Sample-processing device and method for magnetic bead-based sample processing

Abstract

Sample-processing device (100) for magnetic bead-based sample processing, the sample-processing device (100) comprises: A magnetic bead attraction element (10) comprising at least one first magnet section (11a) and at least one second magnet section (12a) being oriented at an angle of 90° < α < 180° with respect to the at least one first magnet section (11a); and A test tube-receiving mechanism (13) for receiving at least one test tube (14) with a main tube wall section (15) and a tapered bottom wall section (16) for containing a sample liquid (17) with magnetic beads (18), wherein the magnetic bead attraction element (10) and the test tube-receiving mechanism (13) are at least partially movably arranged relative to each other between: a first bead collection configuration (A), in which the magnetic bead attraction element (10) is positioned with respect to the test tube (14), when being received by the test tube-receiving mechanism (13), such that the at least one first magnet section (11a) overlaps with at least a portion of the main tube wall section (15) and the at least one second magnet section (12a) overlaps with at least a portion of the tapered bottom wall section (16); and a second bead collection configuration (B), in which the magnetic bead attraction element (10) is positioned with respect to the test tube (14) when being received by the test tube-receiving mechanism (13), such that the at least one first magnet section (11a) overlaps with at least a portion of the tapered bottom wall section (16).

Description

[0001] Sample-processing device and method for magnetic bead-based sample processing

[0002]

[0003] The invention relates to a sample-processing device and a method for magnetic bead-based sample processing, specifically sample pre-processing, such as analyte and / or substance enrichment and / or purification, specifically in the field of In Vitro diagnostics (IVD) and more specifically in the field of pre-analytics and / or sample preparation for IVD.

[0004]

[0005] Magnetic bead-based sample processing is a widely used technique in the pre-analytic phase of IVD, such as for example for purification of DNA or RNA for subsequent PCR, RT-PCR, or sequencing, isolation of specific proteins for analysis or testing and / or enrichment of specific cell types from a heterogeneous population.

[0006] Magnetic bead-based purification is integral in ensuring the quality and purity of analytes, essential for accurate and reliable diagnostic results. This approach involves using magnetic beads coated with specific ligands that can bind to target molecules, such as DNA, RNA, or proteins, from complex biological samples. Using this technique, biological samples, such as blood, urine, or tissue, are prepared and lysed to release the target molecules. Therefore, the following procedure is typically applied: Magnetic beads coated with selective ligands (e.g., antibodies, nucleotides) are added to the sample. These ligands bind specifically to the molecules of interest. The mixture (sample plus coated beads) is then exposed to a magnetic field, causing the beads (with bound target molecules) to separate from the rest of the mixture. The beads are then washed to remove any non-specifically bound materials. The purified target molecules are then eluted from the magnetic beads for further analysis.

[0007] The magnetic bead-based sample processing generally provides a high specificity due to selective binding ligands on the beads. Further, it provides rapid and efficient separation of target molecules, it can be easily scaled for high-throughput applications and it is compatible with automated systems, reducing manual handling and potential errors.

[0008] In view of the efficiency of the pre-analytics and / or sensitivity of the IVD analysis, it is important to achieve a high yield of target molecules. Often, the magnetic beads, after exposure to a magnetic field, stick to the walls of a vial and do not efficiently and / or completely re-suspend, i.e. mixing beads that have settled on the wall of a vial into suspension so that they are evenly distributed throughout the sample liquid and / or sample solution which may often have a negative impact on the efficiency of the purification, the yield of the target molecules and ultimately the sensitivity of the IVD test.

[0009] In Fig. la, a prior art magnetic bead attraction element 200 is shown having a magnet section with a plurality of magnet elements 210, namely eight magnet elements 210. Each one of the eightmagnet elements 210 may be contacted and / or overlapped with a test tube, a vial and / or a sample container as shown in Fig. lb The magnetic bead attraction element 200 is coupled via via a hinge 225 (rotatable around a tipping axis TA) to a motor / actuator to position the magnetic fields of the magnet elements 210 near the respective test tube, a vial and / or a sample container by translation, specifically combined with a rotational movement as a response of the (vertical) translation and to remove the magnetic fields if not needed any longer in a following preparation step (also by translation and / or rotation specifically a combination of translational and rotational movement). The magnetic bead attraction element 200, specifically the hinge 225 may rotate (and / or may be rotated) around a rod (not shown) that is elongated along the tipping axis TA and the rod may be coupled to a motor (not shown) that initiates the translational movement while the rotational movement is due to a force pushing against the magnetic bead attraction element 200 when the translational movement causes the magnetic bead attraction element 200 to contact the vials. A spring force of a spring (not shown) causes the rotational movement to resiliently “push back” to ensure contact between the magnetic bead attraction element 200 and the vials.

[0010] As mentioned, in Fig. lb, multiple test tubes 14 are shown. The test tubes 14 contain a residual amount of sample liquid / solution (see foam on the lower tip of the test tubes 14) and beads 18 that are sticking along the entire wall of the test tubes 14 after being exposed to the magnetic fields generated by the magnetic bead attraction element 200 of Fig. la. To achieve efficient resuspension, the beads 18 are typically washed off the wall of the test tube 14. It may occur that not all beads are removed from the wall, therefore remain while sticking to the wall and cannot be resuspended. This leads to a reduced efficiency of the purification, a reduced yield of the target molecules and / or a reduced sensitivity of the IVD test.

[0011] US 2023 / 118289 Al describes a separating apparatus of biosubstance and a separating method of the same are provided.

[0012] US 2012 / 262260 Al describes a technology that provides articles of manufacture, apparatuses, and methods related to purifying an analyte from a sample matrix using magnetic particles.

[0013] US 2011 / 198293 Al and US 2011 / 031168 Al both describe a magnetic separating device for isolating magnetically labelled particles from a non-magnetic medium.

[0014] WO 2021 / 198959 Al describes a magnetic separator for a liquid handling system.

[0015] Summary of the Invention

[0016] It is therefore desirable to provide an improved and / or enhanced sample-processing device and method for magnetic bead-based sample processing to improve and / or optimize the efficiency of the purification, the yield of the target molecules and / or the sensitivity of the IVD test.

[0017] At least one of these improvements can be achieved by the aspects of this disclosure, i.e. the subject matter defined by the independent claims. Other advantageous effects and / or improvements areachieved by the specific embodiments, i.e. the corresponding subject matter covered by the dependent claims.

[0018] According to an aspect, which may be considered a first aspect, a sample-processing device for magnetic bead-based sample processing, specifically sample pre-processing, such as analyte and / or substance enrichment and / or purification comprises: a magnetic bead attraction element comprising at least one first magnet section and at least one second magnet section being oriented at an angle of 90° < a < 180° with respect to the at least one first magnet section; and a test tubereceiving mechanism for receiving at least one test tube with a main tube wall section and a tapered, specifically a conical or rounded bottom wall section for containing a sample liquid with magnetic beads, wherein the magnetic bead attraction element and the test tube-receiving mechanism are at least partially movably arranged relative to each other between configurations comprising: a first bead collection configuration A, in which the magnetic bead attraction element is positioned with respect to the test tube, when being received by the test tube-receiving mechanism, such that the at least one first magnet section overlaps with at least a portion of the main tube wall section and the at least one second magnet section overlaps with at least a portion of the tapered bottom wall section; and a second bead collection configuration B, in which the magnetic bead attraction element is positioned with respect to the test tube when being received by the test tube-receiving mechanism, such that the at least one first magnet section overlaps with at least a portion of the tapered bottom wall section.

[0019] The sample-processing device for magnetic bead-based sample processing can improve or even optimize the efficiency of the purification, the yield of the target molecules and ultimately the sensitivity of the IVD test.

[0020] The magnetic bead attraction element may be bent and / or tilted to match, fit or at least approximate, i.e. approximately resemble the contour and / or the shape of a test tube that may have a tapered, i.e. a conically-shaped bottom tip or a rounded bottom tip. Further, the magnetic bead attraction element and / or the test tube-receiving mechanism can be moved, i.e. translated along at least one movement axis to change the relative position between the magnetic bead attraction element and the test tube when being received by the test tube-receiving mechanism. Any angle of 90° < a < 180° may provide a sufficient bend / bending to approximately resemble any contour of any test tube with a tapered, specifically a conically-shaped tip.

[0021] The test tube-receiving mechanism may comprise a clamp or several clamps, a rack, specifically a rack with round openings to receive the test tubes and / or another mechanism to receive and temporarily hold one or more test tubes for example using suction forces. The test tube-receiving mechanism may act as a holder and may in some cases, at the same time, have the function of placing, providing and / or removing the test tubes with respect to the magnetic bead attraction element. In other words, the test tube-receiving mechanism may be provided with the test tubes ina position remote of the magnetic bead attraction element before moving the test tube-receiving mechanism towards the magnetic bead attraction element. In all cases, the test tube-receiving mechanism is not fixedly attached to the magnetic bead attraction element to allow adopting different configurations including the first bead collection configuration A and the second bead collection configuration B by moving at least one of: the test tube-receiving mechanism; the magnetic bead attraction element; the test tube being moved by a moving mechanism in or on the tube-receiving mechanism. The test tube-receiving mechanism has the function to receive and hold the test tubes during the processing steps that are associated with the configurations A and B while at the same time being in a translatable relative relationship with the magnetic bead attraction element.

[0022] The at least one first magnet section and the at least one second magnet section may refer to two sections of one element or may refer to two elements, each magnet section comprising and / or being part of and / or corresponding to one distinct element or a set of distinct elements. The at least one first magnet section and the at least one second magnet section may be near each other or may be in contact with each other for example along one of their edges.

[0023] By moving the magnetic bead attraction element and / or the test tube-receiving mechanism, the configurations may be changed between the first bead collection configuration A and the second bead collection configuration B. The configurations A and B do not merely refer to relative positions of the magnetic bead attraction element and the test tube-receiving mechanism and / or the test tube but to a functional state in which certain sample preparation steps can be performed. This may include a resting time in a certain configuration A and / or B and / or a procedure of switching between the configurations. It may include that for a certain time span, the configurations A and B are not exceeded by passing the position by the relative movement. It is noted that the configuration do not merely relate to positions that are passed when removing or receiving the test tube / placing the test tube in the test tube-receiving mechanism.

[0024] In the first bead collection configuration A, the magnetic beads are exposed to the magnetic fields of the at least one first magnet section and the at least one second magnet section. As a result, the magnetic beads, which are solubilized and / or floating in the mixture (comprising sample fluid and beads) are attracted to a portion of the main tube wall section and to at least a portion of the tapered bottom wall section. This is achieved by overlapping the at least one first magnet section with the at least a portion of the main tube wall section and overlapping the at least one second magnet section with the at least a portion of the tapered bottom wall section.

[0025] In the second bead collection configuration B, the magnetic beads are mainly, predominantly or even completely and / or solely exposed to the magnetic fields of the at least one first magnet section. As a result, the magnetic beads, which are sticking to at least a portion of the main tube wall section and to at least a portion of the tapered bottom wall section, are pulled and / or attractedby the magnetic forces towards and / or into at least a portion of the tapered bottom wall section. This is achieved by overlapping the at least one first magnet section with the at least a portion of the tapered bottom wall section. The second bead collection configuration B may correspond to a resting and / or quasi-resting configuration, in which the transition movement may be substantially slowed down or stopped.

[0026] The "stop" and / or "deceleration" at configuration B may be for the purpose of a sample preparation step, such as the addition of a substance such as a reagent.

[0027] The transition movement from configuration A to configuration B may correspond to a substantial downwards movement of the magnetic bead attraction element or to a substantial upward movement of the test tube-receiving mechanism, while the test tube-receiving mechanism may hold at least one test tube and / or to a substantial upward movement of the test tube. The transition movement from configuration A to configuration B may correspond to a substantial downwards and sideward and / or tilt movement of the magnetic bead attraction element to keep the upper first magnet section close to the outer wall of the test tube. This movement may then not only be a translational movement along one single direction but combined with another translation and / or a tilt. Keeping the distance between the upper first magnet section and the outer wall of the test tube short / small allows to efficiently expose the magnetic beads to the magnetic field of the first magnet section. The transition movement from configuration A to configuration B may correspond specifically to a slow movement that allows substantially all magnetic beads to be slowly dragged downwards, i.e. towards the bottom section of the test tube. In other words, the transition movement should be slow enough with the intention of pulling down substantially all the beads. The magnetic bead attraction element and the test tube-receiving mechanism may be at least partially movably arranged relative to each other to allow a translational movement of the magnetic bead attraction element and / or the test tube-receiving mechanism and / or the test tube, when being received by the test tube-receiving mechanism. Specifically, the translational movement may comprise a deceleration and / or a stop, more specifically the translational movement comprises a deceleration and / or a stop near or at the second bead collection configuration. The configurations A and B may therefore be reached by a translational movement of the magnetic bead attraction element and / or the test tube-receiving mechanism and / or the test tube.

[0028] It may in some cases comprise the situation in which a mechanism inside the test tube-receiving mechanism may be movably arranged relative to the magnetic bead attraction element; for example a roller mechanism coupled to a driver may be configured to cause a translational movement of the test tube when being received. Therefore, the magnetic bead attraction element and / or the test tube-receiving mechanism may cause a relative movement between the magnetic bead attraction element and the test tube. This relative movement may be caused by a movement of the magnetic bead attraction element (downwards) against a resting test tube or by a movementof the test tube (upwards) against a resting magnetic bead attraction element or by a movement of the test tube (upwards) against a moving magnetic bead attraction element (downwards). “The magnetic bead attraction element and the test tube-receiving mechanism are at least partially movably arranged relative to each other between configurations A and B” means that at least one or more parts of the magnetic bead attraction element and / or the test tube-receiving mechanism are movably arranged relative to each other.

[0029] The movement of the test tube may be caused by a moving test tube-receiving mechanism or by a mechanism in the test tube-receiving mechanism that controls a movement of the test tube such as a roller mechanism that causes a movement of the test tube with respect to the test tube-receiving mechanism.

[0030] The speed of the transition movement from configuration A to configuration B may, without limitation, may range between around 0, 1 mm / s to 50 mm / s, specifically between around 0,5 mm / s to 25 mm / s or 0,5 mm / s to 15 mm / s, more specifically between around 2 mm / s to 10 mm / s. These speed ranges may be advantageous to allow that the magnetic force exerted by the attraction element on the magnetic beads remains great enough to move (e.g. drag down) the majority, ideally all of the magnetic beads present in a vial. The speed ranges may be adapted to the viscosity of IVD samples (e.g., blood). The speed may be calculated to ensure the magnetic force overcomes viscous drag, specifically allowing for a high recover (e.g. around 90-97% recovery).

[0031] In other words, the magnetic bead attraction element and / or the test tube-receiving mechanism may cause a relative movement - between the magnetic bead attraction element and the test tube -that may have a speed that is slow enough to allow effective dragging of the magnetic beads downwards, i.e. towards the bottom section of the test tube.

[0032] The transition movement (i.e. the relative movement between the magnetic bead attraction element and the test tube) from configuration A to configuration B may comprise a stop or at least a slowing down of the transition movement when the second bead collection configuration B is reached. The stop or the “slowing down” may be of the nature that the transition movement is respectively decelerated / slowed down to a stop or a quasi-stop (i.e. a transition movement that is slowed down from fastest to slowest between the configurations by around 70-99%). During a stop that may last for at least around 0,3s a preparation step of the beads may be performed. For example, a substance may be added to the test tube when the configuration B is reached. Therefore, in preferred embodiments the transition between the first bead collection configuration A and the second bead collection configuration B does not refer to a transition between to states / positions that are inherently adopted and / or passed when fully removing the test tube from the magnetic bead attraction element.

[0033] The sample-processing device for magnetic bead-based sample processing may comprise a controller and / or an actuator and / or a motor configured to drive the translational movementbetween configuration A and configuration B, specifically at a slow controlled speed, more specifically between around 0,5 mm / s to 25 mm / s, and even more specifically between around 2 mm / s to 10 mm / s to drag substantially all magnetic beads or at least around 90%, specifically at least 95% and more specifically at least 97% of the magnetic beads from the main tube wall section into the tapered bottom wall section allowing in some cases that they remain immersed in the sample liquid.

[0034] The first bead collection configuration A may be characterized in that the contour of the magnetic bead attraction element is best positioned to match and / or approximate the contour of the test tube. The first bead collection configuration A and the second bead collection configuration B may be distanced from each other by about 0,2cm to 10cm, specifically by about 0,5cm to 4cm and more specifically by about 0,7cm to 2cm.

[0035] The magnetic bead attraction element can generate one or several magnetic fields to which the magnet beads can be exposed. The magnetic beads typically comprise a paramagnetic material that is sensitive to magnetic fields and that can be non-permanently magnetized resulting in the formation of a magnetic north pole and a magnetic south pole when exposed to a magnetic field. Therefore, the magnetic bead attraction element can attract some or ideally all of the magnetic beads inside a test tube.

[0036] The term "tapered" describes an object that gradually decreases in width or diameter from one end to the other. This narrowing can be designed in various shapes, including a conical form, a rounded and / or a curved form. Therefore, conical, rounded and / or otherwise curved forms can be considered tapered, as long as the object's width reduces progressively towards one end.

[0037] When having a conical bottom, the test tube narrows in a substantially straight line from the main tube wall section to the tip of the bottom, resembling a cone. This is for example common in other objects like funnels. When having a rounded or curved form, the tapering occurs in a smooth, curved manner, creating a more gradual transition.

[0038] Tapered bottom wall sections are common in laboratory vessels. Lab vessels often have a tapered form for several practical reasons, including a more correct volume measurement, a reduction of dead volume, facilitation of pouring and transfer, centrifugation, fitting and sealing and / or ease of cleaning. For example, tapered designs often feature volume markings that are more precise for smaller quantities of liquid, making measurements more accurate at different levels. Specifically, the narrow end reduces the dead volume of remaining liquid after aspiration. Alternatively, or in addition, the narrow end makes it easier to pour liquids accurately and transfer substances without spilling. Alternatively, or in addition, in centrifuge tubes, a tapered bottom helps concentrate and collect sediments at the narrow point, making it easier to separate the supernatant from the pellet. Alternatively, or in addition, tapered ends can provide a better fit in holders, racks, or closures, ensuring secure sealing and stability during experiments. Alternatively, or in addition, taperedforms can be easier to clean because the smooth transition helps in removing residues that might otherwise stick to sharp angles. These functional benefits make tapered lab vessels essential for efficient and precise scientific work.

[0039] The main tube wall section of a test tube may correspond to a cylindrical or an almost cylindrical tube wall section. In other words, the main tube wall section may have a shape of a cylinder or a cylinder-like form. A cylinder-like form may correspond to a form in which the side wall is not shaped like a plane barrel (a non-bulgy barrel) as it would be the case for a cylinder but in which the side wall is slightly tapered and / or inclined, specifically the side wall may deviate from a cylinder wall by about 0,1° to 8°, specifically by about 0,2° to 5° and more specifically by about 0,5° to 2° having the effect that a liquid may glide down the wall towards the bottom specifically the conical bottom. The main tube wall section may have a shape that is different from a cylindrical or an almost cylindrical tube wall section, such as a polygonal shape.

[0040] Test tubes, also denoted “laboratory tubes”, such as culture tubes, microtubes, PCR tubes, cell culture tubes, NMR tubes and / or centrifuge tubes, are commonly constructed from plastic and in some cases from glass and may serve multiple scientific functions. The test tubes described herein correspond to cylindrical (tube-like) vessels having a tapered bottom and / or tip, specifically a conically-shaped or a rounded bottom, often marked with volume indicators to gauge liquid quantities. They are versatile tools used for mixing, transporting, and / or storing small liquid samples.

[0041] A test tube, which may also be considered a sample tube, may comprise at least one of the following products: any kind of Eppendorf® tube; any kind of Corning® Falcon® tube; any kind of Greiner® tube; any kind of Pyrex® tube; any kind of BRAND® tube or others, specifically, BRAND® Test Tubes, Graduated, Glass; BRAND® Universal Sample Tubes; DURAN® Test Tubes; Corning® Falcon® Round Bottom Test Tubes; Eppendorf® Centrifuge Tubes; Greiner Centrifuge Tubes; TPP® Centrifuge Tubes; Nalgene® Centrifuge Tubes; BRAND® Centrifuge Tubes; PYREX® Disposable Glass Conical Centrifuge Tubes; Eppendorf® Safe-Lock Micro Test Tubes; MAXYMum Recovery® Microtubes; Clear-view™ Snap-Cap Microtubes; Corning® PCR Tubes; Eppendorf® PCR Tubes; Pyrex® Culture Tubes; Norell® Natural Quartz NMR Tubes; Bruker® SampleJet NMR Tubes; Wilmad® Quartz NMR Tubes; Aldrich® ColorSpec® NMR Tubes.

[0042] The volume of the test tube may range between approx. 0,1 mL and approx. 100 mL, specifically between approx. 0,3 mL and approx. 5 mL and more specifically between approx. 0,5 mL and 2 mL.

[0043] The term “overlapping” should be understood as the result of a movement of approaching and bringing two elements, specifically the surfaces (some of the outer surfaces) of the two elements, into a position where portions thereof face each other while being in close proximity or even inphysical contact with each other. In the present case, the term “overlapping the at least one first magnet section with the at least a portion of the main tube wall section” means that a surface of the at least one first magnet section faces - from a close proximity or even being in contact - a surface of the at least a portion of the main tube wall section. Similarly, the term “overlapping the at least one second magnet section with the at least a portion of the tapered bottom wall section” means that a surface of the at least one second magnet section faces - from a close proximity or even being in contact - a surface of the at least a portion of the tapered bottom wall section. The term “close proximity” may specifically refer to a surface-to-surface distance of about less than 10mm, specifically less than 1mm and more specifically less than 0,5mm. A physical contact does not leave a gap between the contacting surfaces or portions of the contacting surfaces, i.e. a distance of about 0 mm. That means that a position where portions of the surface of the first or second magnetic section and the outer surface of the test tube have a surface-to-surface distance of less than 10mm, specifically less than 1mm and more specifically less than 0,5mm while facing each other and as a consequence being in close proximity or even in physical contact with each other. A surface-to-surface distance is the shortest distance between two surfaces. A physical contact may be established for only a point of contact or for an area of contact between the first and / or second magnetic section and the outer surface of the test tube. For example, only one point of the first and / or the second magnetic section may physically contact the outer surface of the test tube. Alternatively, an area of contact of the first and / or the second magnetic section may physically contact an area of the outer surface of the test tube. In another case, an area of contact of the first magnetic section may physically contact an area of the outer surface of the test tube while only a point of the outer surface of the second magnetic section contacts the outer surface of the test tube or while the outer surface of the second magnetic section in brought close to the outer surface of the test tube.

[0044] The phrase “a magnetic bead attraction element comprising at least one first magnet section and at least one second magnet section being oriented at an angle of 90° < a < 180° with respect to the at least one first magnet section” is not to be understood in a sense that the angle a is necessarily permanently fixed angle over time. It may in some embodiments be adjusted and / or adjustable. It may be adjustable in the mentioned range. The angle a may be fixed for a certain amount of time. The magnetic bead attraction element and the test tube-receiving mechanism may be at least partially movably arranged relative to each other via a translational movement of the magnetic bead attraction element and / or the test tube-receiving mechanism and / or the test tube, when being received by the test tube-receiving mechanism, specifically the translational movement may comprise a deceleration and / or a stop, and more specifically the translational movement may comprise a deceleration and / or a stop near or at the second bead collection configuration. “Near” means around a distance from a position that relates and / or corresponds to the second beadcollection configuration that ranges from around 1cm to 0,1cm, specifically from around 0,7 to 0,2cm.

[0045] The magnetic bead attraction element and the test tube-receiving mechanism may be movably arranged relative to each other between configurations comprising:

[0046] a first bead collection configuration A, in which the magnetic bead attraction element is positioned with respect to the test tube, when being received by the test tube-receiving mechanism, such that the at least one first magnet section overlaps with at least a portion of the main tube wall section and the at least one second magnet section overlaps with at least a portion of the tapered bottom wall section;

[0047] a second bead collection configuration B, in which the magnetic bead attraction element is positioned with respect to the test tube when being received by the test tube-receiving mechanism, such that the at least one first magnet section overlaps with at least a portion of the tapered bottom wall section; and

[0048] a removal configuration in which the magnetic bead attraction element and / or the test tubereceiving mechanism are removed from each other.

[0049] The removal configuration in which the magnetic bead attraction element and / or the test tubereceiving mechanism are removed from each other may be characterized in that the nearest distance between the test tubes received by the test tube-receiving mechanism and the magnetic bead attraction element does not allow contact between the test tubes received by the test tubereceiving mechanism and the magnetic bead attraction element and / or close vicinity of the test tubes received by the test tube-receiving mechanism and the magnetic bead attraction element and / or exposure of any part of the test tubes received by the test tube-receiving mechanism to the magnetic fields of the magnetic bead attraction element. The removal configuration may be or may comprise a configuration in which the magnetic fields should be substantially removed from the test tubes and the containment such as the magnetic beads inside the test tubes such that the magnetic field does not attract the magnetic particles. Therefore, the removal configuration may (as an approximation) be denoted a “magnetic field removal configuration”. However, in fact the field is never completely removed. Therefore, to be technically correct, the removal configuration may be considered a configuration in which the magnetic bead attraction element is far enough positioned from the test tubes for the magnetic field to be weak enough due to the distance not to attract beads with a significant strength.

[0050] The closest distance between the magnetic bead attraction element and the test tubes received by the test tube-receiving mechanism may range in the removal configuration between approximately 1cm and 3m, specifically between approximately 5cm and 30cm and more specifically between approximately 10cm and 20cm.The removal configuration may be considered in some cases a configuration in which bead attraction element is fully away from the test tubes (e.g. fully below the test tubes without any overlap), therefore, the range of motion may be larger than just between the two configurations A and B. The removal configuration may be realized when re-suspending the magnetic beads in a resuspension liquid.

[0051] The sample-processing device may further comprise at least one actuator to drive the translational movement of the magnetic bead attraction element and / or the test tube-receiving mechanism and / or the test tube between configurations comprising the first bead collection configuration A and the second bead collection configuration B, specifically between configurations comprising the first bead collection A configuration, the second bead collection configuration B and a removal configuration in which the magnetic bead attraction element and / or the test tube-receiving mechanism are removed from each other.

[0052] An actuator may be considered in some cases a device that is configured to convert energy into mechanical motion, enabling it to move or control a system or mechanism. It plays a crucial role in various applications by providing precise and controlled movement. An actuator may comprise and / or may correspond to a motor. Specifically, electric motors may be considered as actuators converting electrical energy into rotational or linear motion.

[0053] The actuator may be configured to perform and / or initiate at least one translational movement of one or both of the magnetic bead attraction element and the test tube-receiving mechanism. The term “at least one translational movement” refers to a translation along at least one direction and / or movement axis, specifically back and forth.

[0054] Employing one or more actuators, the sample-processing device may be operated partially or fully automated when being controlled / operated by a controller. The at least one first magnet section may comprise and / or correspond to at least one first magnet element and / or the at least one second magnet section may comprise and / or correspond to at least one second magnet element. The at least one first magnet section may comprise and / or correspond to a plurality of first magnet elements and / or the at least one second magnet section may comprise and / or correspond to a plurality of second magnet elements, preferably the plurality of first magnet elements and the plurality of second magnet elements refers to the same number of magnet elements, such as 2, 3, 4, 5, 6, 7, 8, 9, 10, up to 20 or even more. When providing a plurality of first magnet elements and a plurality of second magnet elements, a plurality of samples may be processed at the same time, which makes it very efficient to use the sample-processing device.

[0055] Specifically, the at least one first magnet element and / or the at least one second magnet element may comprise a permanent magnet. More specifically, if a plurality of first magnet elements and a plurality of second magnet elements are provided, each magnet element may comprise or maycorrespond to a permanent magnet. It is specifically simple and cheap to generate / provide a magnetic field, specifically a magnetic field with a high field density by using permanent magnets. Specifically, alternatively or additionally, the at least one first magnet element and / or the at least one second magnet element may have the shape of a plate being elongated along a magnet element length axis and may have a magnet element plane surface for overlapping with and / or contacting the at least one test tube, the magnet element plane surface being defined by a magnet element length measured along the magnet element length axis and a magnet element width measured along a magnet element width axis perpendicular to the magnet element length axis.

[0056] An elongated shape of the first and / or the second magnet element allows for overlapping one magnet element with one test tube along the length axis of the test tube. The magnet beads inside the test tube may therefore be exposed to the magnetic field of one first and / or one second magnet element.

[0057] Specifically, the plate may have a magnet element depth measured along a magnet element depth axis that is perpendicular to the magnet element length axis and the magnet element width axis. The depth may be optimized for a max. energyproduct BxH, which depends on the magnetic material. Usual values for d / 1 range from 0,8 to 1,2 for NdFeB and from 2 to 5 for ferrites. Due to design space considerations the dimensions may however deviate from the optimum and / or range around the optimum by approx. + / - 30% to 2%.

[0058] In other words, the first and / or the second magnet element may have the shape of a plate and / or a thin sheet and / or a chip. The first and / or the second magnet element may have a length of approx.

[0059] 0,5 cm to 15 cm, specifically of approx. 0,8 cm to 7 cm and more specifically of approx. 1 cm to 3 cm. The first and / or the second magnet element may have a width of approx. 0,2 cm to 2 cm, specifically of approx. 0,5 cm to 1,5 cm and more specifically of approx. 0,8 cm to 1,3 cm. The first and / or the second magnet element may have a depth of approx. 0,1 cm to 1 cm, specifically of approx. 0,15 cm to 0,5 cm and more specifically of approx. 0,2 cm to 0,4 cm. All the first and the second magnet elements may have the same shape.

[0060] The at least one first magnet element may correspond to a plurality of n or n+2 first magnet elements and / or the at least one second magnet element may correspond to a plurality of n or n+2 second magnet elements. This allows purification of multiple samples provided in multiple test tubes.

[0061] Specifically, all first and second magnet elements may generate substantially the same magnetic field (having the same field strength profile) either from a magnetic north pole or a magnetic south pole.

[0062] Some or each of the plurality of n or n+2 first magnet elements and / or some or each of the plurality of n or n+2 second magnet elements may have the shape of the plate. If all first magnet elementsand / or all second magnet elements have the same shape, a very uniform purification result may be achieved for the samples provided in the plurality of the n test tubes.

[0063] The plurality of n or n+2 first magnet elements may be arranged side-by-side in that / such that respective edges of all of the first magnet elements are aligned along one line with each other parallel to the magnet element width axis and the magnet element length axis of each of the n or n+2 first magnet elements are aligned parallel to each other at a center-to-center distance. The center-to-center distance of two first magnet elements and the center-to-center distance of two second magnet elements may be identical and may be identical for all first magnet elements and all second magnet elements. In that case, a very uniform purification result may be achieved for the samples provided in the plurality of the n test tubes.

[0064] The plurality of n or n+2 second magnet elements may be arranged side-by-side in that / such that respective edges of all of the second magnet elements are aligned along one line with each other parallel to the magnet element width axis and the magnet element length axis of each of the n or n+2 second magnet elements are aligned parallel to each other at a center-to-center distance. The plurality of n or n+2 first magnet elements and the plurality of n or n+2 second magnet elements may be arranged side-by-side in that / such that the respective edges of all of the first magnet elements and of all of the second magnet elements along the magnet element width axis are parallel to each other.

[0065] In other words, all first magnet elements may be provided side by side to each other and / or all second magnet elements may be provided side by side to each other. Moreover, all first magnet elements may be provided above all second magnet elements such that each first magnet element may have at least one other neighboring first magnet element either to one side or to both sides (right and left) and each first magnet element may have one neighboring second magnet element below. Specifically, all second magnet elements may be provided below all first magnet elements such that each second magnet element may have at least one other neighboring second magnet element either to one side or to both sides (right and left) and each second magnet element may have one neighboring first magnet element above.

[0066] As already described previously, the test tube-receiving mechanism may be configured for receiving a plurality of n test tubes. Specifically, the test tube-receiving mechanism may be configured for receiving the plurality of n test tubes in a side-by-side arrangement with a length axis of each of the plurality of n test tubes being parallel to each other and at a center-to-center distance between two neighboring test tubes that corresponds to the center-to-center distance of the first magnet element and / or the second magnet elements. Specifically, each of the plurality of n test tubes may be centered with respect to its own length axis and the length axis of one of the plurality of the n or n+2 first magnet elements and / or the length axis of one of the plurality of the n or n+2 second magnet elements.If a plurality of n first magnet elements and a plurality of n second magnet elements is provided, each of a plurality of n test tubes may be attributed to overlap at least partially with one pair of one first and one second magnet elements of the plurality of n first and second magnet elements. Therefore, the test tube-receiving mechanism may have a capacity to receive n test tubes such that n test tubes can be received by the test tube-receiving mechanism. This means that a pair of one first and one corresponding / neighboring second magnet elements may at least partially be overlapped with one test tube in at least one possible configuration. In this case, a uniform purification result for the samples in all test tubes may be expected, as each test tube is exposed to the same magnetic field profile in absolute values, i.e. the vector field either having a + or a - sign. If a plurality of n+2 first magnet elements and a plurality of n+2 second magnet elements is provided, each of a plurality of n test tubes may still be attributed to overlap at least partially with one pair of one first and one second magnet elements of the plurality of n+2 first and second magnet elements. To both sides of the fully occupied test tube-receiving mechanism, one pair of one first and one second magnet elements may remain “free”, i.e. not overlapped with a test tube. Hence, in sum two pairs of one first and one second magnet elements may remain “free”, i.e. not overlapped with a test tube. This is advantageous as the content of all test tubes are exposed to the same magnetic fields / magnetic field profiles in total (i.e. + or -). Each test tube may not only be exposed to the attributed pair of one first and one second magnet elements but also to the neighboring first and second magnet elements depending on the field strength and the distance between two neighboring pairs of one first and one second magnet elements. Leaving the pairs of one first and one second magnet elements to both ends of the magnetic bead attraction element free, therefore avoids a different purification result for the test tubes that would be overlapped therewith. The pairs of one first and one second magnet elements to both ends of the magnetic bead attraction element may therefore only serve to provide magnetic fields to the test tubes that are actually attributed to the inner neighboring pairs of one first and one second magnet elements. Therefore, a very homogeneous purification result may be achieved for the samples provided in the plurality of the n test tubes.

[0067] Each of the plurality of n or n+2 first magnet elements may comprise a permanent magnet and / or each of the plurality of n or n+2 second magnet elements may comprise a permanent magnet. Specifically, the magnet element plane surface of each of the plurality of n or n+2 first magnet elements and of each of the plurality of n or n+2 second magnet elements may exhibit a magnetic pole corresponding to a magnetic north pole or a magnetic south pole. Specifically, the magnet element plane surfaces of the plurality of n or n+2 first magnet elements being arranged side-by-side to one another may exhibit alternating magnetic poles or same magnetic poles, and / or the magnet element plane surfaces of the plurality of n or n+2 second magnet elements being arranged side-by-side to one another may exhibit alternating magnetic poles or same magnetic poles, and / or the plurality of n or n+2 first magnet elements and / or the plurality of n or n+2 second magnetelements being arranged side-by-side to each other and may exhibit alternating magnetic poles or same magnetic poles.

[0068] The lateral “free” magnet pairs act as magnetic buffers that normalize the magnetic flux density for the internal n positions, effectively shifting the boundary -induced field distortion outside the sample-processing area.

[0069] The sample-processing device may be configured for receiving a plurality of n test tubes, which may be characterized in that the magnetic bead attraction element comprises n+2 first magnet elements and n+2 second magnet elements, arranged such that two pairs of magnet elements remain not overlapped with a test tube at the lateral ends of the magnetic bead attraction element. Magnetic field lines at the ends of a magnet array typically diverge or weaken. By adding "free" magnet pairs at both ends, the n test tubes in the center are all exposed to identical, undistorted magnetic field profiles. This ensures that samples in the outermost tubes of a rack undergo the same purification efficiency as those in the middle, a critical requirement for standardized IVD testing.

[0070] The magnetic bead attraction element may be coupled to the actuator via a hinge having a tipping axis, and further comprising a spring configured to exert a force that causes the magnet sections to resiliently push against and glide along the outer walls of the test tubes during translational movement.

[0071] The spring mechanism may automatically compensate for minor misalignments or variations in test tube diameter, ensuring the magnets do not lose contact during the downward dragging phase. This allows the vertical translation to be an active, motor-driven process while the "contourfollowing" tilt is a passive, resilient process, reducing the mechanical complexity required to handle different vessel shapes.

[0072] The system may incorporate one or more sensors configured to detect the physical characteristics of a sample vial, such as its distance from the processing head, its diameter, its height, and its specific geometric profile. The sensor may comprise a laser displacement sensor, such as a time-of-flight or triangulation sensor, that performs a vertical scan of the vial as the actuator moves. The technical effect of this embodiment may be provided in the generation of a high-resolution topographical map of the vial's exterior, allowing the system to identify the precise transition points between the vial neck, body, and tapered base. It may allow a high-resolution mapping of transition points (neck / body / taper).

[0073] Alternatively or in addition, the system may utilize an optical vision sensor (e.g. a CMOS vision sensor) and / or an image processor to capture a silhouette of the vial, providing the technical effect of instantaneous identification of the vial type from a pre-defined library of consumables, whichfacilitates a "plug-and-play" workflow without manual user input to allow silhouette recognition (e.g. instant "plug-and-play" identification from a consumable library).

[0074] Alternatively, or in addition, an ultrasonic sensor may be employed to measure the distance to the vial, providing the technical effect of reliable detection regardless of the optical properties of the vial material, such as transparency, color, or the presence of reflective condensation on the outer wall.

[0075] The data gathered by one or more of these sensors may be transmitted to a controller that dynamically adjusts the movement of the actuator. Based on the sensed distance and shape, the actuator may adjust the tilt angle of the magnetic rod and / or the processing head to align with the internal slope of the vial wall. The primary technical effect of this adaptive alignment may be provided in the optimization of magnetic bead recovery; by maintaining a minimal and consistent gap between the magnet and the vial wall, the magnetic field gradient is maximized at the site of bead accumulation, thereby preventing loss of the magnetic pellet during wash steps.

[0076] Furthermore, the sensing system may provide the technical effect of active collision avoidance. By verifying the expected position and orientation of the vial before the processing head descends, the system prevents mechanical damage to the magnetic rods and avoids cross-contamination events caused by the processing head striking the rim of an improperly seated vial. Finally, the ability to calculate the exact depth and angle of the vial's lowest point allows the actuator to position the processing tools to minimize residual dead volume, significantly enhancing the efficiency of elution and reducing the waste of expensive biochemical reagents.

[0077] The combination of providing an actuator, a sensor and a feedback pathway allows for an adaptive tilt between the first and second bead attraction elements, specifically to minimize the air gap and to maximize magnetic field gradient for recovery.

[0078] The magnetic bead attraction element may comprise a first metal support wall section to support the at least one first magnet section, and / or the magnetic bead attraction element may comprise a second metal support wall section to support the at least one second magnet section, specifically, the first metal support wall section and / or the second metal support wall section may comprise a magnetizable and / or ferromagnetic material, and / or the second metal support wall section may be oriented at an angle of 90° < a < 180° with respect to the first metal support wall section.

[0079] The first and second metal support walls may serve to support the first magnet elements and the second magnet elements, respectively. Further, if comprising a magnetizable and / or ferromagnetic material, the first and second metal support walls may serve to enhance the magnetic fields generated by the first magnet elements and the second magnet elements.The at least one second magnet section may be oriented at an angle of approx. 130° < a < 180°, specifically of approx. 145° < a < 175° and more specifically of approx. 150° < a < 170° or 150° < a < 160° with respect to the at least one first magnet section.

[0080] These angle ranges for a may be particularly useful for resembling the real conically-shaped tip of a test tube as typically used in a lab, which may range between approx. 130° < 0 < 180°, specifically between approx. 145° < 0 < 175° and more specifically between approx. 150° < 0 < 170°, where 0 corresponds to the angle on the inner side of the tube between the main tube wall section and the tapered bottom wall section.

[0081] The at least one second magnet section and / or the at least one first magnet section may be pivotally mounted with respect to a rotational axis between the at least one first magnet section and the at least one second magnet section. Therefore, the angle a may be adjusted for example in a range between approx. 0° and 180°, specifically in a range between approx. 130° < a < 180°, more specifically in a range between approx. 145° < a < 175° and more specifically in a range between approx. 150° < a < 170°. This may allow to resemble, fit and / or match the outer contour of any kind of test tube with tapered bottom section. The adjustment may be achieved by manual adjustment and / or by automatic adjustment performed by an angle adjustment actuator for example. The angle adjustment actuator may for example tilt the position of the second and / or the first magnet section to approx, or perfectly match the outer contour of the test tube.

[0082] The at least one first magnet section and the at least one second magnet section may be pivotally mounted with respect to a rotational axis located between them, and further comprising an angle adjustment actuator configured to dynamically adjust the angle a to match the outer contour of the test tube. The angle a may hence be dynamically adjusted by an actuator during the transition from configuration A to B, specifically to allow to maintain constant surface contact pressure against the test tube wall. This allows the device to adapt to different test tube taper angles automatically. By providing a pivot point at the axis RA, the device can be configured to precisely match or at least approximate the specific taper angle 0 of various test tube types (e.g., conical vs. rounded bottom). The adjustable configuration ensures that the magnet elements maintain physical contact or close proximity, specifically an equal and / or constant distance (surface-to-surface distance < 1mm) across both the main wall and tapered section. Minimizing the air gap may maximize the magnetic field gradient at the inner wall, which is advantageous for pulling beads through viscous sample fluids where drag is significant.

[0083] According to an aspect, which may be considered a second aspect, a sample processing system, comprises the sample-processing device according to the first aspect or any one of the described embodiments and the at least one test tube.The at least one test tube is therefore comprised by this system together with the sample-processing device. All advantages and embodiments described for the sample-processing device may apply to the sample processing system.

[0084] According to another aspect, which may be considered a third aspect, a sample-processing device for magnetic bead-based sample processing, the sample-processing device comprises: A magnetic bead attraction element comprising at least one first electromagnetic element configured to generate a first magnetic field and at least one second electromagnetic element configured to generate a second magnetic field, the at least one first electromagnetic element and the at least one second electromagnetic element being oriented at an angle of 90° < a < 180° with respect to the at least one first electromagnetic element; A test tube-receiving mechanism for receiving at least one test tube with a main tube wall section and a tapered bottom wall section for containing a sample liquid with magnetic beads; and At least one controller configured to individually control the at least one first electromagnetic element and the at least one second electromagnetic element to individually activate, deactivate, and / or adjust the first and second magnetic fields. The controller may be configured to generate a gradient shift between the at least one first electromagnetic element and the at least one second electromagnetic element, specifically configured to drag the magnetic beads from the main tube wall section into the tapered bottom wall section.

[0085] This sample-processing device according to the third aspect differs from that according to the first aspect in that the magnetic bead attraction element is not required to be moved between the first A and the second bead collection configuration B as the fields can be individually generated, adjusted and removed by separately controlling the at least one first electromagnetic element and at least one second electromagnetic element. All features and advantages of the sample-processing device according to the first aspect or embodiments thereof may apply to the sample-processing device according to the third aspect. Even though the translation between the configurations is not required in the third aspect it may be combined therewith.

[0086] According to an aspect, which may be considered a fourth aspect, a method for magnetic beadbased sample processing, specifically sample pre-processing, such as analyte and / or substance enrichment and / or purification comprises: providing at least one test tube having a main tube wall section and a tapered bottom wall section and containing a sample liquid and magnetic beads dispersed on the sample liquid; attracting, in a first bead collection configuration A, at least a portion of the magnetic beads to the main tube wall section by means of a magnetic field; attracting, in a second bead collection configuration B, at least a portion of the magnetic beads to the tapered bottom wall section by means of a magnetic field; aspirating at least a portion of the sample liquid from the at least one test tube; adding a re-suspension liquid; removing the magnetic field and re-suspending at least a portion of the magnetic beads in the re-suspension liquid.The transition from the first bead collection configuration to the second bead collection configuration may be performed by a translational movement at a speed slow enough to maintain the attraction of substantially all magnetic beads such that they are dragged downwards from the main tube wall section into the tapered bottom wall section while remaining immersed in the sample liquid.

[0087] Moving the beads down before aspiration prevents them from being "marooned" on upper walls that will no longer be covered by liquid once the volume is reduced. By concentrating the beads into the narrow-tapered bottom (Configuration B) before adding elution buffer, the device optimizes the surface-to-volume ratio for subsequent steps, directly improving IVD test sensitivity. Moving the beads into the taper while remaining immersed may prevent the beads from being "marooned" on dry walls during aspiration.

[0088] The method may preferably be performed in exactly this order:

[0089] 1. providing at least one test tube having a main tube wall section and a tapered bottom wall section and containing a sample liquid and magnetic beads dispersed on the sample liquid;

[0090] 2. attracting, in a first bead collection configuration A, at least a portion of the magnetic beads to the main tube wall section by means of a magnetic field;

[0091] 3. attracting, in a second bead collection configuration B, at least a portion of the magnetic beads to the tapered bottom wall section by means of a magnetic field;

[0092] 4. aspirating at least a portion of the sample liquid from the at least one test tube;

[0093] While the steps of adding a re-suspension liquid and removing the magnetic field and resuspending at least a portion of the magnetic beads in the re-suspension liquid may be switched and / or overlap each other.

[0094] In step 2, which refers to attracting, in a first bead collection configuration A, at least a portion of the magnetic beads to the main tube wall section by means of a magnetic field, also a portion of the magnetic beads may be attracted to the tapered bottom wall section. In fact, the magnetic beads may be attracted to a portion of the main tube wall section and to a portion of the tapered bottom wall section however preferably not to the very bottom tip of the tapered bottom wall section. In step 3, which refers to attracting, in a second bead collection configuration B, at least a portion of the magnetic beads to the tapered bottom wall section by means of a magnetic field, the magnetic beads, which are attracted to the wall, are dragged downwards to be concentrated in a lower position, namely in the tapered bottom wall section, however not necessarily to the very bottom tip of the tapered bottom wall section or in some case preferably not necessarily to the very bottom tip of the tapered bottom wall section.Importantly, the beads are being dragged down in general, while the distance and position can vary. The extent (or distance) of how much / far the beads are dragged down may in some cases be very small, e.g. several mm. In some cases, it is also possible that beads are dragged down from a higher point within the main tube wall section to a lower point of the main tube wall section (and not dragging down all the way to the tapered bottom wall section).

[0095] Aspiration is in this variant started after the attraction of the beads to the wall position in configuration B, because the movement from A to B serves the purpose of pulling down the beads from the upper part of the vessel to the lower part; this is advantageous for enrichment / concentration of a sample: from one step to the next the volume is reduced, meaning that the liquid level before bead separation will be higher than after the resuspension, which could lead to beads being stuck (and therefore lost) on the upper part of the vessel which will not be covered with liquid again.

[0096] Step 5., which refers to adding a re-suspension liquid and step 6., which refers to removing the magnetic field and re-suspending at least a portion of the magnetic beads in the re-suspension liquid, may be performed in that exact order or in the opposite order such that the magnetic fields are removed, the re-suspension liquid is added and the magnetic beads are re-suspended. Removing the magnetic field(s) may be realized by establishing the removal configuration. Resuspending the magnetic beads should not take place under the influence of the magnetic fields. If the re-suspension liquid is added after removal of the magnetic fields, at least some of the magnetic beads may have been dragged down towards the very bottom of the test tube by the movement of the magnetic fields downwards. In addition, if some magnetic beads remain seated on the side wall of the tapered bottom wall section, the re-suspension liquid may wash these beads off of the wall down towards the very bottom of the test tube.

[0097] The method may alternatively be performed in another order, namely

[0098] 1. providing at least one test tube having a main tube wall section and a tapered bottom wall section and containing a sample liquid and magnetic beads dispersed on the sample liquid; 2. attracting, in a first bead collection configuration A, at least a portion of the magnetic beads to the main tube wall section by means of a magnetic field; 3. aspirating at least a portion of the sample liquid from the at least one test tube; 4. attracting, in a second bead collection configuration B, at least a portion of the magnetic beads to the tapered bottom wall section by means of a magnetic field; 5. adding a re-suspension liquid; 6. removing the magnetic field and re-suspending at least a portion of the magnetic beads in the re-suspension liquid, while 5 and 6 may overlap or may be switched.

[0099] The method may further comprise the step of moving of a magnetic bead attraction element having at least one first magnet section and at least one second magnet section and / or moving of the test tube between: the first bead collection configuration A, specifically in which the at least one first magnet section overlaps with at least a portion of the main tube wall section and the at least onesecond magnet section overlaps with at least a portion of the tapered bottom wall section; and the second bead collection configuration B, specifically in which the at least one first magnet section Ila overlaps with at least a portion of the tapered bottom wall section 16.

[0100] The method may further comprise the step of providing the at least one second magnet section at an angle of 90° < a < 180° with respect to the at least one first magnet section.

[0101] The method or any embodiment thereof may correspond to and / or utilize and / or be performed or combined with the sample-processing device of the aspects or embodiments thereof.

[0102] Detailed Descriotion of the Invention

[0103] In the following, some example embodiments will be described in detail, wherein the invention should not be understood to be limited to the examples and embodiments described. The following examples, embodiments and figures are provided to aid the understanding of the present invention, the true scope of which is set forth in the appended claims. Single features being described in a particular embodiment may be arbitrarily combined, given that they are not excluding each other. In addition, different features, which are provided together in the example embodiments are not to be considered restrictive to the invention or the embodiment.

[0104] Skilled artisans appreciate that elements in the figures are illustrated for simplicity and clarity and have not necessarily been drawn to scale. For example, the dimensions of some of the elements in the figures may be exaggerated relative to other elements whereas other elements may have been left out or represented in a reduced number in order to enhance clarity and improve understanding of the aspects of the present disclosure.

[0105] The same reference numerals are used among different embodiments and examples for the same or similar elements or elements that have similar or the same effects.

[0106]

[0107] Fig. la is a picture of a magnetic bead attraction element with a plurality of magnet elements, according to the prior art;

[0108] Fig. la is a picture of a plurality of test tubes having magnetic beads sticking to the inner surface of their walls as a result of attracting the magnetic beads by means of the magnetic bead attraction element;

[0109] Fig. 2a is a schematic drawing of a magnetic bead attraction element placed on the outer wall of a test tube in the first bead collection configuration, according to an embodiment;

[0110] Fig. 2b is a picture of a test tube;

[0111] Fig. 3a is a picture of a magnetic bead attraction element with a plurality of magnet elements, according to an embodiment;Fig. 3b is a schematic front view drawing of a plurality of test tubes positioned side-by-side to each other, according to an embodiment;

[0112] Fig. 3c is a schematic top view drawing of a plurality of test tubes positioned side-by-side to each other, according to an embodiment;

[0113] Fig.4a-4d are schematic side view drawings of a sample-processing device in different operational configurations with respect to a test tube containing a magnetic beads, according to an embodiment;

[0114] Fig. 5a and 5b are schematic perspective view drawings of a magnetic bead attraction element with and without first and second magnetic elements, respectively, according to an embodiment;

[0115] Fig- 6 is a picture of a magnetic bead attraction element with a plurality of magnet elements, according to an embodiment; and

[0116] Fig- 7 is a flow chart of a method for magnetic bead-based sample processing, according to an embodiment.

[0117] Fig. la is a picture of a prior art magnetic bead attraction element and Fig. la is a picture of a plurality of test tubes having magnetic beads sticking to the inner surface of their walls as a result of attracting the magnetic beads by means of the magnetic bead attraction element of Fig. la as described above.

[0118] Fig. 2a is a schematic drawing of a magnetic bead attraction element 10 placed on the outer wall 14a of a test tube 14 in the first bead collection configuration A, according to an embodiment. Fig.

[0119] 2b is a picture of a test tube 14 according to an example.

[0120] The magnetic bead attraction element 10 comprises a first magnet section Ila, that is an upper magnet section and a second magnet section 12a, that is a lower magnet section. The second magnet section 12a is oriented at an angle of 90° < a < 180° with respect to the first magnet section 1 la to match or at least resemble the outer surface 14a of the test tube 14 that has a main tube wall section 15 and a tapered bottom wall section 16. The tapered outer surface 14a of the test tube 14 is defined by an angle 0, wherein 90° < 0 < 180°. Specifically, 0 may range between approx. 130° < 0 < 180°, specifically of approx. 145° < 0< 175° and more specifically of approx. 150° < 0 < 170° (as shown in Fig. 2a and 2b), where 0 is the angle between the inner walls of the main tube wall section and the tapered bottom wall section. Therefore, the angle a may correspond to or at least resemble the angle 0. Specifically, a may range between approx. 130° < a < 180°, specifically of approx. 145° < a< 175° and more specifically of approx. 150° < a < 170° (as shown in Fig.2a and 2b). In one specific embodiment, a equals 0, for example having a value of approx.

[0121] 167° + / - 3°.In Fig. 2a and 2b, the orientation of the magnetic bead attraction element 10 and the test tube 14 is shown as operated in a normal case with respect to the gravitational direction G, indicated by an arrow in Fig. 2a. The gravitational direction G is directed parallel to the z-axis of the indicated room coordinates x, y, z. In that orientation, the first magnet section Ila is the upper magnet section and the second magnet section 12a is the lower magnet section. The angle a is measured between the first and the second magnet section Ila, 12a around the axis RA, wherein the axis RA is located between the first and the second magnet section Ila, 12a parallel to the indicated xy-plane, in the typical operational state.

[0122] The angle 0 defining the tapered shape of the test tube 14 is measured on the inner wall between the main tube wall section 15 and the tapered bottom wall section 16 (see Fig. 2b).

[0123] In the embodiment of Fig. 2a, the first magnet section Ila comprises a first magnet(ic) element 11 and the second magnet section 12a comprises a second magnet(ic) element 12, which are each positioned on a support wall, which may comprise a first metal support wall section 21 and second metal support wall section 22. The first magnet section Ila and the second magnet section 12a may be in a fixed (non-changeable) relation with each other or the first magnet section Ila and the second magnet section 12a may be in a tiltable / pivotable (changeable) relation with each other, such that one or both of them may rotate and / or pivot around the axis RA which may then be considered a rotational axis RA.

[0124] In the embodiment of Fig. 2a, the first bead collection configuration A is shown, in which the magnetic bead attraction element 10 is positioned with respect to the test tube 14, when being received by the test tube-receiving mechanism (not shown in this figure), such that the first magnet section Ila overlaps with at least a portion of the main tube wall section 15 and the second magnet section 12a overlaps with at least a portion of the tapered bottom wall section 16. In more detail, the first magnet section Ila contacts at least a portion of the main tube wall section 15 and the second magnet section 12a contacts at least a portion of the tapered bottom wall section 16. The angles a and 0 are substantially identical such that the contact surfaces of the magnet elements 11, 12 fully contact a portion of the outer surface 14a of the test tube 14.

[0125] The magnetic bead attraction element 10 comprises a leg 20 and a coupling element 25 that may be coupled directly or indirectly to an actuator (not shown). The coupling element 25 may comprise or correspond to a hinge 25 that has a tipping axis TA around which the magnetic bead attraction element 10 may be rotated and / or tilted and / or tipped at least partially.

[0126] The magnetic bead attraction element 10 may be coupled via the hinge 25 (rotatable around a tipping axis TA) to a motor / actuator to position the magnetic fields of the magnet elements 11, 12 near the respective test tubes 14, a vial and / or a sample container by translation, specifically combined with a rotational movement as a response of the (vertical) translation and to remove the magnetic fields if not needed any longer in a following preparation step (also by translation and / orrotation specifically a combination of translational and rotational movement). The magnetic bead attraction element 10, specifically the hinge 25 may rotate (and / or may be rotated) around a rod (not shown) that is elongated along the tipping axis TA and the rod may be coupled to a motor (not shown) that initiates the translational movement while the rotational movement is due to a force pushing against the magnetic bead attraction element 10 when the translational movement causes the magnetic bead attraction element 10 to contact the vials. A spring force of a spring (not shown) may be provided to cause the rotational movement to resiliently “push back” to ensure contact between the magnetic bead attraction element 10 and the test tubes 14. The translational movement of the magnetic bead attraction element 10 may be a driven and / or active movement driven by a motor while the rotational movement may be a passive movement (against a spring force) when the magnetic bead attraction element 10 glides along the outer walls if the test tubes 14 caused by the translational movement.

[0127] Fig. 3a is a front picture of a magnetic bead attraction element 10 with a plurality of magnet elements 11, 12, according to an embodiment. Fig. 3b is a schematic front view drawing of a plurality of test tubes 14 positioned side-by-side to each other, according to an embodiment. Fig.

[0128] 3c is a schematic top view drawing of a plurality of test tubes 14 positioned side-by-side to each other, according to an embodiment.

[0129] As shown in Fig. 3a, the first magnet section Ila comprises a plurality of first magnet elements 11, namely eight first magnet elements 11 and the second magnet section 12a comprises a plurality of second magnet elements 12, namely eight second magnet elements 12, specifically comprising permanent magnets. In other words, the at least one first magnet element 11 corresponds to a plurality of n=8 first magnet elements 11 and the at least one second magnet element 12 corresponds to a plurality of n=8 second magnet elements 12.

[0130] All first magnet elements 11 and all second magnet elements 12 each have the shape of a (thin) plate being elongated along a magnet element length axis LA (i.e. LAI for the first magnet elements 11 and LA2 for the second magnet elements 12). Each plate has a magnet element plane surface S for overlapping with and / or contacting the corresponding test tube 14. The magnet element plane surface S is defined by a magnet element length L measured along the magnet element length axis LA (i.e. LAI and LA2) and a magnet element width W measured along a magnet element width axis WA (i.e. WAI for the first magnet elements 11 and WA2 for the second magnet elements 12) perpendicular to the corresponding magnet element length axis LA. Each plate has a magnet element depth D measured along a magnet element depth axis DA that is perpendicular to the magnet element length axis LAI, LA2 and the magnet element width axis WAI, WA2.

[0131] The plurality of first magnet elements 11 are arranged side-by-side in that respective edges of all of the first magnet elements 11 are aligned along one line with each other, the line being parallelto the magnet element width axis WAI. The magnet element length axes LAI of the eight first magnet elements 11 are aligned parallel to each other at a center-to-center distance cdl, i.e. the distance between the center widths of two first magnet elements 11.

[0132] The plurality of second magnet elements 12 are arranged side-by-side in that respective edges of all of the second magnet elements 12 are aligned along one line with each other, the line being parallel to the magnet element width axis WA2. The magnet element length axes LA2 of the eight second magnet elements 12 are aligned parallel to each other at a center-to-center distance cd2, i.e. the distance between the center widths of two second magnet elements 12.

[0133] In the present case, the plurality of n first magnet elements 11 and the plurality of n second magnet elements 12 are arranged side-by-side in that the respective edges of all of the first magnet elements 11 and of all of the second magnet elements 12 along the magnet element width axis WAI, WA2 are parallel to each other.

[0134] The distance may also be expressed as an edge-to-edge distance edl, ed2 that corresponds to the distance from an edge of a magnet element to a neighboring edge of a neighboring magnet element. The edge-to-edge distance edl, ed2 may range from about 0 cm (i.e. having a direct contact) to about 3 cm, specifically from about 0,2 cm to about 1,5 cm.

[0135] The test tube-receiving mechanism, which is not shown in the Fig. 3a-3c, is configured for receiving a plurality of n test tubes 14, namely n=8 in the present case. The test tube-receiving mechanism 13 is configured for receiving the plurality of n test tubes 14 in a side-by-side arrangement with a length axis LA3 of each of the plurality of n test tubes 14 being parallel to each other and at a center-to-center distance cd3 between two neighboring test tubes 14 that corresponds to the center-to-center distance cdl) of the plurality of the n first magnet elements and the center-to-center distance cd2 of the plurality of the n second magnet elements.

[0136] Each of the n test tubes 14 is centered with respect to its own length axis LA3 and the length axis LAI of one of the plurality of the n first magnet elements 11 and the length axis LA2 of one of the plurality of the n second magnet elements 12.

[0137] As shown in Fig. 3b-3c, eight test tubes 14, which are all in contact to their next neighbor(s), are shown in a front view (Fig. 3b) and in a top view (Fig. 3c), i.e. the edge-to-edge distance of two neighboring test tubes 14 is 0 cm. The center-to-center distance cd3 between two neighboring test tubes 14 therefore corresponds to the width of one test tube 14 when the test tubes 14 all have the same widths. As an example, without limitation, the test tubes 14 may all have a width / diameter of 9mm on the main tube wall section 15 and a smallest width / diameter of 4,5mm on the tapered bottom wall section 16. Further, without limitation, the test tubes 14 may all have a length of 45mm.In the top view of Fig. 3c, the eight test tubes 14 and the eight first magnet elements 11, each one contacting the outer surface of a corresponding test tube 14, are shown. Each of the test tubes 14 is centered with respect to the corresponding contacting first magnet element 14.

[0138] Fig. 4a-4d are schematic side view drawings of a sample-processing device 100 in different operational configurations A, B with respect to a test tube 14 containing magnetic beads 18, according to an embodiment.

[0139] In Fig. 4a, a magnetic bead attraction element 10, a test tube 14, a test tube-receiving mechanism 13 and an actuator 19 are schematically illustrated. The test tube 14 contains a sample liquid 17 and magnetic beads 18. The test tube 14 comprises a main tube wall section 15 and a tapered bottom wall section, i.e. a conical bottom wall section. In this configuration, the coating of the magnetic beads 18 may have reacted with an analyte of interest that is present in the sample liquid 17.

[0140] The test tube 14 is held by the test tube-receiving mechanism 13. The magnetic bead attraction element 10 comprises a first magnet section Ila with a first magnet element 11 and a second magnet section 12a with a second magnet element 12. The first magnet element 11 and the second magnet element 12 are positioned on a supporting structure, such as a supporting wall which may be magnetic.

[0141] The magnetic bead attraction element 10 comprises a leg 20 and is connected to an actuator 19 that can control the magnetic bead attraction element 10 and the configurations.

[0142] The first bead collection configuration A is shown in this Fig. 4a. In the first bead collection configuration A, the magnetic bead attraction element 10 is positioned with respect to the test tube 14 that is received by the test tube-receiving mechanism 13, such that the at least one first magnet section Ila overlaps with at least a portion of the main tube wall section 15 and the at least one second magnet section 12a overlaps with at least a portion of the tapered bottom wall section 16. In more detail, the first magnet element 11 contacts at least a portion of the main tube wall section 15 and the second magnet element 12 contacts at least a portion of the tapered bottom wall section 16 in the first bead collection configuration A of this embodiment. The magnetic beads 18 are attracted to the inner wall of the test tube 14 in a region of the tapered bottom wall section 16 and the main tube wall section 15.

[0143] Fig. 4a may refer to a method step of providing 401 at least one test tube 14 having a main tube wall section 15 and a tapered bottom wall section 16 and containing a sample liquid 17 and magnetic beads 18 dispersed on the sample liquid 17. Fig. 4a may also refer to a method step of attracting 402, in a first bead collection configuration A, at least a portion of the magnetic beads 18 to the main tube wall section 15 by means of a magnetic field. The magnetic beads 18 are exposed to both magnet sections Ila, 12a.The transition between Fig. 4a and Fig. 4b is realized by (slowly) moving the magnetic bead attraction element 10 downwards along the direction M that is indicated by an arrow. The actuator 19 controls, drives and / or initiates this translation along the direction M.

[0144] In Fig. 4b, the second bead collection configuration B, in which the magnetic bead attraction element 10 is positioned with respect to the test tube 14, such that the at least one first magnet section Ila overlaps with and contacts at least a portion of the tapered bottom wall section 16. As a result thereof, the magnetic beads 18 are pulled downwards into the region of the tapered bottom wall section 16 but preferably not to the very bottom. The second magnet section 12a does not contact the outer surface of the test tube 14 in this configuration B. The magnetic beads 18 are therefore mainly or even only exposed to the first magnet section Ila.

[0145] Fig. 4b may refer to a method step of attracting 403, in a second bead collection configuration B, at least a portion of the magnetic beads 18 to the tapered bottom wall section 16 by means of a magnetic field of the first magnet section Ila and / or the first magnet element 11.

[0146] In Fig. 4c, a syringe 26 is indicated. Fig. 4c may refer to a method step of aspirating 404, in the second bead collection configuration B, at least a portion of the sample liquid 17 from the at least one test tube 14, while the magnetic beads 18 stick to the inner wall of the test tube 14 specifically in the tapered bottom wall section 16. The test tube 14 may only contain the magnetic beads 18 and most or all of the sample liquid 17 may be removed by the syringe 26. The magnetic beads 18 may have captured the analyte of interest if it was present in the sample solution 17.

[0147] Alternatively, the step of aspirating 404 at least a portion of the sample liquid 17 from the at least one test tube 14 may be performed in the first bead collection configuration A while the magnetic beads 18 stick to the inner wall of the test tube 14 specifically in the region of the main tube wall section 15 and potentially in the region of the tapered bottom wall section 16. In that case, the method step of attracting 403 at least a portion of the magnetic beads 18 to the tapered bottom wall section 16 by means of a magnetic field of the first magnet section Ila and / or the first magnet element 11 may follow the step of aspirating. Therefore, the steps may be performed in the temporal order: first 402, second 403, third 404 or instead first 402, second 404, third 403. Even though both orders are possible, the preferred order is 402 - 403 - 404 and in that case pulling down the magnetic beads is performed when everything is still immersed in fluid, which makes it easier to move down more of the magnetic beads and aspiration should be conducted after the bead separation from the sample liquid has been completed (as good as possible).

[0148] Also in Fig. 4c, a syringe 26 is indicated. This time, the syringe is for adding 405 a re-suspension liquid. Moreover, the magnetic bead attraction element is removed from the test tube 14 such that the magnetic beads 18 are not exposed to the magnetic fields thereof any longer. Therefore, the magnetic beads 18 may remove from the inner wall of the test tube 14 and re-suspend in the resuspension liquid 27. Fig. 4c may hence refer to a method step of adding 405 a re-suspensionliquid 27 and removing 406 the magnetic field and re-suspending 407 at least a portion of the magnetic beads 18 in the re-suspension liquid. The resuspension liquid 27 may comprise, depending on the application, e.g. all sorts of aqueous solutions, buffer solutions, sample solutions such as serum or plasma, and acid or base (among others).

[0149] Fig. 5a and 5b are schematic perspective view drawings of a magnetic bead attraction element 10 with all first and second magnetic elements 11, 12 and with only one first and one second magnetic element 11, 12, respectively, according to an embodiment. The magnetic bead attraction element 10 comprises a first metal support wall section 21 to support the at least one first magnet section Ila and / or magnet elements 11 and the magnetic bead attraction element 10 comprises a second metal support wall section 22 to support the at least one second magnet section 12a and / or magnet elements 12. Specifically, the first metal support wall section 21 and / or the second metal support wall section 22 comprises a magnetizable and / or ferromagnetic material, and / or the second metal support wall section 22 is oriented at an angle of 90° < a < 180° with respect to the first metal support wall section 21.

[0150] Fig- 6 is a picture of a magnetic bead attraction element 10 with a plurality of magnet elements 11, 12, according to an embodiment. Each of the plurality of n=8 first magnet elements 11 comprises a permanent magnet and each of the plurality of n=8 second magnet elements 12 comprises a permanent magnet. The magnet element plane surface S of each of the plurality of n first magnet elements 11 and of each of the plurality of n second magnet elements 12 exhibits a magnetic pole corresponding to a magnetic north pole NP or a magnetic south pole SP.

[0151] In the present case, the magnet element plane surfaces S of the plurality of n first magnet elements 11 being arranged side-by-side to one another exhibit alternating magnetic poles NP, SP and the magnet element plane surfaces S of the plurality of n second magnet elements 12 being arranged side-by-side to one another exhibit alternating magnetic poles NP, SP and the plurality of n first magnet elements 11 and the plurality of n second magnet elements 12 being arranged side-by-side to each other exhibit alternating magnetic poles NP, SP. In other words, direct neighboring plates do not exhibit the same magnetic poles NP, SP but alternating poles magnetic poles NP, SP. Fig- 7 is a flow chart of a method 400 for magnetic bead-based sample processing, according to an embodiment. The method 400 for magnetic bead-based sample processing comprises:

[0152] Providing 401 at least one test tube 14 having a main tube wall section 15 and a tapered bottom wall section 16 and containing a sample liquid 17 and magnetic beads 18 dispersed on the sample liquid 17;

[0153] Attracting 402, in a first bead collection configuration A, at least a portion of the magnetic beads 18 to the main tube wall section 15 and preferably to a portion of the tapered bottom wall section 16 by means of a magnetic field to attract the beads to portions of the wall along the tube wall (upper main tube wall section 15 and lower tapered bottom wall section 16);Attracting 403, in a second bead collection configuration B, at least a portion of the magnetic beads 18 to the tapered bottom wall section 16 by means of a magnetic field by slowly moving down the magnetic fields and thereby slowly pulling down the magnetic beads from the upper portion (upper main tube wall section 15) to the lower portion (lower tapered bottom wall section 16);

[0154] Aspirating 404 at least a portion of the sample liquid 17 from the at least one test tube 14;

[0155] Adding 405 a re-suspension liquid 27;

[0156] Removing 406 the magnetic field and re-suspending 407 at least a portion of the magnetic beads 18 in the re-suspension liquid 27.

[0157] The steps may be performed in the temporal order: first 402 (attracting configuration A), second 403 (attracting configuration B), third 404 (aspirating) or instead first 402 (attracting configuration A), second 404 (aspirating), third 403 (attracting configuration B).

[0158] The method of Fig. 7 further comprises moving 408a of a magnetic bead attraction element 10 having at least one first magnet section Ila and at least one second magnet section 12a and / or moving 408b of the test tube 14 between:

[0159] the first bead collection configuration A, specifically in which the at least one first magnet section Ila overlaps with at least a portion of the main tube wall section 15 and the at least one second magnet section 12a overlaps with at least a portion of the tapered bottom wall section 16; and the second bead collection configuration B, specifically in which the at least one first magnet section Ila overlaps with at least a portion of the tapered bottom wall section 16.

[0160] The method 400 may further comprise: providing the at least one second magnet section 12a at an angle of 90° < a < 180° with respect to the at least one first magnet section Ila.

[0161] The method 400 may specifically be performed in combination with any embodiment of the sample-processing device and / or system or elements / components thereof being described herein. The method 400 may at least partially refer to the configurations shown in Fig. 4a-4d.

[0162] Reference list

[0163] 10 magnetic bead attraction element

[0164] 11 at least one first magnet element

[0165] Ila at least one first magnet section

[0166] 12 at least one second magnet element

[0167] 12a at least one second magnet section

[0168] 13 test tube-receiving mechanism

[0169] 14 at least one test tube

[0170] 14a outer wall of a test tube15 main tube wall section

[0171] 16 tapered bottom wall section, specifically a conical bottom wall section or a rounded bottom wall section

[0172] 17 sample liquid

[0173] 18 magnetic beads

[0174] 19 actuator

[0175] 20 leg

[0176] 21 first metal support wall section

[0177] 22 second metal support wall section

[0178] 25 hinge

[0179] 26 syringe

[0180] 27 Re-suspension liquid

[0181] 100 sample-processing device

[0182] 200 magnetic bead attraction element

[0183] 210 magnet elements

[0184] 225 hinge

[0185] 400 method for magnetic bead-based sample processing

[0186] 401-408a / b steps of the method for magnetic bead-based sample processing

[0187] A first bead collection configuration

[0188] a angle between the at least one first magnet section and the at least one second magnet section

[0189] B second bead collection configuration

[0190] cdl center-to-center distance of two first magnet elements

[0191] cd2 center-to-center distance of two second magnet elements

[0192] cd3 center-to-center distance of two test tubes

[0193] D magnet element depth

[0194] DA magnet element depth axis

[0195] edl edge-to-edge distance of two first magnet elements

[0196] ed2 edge-to-edge distance of two second magnet elements

[0197] G gravitational direction

[0198] L magnet element length axis

[0199] LAI length axis of a first magnet element

[0200] LA2 length axis of a second magnet element

[0201] LA3 length axis of a test tube

[0202] NP magnetic north pole

[0203] RA rotational axis between the at least one first magnet section and the at least one second magnet section

[0204] S magnet element plane surfaceSP magnetic south pole

[0205] TA tipping axis

[0206] W magnet element width WA magnet element width axis

Claims

- 32 - Patent Claims1. Sample-processing device (100) for magnetic bead-based sample processing, the sampleprocessing device (100) comprises:A magnetic bead attraction element (10) comprising at least one first magnet section (Ila) and at least one second magnet section (12a) being oriented at an angle of 90° < a < 180° with respect to the at least one first magnet section (Ila); andA test tube-receiving mechanism (13) for receiving at least one test tube (14) with a main tube wall section (15) and a tapered bottom wall section (16) for containing a sample liquid (17) with magnetic beads (18),wherein the magnetic bead attraction element (10) and the test tube-receiving mechanism (13) are at least partially movably arranged relative to each other between configurations comprising:a first bead collection configuration (A), in which the magnetic bead attraction element (10) is positioned with respect to the test tube (14), when being received by the test tubereceiving mechanism (13), such that the at least one first magnet section (Ila) overlaps with at least a portion of the main tube wall section (15) and the at least one second magnet section (12a) overlaps with at least a portion of the tapered bottom wall section (16); and a second bead collection configuration (B), in which the magnetic bead attraction element (10) is positioned with respect to the test tube (14) when being received by the test tubereceiving mechanism (13), such that the at least one first magnet section (Ila) overlaps with at least a portion of the tapered bottom wall section (16).

2. The sample-processing device (100) according to claim 1, wherein the magnetic bead attraction element (10) and the test tube-receiving mechanism (13) are at least partially movably arranged relative to each other to allow a translational movement (M) of the magnetic bead attraction element (10) and / or the test tube-receiving mechanism (13) and / or the test tube (14), when being received by the test tube-receiving mechanism (13), specifically wherein the translational movement comprises a deceleration and / or a stop, more specifically the translational movement (M) comprises a deceleration and / or a stop near or at the second bead collection configuration (B).

3. The sample-processing device (100) according to claim 2, further comprising at least one actuator (19) to drive the translational movement (M) between configurations comprising the first bead collection configuration (A) and the second bead collection configuration (B), specifically between configurations comprising the first bead collection (A) configuration, the second bead collection configuration (B) and a removal configuration in- 33 -which the magnetic bead attraction element (1) and / or the test tube-receiving mechanism (13) are removed from each other.

4. The sample-processing device (100) according to any one of the preceding claims, wherein the at least one first magnet section (Ila) comprises at least one first magnet element (11) and / or wherein the at least one second magnet section (12a) comprises at least one second magnet element (12), specificallywherein the at least one first magnet element (11) and / or the at least one second magnet element (12) comprises a permanent magnet; and / orwherein the at least one first magnet element (11) and / or the at least one second magnet element (12) has / have the shape of a plate being elongated along a magnet element length axis (LA) and having a magnet element plane surface (S) for overlapping with and / or contacting the at least one test tube (14), the magnet element plane surface (S) being defined by a magnet element length (L) measured along the magnet element length axis (LA) and a magnet element width (W) measured along a magnet element width axis (WA) perpendicular to the magnet element length axis (LA), specificallywherein the plate has a magnet element depth (D) measured along a magnet element depth axis (DA) that is perpendicular to the magnet element length axis (LA) and the magnet element width axis (WA).

5. The sample-processing device (100) according to claim 4,wherein the at least one first magnet element (11) corresponds to a plurality of n or n+2 first magnet elements (11); and / orwherein the at least one second magnet element (12) corresponds to a plurality of n or n+2 second magnet elements (12).

6. The sample-processing device (100) according to claims 4 and 5,wherein each of the plurality of n or n+2 first magnet elements (11) and / or each of the plurality of n or n+2 second magnet elements (12) has the shape of the plate, and wherein the plurality of n or n+2 first magnet elements (11) are arranged side-by-side in that respective edges of all of the first magnet elements (11) are aligned along one line with each other parallel to the magnet element width axis (WA) and the magnet element length axis of each of the n or n+2 first magnet elements (11) are aligned parallel to each other at a center-to-center distance (cdl), and / orwherein the plurality of n or n+2 second magnet elements (12) are arranged side-by-side in that respective edges of all of the second magnet elements (12) are aligned along one linewith each other parallel to the magnet element width axis (WA) and the magnet element length axis of each of the n or n+2 second magnet elements (12) are aligned parallel to each other at a center-to-center distance (cd2), and / orwherein the plurality of n or n+2 first magnet elements (11) and the plurality of n or n+2 second magnet elements (12) are arranged side-by-side in that the respective edges of all of the first magnet elements (11) and of all of the second magnet elements (12) along the magnet element width axis (WA) are parallel to each other.

7. The sample-processing device (100) according to claim 6,wherein the test tube-receiving mechanism (13) is configured for receiving a plurality of n test tubes (14), specificallywherein the test tube-receiving mechanism (13) is configured for receiving the plurality of n test tubes (14) in a side-by-side arrangement with a length axis (LA3) of each of the plurality of n test tubes (14) being parallel to each other and at a center-to-center distance (cd3) between two neighboring test tubes (14) that corresponds to the center-to-center distance (cdl) of the plurality of the n or n+2 first magnet elements and / or the center-to- center distance (cd2) of the plurality of the n or n+2 second magnet elements, specifically wherein each of the plurality of n test tubes (14) is centered with respect to its own length axis (LA3) and the length axis (LAI) of one of the plurality of the n or n+2 first magnet elements (11) and / or the length axis (LA2) of one of the plurality of the n or n+2 second magnet elements (12).

8. The sample-processing device (100) according to claims 4 and 6 or 7,wherein each of the plurality of n or n+2 first magnet elements (11) comprises a permanent magnet and each of the plurality of n or n+2 second magnet elements (12) comprises a permanent magnet, specificallywherein the magnet element plane surface (S) of each of the plurality of n or n+2 first magnet elements (11) and of each of the plurality of n or n+2 second magnet elements (12) exhibits a magnetic pole corresponding to a magnetic north pole (NP) or a magnetic south pole (SP), specificallywherein the magnet element plane surfaces (S) of the plurality of n or n+2 first magnet elements (11) being arranged side-by-side to one another exhibit alternating magnetic poles (NP, SP) or same magnetic poles (NP, SP), and / orwherein the magnet element plane surfaces (S) of the plurality of n or n+2 second magnet elements (12) being arranged side-by-side to one another exhibit alternating magnetic poles (NP, SP) or same magnetic poles (NP, SP), and / orwherein the plurality of n or n+2 first magnet elements (11) and the plurality of n or n+2 second magnet elements (12) being arranged side-by-side to each other exhibit alternating magnetic poles (NP, SP) or same magnetic poles (NP, SP).

9. The sample-processing device (100) according to any one of the preceding claims, wherein the magnetic bead attraction element (10) comprises a first metal support wall section (21) to support the at least one first magnet section (Ila), and / orwherein the magnetic bead attraction element (10) comprises a second metal support wall section (22) to support the at least one second magnet section (12a), specifically wherein the first metal support wall section (21) and / or the second metal support wall section (22) comprises a magnetizable and / or ferromagnetic material, and / or wherein the second metal support wall section (22) is oriented at an angle of 90° < a < 180° with respect to the first metal support wall section (21).

10. The sample-processing device (100) according to any one of the preceding claims, wherein the at least one second magnet section (12a) is oriented at an angle of 130° < a < 180°, specifically 145° < a < 165° and more specifically 150° < a < 160° with respect to the at least one first magnet section.

11. The sample-processing device (100) according to any one of the preceding claims, wherein the at least one second magnet section (12a) and the at least one first magnet section (Ila) are pivotally mounted with respect to a rotational axis (RA) between the at least one first magnet section (Ila) and the at least one second magnet section (12a), specifically wherein the angle a is dynamically adjusted by an actuator during the transition from configuration A to B.

12. A sample-processing system, comprising the sample-processing device (100) according to any one of the preceding claims and the at least one test tube (14).

13. A Sample-processing device for magnetic bead-based sample processing, the sampleprocessing device comprises:A magnetic bead attraction element (10) comprising at least one first electromagnetic element (11) configured to generate a first magnetic field and at least one second electromagnetic element (12) configured to generate a second magnetic field, the at least one first electromagnetic element (11) and the at least one second electromagnetic element (12) being oriented at an angle of 90° < a < 180° with respect to the at least one first electromagnetic element (11);- 36 -A test tube-receiving mechanism (13) for receiving at least one test tube (14) with a main tube wall section (15) and a tapered bottom wall section (16) for containing a sample liquid (17) with magnetic beads (18); andAt least one controller configured to individually control the at least one first electromagnetic element (11) and the at least one second electromagnetic element (12) to individually activate, deactivate, and / or adjust the first and second magnetic fields.

14. A method (400) for magnetic bead-based sample processing comprising:Providing (401) at least one test tube (14) having a main tube wall section (15) and a tapered bottom wall section (16) and containing a sample liquid (17) and magnetic beads (18) dispersed on the sample liquid (17);Attracting (402), in a first bead collection configuration (A), at least a portion of the magnetic beads (18) to the main tube wall section (15) by means of a magnetic field;Attracting (403), in a second bead collection configuration (B), at least a portion of the magnetic beads (18) to the tapered bottom wall section (16) by means of a magnetic field; Aspirating (404) at least a portion of the sample liquid (17) from the at least one test tube (14);Adding (405) a re-suspension liquid;Removing (406) the magnetic field and re-suspending (407) at least a portion of the magnetic beads (18) in the re-suspension liquid.

15. The method (400) of claim 14, further comprising moving (408a) of a magnetic bead attraction element (10) having at least one first magnet section (Ila) and at least one second magnet section (12a) and / or moving (408b) of the test tube (14) between:the first bead collection configuration (A), specifically in which the at least one first magnet section (Ila) overlaps with at least a portion of the main tube wall section (15) and the at least one second magnet section (12a) overlaps with at least a portion of the tapered bottom wall section (16); andthe second bead collection configuration (B), specifically in which the at least one first magnet section (Ila) overlaps with at least a portion of the tapered bottom wall section (16), specifically wherein the method further comprises: providing the at least one second magnet section (12a) at an angle of 90° < a < 180° with respect to the at least one first magnet section (Ha).

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