X-ray detection device and detection method
Patent Information
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2026-02-06
- Publication Date
- 2026-08-13
Smart Images
Figure CN2026077513_13082026_PF_FP_ABST
Abstract
Description
X-ray inspection equipment and methods
[0001] This application claims priority to Chinese Patent Application No. 202510138849.3, filed with the Chinese Patent Office on February 8, 2025, the entire contents of which are incorporated herein by reference. Technical Field
[0002] This application relates to the field of dynamic testing technology, such as an X-ray testing device and testing method. Background Technology
[0003] Many products inevitably experience impacts from drops during use, especially from falling from hands or tables. The ability to withstand such impacts is a critical performance indicator for a product.
[0004] Drop tests are typically conducted on a testing machine, where a high-speed camera observes and records the appearance of the product during the drop. However, it is impossible to obtain information about the internal damage of the product during the drop. Furthermore, X-ray inspection equipment in related technologies cannot meet the requirements of high-speed imaging and can only detect and analyze the static damage of the product after the drop. Therefore, it is impossible to obtain dynamic damage information of the product during the drop. Summary of the Invention
[0005] This application provides an X-ray inspection device and inspection method for realizing dynamic damage detection of the product to be tested.
[0006] This application provides an X-ray detection device, including a radiation protection device and a detection device disposed inside the radiation protection device, the detection device comprising:
[0007] The radiation source assembly includes two components, each comprising a first arc-shaped guide rail and a radiation emission module slidably mounted on the first arc-shaped guide rail.
[0008] The detector assembly comprises two detector modules, each including a second arc-shaped guide rail and a detector module slidably mounted on the second arc-shaped guide rail. The centers of the first and second arc-shaped guide rails coincide and their openings face each other. The first and second arc-shaped guide rails are spaced apart to form an X-axis channel, which is positioned through the center position. The two detector modules correspond one-to-one with the two ray-emitting modules and face the center position.
[0009] A spiral CT observation platform, configured to hold the product under test and move the product under test along the X direction within the X-direction channel;
[0010] A drop tester is configured to attract the product under test in the X-direction channel and drive the product under test to rise and fall along the Z-direction. When the product under test rises to a specified height along the Z-direction and is directly facing the center position, the drop tester releases the product under test and causes it to fall.
[0011] A drop platform capable of moving within an XZ plane to receive the dropped product under test, wherein the X direction is horizontal and the Z direction is vertical.
[0012] In some embodiments, the radiation source assembly further includes:
[0013] A first base, the first base being provided with two of the first arc-shaped guide rails;
[0014] The first mounting base plate is provided in two parts, and the two first mounting base plates are slidably connected to the two first arc-shaped guide rails respectively.
[0015] The first linear module is provided in two, and the two first linear modules are respectively provided on the two first mounting base plates. The extended line of the axis of the first linear module passes through the center position of the circle, and the two ray emitting modules are respectively provided on the two first linear modules.
[0016] In some embodiments, the detector assembly further includes:
[0017] The second base is provided with two second arc-shaped guide rails;
[0018] The second mounting base plate is provided in two parts, and the two second mounting base plates are slidably connected to the two second arc-shaped guide rails respectively.
[0019] The second linear module is provided in two parts, which are respectively mounted on two second mounting base plates. The extended axis of the second linear module passes through the center position of the circle, and the two detector modules are respectively mounted on the two second linear modules.
[0020] In some embodiments, the spiral CT observation platform includes:
[0021] A third linear module is provided along the X direction;
[0022] A fourth linear module is provided along the Z-direction and is slidably disposed on the third linear module. A lifting mounting plate is slidably disposed on the fourth linear module.
[0023] A rotating base plate is rotatably mounted on the lifting mounting plate, and the rotating axis of the rotating base plate is arranged along the Z direction;
[0024] The gripper is disposed on the rotating base plate and configured to hold the product to be tested.
[0025] In some embodiments, the drop platform includes:
[0026] The fifth linear module is arranged along the X direction, and a sliding plate is slidably mounted on the fifth linear module;
[0027] A lifting assembly, the bottom of which is disposed on the slide plate, and a lifting base is provided at the top of which is configured to receive the product under test falling.
[0028] A protective net is provided above the lifting base to restrain the falling product under test on the lifting base.
[0029] In some embodiments, the drop platform further includes a shock absorber disposed between the slide and the lifting assembly.
[0030] In some embodiments, the drop machine includes:
[0031] A sixth linear module is provided along the X direction, and a connecting plate is slidably provided on the sixth linear module;
[0032] A lifting guide rail is provided along the Z-direction and is disposed on the connecting plate;
[0033] A suction cup assembly is slidably mounted on the lifting guide rail to drive the product under test to rise and fall.
[0034] In some embodiments, the drop machine further includes a rotation drive member slidably disposed on the lifting guide rail, the output end of the rotation drive member being disposed along the Y direction, the suction cup assembly being disposed at the output end of the rotation drive member, and the rotation drive member being configured to drive the suction cup assembly to rotate, wherein the Y direction is horizontal and perpendicular to the X direction.
[0035] In some embodiments, the drop machine further includes a lifting drive, the output end of which is connected to the rotation drive, and the lifting drive is configured to drive the rotation drive to slide on the lifting guide rail.
[0036] This application also provides an X-ray detection method, using the X-ray detection equipment provided in this application, the X-ray detection method comprising:
[0037] Adjust the imaging angle of the X-ray source assembly and the detector assembly;
[0038] The spiral CT observation platform holds the product under test and moves it along the X-axis to the center of the X-ray source assembly and the detector assembly.
[0039] The drop tester picks up the product to be tested and raises it to a specified height, while the spiral CT observation platform moves in the opposite direction to move away from the center position.
[0040] The drop platform moves to the center position of the circle;
[0041] The X-ray source assembly and the detector assembly are activated, the drop machine releases the product under test, the product under test falls onto the drop platform, and the X-ray source assembly and the detector assembly capture images. Attached Figure Description
[0042] Figure 1 is a schematic diagram of the external structure of the radiation protection device in the X-ray detection equipment provided in the embodiment of this application;
[0043] Figure 2 is a schematic diagram of the structure of the detection device inside the radiation protection device in the X-ray detection equipment provided in the embodiment of this application;
[0044] Figure 3 is a top view of the detection device in the X-ray detection equipment provided in the embodiment of this application;
[0045] Figure 4 is a schematic diagram of the structure of the X-ray source assembly and detector assembly in the X-ray detection equipment provided in the embodiment of this application;
[0046] Figure 5 is a top view of the X-ray source assembly in the X-ray detection equipment provided in the embodiment of this application;
[0047] Figure 6 is a top view of the detector assembly in the X-ray detection equipment provided in the embodiment of this application;
[0048] Figure 7 is a schematic diagram of the spiral CT observation platform and drop platform in the X-ray detection equipment provided in the embodiment of this application;
[0049] Figure 8 is a schematic diagram of the drop tester in the X-ray inspection equipment provided in the embodiment of this application;
[0050] Figure 9 is a front view of the drop tester in the X-ray inspection equipment provided in the embodiment of this application.
[0051] In the picture:
[0052] 100. Product to be tested;
[0053] 1. Radiation protection device; 11. Automatic lead door;
[0054] 2. X-ray source assembly; 21. X-ray emission module; 22. First arc-shaped guide rail; 23. First base; 24. First mounting base plate; 25. First linear module;
[0055] 3. Detector assembly; 31. Detector module; 32. Second arc-shaped guide rail; 33. Second base; 34. Second mounting base plate; 35. Second linear module;
[0056] 4. Spiral CT observation platform; 41. Third linear module; 42. Fourth linear module; 43. Rotating base plate; 44. Grippers; 45. Lifting mounting plate; 46. Rotary motor;
[0057] 5. Drop tester; 51. Sixth linear module; 511. Connecting plate; 52. Lifting guide rail; 53. Suction cup assembly; 54. Rotation drive component; 55. Lifting drive component;
[0058] 6. Drop platform; 61. Fifth linear module; 62. Lifting assembly; 621. Drop drive component; 622. Third mounting base plate; 623. Guide shaft; 63. Protective net; 64. Slide plate; 65. Lifting base; 66. Shock absorber;
[0059] 7. X-direction channel. Detailed Implementation
[0060] The present application will now be described in conjunction with the accompanying drawings and embodiments. The embodiments described herein are for illustrative purposes only. Furthermore, for ease of description, only the parts of the structure relevant to the present application are shown in the accompanying drawings.
[0061] In the description of this application, unless otherwise expressly specified and limited, the terms "connected," "linked," and "fixed" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the meaning of the above terms in this application as appropriate.
[0062] In this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature being directly above or diagonally above the second feature, or indicating that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature being directly below or diagonally below the second feature, or indicating that the first feature is at a lower horizontal level than the second feature.
[0063] In the description of this embodiment, the terms "upper," "lower," "left," and "right," etc., refer to the orientation or positional relationship shown in the accompanying drawings. They are used only for ease of description and simplification of operation, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. In addition, the terms "first" and "second" are used only for distinction in description and have no special meaning.
[0064] This application first provides an X-ray detection device, such as a dynamic binocular X-ray detection device, as shown in Figures 1-3. It includes a radiation shielding device 1 and a detection device located inside the radiation shielding device 1. The detection device includes a radiation source assembly 2, a detector assembly 3, a spiral computed tomography (CT) observation platform 4, a drop machine 5, and a drop platform 6. The radiation shielding device 1 is a lead room with an automatic lead door 11 for isolating radiation. Two radiation source assemblies 2 and two detector assemblies 3 are provided to form a binocular X-ray detection system. The X-ray source assembly 2 includes a first arc-shaped guide rail 22 and a X-ray emitting module 21 slidably mounted on the first arc-shaped guide rail 22; the detector assembly 3 includes a second arc-shaped guide rail 32 and a detector module 31 slidably mounted on the second arc-shaped guide rail 32. The centers of the first arc-shaped guide rail 22 and the second arc-shaped guide rail 32 coincide and their openings face each other. The first arc-shaped guide rail 22 and the second arc-shaped guide rail 32 are spaced apart to form an X-axis channel 7, which is positioned through the center of the circle. The two detector modules 31 correspond one-to-one with the two X-ray emitting modules 21 and face the center of the circle. For example, the first arc-shaped guide rail 22 and the second arc-shaped guide rail 32 are located on two arcs of the same circle to facilitate the centering adjustment of the X-ray source assembly 2 and the detector assembly 3. The spiral CT observation platform 4 is configured to hold the product under test 100 and move it along the X-axis within the X-channel 7. Since the X-channel 7 passes through the center position, the spiral CT observation platform 4 can deliver the product under test 100 to this center position. This center position includes the location of the center of the first arc-shaped guide rail 22 and the second arc-shaped guide rail 32, as well as any position on the Z-axis where the center is located. This ensures that the X-ray source assembly 2 and the detector assembly 3 can acquire images of the product under test 100. By defining the center position and the X-channel 7 passing through it, the movement direction of the product under test 100 can be controlled for rapid positioning. The product under test 100 can be a product requiring drop testing, such as electronic products like mobile phones and tablets. The drop machine 5 is configured to adsorb the product under test 100 in the X-direction channel 7 and drive the product under test 100 to rise and fall along the Z-direction. When the product under test 100 rises to a specified height along the Z-direction and is directly facing the center position, the drop machine 5 releases the product under test 100 and causes it to fall. The drop platform 6 can move in the XZ plane to receive the falling product under test 100, wherein the X-direction is horizontal, the Z-direction is vertical, and the X-direction and Y-direction are perpendicular to each other and both are located in the horizontal direction.
[0065] The X-ray inspection equipment provided in this application combines a drop machine 5, two X-ray source assemblies 2, and two detector assemblies 3. The drop machine 5 is configured to perform a drop operation on the product 100 under test. The two X-ray source assemblies 2 and the two detector assemblies 3 are configured to detect the dynamic damage process of the dropped product 100, thereby realizing dynamic binocular multi-angle X-ray inspection of the product 100 under test, with more comprehensive and complete detection parameters. By setting the spiral CT observation platform 4, the drop machine 5, and the drop platform 6 to move in the XZ plane, the inspection equipment can achieve dynamic binocular multi-angle X-ray inspection of the product 100 under test. The loading, dropping, and receiving of the test product 100 at the center position allows the test product 100 to drop at the common center position of the first arc-shaped guide rail 22 and the second arc-shaped guide rail 32, thereby being captured by the X-ray source assembly 2 and the detector assembly 3 for high-frequency image acquisition (image capture). This obtains the dynamic damage information of the test product 100 during the drop process, which is beneficial for studying the dynamic damage mechanism of the test product 100, providing a basis for test parameters for the optimized design of the test product 100, and can significantly reduce the number of tests, shorten the development cycle, and reduce costs.
[0066] In some embodiments, the X-ray source assembly 2 further includes a first base 23, a first mounting base 24, and a first linear module 25; wherein, the first base 23 is provided with two first arc-shaped guide rails 22; there are two first mounting bases 24, which are slidably connected to the two first arc-shaped guide rails 22 respectively; there are two first linear modules 25, which are respectively disposed on the two first mounting bases 24, and the extended axis of the first linear module 25 passes through the center position; and two X-ray emission modules 21 are disposed on the two first linear modules 25 respectively.
[0067] As shown in Figures 4 and 5, the two X-ray source assemblies 2 share a first base 23. Two first arc-shaped guide rails 22 are provided on the first base 23 to allow the two X-ray emission modules 21 to slide. The two first arc-shaped guide rails 22 can be protrusions with an I-shaped cross-section or grooves, used to define the sliding trajectory of the X-ray emission modules 21. When the X-ray emission module 21 slides on the first arc-shaped guide rail 22 to adjust its position, the emission direction of the X-ray emission module 21 always faces the center position, i.e., along the diameter direction of the first arc-shaped guide rail 22, to facilitate cooperation with the corresponding detector module 31. The first linear module 25 facilitates the adjustment and control of the distance between the X-ray emission module 21 and the product under test 100, allowing for adjustment of different magnifications to meet the detection requirements of products 100 of various sizes. To achieve automatic movement of the X-ray emission module 21, the first mounting base 24 and the first linear module 25 each have a first electric drive mechanism.
[0068] In some embodiments, the detector assembly 3 further includes a second base 33, a second mounting base 34, and a second linear module 35. The second base 33 is provided with two second arc-shaped guide rails 32; there are two second mounting bases 34, which are slidably connected to the two second arc-shaped guide rails 32 respectively; there are two second linear modules 35, which are respectively disposed on the two second mounting bases 34, and the extended axis of the second linear module 35 passes through the center position; the two detector modules 31 are disposed on the two second linear modules 35 respectively.
[0069] The second base 33, the second mounting plate 34, and the second linear module 35 are arranged and connected in the same way as the first base 23, the first mounting plate 24, and the first linear module 25 in the X-ray source assembly 2, which facilitates processing and simplifies design costs. The first base 23 and the second base 33 are spaced apart to form an X-axis channel 7, which is used for conveying and loading the product under test 100 and for drop receiving. To achieve automatic control of the detector module 31, the second mounting plate 34 and the second linear module 35 each have a second electric drive mechanism.
[0070] As shown in Figures 3 and 4, by setting the first arc-shaped guide rail 22 and the second arc-shaped guide rail 32, the ray emission module 21 and the detector module 31 form two imaging systems in the circumferential direction. The two imaging systems rotate synchronously to meet different angle detection requirements, realizing binocular functionality with a detection angle range of 60°-120°. By setting the two segmented first arc-shaped guide rails 22 and the two second arc-shaped guide rails 32, positional interference between the two ray emission modules 21 and between the two detector modules 31 can be avoided, and the movement endpoints of the two ray emission modules 21 and the two detector modules 31 can be restricted respectively. For example, the first arc-shaped guide rail 22 and the second arc-shaped guide rail 32 are provided with scale values on one or both sides to facilitate adjustment of the initial detection angle position. The detection angle refers to the angle formed by the ray emission directions of the two ray emission modules 21.
[0071] In some embodiments, the spiral CT observation platform 4 includes a third linear module 41, a fourth linear module 42, a rotating base plate 43, and grippers 44. The third linear module 41 is arranged along the X-axis, the fourth linear module 42 is arranged along the Z-axis, the fourth linear module 42 is slidably disposed on the third linear module 41, and a lifting mounting plate 45 is slidably disposed on the fourth linear module 42; the rotating base plate 43 is rotatably disposed on the lifting mounting plate 45, and the rotation axis of the rotating base plate 43 is arranged along the Z-axis; the grippers 44 are disposed on the rotating base plate 43 and are configured to hold the product 100 to be tested.
[0072] As shown in Figure 7, the fourth linear module 42 slides along the X-axis on the third linear module 41, enabling the test product 100 to move towards and away from the center position. The lifting mounting plate 45 moves up and down along the Z-axis on the fourth linear module 42, enabling the test product 100 to move up and down along the Z-axis, thereby avoiding objects in the direction of movement and raising the test product 100 to a suitable height to connect with the drop machine 5 for transfer, facilitating the drop machine 5 to pick up the test product 100 for drop testing. A rotary motor 46 is fixed on the lifting mounting plate 45, with the output shaft of the rotary motor 46 pointing upwards along the Z-axis. A rotating base plate 43 is mounted on the output end of the rotary motor 46. The rotary motor 46 drives the rotating base plate 43 to rotate, thereby causing the test product 100 on the gripper 44 to rotate to a suitable angle, facilitating the transfer of the test product 100 in cooperation with the drop machine 5. After the spiral CT observation platform 4 clamps the product to be tested 100 on the outside of the X-direction channel 7, which is far from the center, it passes through the X-direction channel 7 along the X direction and, after reaching the center position, adjusts the lifting height and rotation angle so that the drop machine 5 can adsorb the product to be tested 100; then the spiral CT observation platform 4 moves in the opposite direction away from the center position, resets, and prepares to clamp the next product to be tested 100.
[0073] In some embodiments, the drop platform 6 includes a fifth linear module 61, a lifting assembly 62, and a protective net 63. The fifth linear module 61 is arranged along the X direction, and a slide plate 64 is slidably mounted on the fifth linear module 61. The bottom end of the lifting assembly 62 is disposed on the slide plate 64, and the top end of the lifting assembly 62 is provided with a lifting base 65, which is configured to receive the dropped product under test 100. The protective net 63 is disposed above the lifting base 65 to confine the dropped product under test 100 on the lifting base 65.
[0074] As shown in Figure 7, the fifth linear module 61 is configured to drive the slide plate 64 to move along the X-direction, thereby adjusting the lifting base 65 to the center position to face the falling test product 100 and receive it. The fifth linear module 61 can be driven by a motor through a combination of rail and slider. The lifting assembly 62 adjusts the height of the lifting base 65, thereby cooperating with the drop machine 5 to adjust the drop height of the test product 100, and can be adjusted according to the detection height of the X-ray source assembly 2 and the detector assembly 3 to facilitate image acquisition and detection. In this embodiment, the lifting assembly 62 includes a drop drive component 621, a third mounting base plate 622, and a guide shaft 623. Taking the drop drive component 621 as an example, which uses a linear drive mechanism (such as an electric cylinder, pneumatic cylinder, or hydraulic cylinder), the bottom end of the drop drive component 621 is fixed, and the top end of the drop drive component 621 passes through a third mounting base plate 622 and connects to the lifting base 65. It is configured to drive the lifting base 65 to move up and down. The third mounting base plate 622 is fixedly assembled with the body of the drop drive component 621. There are two or more guide shafts 623. The top ends of the multiple guide shafts 623 are fixedly connected to the lifting base 65, and the bottom ends slide through the third mounting base plate 622. When the drop drive component 621 drives the lifting base 65 to move up and down, the multiple guide shafts 623 slide along the third mounting base plate 622 to guide the lifting base 65. The function of the protective net 63 is to confine the product under test 100 within the range of the lifting base 65 when it bounces after falling onto the lifting base 65, so that it can be captured by the X-ray source assembly 2 and the detector assembly 3 for image acquisition and detection. It is understood that the bottom end of the protective net 63 is connected to the edge of the lifting base 65, and the protective net 63 extends a certain height above the upper surface of the lifting base 65 along the Z direction to form a defined spatial area. The protective net 63 is generally a net bag structure.
[0075] In some embodiments, the drop platform 6 further includes a shock absorber 66, which is disposed between the slide plate 64 and the lifting assembly 62. As shown in FIG7, the shock absorber 66 is disposed between the slide plate 64 and the lifting assembly 62, which plays a shock-absorbing role when the product under test 100 falls onto the lifting base 65, so as to protect components such as the drop drive component 621 and the fifth linear module 61.
[0076] In some embodiments, the drop tester 5 includes a sixth linear module 51, a lifting guide rail 52, and a suction cup assembly 53. The sixth linear module 51 is arranged along the X-axis and is used for initial positioning, facilitating the adjustment of the X-axis drop position of the adsorbed product 100. A connecting plate 511 is slidably arranged on the sixth linear module 51, and the lifting guide rail 52 is arranged along the Z-axis and mounted on the connecting plate 511. The suction cup assembly 53 is slidably mounted on the lifting guide rail 52 to drive the product 100 to rise and fall, thereby achieving Z-axis position adjustment of the product 100 before it falls.
[0077] As shown in Figures 7 and 8, and referring to Figure 2, the lifting guide rail 52 can be positioned on the side of the sixth linear module 51 facing the drop platform 6 via the connecting plate 511. The suction cup assembly 53 is positioned on the side of the lifting guide rail 52 facing the drop platform 6, thereby allowing the product under test 100 to be adjusted directly above the center position for drop testing. The lifting and lowering movement of the suction cup assembly 53 facilitates its approach to the spiral CT observation platform 4 during descent to adsorb the product under test 100, and then its upward movement to raise the product under test 100 to the test height.
[0078] In some embodiments, the drop machine 5 further includes a rotation drive 54, which is slidably disposed on the lifting guide rail 52. The output end of the rotation drive 54 is disposed along the Y direction, and the suction cup assembly 53 is disposed at the output end of the rotation drive 54. The rotation drive 54 is configured to drive the suction cup assembly 53 to rotate.
[0079] As shown in Figure 8, the rotation drive 54 is configured to adjust the tilt angle of the suction cup assembly 53. Referring to Figure 7, the product under test 100 is clamped on the gripper 44. The spiral CT observation platform 4 can adjust the rotation angle and height of the product under test 100, and the rotation drive 54 can adjust the tilt angle of the suction cup assembly 53, allowing the suction cup assembly 53 to adhere to a suitable position on the product under test 100 for stable adhesion. Simultaneously, the rotation drive 54 can adjust the initial position of the adhered product under test 100, allowing the product under test 100 to be released and dropped at a specified angle, meeting the diverse needs of drop tests. The rotation drive 54 can be a rotation output motor. The suction cup assembly 53 can be a vacuum adsorption assembly for adhesion.
[0080] In some embodiments, the drop machine 5 further includes a lifting drive 55, the output end of which is connected to a rotation drive 54, and the lifting drive 55 is configured to drive the rotation drive 54 to slide on the lifting guide rail 52.
[0081] As shown in Figures 8 and 9, taking the lifting drive component 55 as an example where a rotary drive motor is used, the lifting drive component 55 is located at the bottom end of the lifting guide rail 52. The output end of the lifting drive component 55 is driven and connected to the rotary drive component 54 through a conveyor belt, transmission chain, or screw drive. In this embodiment, the rotary drive component 54 is located on the conveyor belt, and the lifting drive component 55 drives the rotary drive component 54 to move up and down through the conveyor belt.
[0082] Unless otherwise specified, the fixed structures in the detection device of this application embodiment are all fixed on the inner wall of the radiation protection device 1, and the movable devices are all controlled and connected by electric drive mechanisms (such as motors). The movement and rotation in this application embodiment are all controlled by electric automatic drive. The first linear module 25, the second linear module 35, the third linear module 41, the fourth linear module 42, the fifth linear module 61, and the sixth linear module 51 are each equipped with their own electric drive mechanisms.
[0083] Using the dynamic binocular X-ray detection equipment provided in this application, this application also provides an X-ray detection method, such as a dynamic binocular X-ray detection method, comprising the following steps:
[0084] S1, adjust the imaging angle of the X-ray source assembly 2 and the detector assembly 3;
[0085] S2, the spiral CT observation platform 4 clamps the product under test 100 and moves the product under test 100 to the center position of the X-ray source assembly 2 and the detector assembly 3 along the X-ray direction;
[0086] S3, the drop tester 5 adsorbs the product to be tested 100 and raises the product to be tested 100 to a specified height, and the spiral CT observation platform 4 moves in the opposite direction to leave the center position;
[0087] S4, the drop platform 6 moves to the center position;
[0088] S5, activate X-ray source component 2 and detector component 3, drop machine 5 releases product under test 100, product under test 100 falls onto drop platform 6, X-ray source component 2 and detector component 3 take images.
[0089] In the above steps, during the drop of the product under test 100, the X-ray source component 2 and the detector component 3 can acquire multiple frames of images per second to form a video. By processing and fusing these image information, the rapid and accurate three-dimensional reconstruction and defect detection of the product under test 100 are completed, thereby realizing real-time dynamic observation of the complex internal structure of the product under test 100.
[0090] Based on the aforementioned dynamic binocular X-ray detection equipment, the spiral CT observation platform 4 holds the product under test 100 and drives the product under test 100 to lift, move, or rotate. In conjunction with the accelerated testing of the product under test 100, such as the folding aging test of a foldable mobile phone, the aging process of the product under test 100 can be dynamically detected and monitored, providing important parameters for the study of the aging process.
Claims
1. An X-ray detection device, comprising a radiation protection device (1) and a detection device disposed inside the radiation protection device (1), the detection device comprising: The radiation source assembly (2) is provided in two parts. The radiation source assembly (2) includes a first arc-shaped guide rail (22) and a radiation emission module (21) that is slidably mounted on the first arc-shaped guide rail (22). The detector assembly (3) comprises two components, including a second arc-shaped guide rail (32) and a detector module (31) slidably mounted on the second arc-shaped guide rail (32). The centers of the first arc-shaped guide rail (22) and the second arc-shaped guide rail (32) coincide and their openings face each other. The first arc-shaped guide rail (22) and the second arc-shaped guide rail (32) are spaced apart to form an X-axis channel (7), which passes through the center position. The two detector modules (31) correspond one-to-one with the two ray emission modules (21) and face the center position. A spiral computed tomography (CT) observation platform (4) is configured to hold the product under test (100) and move the product under test (100) along the X direction within the X-direction channel (7); Drop machine (5), the drop machine (5) is configured to adsorb the product to be tested (100) in the X-direction channel (7) and drive the product to be tested (100) to rise and fall along the Z-direction. When the product to be tested (100) rises along the Z-direction to a specified height and is directly facing the center position, the drop machine (5) releases the product to be tested (100) and causes it to fall. A drop platform (6) is movable in the XZ plane to receive the dropped product under test (100), wherein the X direction is horizontal and the Z direction is vertical.
2. The X-ray detection equipment according to claim 1, wherein, The radiation source assembly (2) also includes: The first base (23) is provided with two first arc-shaped guide rails (22); The first mounting base plate (24) is provided in two, and the two first mounting base plates (24) are slidably connected to the two first arc-shaped guide rails (22); The first linear module (25) is provided in two, and the two first linear modules (25) are respectively provided on the two first mounting base plates (24). The extension line of the axis of the first linear module (25) passes through the center position. The two ray emission modules (21) are respectively provided on the two first linear modules (25).
3. The X-ray detection equipment according to claim 1, wherein, The detector assembly (3) includes: The second base (33) is provided with two second arc-shaped guide rails (32); The second mounting base plate (34) is provided in two, and the two second mounting base plates (34) are slidably connected to the two second arc-shaped guide rails (32); The second linear module (35) is provided in two. The two second linear modules (35) are respectively provided on the two second mounting base plates (34). The extension line of the axis of the second linear module (35) passes through the center position. The two detector modules (31) are respectively provided on the two second linear modules (35).
4. The X-ray detection equipment according to claim 1, wherein, The spiral CT observation platform (4) includes: A third linear module (41) is arranged along the X direction; The fourth linear module (42) is arranged along the Z direction and is slidably disposed on the third linear module (41). A lifting mounting plate (45) is slidably disposed on the fourth linear module (42). A rotating base plate (43) is rotatably mounted on the lifting mounting plate (45), and the rotating shaft of the rotating base plate (43) is arranged along the Z direction; A gripper (44) is disposed on the rotating base plate (43) and configured to grip the product to be tested (100).
5. The X-ray detection equipment according to claim 1, wherein, The drop platform (6) includes: A fifth linear module (61) is arranged along the X direction, and a sliding plate (64) is slidably mounted on the fifth linear module (61). A lifting assembly (62) is provided at its bottom end on the slide plate (64), and a lifting base (65) is provided at its top end. The lifting base (65) is configured to receive the product under test (100) falling. A protective net (63) is provided above the lifting base (65) to restrain the falling product under test (100) on the lifting base (65).
6. The X-ray detection device according to claim 5, wherein, The drop platform (6) also includes a shock absorber (66) disposed between the slide plate (64) and the lifting assembly (62).
7. The X-ray detection equipment according to claim 1, wherein, The drop machine (5) includes: A sixth linear module (51) is provided along the X direction, and a connecting plate (511) is slidably provided on the sixth linear module (51). A lifting guide rail (52) is provided along the Z direction and is provided on the connecting plate (511); A suction cup assembly (53) is slidably mounted on the lifting guide rail (52) to drive the product under test (100) to rise and fall.
8. The X-ray inspection device according to claim 7, wherein, The drop machine (5) further includes a rotation drive (54), which is slidably disposed on the lifting guide rail (52). The output end of the rotation drive (54) is disposed along the Y direction. The suction cup assembly (53) is disposed at the output end of the rotation drive (54). The rotation drive (54) is configured to drive the suction cup assembly (53) to rotate. The Y direction is horizontal and perpendicular to the X direction.
9. The X-ray inspection device according to claim 8, wherein, The drop machine (5) also includes a lifting drive (55), the output end of which is connected to the rotation drive (54), and the lifting drive (55) is configured to drive the rotation drive (54) to slide on the lifting guide rail (52).
10. An X-ray detection method, using the X-ray detection equipment according to any one of claims 1-9, comprising: Adjust the imaging angle of the X-ray source assembly (2) and the detector assembly (3); The spiral computed tomography (CT) observation platform (4) clamps the product under test (100) and moves the product under test (100) along the X-axis to the center position of the X-ray source assembly (2) and the detector assembly (3); The drop tester (5) adsorbs the product to be tested (100) and raises the product to be tested (100) to a specified height, while the spiral CT observation platform (4) moves in the opposite direction to leave the center position; The drop platform (6) moves to the center position; The X-ray source assembly (2) and the detector assembly (3) are turned on, the drop machine (5) releases the product under test (100), the product under test (100) falls onto the drop platform (6), and the X-ray source assembly (2) and the detector assembly (3) take pictures.