the preceding claims, which is designed for an electrical voltage of no more than 60 V and for an electrical power consumption of no more than 50 W.
16. Control unit (3) according to one of the preceding claims, comprising at least three and at most 96 of the output channels ( 61, 62, 63, 64 ).
17. Operating method for a control unit (3) according to any one of the preceding claims, comprising - Capturing the reference limit (T) by the reference value determination component (37 ) , - Acquisition of at least one electrical parameter (P) for each of the output channels ( 61, 62, 63, 64 ) by the at least one measuring system (7, 71, 72, 73, 74 ), and - Comparing at least one electrical parameter (P) with the comparison limit (T) using the comparison module (31 ).
18. Semiconductor light source ( 1 ) with - a control unit (3) according to one of claims 1 to 15, and 2024PF01722 December 18, 2025 P2024, 1176 WO N 53 - several lighting strings (2) which are grouped together in one or more lighting groups (5), where - each of the light strings (2) comprises several optoelectronic semiconductor chips (21) for light generation, - each of the lighting strings (2 ) is connected to one of the output channels ( 61, 62, 63, 64 ), and - the control unit (3) is configured to operate all lighting strings (2) within each of the at least one lighting group (5) in the same electrical manner.
19. Semiconductor light source ( 1 ) according to the preceding claim, encompassing several of the lighting groups, wherein the optoelectronic semiconductor chips (21) are each light-emitting diodes and each lighting string (2) comprises at least four and at most 100 of the optoelectronic semiconductor chips (21), where the distance between adjacent light strings (2 ) within the groups is at most 10 cm .