Information processing device, electromagnetic wave testing apparatus, program, and electromagnetic wave testing system

WO2026196926A1PCT designated stage Publication Date: 2026-09-24TDK CORP
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Patent Information

Application Number
PCT/JP2026/006155
Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-03-21
Filing Date
2026-02-19
Publication Date
2026-09-24

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Abstract

This information processing device causes an electromagnetic wave testing apparatus including a reflection box to perform a plurality of types of electromagnetic wave tests. Upon execution of a first application for causing the electromagnetic wave testing apparatus to perform a first test among the plurality of types of electromagnetic wave tests, the information processing device causes the electromagnetic wave testing apparatus to display a first operation reception image for receiving, from a user, an operation for the first application. The first operation reception image includes a first image for receiving an operation for displaying a first setting reception image for receiving a first setting related to an instrument for use in measurement of the first test among settings set for the first application, and a second image for receiving an operation for designating whether or not to set, as the first setting, a first reference setting serving as a reference for the first setting.
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Description

Information processing apparatus, electromagnetic wave testing apparatus, program, and electromagnetic wave testing system

[0001] The present disclosure relates to an information processing apparatus, an electromagnetic wave testing apparatus, a program, and an electromagnetic wave testing system. The present application claims priority based on Japanese Patent Application No. 2025-046246 filed in Japan on March 21, 2025, the content of which is incorporated herein by reference.

[0002] Research and development have been conducted on techniques for performing electromagnetic wave tests such as Electromagnetic Compatibility (EMC) tests using a reverberation chamber. Note that EMC tests include Electromagnetic Interference (EMI) tests and Electromagnetic Susceptibility (EMS) tests.

[0003] Patent Document 1 describes a setting method for starting up a measuring apparatus, comprising the steps of: acquiring corresponding set values from a database in which a plurality of set values used for setting each setting item of each setting object of a measuring apparatus having a plurality of setting objects are stored in association with the respective setting items, based on data specifying each setting item of each setting object that requires setting when the measuring apparatus is started up; and performing initial setting of the measuring apparatus with the acquired set values.

[0004] Japanese Unexamined Patent Publication No. 2010-181425

[0005] Here, the setting method described in Patent Document 1 is, so to speak, a method of setting default values ​​for each setting item when the measuring device is started up. However, with this setting method, it was sometimes not possible for the user to determine whether the setting value set when the measuring device was started up was the default setting value or not. This can be a psychological burden on the user when trying to change the setting value. This is because the setting value set when the measuring device is started up may be, for example, a setting value that was optimized by an operator who operated the measuring device in the past, and if that setting value is not the default setting value, changing the setting value may result in the loss of the optimized setting value. This can lead to continuing to use an unoptimized setting value as an optimized setting value without changing it, which is undesirable. And this problem also exists in electromagnetic wave testing devices that perform electromagnetic wave testing using a reflection box.

[0006] This disclosure describes the provision of an information processing device, an electromagnetic wave testing device, a program, and an electromagnetic wave testing system that can reduce the psychological burden on users regarding changes to settings of equipment used in electromagnetic wave testing using an electromagnetic wave testing device.

[0007] One aspect of the present disclosure is an information processing device for causing an electromagnetic wave testing apparatus including a reflecting box to perform a plurality of types of electromagnetic wave tests, wherein when a first application is executed to cause the electromagnetic wave testing apparatus to perform a first test among the plurality of types of electromagnetic wave tests, the information processing device displays a first operation reception image for receiving user operations on the first application, the first operation reception image includes a first image for receiving an operation to display a first setting reception image for receiving a first setting related to the equipment used for measuring the first test among the settings set in the first application, and a second image for receiving an operation to specify whether or not to set a first reference setting that serves as a standard for the first setting as the first setting.

[0008] Furthermore, one aspect of this disclosure is an electromagnetic wave testing apparatus that includes the information processing apparatus described above.

[0009] Furthermore, one aspect of the present disclosure is a program to be executed by a computer of an information processing device that causes an electromagnetic wave testing apparatus including a reflecting box to perform a plurality of types of electromagnetic wave tests, wherein the program is a first application that causes the electromagnetic wave testing apparatus to perform a first test among the plurality of types of electromagnetic wave tests, and when executed, displays a first operation reception image that accepts user operations for the first application, the first operation reception image includes a first image that accepts an operation to display a first setting reception image that accepts a first setting related to the equipment used for measuring the first test among the settings set in the first application, and a second image that accepts an operation to specify whether or not to set a first reference setting that serves as a standard for the first setting as the first setting.

[0010] Furthermore, one aspect of the present disclosure is an electromagnetic wave testing system comprising an electromagnetic wave testing apparatus including a reflecting box and an information processing apparatus for causing the electromagnetic wave testing apparatus to perform a plurality of types of electromagnetic wave tests, wherein when the information processing apparatus executes a first application for causing the electromagnetic wave testing apparatus to perform a first test among the plurality of types of electromagnetic wave tests, it displays a first operation reception image for receiving user operations on the first application, and the first operation reception image includes a first image for receiving an operation to display a first setting reception image for receiving a first setting related to the equipment used for measuring the first test among the settings set in the first application, and a second image for receiving an operation to specify whether or not to set a first reference setting that serves as a standard for the first setting as the first setting.

[0011] According to this disclosure, it is possible to reduce the psychological burden on users regarding changes to the settings of equipment used in electromagnetic wave testing using an electromagnetic wave testing device.

[0012] This figure shows an example of the configuration of the electromagnetic wave testing system 1 according to the embodiment. This figure shows an example of the configuration of the electromagnetic wave testing device 10. This figure shows an example of the reflection box 5 in a state where the radiation of electromagnetic waves from the transmitting antenna 51 is stopped and the power of the test specimen TM is turned on. This figure shows an example of the main menu image P0. This figure shows an example of the EMI test operation reception image P1. This figure shows an example of image P2. This figure shows an example of image P3. This figure shows an example of image P3 when the tab "System Settings" is selected in area R31. This figure shows an example of image P3 when the tab "File" is selected in area R31. This is an enlarged view of the area around area R2 in the EMI test operation reception image P1 shown in Figure 5. This figure shows an example of the hardware configuration of the information processing device 20. This figure shows an example of the functional configuration of the information processing device 20. This figure shows an example of the processing flow executed by the information processing device 20 in the EMI test operation reception image P1.

[0013] <Embodiments> Embodiments of this disclosure will be described below with reference to the drawings. In the following description, the electric field may be read as a magnetic field or an electromagnetic field. Also, for the sake of convenience in the following description, an application program will be simply referred to as an application.

[0014] <Overview of the Electromagnetic Wave Testing System> First, an overview of the electromagnetic wave testing system according to this embodiment will be described. The electromagnetic wave testing system comprises an electromagnetic wave testing device and an information processing device. The electromagnetic wave testing device includes a reflecting box. The information processing device causes the electromagnetic wave testing device to perform multiple types of electromagnetic wave tests. Furthermore, when the information processing device executes a first application that causes the electromagnetic wave testing device to perform a first test among the multiple types of electromagnetic wave tests, it displays a first operation reception image that accepts user input for the first application. The information processing device then sets at least a portion of the second reference setting, which serves as a standard for the second setting concerning the equipment used for measuring the second test among the settings set in the second application that causes the electromagnetic wave testing device to perform a second test different from the first test among the multiple types of electromagnetic wave tests, as the first setting concerning the equipment used for measuring the first test among the settings set in the first application, in response to the operation received via the first operation reception image. As a result, the electromagnetic wave testing system and the information processing device provided in the electromagnetic wave testing system can improve the efficiency of settings concerning the equipment used for multiple types of tests using the electromagnetic wave testing device.

[0015] Furthermore, the electromagnetic wave testing system according to this embodiment comprises an electromagnetic wave testing device and an information processing device. The electromagnetic wave testing device includes a reflecting box. The information processing device causes the electromagnetic wave testing device to perform multiple types of electromagnetic wave tests. When the information processing device executes a first application that causes the electromagnetic wave testing device to perform a first test among the multiple types of electromagnetic wave tests, it displays a first operation reception image that accepts user input for the first application. The first operation reception image includes a first image that accepts an operation to display a first setting reception image that accepts a first setting related to the equipment used for measuring the first test among the settings set in the first application, and a second image that accepts an operation to specify whether or not to set a first reference setting, which serves as a standard for the first setting, as the first setting. As a result, the electromagnetic wave testing system and the information processing device included in the electromagnetic wave testing system can reduce the psychological burden on the user regarding changes to the settings related to the equipment used in electromagnetic wave testing using the electromagnetic wave testing device.

[0016] The following describes in detail the configurations of the electromagnetic wave testing system and the information processing device provided within the electromagnetic wave testing system according to this embodiment.

[0017] <Configuration of the Electromagnetic Wave Testing System> First, the configuration of the electromagnetic wave testing system 1 according to the embodiment will be described with reference to Figure 1. Figure 1 is a diagram showing an example of the configuration of the electromagnetic wave testing system 1 according to the embodiment.

[0018] The electromagnetic wave testing system 1 comprises an electromagnetic wave testing device 10 including a reflection box 5, and an information processing device 20 that controls the electromagnetic wave testing device 10. The electromagnetic wave testing system 1 is a system that causes the electromagnetic wave testing device 10 to perform multiple types of electromagnetic wave tests in response to operations received by the information processing device 20. These multiple types of electromagnetic wave tests include, but are not limited to, EMI tests, EMS tests, EMI-CE (Conducted Emission) tests, EMS-CIM (Conducted Immunity) tests, and calibration tests of the electromagnetic wave testing device 10. In this embodiment, the details of the EMI-CE test are known and therefore omitted from the explanation. Similarly, in this embodiment, the details of the EMS-CIM test are known and therefore omitted from the explanation. Furthermore, as an example, the case in which the electromagnetic wave testing system 1 performs an EMI test, which is one example of an electromagnetic wave test, will be described below. Note that the matters described below using the EMI test as an example may also be applied to electromagnetic wave tests other than the EMI test.

[0019] Here, the reflecting box 5 is a metal cavity resonator. Various components used for electromagnetic wave testing are provided inside the reflecting box 5. Therefore, the electromagnetic wave testing apparatus 10 is composed of the reflecting box 5 and these various components. These various components include, for example, a transmitting antenna 51 that transmits electromagnetic waves inside the reflecting box 5, a receiving antenna 52 that receives electromagnetic waves inside the reflecting box 5, an electromagnetic stirrer 53 that stirs the electromagnetic waves radiated from the transmitting antenna 51, and a mounting table 54 on which the test specimen TM is placed, but are not limited to these. A reflecting box 5 with this configuration resonates the electromagnetic waves inside the reflecting box 5. The electromagnetic stirrer 53 placed inside the reflecting box 5 stirs the electromagnetic waves inside the reflecting box 5. The stirring of electromagnetic waves by the electromagnetic stirrer 53 brings the distribution of electric field strength inside the reflecting box 5 closer to a uniform distribution. Note that in Figure 1, the transmitting antenna 51, receiving antenna 52, electromagnetic stirrer 53, and mounting table 54 are omitted for simplification of the figure.

[0020] The test specimen TM, placed on the mounting table 54 located inside the reflective box 5, is the object that the electromagnetic wave testing device 10 is intended to test using EMI. The electronic device to be tested as the test specimen TM can be any device that is electrically controlled. Therefore, the test specimen TM can be, but is not limited to, devices that are electrically controlled, such as multi-function mobile phone terminals (smartphones), mobile phone terminals, drive recorders, and various types of computers.

[0021] The information processing device 20 can be any device capable of controlling the electromagnetic wave testing device 10, such as a workstation, desktop PC (Personal Computer), notebook PC, tablet PC, multifunction mobile phone terminal, mobile phone terminal, PDA (Personal Digital Assistant), etc., but is not limited to these. Communication between the information processing device 20 and the electromagnetic wave testing device 10 may be wired or wireless, as long as it is based on a communication standard that does not interfere with the electromagnetic wave test.

[0022] Figure 2 shows an example of the configuration of the electromagnetic wave testing apparatus 10. In the example shown in Figure 2, the electromagnetic wave testing apparatus 10 comprises a reflecting box 5, a transmitting antenna 51, a receiving antenna 52, an electromagnetic stirrer 53, and a mounting table 54.

[0023] In the example shown in Figure 2, the transmitting antenna 51, receiving antenna 52, and electromagnetic stirrer 53 are each depicted as being communicatively connected to the information processing device 20 via a communication cable. However, this is a measure taken to simplify the diagram. Therefore, the actual configuration inside the reflecting box 5 may differ from the configuration shown in Figure 2. In practice, for example, the transmitting antenna 51 may be connected to the information processing device 20 via a transmitter. In this case, the information processing device 20 controls the transmitter and outputs an RF (Radio Frequency) signal from the transmitter to the transmitting antenna 51 via an RF (Radio Frequency) cable. The transmitting antenna 51 radiates electromagnetic waves corresponding to the RF signal thus output. Alternatively, for example, the receiving antenna 52 may be connected to the information processing device 20 via a receiver. In this case, the receiving antenna 52 outputs power corresponding to the electromagnetic waves received inside the reflecting box 5 to the receiver via an RF cable. The information processing device 20 then controls the receiver and acquires the power thus output to the receiver. Alternatively, for example, the electromagnetic stirrer 53 may be connected to the information processing device 20 via a controller. In this case, the information processing device 20 controls the controller to cause the electromagnetic stirrer 53 to stir the electromagnetic waves inside the reflection box 5. Some or all of the transmitter, receiver, and controller may be integrated with the reflection box 5, electromagnetic wave testing device 10, or information processing device 20. When configured as described above, the transmitting antenna 51, receiving antenna 52, and electromagnetic stirrer 53 are each controlled by the information processing device 20. For the sake of explanation, the processing performed by the transmitter, receiver, and controller will be described below as processing performed by the information processing device 20, and individual descriptions of the transmitter, receiver, and controller will be omitted. Specifically, the transmitting antenna 51 is configured to radiate electromagnetic waves into the reflection box 5 in accordance with the RF signal input from the information processing device 20. The receiving antenna 52 is configured to output power to the information processing device 20 in accordance with the electromagnetic waves received inside the reflection box 5. The electromagnetic stirrer 53 is configured to rotate in accordance with the control from the information processing device 20 and stir the electromagnetic waves inside the reflection box 5.In Figure 2, for the sake of further simplification, the communication cables connecting the receiving antenna 52 and the electromagnetic stirrer 53 to the information processing device 20 have also been omitted. In this example, the test specimen TM is placed on a mounting platform 54 located near the center of the floor of the reflecting box 5.

[0024] In an EMI test using a reflective box 5 as shown in Figure 2, the total radiated power emitted as electromagnetic waves from the test specimen TM is measured, and based on the measured total radiated power, the strength of the electric field generated by the electromagnetic waves emitted from the test specimen TM at a desired distance from the test specimen TM is measured. The procedure for such an EMI test using a reflective box 5 was standardized, for example, in August 2003 as IEC 61000-4-21, an IEC (International Electrotechnical Commission) document. In IEC 61000-4-21, the total radiated power emitted as electromagnetic waves by the test specimen TM is measured using the substitution method.

[0025] The substitution method is a method for calculating the total radiated power of the test specimen TM by utilizing the fact that the first power ratio and the second power ratio measured inside the reflecting box 5 are equal. Here, the first power ratio is the ratio of the value obtained by multiplying the reference radiated power by the efficiency of the transmitting antenna 51 to the reference received power. The reference radiated power is the power radiated as electromagnetic waves from the transmitting antenna 51 inside the reflecting box 5 with the power supply of the test specimen TM turned off. The reference received power is the power output from the receiving antenna 52 that receives the electromagnetic waves radiated from the transmitting antenna 51 inside the reflecting box 5 in the same state. For example, in the example shown in Figure 2, the power supply of the test specimen TM is turned off. Therefore, the electromagnetic waves transmitted from the transmitting antenna 51 reach the receiving antenna 52, for example, as shown by arrow A1 in Figure 2. The power output from the receiving antenna 52 that receives the electromagnetic waves in this way is the reference received power. On the other hand, the second power ratio is the ratio of the total radiated power emitted as electromagnetic waves from the test specimen TM to the target received power in the reflective box 5 in a state where the radiation of electromagnetic waves from the transmitting antenna 51 is stopped and the power supply of the test specimen TM is turned on. The target received power is the power output from the receiving antenna 52 that receives the electromagnetic waves radiated from the test specimen TM in the reflective box 5 in the said state. Here, Figure 3 is a diagram showing an example of the reflective box 5 in a state where the radiation of electromagnetic waves from the transmitting antenna 51 is stopped and the power supply of the test specimen TM is turned on. As shown in Figure 3, in this state, the electromagnetic waves radiated from the test specimen TM reach the receiving antenna 52, for example, as shown by arrow A2 in Figure 3. In this embodiment, the substitution method is known, so further detailed explanation is omitted.

[0026] Here, in electromagnetic wave testing systems such as System 1, which uses a reflective box to perform EMI testing, it is necessary to perform calibration tests on each component included in the system (e.g., transmitting antenna, receiving antenna, receiver connected to the receiving antenna, etc.) before performing the EMI test. For example, the calibration tests on each component may include measurements such as chamber gain, antenna verification factor, chamber verification factor, and chamber loading factor. In such systems, the application for performing the calibration tests on each component and the application for performing the EMC tests are often configured separately. This is a convention due to the fact that in EMI testing using an anechoic chamber, the timing of the calibration tests and the timing of the EMI tests differ. This situation is also true for other electromagnetic wave tests.

[0027] However, conventionally, users have had to configure settings for the equipment used in each electromagnetic wave test application for each type of electromagnetic wave test. For example, conventionally, even if the settings for the equipment used in the calibration test application for the electromagnetic wave testing device 10 and the settings for the equipment used in the EMI test application were almost identical, users had to configure these two settings independently. Furthermore, the number of settings for the equipment used in electromagnetic wave tests such as EMI tests often exceeds 100. This is not only a burden on users who have to configure the equipment used in electromagnetic wave tests for each application, but it also induces user errors, which is undesirable.

[0028] One known method to address this problem involves creating a database of settings for the equipment used in each electromagnetic wave test. This database reduces the burden on users in configuring the settings and suppresses user errors. However, this method is known to make database management cumbersome. Therefore, when using this method, which makes database management complicated, users may fail to configure the equipment used in electromagnetic wave testing due to errors such as loading the wrong file. This is also undesirable.

[0029] Therefore, the information processing device 20 stores reference setting data for each application that causes the electromagnetic wave testing device 10 to perform various types of electromagnetic wave tests, which in turn indicates reference setting data that serves as a standard for the settings related to the equipment used for measuring the electromagnetic wave tests performed by the application. This allows the information processing device 20 to set reference setting data for the settings related to the equipment used for electromagnetic wave tests performed by one application on the electromagnetic wave testing device 10, as well as reference setting data for the settings related to the equipment used for electromagnetic wave tests performed by other applications on the electromagnetic wave testing device 10. This eliminates the need for users to perform redundant settings between applications. In other words, the information processing device 20 can improve the efficiency of setting up equipment used for various types of electromagnetic wave tests using the electromagnetic wave testing device 10. Furthermore, the information processing device 20 can also suppress the occurrence of user errors. Note that the settings related to the equipment used for measuring the electromagnetic wave tests include at least one or both of the settings for the equipment used in the electromagnetic wave tests and the settings for the measurement system used in the electromagnetic wave tests.

[0030] For the sake of clarity, in the following explanation, the settings related to the equipment used for measuring electromagnetic waves in a given electromagnetic wave test will be referred to as "electromagnetic wave test equipment-related settings," the settings of the equipment used in the electromagnetic wave test will be referred to as "electromagnetic wave test equipment settings," and the settings of the measurement system used in the electromagnetic wave test will be referred to as "electromagnetic wave test system settings." In this case, for example, EMI test equipment-related settings refer to the settings related to the equipment used for measuring EMI tests. Also, for example, EMS test equipment-related settings refer to the settings related to the equipment used for measuring EMS tests. Furthermore, for the sake of clarity, in the following explanation, data showing the electromagnetic wave test equipment-related settings for a given electromagnetic wave test will be referred to as "electromagnetic wave test equipment-related setting data," data showing the electromagnetic wave test equipment settings for the given electromagnetic wave test will be referred to as "electromagnetic wave test equipment setting data," and data showing the electromagnetic wave test system settings for the given electromagnetic wave test will be referred to as "electromagnetic wave test system setting data." In this case, for example, EMI test equipment-related setting data refers to data showing the settings related to the equipment used for measuring EMI tests. In this case, for example, EMS test equipment-related setting data refers to data that indicates the settings of the equipment used for measurement in EMS testing.

[0031] Such an information processing device 20 displays an EMI test operation acceptance image P1 by receiving an operation via the main menu image P0 shown in Figure 4. The EMI test operation acceptance image P1 is an image that accepts an operation to perform an EMI test on the electromagnetic wave testing device 10. Figure 4 is a diagram showing an example of the main menu image P0.

[0032] When the information processing device 20 receives a predetermined operation, it displays the main menu image P0 on the display unit. The display unit is, for example, the display of the information processing device 20, a display device connected to the information processing device 20 in a communicative manner, etc., but is not limited to these. In the following, as an example, the case in which the display unit is the display of the information processing device 20 will be described. Also, in the following, for the sake of explanation, the act of the information processing device 20 displaying an image on the display unit will be referred to as "the information processing device 20 displaying the image." Also, in order to simplify the explanation, the details of the login process performed by the user when the main menu image P0 is displayed will be omitted.

[0033] In the example shown in Figure 4, the main menu image P0 includes six icons, I1 to I6, and five buttons, B1 to B5.

[0034] Icon I1 is an icon that accepts an operation to execute an EMI test application on the information processing device 20. The EMI test application is an application that causes the electromagnetic wave testing device 10 to perform an EMI test in response to an operation received via the EMI test operation acceptance image P1. Therefore, when a selection operation (e.g., click, tap, etc.) is performed on icon I1, the information processing device 20 deletes the display of the main menu image P0 and displays the EMI test operation acceptance image P1. In this embodiment, the information processing device 20 may be configured to display the EMI test operation acceptance image P1 without deleting the display of the main menu image P0.

[0035] Icon I2 is an icon that accepts an operation to execute the EMS test application that the information processing device 20 has. The EMS application is an application that causes the electromagnetic wave test device 10 to perform an EMS test in response to an operation received via the EMS test operation acceptance image that the EMS application accepts. For this reason, when an operation to select icon I2 is performed on the information processing device 20, the display of the main menu image P0 is deleted and the EMS test operation acceptance image is displayed. In this case, the information processing device 20 may be configured to display the EMS test operation acceptance image without deleting the display of the main menu image P0. Furthermore, in this embodiment, the details of the EMS test operation acceptance image are omitted from the explanation. In this embodiment, the EMS test application is an example of a second application and a third application.

[0036] Icon I3 is an icon that accepts an operation to execute the EMI-CE test application that the information processing device 20 has. The EMI-CE test application is an application that causes the electromagnetic wave test device 10 to perform an EMI-CE test in response to an operation received via the EMI-CE test operation acceptance image that the EMI-CE test application accepts. For this reason, when an operation to select icon I3 is performed on the information processing device 20, the display of the main menu image P0 is deleted and the EMI-CE test operation acceptance image is displayed. In this case, the information processing device 20 may be configured to display the EMI-CE test operation acceptance image without deleting the display of the main menu image P0. Furthermore, in this embodiment, the details of the EMI-CE test operation acceptance image are omitted from the explanation. In this embodiment, the EMI-CE test application is an example of the second application and the third application.

[0037] Icon I4 is an icon that accepts an operation to execute the EMS-CIM test application that the information processing device 20 has. The EMS-CIM test application is an application that causes the electromagnetic wave test device 10 to perform an EMS-CIM test in response to an operation received via the EMS-CIM test operation acceptance image that the EMS-CIM test application accepts. For this reason, when an operation to select icon I4 is performed on the information processing device 20, the display of the main menu image P0 is deleted and the EMS-CIM test operation acceptance image is displayed. In this case, the information processing device 20 may be configured to display the EMS-CIM test operation acceptance image without deleting the display of the main menu image P0. Furthermore, in this embodiment, the details of the EMS-CIM test operation acceptance image are omitted from the explanation. In this embodiment, the EMS-CIM test application is an example of the second application and the third application.

[0038] Icon I5 is an icon that accepts an operation to execute the site suitability test application that the information processing device 20 has. Here, the site suitability test is a test to confirm whether the reflection box 5 satisfies the uniformity of the spatial distribution of electric field strength (E-Field Uniformity) specified in the standard, and may also be called an electric field uniformity test. The site suitability test application is an application that causes the electromagnetic wave testing device 10 to perform a site suitability test in response to an operation received via the site suitability test operation acceptance image that the site suitability test application accepts. For this reason, when an operation to select icon I5 is performed on the information processing device 20, the display of the main menu image P0 is deleted and the site suitability test operation acceptance image is displayed. In this case, the information processing device 20 may be configured to display the site suitability test operation acceptance image without deleting the display of the main menu image P0. Furthermore, in this embodiment, the details of the site suitability test are known and therefore will be omitted from the explanation. For this reason, in this embodiment, the details of the site suitability test operation acceptance image will also be omitted from the explanation. In this embodiment, the site suitability test application is an example of the second and third applications.

[0039] Icon I6 is an icon that accepts an operation to execute a calibration test application on the information processing device 20. The calibration test application is an application that causes the electromagnetic wave testing device 10 to perform a calibration test on the electromagnetic wave testing device 10 in response to an operation received via the calibration test operation acceptance image that the calibration test application accepts. For this reason, when an operation to select icon I6 is performed on the information processing device 20, the display of the main menu image P0 is deleted and the calibration test operation acceptance image is displayed. In this case, the information processing device 20 may be configured to display the calibration test operation acceptance image without deleting the display of the main menu image P0. Furthermore, in this embodiment, the details of the calibration test operation acceptance image are omitted from the explanation. In this embodiment, the calibration test application is an example of a second application and a third application.

[0040] In the information processing device 20, the six applications—EMI test application, EMS test application, EMI-CE test application, EMS-CIM test application, site conformity test application, and calibration test application—may be implemented as separate applications or as a single application. Below, as an example, we will describe the case where each of the six applications is implemented as a separate application. Furthermore, each of the six applications is allocated a different memory area in the information processing device 20. For example, the memory area allocated to the EMI test application is the memory area used by the EMI test application when it is executed. Similarly, the memory area allocated to the EMS test application is the memory area used by the EMS test application when it is executed. Therefore, data exchange between the six applications cannot be freely performed by the user; it is performed by the information processing device 20 accepting predetermined operations. This is useful because it prevents the user from incorrectly exchanging data. However, if the information processing device 20 completely prevents data exchange, it would cause inconvenience. Therefore, the information processing device 20 allows the exchange of data between each of the six applications by accepting predetermined operations.

[0041] Button B1 is a button that accepts an operation to display an image that allows the user to switch from the logged-in user to another user when the main menu image P0 is displayed. When the information processing device 20 selects button B1, it displays the image. In this embodiment, the details of the image will not be explained.

[0042] Button B2 is a button that accepts an operation to display an image for accepting an operation to perform measurement of a loss in a cable. The information processing apparatus 20 displays the image when a selection operation on button B2 is performed. Note that, in the present embodiment, description of the details of the image is omitted.

[0043] Button B3 is a button that accepts an operation to display an image for accepting an operation to cause the information processing apparatus 20 to change environment settings. The information processing apparatus 20 displays the image when a selection operation on button B3 is performed. Note that, in the present embodiment, description of the details of the image is omitted.

[0044] Button B4 is a button that accepts an operation to display help for the main menu image P0. The information processing apparatus 20 displays the help when a selection operation on button B3 is performed. Note that, in the present embodiment, description of the details of the help is omitted.

[0045] Button B5 is a button that accepts an operation to delete the display of the main menu image P0. The information processing apparatus 20 deletes the display of the main menu image P0 when a selection operation on button B5 is performed.

[0046] FIG. 5 is a diagram showing an example of an EMI test operation acceptance image P1. The information processing apparatus 20 accepts various operations related to an EMI test that an EMI test application causes the electromagnetic wave test apparatus 10 to perform, via the EMI test operation acceptance image P1. That is, the EMI test operation acceptance image P1 includes GUIs for accepting the various operations. However, in the present embodiment, to simplify the description, only details of some of the GUIs that accept the various operations will be described.

[0047] The EMI test operation acceptance image P1 includes at least two regions: a region R1 and a region R2.

[0048] The region R1 is a region where a GUI for accepting operations related to the EMI test is displayed. More specifically, the region R1 includes at least button B11 and button B12.

[0049] Button B11 is a button that accepts an operation to display image P2, which accepts an operation regarding the measurement conditions in the EMI test. These conditions include, but are not limited to, some or all of the following: specifying whether the operation of the electromagnetic stirrer 53 is step rotation or continuous rotation; specifying whether to use a spectrum analyzer, a network analyzer, or an electric field sensor as the measuring instrument; specifying whether to prioritize frequency or the rotation of the electromagnetic stirrer 53 as the measurement order; specifying the frequency range; and specifying the frequency step size. When the information processing device 20 receives a selection operation from button B11, it displays image P2. Note that image P2 may be the image displayed in the EMI test operation acceptance image P1. Therefore, in this embodiment, the processing performed by the information processing device 20 in response to an operation received via image P2 is treated as processing performed by the information processing device 20 in response to an operation received via the EMI test operation acceptance image P1.

[0050] Here, Figure 6 shows an example of image P2. Image P2 includes, for example, region R21 and region R22. Note that image P2 may also include, in place of or in addition to either one or both of these, another GUI that accepts operations related to EMI test measurement condition data.

[0051] Region R21 is a region where a GUI is displayed that accepts user input for specifying measurement conditions in EMI testing, such as whether the electromagnetic stirrer 53 operates in step rotation or continuous rotation, whether a spectrum analyzer, network analyzer, or field sensor is used as the measuring instrument, and whether frequency or the rotation of the electromagnetic stirrer 53 should be prioritized in the measurement order. In the example shown in Figure 6, the GUI displays radio buttons to specify whether the electromagnetic stirrer 53 operates in step rotation or continuous rotation, radio buttons to specify whether a spectrum analyzer, network analyzer, or field sensor is used as the measuring instrument, and radio buttons to specify whether frequency or the rotation of the electromagnetic stirrer 53 should be prioritized in the measurement order.

[0052] Region R22 is the area where a GUI is displayed that accepts user input for specifying measurement conditions in EMI testing, such as frequency range and frequency step size. In the example shown in Figure 6, this GUI displays a table for specifying the frequency range, frequency step size, etc.

[0053] Button B12 is a button that accepts an operation to display image P3, which accepts EMI test measurement-related settings. Here, image P3 is an image that accepts EMI test equipment settings and EMI test system settings, respectively. When the information processing device 20 accepts a selection operation to button B12, it displays image P3. Here, the equipment used in EMI testing includes, but is not limited to, receivers, antennas, switches, electromagnetic stirrers, reflector boxes, etc. used in EMI testing. Furthermore, EMI test equipment settings are the registration of equipment used in EMI testing to the information processing device 20, and are not limited to, for example, a combination of a label indicating the equipment, the model of the equipment, and the network address assigned to the equipment (e.g., an IP (Internet Protocol) address). Furthermore, EMI test system settings are settings related to the connection between equipment registered in the information processing device 20 as equipment used in EMI testing, and are not limited to, for example, a combination of the models of the receiver and receiving antenna to be connected in EMI testing, and the loss of the cable connecting the receiver and the receiving antenna. Note that image P3 may be the image displayed in EMI test operation reception image P1. Therefore, in this embodiment, the processing performed by the information processing device 20 in response to an operation received via image P3 is treated as processing performed by the information processing device 20 in response to an operation received via EMI test operation reception image P1.

[0054] Here, Figure 7 shows an example of image P3. Image P3 includes at least region R31 and region R32.

[0055] Area R31 is an area where multiple tabs are displayed. In the example shown in Figure 7, area R31 includes at least three tabs: "Device Registration," "System Settings," and "Files." The information processing device 20 accepts an operation to select one of these tabs in area R31.

[0056] When the information processing device 20 receives an operation to select the "Device Registration" tab in area R31, it displays a GUI for accepting EMI test device settings in area R32. Furthermore, when the information processing device 20 receives an operation to select the "System Settings" tab in area R31, it displays a GUI for accepting EMI test system settings in area R32. Also, when the information processing device 20 receives an operation to select the "File" tab in area R31, it displays a GUI for accepting operations related to EMI test device settings in area R32.

[0057] Area R32 is the area where the GUI associated with the tab selected in area R31 is displayed. In the example shown in Figure 7, the tab "Device Registration" is selected in area R31. Therefore, the GUI for accepting EMI test equipment settings is displayed in area R32. This GUI can have any configuration as long as it is capable of accepting EMI test equipment settings. For this reason, the details of this GUI are omitted in this embodiment. In the example shown in Figure 7, the GUI displayed in area R31 accepts a label indicating the receiver that receives signals from the receiving antenna 52, the model of the receiver, the network address to be assigned to the receiver, etc. The information processing device 20 sets the settings as EMI test equipment settings by storing the data indicating the settings received via area R32 shown in Figure 7 as EMI test equipment setting data.

[0058] Figure 8 shows an example of image P3 when the "System Settings" tab is selected in area R31. In the example shown in Figure 8, the "Measurement System" tab is selected in area R31. Therefore, a GUI for accepting EMI test system settings is displayed in area R32. This GUI can have any configuration as long as it is capable of accepting EMI test system settings. For this reason, the details of this GUI will not be explained in this embodiment. In the example shown in Figure 8, the GUI displayed in area R31 accepts the models of the receiver and receiving antenna to be connected in the EMI test, the loss of the cable connecting the receiver and the receiving antenna, the model of the controller of the electromagnetic stirrer 53, etc. The information processing device 20 sets the settings as EMI test system settings by storing the data indicating the settings received via area R32 shown in Figure 8 as EMI test system setting data.

[0059] For the sake of clarity, the EMI test equipment settings and EMI test system settings configured via image P3 will be collectively referred to as EMI test equipment-related settings. Furthermore, for the sake of clarity, the data representing these EMI test equipment-related settings will be referred to as EMI test equipment-related setting data.

[0060] Figure 9 shows an example of image P3 when the "File" tab is selected in region R31. In the example shown in Figure 9, the "File" tab is selected in region R31. Therefore, region R32 displays a GUI that accepts operations related to EMI test equipment settings. In this example, the GUI includes at least four buttons, buttons B31 to B34.

[0061] Button B31 is a button that accepts an operation to store the EMI test equipment-related settings set in the information processing device 20 via the GUI displayed in area R32 shown in Figures 7 and 8 as the EMI test standard setting, which serves as the basis for the EMI test equipment-related settings. However, only users with predetermined privileges can select button B31. For this reason, the information processing device 20 does not allow the selection of button B31 if the user logged in in the EMI test operation reception image P1 does not have the predetermined privileges. On the other hand, the information processing device 20 allows the selection of button B31 if the user logged in in the EMI test operation reception image P1 has the predetermined privileges. When the information processing device 20 accepts the selection of button B31, it identifies the EMI test equipment-related settings indicated by the stored EMI test equipment-related setting data as the EMI test standard setting, and stores the data indicating the EMI test standard setting as EMI test standard setting data. Furthermore, if EMI test standard setting data is already stored in the information processing device 20, it will update the stored EMI test standard setting data with the new EMI test standard setting data. Therefore, when the information processing device 20 does not allow operation of button B31 by a user who does not have the prescribed authority, it means that the information processing device 20 does not allow that user to edit the EMI test standard setting data. Conversely, when the information processing device 20 allows operation of button B31 by a user who has the prescribed authority, it means that the information processing device 20 allows that user to edit the EMI test standard setting data. The prescribed authority is, for example, the authority to edit the EMI test standard setting data, but is not limited to this. Also, the EMI test standard setting indicated by the EMI test standard setting data may be rephrased as the default setting for EMI test equipment-related settings.

[0062] Button B32 is a button that displays an inter-application shared image that accepts the operation to set the electromagnetic wave testing equipment-related settings configured in one of the six applications mentioned above (excluding the EMI testing application) as the EMI testing equipment-related settings. Here, the inter-application shared image includes a GUI that accepts the operation to select one of the five electromagnetic wave tests other than the EMI test from the six electromagnetic wave tests: EMI test, EMS test, EMI-CE test, EMS-CIM test, site conformity test, and calibration test of the electromagnetic wave testing device 10. For the sake of explanation, in the following, the electromagnetic wave test selected by the user via the inter-application shared image will be referred to as the target electromagnetic wave test. When the information processing device 20 receives a selection operation to button B32, it displays the inter-application shared image. When the information processing device 20 receives an operation to select one of the five electromagnetic wave tests as the target electromagnetic wave test via an inter-application shared image, it reads the target electromagnetic wave test reference setting data stored in the memory area allocated to the target electromagnetic wave test application, and sets at least a portion of the target electromagnetic wave test reference setting indicated by the read target electromagnetic wave test reference setting data as the EMI test equipment related setting. The target electromagnetic wave test reference setting data is data that indicates the target electromagnetic wave test reference setting that serves as the basis for the target electromagnetic wave test equipment related setting. For example, if the target electromagnetic wave test is a calibration test, the target electromagnetic wave test equipment related setting is the calibration test equipment related setting. In this case, the target electromagnetic wave test reference setting is the calibration test reference setting. In this case, the target electromagnetic wave test reference setting data is the calibration test reference setting data. As a result, the user can use at least a portion of the target electromagnetic wave test reference setting data stored in the memory area allocated to the application performing the target electromagnetic wave test as the EMI test equipment related setting. Therefore, the information processing device 20 eliminates the need for the user to perform redundant settings between applications that cause the electromagnetic wave testing device 10 to perform electromagnetic wave testing. As a result, the information processing device 20 can improve the efficiency of settings related to equipment used for multiple types of electromagnetic wave testing using the electromagnetic wave testing device 10.Furthermore, the information processing device 20 can also suppress the occurrence of user-incorrect settings.

[0063] Furthermore, the target electromagnetic wave test standard setting data includes target electromagnetic wave test equipment setting data indicating the target electromagnetic wave test equipment settings, and target electromagnetic wave test system setting data indicating the target electromagnetic wave test system settings. For this reason, the inter-app shared image may include a GUI that accepts the operation of selecting either the target electromagnetic wave test equipment settings or the target electromagnetic wave test system settings, or both, as settings to be set as EMI test equipment related settings. This allows the information processing device 20 to selectively set either the target electromagnetic wave test equipment setting data or the target electromagnetic wave test system setting data, or both, as EMI test equipment related settings.

[0064] Furthermore, if the information processing device 20 sets at least a portion of the target electromagnetic wave test standard settings as EMI test equipment related settings, it displays at least a portion of the target electromagnetic wave test standard settings as modifiable EMI test equipment related settings in image P3. For example, if the target electromagnetic wave test is a calibration test, the calibration test equipment settings indicated by the calibration test equipment setting data included in the calibration test standard setting data are displayed as modifiable EMI test equipment settings in area R32 of image P3 shown in Figure 7. In this case, the information processing device 20 can change the EMI test equipment settings displayed in image P3 according to the operation received in area R32 of image P3. When the EMI test equipment settings are changed, the information processing device 20 updates the EMI test equipment settings set in the first application to the changed EMI test equipment settings. Also, for example, if the target electromagnetic wave test is a calibration test, the calibration test system settings indicated by the calibration test system setting data included in the calibration test standard setting data are displayed as modifiable EMI test system settings in area R32 of image P3 shown in Figure 8. In this case, the information processing device 20 can change the EMI test system settings displayed in image P3 in response to an operation received in area R32 of image P3. When the EMI test system settings are changed, the information processing device 20 updates the EMI test system settings set in the first application to the changed EMI test system settings. As described above, after setting at least a portion of the target electromagnetic wave test standard settings as EMI test equipment related settings, the information processing device 20 can change the EMI test equipment related settings set in the first application in response to an operation received via image P3. This allows the user to use at least a portion of the target electromagnetic wave test standard settings as a template for EMI test equipment related settings and make desired changes to the EMI test equipment related settings.

[0065] Furthermore, the information processing device 20 does not change the target electromagnetic wave test standard setting data regardless of how the settings displayed in image P3 are changed. This allows the user to change the settings displayed in image P3 to their desired settings without worrying about the loss of the target electromagnetic wave test standard setting data. In addition, when the information processing device 20 sets at least a portion of the target electromagnetic wave test standard settings as EMI test equipment related settings, it may be configured to set a predetermined portion of the target electromagnetic wave test standard settings as EMI test equipment related settings, or it may be configured to set a portion of the target electromagnetic wave test standard settings selected by the user as EMI test equipment related settings.

[0066] Button B33 is a button that displays an image that accepts an operation to import an EMI test equipment-related settings file, which shows the EMI test equipment-related settings to be set in the EMI test application. When the information processing device 20 receives a selection operation for button B33, it displays the image. When the image is displayed, the information processing device 20 imports the EMI test equipment-related settings file desired by the user in accordance with the operation received via the image, and updates the EMI test equipment-related settings set in the EMI test application to the EMI test equipment-related settings indicated in the imported EMI test equipment-related settings file. Here, the EMI test equipment-related settings file to be imported may be, for example, a file generated by any of the five applications other than the EMI test application among the six applications mentioned above, or a file generated by another device. However, the format of the file generated by another device is the same as the format of the file generated by the six applications.

[0067] Button B34 is a button that displays an image that accepts an operation to export an EMI test equipment-related settings file, which shows the EMI test equipment-related settings configured in the EMI test application. When the information processing device 20 receives a selection operation for button B34, it displays the image. When the image is displayed, the information processing device 20 exports an EMI test equipment-related settings file, which shows the EMI test equipment-related settings configured in the EMI test application, in accordance with the operation received via the image.

[0068] Returning to Figure 5, area R2 is the area where a checkbox CH is displayed, which accepts the operation of specifying whether or not to set the EMI test criteria setting as an EMI test equipment related setting. Figure 10 is a magnified view of the area around area R2 in the EMI test operation acceptance image P1 shown in Figure 5.

[0069] As described above, checkbox CH accepts an operation to specify whether or not to set the EMI test standard setting as an EMI test equipment related setting. If a selection operation is accepted when checkbox CH is not displayed, a check mark will be displayed. On the other hand, if a selection operation is accepted when checkbox CH is displayed, the displayed check mark will be removed. When a check mark is displayed on checkbox CH by a selection operation on checkbox CH, the information processing device 20 sets the EMI test standard setting as an EMI test equipment related setting. However, in this case, the information processing device 20 stores data indicating the EMI test equipment related setting that was set in the EMI test application immediately before the check mark was displayed on checkbox CH as EMI test equipment related setting history data in the memory area allocated to the EMI test application. Subsequently, when the check mark is removed from checkbox CH by a selection operation on checkbox CH, the information processing device 20 resets the EMI test equipment related setting set in the EMI test application from the EMI test standard setting to the EMI test equipment related setting indicated by the EMI test equipment related setting history data. This allows users to revert the EMI test application to its state before selecting checkbox CH, even if they have mistakenly set the EMI test equipment-related settings to EMI test criteria settings.

[0070] Furthermore, if a check mark appears on checkbox CH due to a selection operation, the information processing device 20 sets the startup state of the EMI test application to a state where a check mark is displayed on checkbox CH and the EMI test criteria setting is set as an EMI test equipment related setting. As a result, when the EMI test application is executed, the information processing device 20 can display an EMI test operation reception image P1 where a check mark is displayed on checkbox CH and the EMI test criteria setting is set as an EMI test equipment related setting. On the other hand, if the check mark is removed from checkbox CH due to a selection operation, the information processing device 20 sets the startup state of the EMI test application to a state where a check mark is not displayed on checkbox CH and the EMI test criteria setting is not set as an EMI test equipment related setting. As a result, when the EMI test application is executed, the information processing device 20 can display an EMI test operation reception image P1 where a check mark is not displayed on checkbox CH and the EMI test criteria setting is not set as an EMI test equipment related setting. These features enable the information processing device 20 to improve user convenience when operating on the EMI test operation reception image P1.

[0071] As shown in Figure 10, a caption for checkbox CH is displayed next to it, providing a description of checkbox CH. In the example shown in Figure 10, the caption reads, "Enables the default settings for the equipment." Thus, the caption for checkbox CH includes information indicating the default settings. This allows the information processing device 20 to visually and easily understand the EMI test standard settings as the default settings for EMI test equipment-related settings to be set in the EMI test application.

[0072] Furthermore, in the EMI test operation reception image P1, a checkbox CH like this is displayed on the same image as button B12. This allows the information processing device 20 to make the user aware that the EMI test standard settings, which are set as EMI test equipment-related settings in the EMI application by selecting checkbox CH, are not settings that can be erased by user operations, but rather settings that can be loaded in response to user operations. As a result, the information processing device 20 can reduce the user's psychological burden regarding changes to settings related to equipment used in electromagnetic wave testing using electromagnetic wave testing equipment. This is also useful because it encourages users to optimize the EMI test equipment-related settings they set in the EMI test application.

[0073] As described above, the information processing device 20 sets at least a portion of the settings related to the target electromagnetic wave test equipment as EMI test equipment-related settings among the settings set in the EMI test application, in response to the operation received via the EMI test operation reception image P1. This allows the information processing device 20 to improve the efficiency of settings related to the equipment used in EMI testing.

[0074] Furthermore, in the information processing device 20, the EMI test operation reception image P1 includes a button B12 and a checkbox CH. This allows the information processing device 20 to reduce the psychological burden on the user when changing EMI test equipment-related settings.

[0075] Furthermore, some or all of the configuration of the EMI test operation reception image P1 described above may be applied to some or all of the EMS test operation reception image, EMI-CE test operation reception image, EMS-CIM test operation reception image, site conformity test operation reception image, and calibration test operation reception image. For example, if the EMS test is an example of the first test, then the EMI test, EMI-CE test, EMS-CIM test, site conformity test, and calibration test are examples of the second and third tests, respectively.

[0076] <Hardware Configuration of Information Processing Device> The hardware configuration of the information processing device 20 will be described below with reference to Figure 11. Figure 11 is a diagram showing an example of the hardware configuration of the information processing device 20.

[0077] The information processing device 20 includes, for example, a processor 21, a storage unit 22, an input receiving unit 23, a communication unit 24, and a display unit 25. These components are connected to each other via a bus so that they can communicate with one another. The information processing device 20 also communicates with the transmitting antenna 51, receiving antenna 52, electromagnetic stirrer 53, etc. of the electromagnetic wave testing device 10 via the communication unit 24.

[0078] The processor 21 is, for example, a CPU (Central Processing Unit). However, the processor 21 may be another processor, such as an FPGA (Field Programmable Gate Array), instead of a CPU. The processor 21 executes various programs stored in the memory unit 22.

[0079] The storage unit 22 is a storage device that includes, for example, an HDD (Hard Disk Drive), an SSD (Solid State Drive), an EEPROM (Electrically Erasable Programmable Read Only Memory), a ROM (Read Only Memory), or a RAM (Random Access Memory). The storage unit 22 may be an external storage device connected via a digital input / output port such as a USB (Universal Serial Bus), instead of being built into the information processing device 20. The storage unit 22 stores various types of information, images, and programs processed by the information processing device 20. In other words, the various types of information stored by the information processing device 20 are stored in the storage unit 22. The storage areas allocated to each of the six applications mentioned above are the storage areas included in the storage area of ​​the storage unit 22.

[0080] The input receiving unit 23 is an input device such as a keyboard, mouse, or touchpad. The input receiving unit 23 may also be configured as a touch panel and integrated with the display unit 25.

[0081] The communication unit 24 is a communication device that includes, for example, digital input / output ports such as USB, an Ethernet® port, an antenna for wireless communication, and the like.

[0082] The display unit 25 is a display device including the display of the information processing device 20. The display is, for example, a liquid crystal display, but is not limited to that.

[0083] <Functional Configuration of the Information Processing Device> The functional configuration of the information processing device 20 will be described below with reference to Figure 12. Figure 12 is a diagram showing an example of the functional configuration of the information processing device 20.

[0084] The information processing device 20 includes a storage unit 22, an input receiving unit 23, a communication unit 24, a display unit 25, and a control unit 26.

[0085] The control unit 26 controls the entire information processing device 20. The control unit 26 comprises a processing unit 261 and a display control unit 262. These functional units of the control unit 26 are realized, for example, by the processor 21 executing various programs stored in the storage unit 22. Some or all of these functional units may be hardware functional units such as LSIs (Large Scale Integration) or ASICs (Application Specific Integrated Circuits).

[0086] The processing unit 261 executes various processes performed by the information processing device 20. For example, the processing unit 261 performs the processes that the information processing device 20 performs to enable each of the six applications mentioned above to perform their respective functions. However, in the information processing device 20, the generation and display of images are performed by the display control unit 262, which will be described later.

[0087] The display control unit 262 generates various images in response to operations received by the information processing device 20. The display control unit 262 displays the generated images on the display unit 25.

[0088] <Processing performed by the information processing device on the operation reception image> The following describes the flow of processing performed by the information processing device 20 on the EMI test operation reception image P1, with reference to Figure 13. Figure 13 is a diagram showing an example of the flow of processing performed by the information processing device 20 on the EMI test operation reception image P1. For example, when the EMI test operation reception image P1 is displayed on the display unit 25, the information processing device 20 performs the processing shown in the flowchart in Figure 13.

[0089] After the EMI test operation reception image P1 is displayed on the display unit 25, the control unit 26 waits until it receives an operation via the EMI test operation reception image P1 (step S110). In Figure 13, the process in step S110 is indicated by "Operation reception?".

[0090] If the control unit 26 determines that it has received an operation via the EMI test operation reception image P1 (step S110-YES), it determines whether the received operation is an operation that terminates the process shown in the flowchart in Figure 13 (step S120). The determination process in step S120 by the control unit 26 may be performed by a known method or by a method to be developed in the future. Also, in Figure 13, the process in step S120 is indicated by "Termination?".

[0091] If the control unit 26 determines that the operation received in step S110 is an operation to terminate the process shown in the flowchart in Figure 13 (step S120-YES), it terminates the process shown in the flowchart in Figure 13.

[0092] On the other hand, if the control unit 26 determines that the operation received in step S110 is not an operation that terminates the process shown in the flowchart in Figure 13 (step S120-NO), it performs processing according to the received operation (step S130). This processing includes various processes that have been described as processes performed by the information processing device 20 in this embodiment. Here, the processing performed by the control unit 26 in step S130 has already been described in the explanation of Figures 5 to 10, so a detailed explanation is omitted.

[0093] After the processing in step S130 is completed, the control unit 26 transitions to step S110 and waits again until it receives an operation via the EMI test operation reception image P1.

[0094] As described above, the information processing device according to the embodiment is an information processing device that causes an electromagnetic wave testing device including a reflecting box to perform multiple types of electromagnetic wave tests. When a first application is executed to cause the electromagnetic wave testing device to perform a first test among the multiple types of electromagnetic wave tests, the information processing device displays a first operation reception image that accepts user operations for the first application. At least a part of the second reference setting, which serves as a reference for the second setting concerning the equipment used for measuring the second test among the settings set in the second application that causes the electromagnetic wave testing device to perform a second test different from the first test among the multiple types of electromagnetic wave tests, is set as the first setting concerning the equipment used for measuring the first test among the settings set in the first application, in response to the operation received via the first operation reception image. As a result, the information processing device can improve the efficiency of setting up equipment used for multiple types of electromagnetic wave tests using the electromagnetic wave testing device.

[0095] Furthermore, the information processing device according to the embodiment is an information processing device that causes an electromagnetic wave testing device including a reflection box to perform multiple types of electromagnetic wave tests, and when a first application is executed that causes the electromagnetic wave testing device to perform a first test among the multiple types of electromagnetic wave tests, the information processing device displays a first operation reception image that accepts user operations on the first application, and the first operation reception image includes a first image that accepts an operation to display a first setting reception image that accepts a first setting related to the equipment used for measuring the first test among the settings set in the first application, and a second image that accepts an operation to specify whether or not to set a first reference setting that serves as a standard for the first setting as the first setting. As a result, the information processing device can reduce the psychological burden on the user regarding changes to the settings related to the equipment used in electromagnetic wave tests using the electromagnetic wave testing device.

[0096] The information processing device 20 described above may be configured as an integral part of the electromagnetic wave testing device 10.

[0097] Furthermore, the matters described above may be combined in any way. Also, the GUI described above may be referred to as an image.

[0098] <Note 1> [1] An information processing device for causing an electromagnetic wave testing apparatus including a reflecting box to perform multiple types of electromagnetic wave tests, wherein when a first application is executed to cause the electromagnetic wave testing apparatus to perform a first test among the multiple types of electromagnetic wave tests, the information processing device displays a first operation reception image for receiving user operations for the first application, and sets at least a part of a second reference setting that serves as a standard for a second setting concerning the equipment used to measure the second test among the settings set in a second application for causing the electromagnetic wave testing apparatus to perform a second test different from the first test among the multiple types of electromagnetic wave tests, as a first setting concerning the equipment used to measure the first test among the settings set in the first application in response to an operation received via the first operation reception image. [2] The information processing device according to [1], further comprising a storage unit for storing the first application and the second application, wherein a second storage area of ​​the storage unit used by the second application when the second application is executed stores second reference setting data indicating the second reference setting, and the information processing device reads the second reference setting data in response to an operation received via the first operation reception image, and sets at least a part of the second reference setting indicated by the read second reference setting data as the first setting. [3] The information processing device according to [2], wherein the first setting includes settings for equipment used in the first test and settings for a measurement system used in the first test, and the second setting includes settings for equipment used in the second test and settings for a measurement system used in the second test, and the information processing device reads either or both of the data included in the second reference setting data, which are second equipment setting data indicating settings for equipment used in the second test and second system setting data indicating settings for a measurement system used in the second test, in response to an operation received via the first operation reception image, and sets at least a part of the read data as the first setting.[4] The information processing device according to any one of [1] to [3], wherein the information processing device sets a first reference setting that serves as a basis for the first setting as the first setting in response to an operation received via the first operation reception image. [5] The information processing device according to [4], comprising a storage unit that stores the first application and the second application, wherein a first storage area of ​​the storage area of ​​the storage unit that is used by the first application when the first application is executed stores first reference setting data indicating a first reference setting that serves as a basis for the first setting, and the information processing device reads the first reference setting data in response to an operation received via the first operation reception image, and sets the first reference setting indicated by the read first reference setting data as the first setting. [6] The information processing device according to [5], wherein the information processing device permits editing of the first reference setting data by a user with predetermined authority, and does not permit editing of the first reference setting data by a user without the predetermined authority. [7] The information processing device according to any one of [1] to [6], wherein when the second application is executed, the information processing device displays a second operation reception image for receiving user operations on the second application, sets the second reference setting as the second setting in accordance with the operation received via the second operation reception image, and sets at least a portion of the first reference setting which serves as the basis for the first setting as the second setting in accordance with the operation received via the second operation reception image. [8] The information processing device according to any one of [1] to [7], wherein the first operation reception image includes an image for receiving an operation to display a first setting reception image which accepts the first setting, and when at least a portion of the second reference setting is set as the first setting, the information processing device displays at least a portion of the second reference setting as a modifiable first setting in the first setting reception image, changes the first setting displayed in the first operation reception image in accordance with the operation received, and updates the first setting set in the first application.[9] The information processing device according to [8], wherein the information processing device exports a first setting file showing the first setting displayed in the first setting reception image in response to an operation received.

[10] The information processing device according to any one of [1] to [9], wherein the information processing device executes either the first application, the second application, or a third application that causes the electromagnetic wave testing device to perform a third test different from the first and second tests among the plurality of types of electromagnetic wave tests, and selects to execute either setting at least a part of the second reference setting as the first setting via the first operation reception image, or setting at least a part of the third reference setting that serves as a reference for the third setting related to the equipment used for measuring the third test among the settings set in the third application as the first setting.

[11] A storage unit that stores the first application, the second application, and the third application, wherein a first storage area of ​​the storage unit used by the first application when the first application is executed stores first reference setting data indicating a first reference setting that serves as a basis for the first setting, a second storage area of ​​the storage unit used by the second application when the second application is executed stores second reference setting data indicating a second reference setting, and a third storage area of ​​the storage unit used by the third application when the third application is executed stores The information processing device according to

[10] , wherein a third reference setting data indicating the third reference setting is stored, and the information processing device reads the first reference setting data in response to an operation received via the first operation reception image, sets the first reference setting indicated by the read first reference setting data as the first setting, reads the second reference setting data in response to an operation received via the first operation reception image, sets at least a part of the second reference setting indicated by the read second reference setting data as the first setting, reads the third reference setting data in response to an operation received via the first operation reception image, sets at least a part of the third reference setting indicated by the read third reference setting data as the first setting.

[12] The information processing device according to any one of [1] to

[11] , wherein the information processing device imports a first setting file indicating the first setting in response to an operation received.

[13] The information processing device according to

[12] , wherein the first setting file is a file generated by the second application.

[14] The information processing apparatus according to

[12] , wherein the first configuration file is a file generated by another device, and the format of the file generated by the other device is the same as the format of the file generated by the second application.

[15] The information processing device according to any one of [1] to

[14] , wherein the first operation reception image includes a first image that accepts an operation to display a first setting reception image that accepts the first setting, and a second image that accepts an operation to specify whether or not to set a first reference setting that serves as a basis for the first setting as the first setting.

[16] The information processing device according to

[15] , wherein the caption of the second image includes information indicating the default.

[17] The information processing device according to

[15] or

[16] , wherein when the first application is executed in which a state is maintained in which an operation to specify setting the first reference setting as the first setting has been accepted in the second image, the information processing device displays the first operation reception image in which the first reference setting is set as the first setting, and when the first application is executed in which a state is maintained in which an operation to specify setting the first reference setting as the first setting has not been accepted in the second image, the information processing device according to

[15] or

[16] , wherein the information processing device displays the first operation reception image in which the first reference setting is not set as the first setting.

[18] The information processing device according to any one of

[15] to

[17] , comprising a storage unit for storing the first application and the second application, wherein the information processing device, after receiving a setting to be set as the first setting as a target setting, receives an operation via the second image to specify that the first reference setting be set as the first setting, stores data indicating the target setting in the storage unit as target setting history data, and sets the first reference setting as the first setting, and then receives an operation via the second image to specify that the first reference setting be not set as the first setting, reads the target setting history data stored in the storage unit, and resets the target setting indicated by the read target setting history data as the first setting.

[19] The information processing device according to any one of [1] to

[18] , wherein the equipment used for measuring the first test and the equipment used for measuring the second test are equipment used in electromagnetic wave testing.

[20] An electromagnetic wave testing apparatus comprising an information processing device described in any one of [1] to

[19] .

[21] A program to be executed by a computer of an information processing device that causes an electromagnetic wave testing apparatus including a reflecting box to perform a plurality of types of electromagnetic wave tests, wherein the program is a first application that causes the electromagnetic wave testing apparatus to perform a first test among the plurality of types of electromagnetic wave tests, and when executed, displays a first operation reception image that accepts operations from a user to the first application, and sets at least a part of a second reference setting that serves as a reference for a second setting concerning equipment used for measuring the second test among the settings set in a second application that causes the electromagnetic wave testing apparatus to perform a second test different from the first test among the plurality of types of electromagnetic wave tests, as a first setting concerning equipment used for measuring the first test among the settings set in the first application in response to an operation received via the first operation reception image.

[22] An electromagnetic wave testing system comprising an electromagnetic wave testing apparatus including a reflecting box and an information processing device for causing the electromagnetic wave testing apparatus to perform a plurality of types of electromagnetic wave tests, wherein when the information processing device executes a first application for causing the electromagnetic wave testing apparatus to perform a first test among the plurality of types of electromagnetic wave tests, it displays a first operation reception image for accepting user operations for the first application, and sets at least a part of a second reference setting that serves as a reference for a second setting concerning the equipment used for measuring the second test among the settings set in a second application for causing the electromagnetic wave testing apparatus to perform a second test different from the first test among the plurality of types of electromagnetic wave tests, as a first setting concerning the equipment used for measuring the first test among the settings set in the first application in response to an operation received via the first operation reception image.

[0099] <Note 2> [1] An information processing device that causes an electromagnetic wave testing apparatus including a reflecting box to perform multiple types of electromagnetic wave tests, wherein when a first application is executed to cause the electromagnetic wave testing apparatus to perform a first test among the multiple types of electromagnetic wave tests, the information processing device displays a first operation reception image for receiving user operations on the first application, the first operation reception image includes a first image for receiving an operation to display a first setting reception image for receiving a first setting related to the equipment used for measuring the first test among the settings set in the first application, and a second image for receiving an operation to specify whether or not to set a first reference setting that serves as a standard for the first setting as the first setting. [2] The information processing device according to [1], further comprising a storage unit for storing the first application, wherein a first storage area of ​​the storage unit used by the first application when the first application is executed stores first reference setting data indicating a first reference setting that serves as a standard for equipment used to measure the first test, and in response to an operation received via the first operation reception image, the first reference setting data is read, and the first reference setting indicated by the read first reference setting data is set as the first setting. [3] The information processing device according to [1] or [2], wherein the caption of the second image contains information indicating the default. [4] The information processing device according to any one of [1] to [3], wherein when the information processing device executes the first application in which a state has been maintained in which an operation to specify setting the first reference setting as the first setting has been accepted in the second image, it displays the first operation acceptance image in which the first reference setting is set as the first setting, and when the information processing device executes the first application in which a state has been maintained in which an operation to specify setting the first reference setting as the first setting has not been accepted in the second image, it displays the first operation acceptance image in which the first reference setting is not set as the first setting.[5] The information processing device according to any one of [1] to [4], comprising a storage unit for storing the first application, wherein the information processing device, after receiving a setting to be set as the first setting as a target setting, receives an operation via the second image to specify that the first reference setting be set as the first setting, stores data indicating the target setting in the storage unit as target setting history data, and sets the first reference setting as the first setting, and then receives an operation via the second image to specify that the first reference setting be not set as the first setting, reads the target setting history data stored in the storage unit, and resets the target setting indicated by the read target setting history data as the first setting. [6] The information processing device according to any one of [1] to [5], wherein the equipment used for measuring the first test is equipment used in electromagnetic wave testing. [7] Electromagnetic wave testing device, comprising the information processing device according to any one of [1] to [6]. [8] A program to be executed by a computer of an information processing device that causes an electromagnetic wave testing apparatus including a reflector box to perform multiple types of electromagnetic wave tests, wherein the program is a first application that causes the electromagnetic wave testing apparatus to perform a first test among the multiple types of electromagnetic wave tests, and when executed, displays a first operation reception image that accepts user operations for the first application, the first operation reception image includes a first image that accepts an operation to display a first setting reception image that accepts a first setting related to the equipment used for measuring the first test among the settings set in the first application, and a second image that accepts an operation to specify whether or not to set a first reference setting that serves as a standard for the first setting as the first setting.[9] An electromagnetic wave testing system comprising an electromagnetic wave testing apparatus including a reflecting box and an information processing apparatus for causing the electromagnetic wave testing apparatus to perform a plurality of types of electromagnetic wave tests, wherein when the information processing apparatus executes a first application for causing the electromagnetic wave testing apparatus to perform a first test among the plurality of types of electromagnetic wave tests, it displays a first operation reception image for accepting user operations on the first application, the first operation reception image includes a first image for accepting an operation to display a first setting reception image for accepting a first setting related to the equipment used for measuring the first test among the settings set in the first application, and a second image for accepting an operation to specify whether or not to set a first reference setting that serves as a standard for the first setting as the first setting.

[0100] Although embodiments of this disclosure have been described in detail above with reference to the drawings, the specific configuration is not limited to these embodiments and may be modified, replaced, deleted, etc., as long as it does not deviate from the gist of this disclosure.

[0101] Furthermore, a program to realize the function of any component in the apparatus described above (for example, electromagnetic wave testing system 1, electromagnetic wave testing device 10, information processing device 20, etc.) may be recorded on a computer-readable recording medium, and the program may be loaded into a computer system and executed. Here, "computer system" includes hardware such as the OS (Operating System) and peripheral devices. Furthermore, "computer-readable recording medium" refers to portable media such as flexible disks, magneto-optical disks, ROM (Read Only Memory), CD (Compact Disk)-ROM, and storage devices such as hard disks built into computer systems. Moreover, "computer-readable recording medium" also includes volatile memory (such as RAM (Random Access Memory)) inside computer systems that act as servers or clients when programs are transmitted via networks such as the Internet or communication lines such as telephone lines, which retain programs for a certain period of time.

[0102] Furthermore, the above program may be transmitted from a computer system that stores this program in a memory device or the like to another computer system via a transmission medium or by transmission waves within the transmission medium. Here, the "transmission medium" for transmitting the program refers to a medium that has the function of transmitting information, such as a network (communication network) such as the Internet or a communication line (communication line) such as a telephone line. Also, the above program may be for the purpose of realizing a part of the functions described above. Furthermore, the above program may be one that can realize the functions described above in combination with a program already recorded in the computer system, a so-called differential file (differential program).

[0103] This reduces the psychological burden on users when it comes to changing settings on equipment used in electromagnetic wave testing using electromagnetic wave testing devices.

[0104] 1...Electromagnetic wave testing system, 5...Reflector box, 10...Electromagnetic wave testing device, 20...Information processing device, 21...Processor, 22...Storage unit, 23...Input receiving unit, 24...Communication unit, 25...Display unit, 26...Control unit, 51...Transmitting antenna, 52...Receiving antenna, 53...Electromagnetic stirrer, 54...Mounting platform, 261...Processing unit, 262...Display control unit, TM...Test specimen

Claims

1. An information processing device for causing an electromagnetic wave testing apparatus including a reflecting box to perform multiple types of electromagnetic wave tests, wherein when a first application is executed to cause the electromagnetic wave testing apparatus to perform a first test among the multiple types of electromagnetic wave tests, the information processing device displays a first operation reception image for accepting user operations on the first application, the first operation reception image includes a first image for accepting an operation to display a first setting reception image for accepting a first setting related to the equipment used for measuring the first test among the settings set in the first application, and a second image for accepting an operation to specify whether or not to set a first reference setting, which serves as a standard for the first setting, as the first setting.

2. The information processing device according to claim 1, comprising a storage unit for storing the first application, wherein a first storage area of ​​the storage unit used by the first application when the first application is executed stores first reference setting data indicating a first reference setting that serves as a standard for equipment used to measure the first test, and reads the first reference setting data in response to an operation received via the first operation reception image, and sets the first reference setting indicated by the read first reference setting data as the first setting.

3. The information processing apparatus according to claim 1, wherein the caption of the second image includes information indicating the default.

4. The information processing device according to claim 1, wherein when the information processing device executes the first application in which a state has been maintained in which an operation to specify setting the first reference setting as the first setting has been accepted in the second image, it displays the first operation acceptance image in which the first reference setting is set as the first setting, and when the information processing device executes the first application in which a state has been maintained in which an operation to specify setting the first reference setting as the first setting has not been accepted in the second image, it displays the first operation acceptance image in which the first reference setting is not set as the first setting.

5. The information processing device according to claim 1, comprising a storage unit for storing the first application, wherein the information processing device, after receiving a setting to be set as the first setting as a target setting, receives an operation via the second image to specify that the first reference setting be set as the first setting, stores data indicating the target setting in the storage unit as target setting history data, and sets the first reference setting as the first setting, and then receives an operation via the second image to specify that the first reference setting be not set as the first setting, reads the target setting history data stored in the storage unit, and resets the target setting indicated by the read target setting history data as the first setting.

6. The information processing apparatus according to claim 1, wherein the equipment used for the measurement of the first test is equipment used in electromagnetic wave testing.

7. An electromagnetic wave testing apparatus comprising an information processing device according to any one of claims 1 to 6.

8. A program to be executed by a computer of an information processing device that causes an electromagnetic wave testing apparatus including a reflecting box to perform multiple types of electromagnetic wave tests, wherein the program is a first application that causes the electromagnetic wave testing apparatus to perform a first test among the multiple types of electromagnetic wave tests, and when executed, displays a first operation reception image that accepts user operations for the first application, the first operation reception image includes a first image that accepts an operation to display a first setting reception image that accepts a first setting related to the equipment used for measuring the first test among the settings set in the first application, and a second image that accepts an operation to specify whether or not to set a first reference setting that serves as a standard for the first setting as the first setting.

9. An electromagnetic wave testing system comprising an electromagnetic wave testing apparatus including a reflecting box and an information processing apparatus for causing the electromagnetic wave testing apparatus to perform a plurality of types of electromagnetic wave tests, wherein when the information processing apparatus executes a first application for causing the electromagnetic wave testing apparatus to perform a first test among the plurality of types of electromagnetic wave tests, it displays a first operation reception image for accepting user operations on the first application, the first operation reception image includes a first image for accepting an operation to display a first setting reception image for accepting a first setting related to the equipment used for measuring the first test among the settings set in the first application, and a second image for accepting an operation to specify whether or not to set a first reference setting, which serves as a standard for the first setting, as the first setting.