Electronic load system, power supply testing method, electronic device, and storage medium

Abstract

The present application relates to the technical field of electricity and discloses an electronic load system, a power supply testing method, an electronic device, and a storage medium. A main control circuit can provide a reference voltage to a current sampling and control circuit, and can also acquire load current set parameters. The current sampling and control circuit determines a control voltage mainly by means of acquiring a sampled voltage and comparing the sampled voltage with the reference voltage, to control the on-resistance in a power circuit by means of the control voltage, thereby controlling the magnitude of a current passing through on / off resistors. Meanwhile, since the load current parameters can control a change rate of the current, rapid changes in a load current can be achieved. Thus, the technical problem of how to achieve rapid changes in a current and improve the accuracy of a test result can be solved, thereby satisfying a requirement of rapid current change and achieving the technical effect of improving the test result.

Description

Electronic load systems and power supply test methods, electronic devices and storage media

[0001] Cross-references to related applications

[0002] This application claims priority to Chinese Patent Application No. 202510379036.3, filed on March 28, 2025, entitled “Electronic Load System and Power Supply Test Method, Electronic Device and Storage Medium”, the entire contents of which are incorporated herein by reference. Technical Field

[0003] This application relates to the field of electrical technology, and in particular to an electronic load system and power supply testing method, electronic equipment and storage medium. Background Technology

[0004] In the field of electronics, board-level power supply integrity testing is a crucial step in ensuring the quality of power supplies on circuit boards. Dynamic load testing, as an important component of board-level power supply integrity testing, is primarily used to evaluate the power supply's response and stability under rapid load changes. Currently, dynamic load testing mainly relies on electronic load meters.

[0005] In board-level power supply integrity testing, DC circuits with digital chips as loads require a high current change slope. However, existing electronic load systems or instruments have low nominal maximum load slopes and cannot actually reach the nominal specifications, making it impossible to quickly change the current, which leads to inaccurate test results. Summary of the Invention

[0006] This application provides an electronic load system and power supply testing method, electronic device and storage medium to at least solve the problem that existing electronic load systems or instruments in the related art have low nominal maximum load slopes and cannot actually reach the nominal indicators, and cannot quickly change the current, thus leading to inaccurate test results.

[0007] This application provides an electronic load system, including: a main control circuit, a current sampling and control circuit, a power circuit, and a power supply circuit.

[0008] The power supply circuit is used to provide operating voltage to the main control circuit.

[0009] The main control circuit is used to acquire pre-configured load current parameters, convert the operating voltage into a reference voltage based on the load current parameters, and transmit the reference voltage to the current sampling and control circuit; wherein, the reference voltage is a stable voltage value used as a reference standard in the electronic load system;

[0010] The current sampling and control circuit is used to sample voltage from the power circuit to obtain the sampled voltage, and to perform differential calculation between the sampled voltage and the reference voltage to obtain the control voltage, which is then transmitted to the power circuit.

[0011] A power circuit is used to adjust the magnitude of the on-resistance in the power circuit according to the control voltage, and to adjust the magnitude of the current according to the adjusted on-resistance and the load current parameters to obtain the target current. The load current parameters are used to control at least the rate at which the magnitude of the current is adjusted.

[0012] This application also provides a power supply testing method, which is applied to the above-mentioned electronic load system, including:

[0013] Obtain the pre-configured load current parameters and convert the operating voltage into a reference voltage based on the load current parameters; wherein, the reference voltage is a stable voltage value used as a reference standard in the electronic load system;

[0014] Voltage sampling is performed on the power circuit of the electronic load system to obtain the sampled voltage. Then, differential calculation is performed between the sampled voltage and the reference voltage to obtain the control voltage. The electronic load system is a pre-built system for power supply testing.

[0015] The on-resistance in the power circuit is adjusted according to the control voltage, and the current is adjusted according to the adjusted on-resistance and load current parameters to obtain the target current. The load current parameters are used to control at least the rate at which the current is adjusted.

[0016] This application also provides a power supply testing device, including:

[0017] The acquisition unit is used to acquire pre-configured load current parameters and convert the operating voltage into a reference voltage based on the load current parameters; wherein, the reference voltage is a stable voltage value used as a reference standard in the electronic load system;

[0018] The sampling unit is used to perform voltage sampling processing on the power circuit of the electronic load system to obtain the sampled voltage;

[0019] The arithmetic unit is used to perform differential arithmetic processing based on the sampled voltage and the reference voltage to obtain the control voltage; the electronic load system is a pre-built system for power supply testing.

[0020] The adjustment unit is used to adjust the magnitude of the on-resistance in the power circuit according to the control voltage, and to adjust the magnitude of the current according to the adjusted on-resistance and the load current parameters to obtain the target current. The load current parameters are used to control at least the rate at which the magnitude of the current is adjusted.

[0021] This application also provides an electronic device, including: a memory for storing a computer program; and a processor for executing the computer program to implement the steps of any of the above power supply testing methods.

[0022] This application also provides a computer non-volatile readable storage medium storing a computer program, wherein the computer program, when executed by a processor, implements the steps of any of the above-described power supply testing methods.

[0023] This application also provides a computer program product, including a computer program that, when executed by a processor, implements the steps of any of the above-described power supply testing methods.

[0024] The electronic load system, power supply testing method, electronic device, and storage medium of this application provide a reference voltage to the current sampling and control circuit, and also acquire load current setting parameters. The current sampling and control circuit determines the control voltage by comparing the sampled voltage with the reference voltage. This control voltage controls the on-resistance in the power circuit, thereby controlling the magnitude of the current flowing through the on-resistance. Furthermore, since the load current parameters can control the rate of current change, rapid changes in the load current can be achieved. Therefore, this invention solves the technical problem of achieving rapid current changes and improving the accuracy of test results, thus meeting the requirements for rapid current changes and improving the technical effect of test results. Attached Figure Description

[0025] To more clearly illustrate the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0026] Figure 1 is a schematic diagram of an electronic load system provided in an embodiment of this application;

[0027] Figure 2 is a working block diagram of an electronic load system provided in an embodiment of this application;

[0028] Figure 3 is a schematic diagram of a host computer page provided in an embodiment of this application;

[0029] Figure 4 is a schematic diagram of a current control loop provided in an embodiment of this application;

[0030] Figure 5 is a flowchart illustrating a power supply testing method provided in an embodiment of this application;

[0031] Figure 6 is a schematic diagram of a power supply testing device provided in an embodiment of this application. Detailed Implementation

[0032] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of this application.

[0033] It should be noted that, in the description of this application, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. The terms "first," "second," etc., in this application are used to distinguish similar objects and are not used to describe a specific order or sequence.

[0034] To enable those skilled in the art to better understand the present application, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0035] The specific application environment architecture or specific hardware architecture on which the power supply testing method depends is described here.

[0036] Figure 1 is a schematic diagram of an electronic load system provided in this application. The execution of the power supply test method depends on the electronic load system.

[0037] As shown in Figure 1, the electronic load system includes: a main control circuit 11, a current sampling and control circuit 12, a power circuit 13, and a power supply circuit 14.

[0038] The power supply circuit 14 is used to provide operating voltage to the main control circuit 11;

[0039] The main control circuit 11 is used to acquire the pre-configured load current parameters, convert the working voltage into a reference voltage based on the load current parameters, and transmit the reference voltage to the current sampling and control circuit 12.

[0040] The current sampling and control circuit 12 is used to perform voltage sampling processing from the power circuit to obtain the sampled voltage, and to perform differential operation processing based on the sampled voltage and the reference voltage to obtain the control voltage, and then transmit the control voltage to the power circuit 13.

[0041] The power circuit 13 is used to adjust the magnitude of the on-resistance in the power circuit according to the control voltage, and to adjust the magnitude of the current according to the adjusted on-resistance and the load current parameter to obtain the target current. The load current parameter is used to control at least the rate at which the magnitude of the current is adjusted.

[0042] The main control circuit 11 can be a digital control circuit composed of an STM32F103 as the main control chip. Its main function is to provide a reference voltage to the current sampling and control circuit 12 through digital-to-analog conversion (DAC) to control the current passing through the metal-oxide-semiconductor (MOS). It can also communicate with a host computer to obtain load current setting parameters and can achieve multi-machine parallel operation through an inter-integrated circuit (IIC) bus. The current sampling and control circuit 12 mainly consists of an operational amplifier. It controls the on-resistance of the MOS by comparing the current value flowing through the MOS with the given value of the main control chip, thereby controlling the magnitude of the current passing through the MOS. The power circuit 13 mainly consists of four MOS (on-resistors) used as load current sinks. Due to its ability to quickly turn on and off, it can realize the function of rapid load current change. The main function of the power supply circuit 14 is to provide the necessary power supply voltage to the main control circuit 11 to ensure that the entire electronic load system can work normally. Its components include, but are not limited to, power adapters, voltage regulators and other components to ensure that the output voltage is stable and meets the requirements of the main control circuit 11.

[0043] Furthermore, to facilitate understanding of the embodiments of this application, this application also provides a working block diagram of an electronic load system, as shown in FIG2, wherein the main control circuit is connected to the host computer, the working power supply circuit and the current sampling and control circuit, and the power circuit is connected to the device under test and the current sampling and control circuit.

[0044] The main control circuit 11, serving as the system's control center, includes, but is not limited to, a main control chip, a digital-to-analog converter (DAC), a communication interface, and a logic control unit. The main control chip (e.g., STM32F103) receives load current parameters set by an external host computer through the communication interface, including but not limited to: target current value, current change rate, and extreme current duration. The DAC converts the target current value from the load current parameters into a corresponding reference voltage signal.

[0045] The current sampling and control circuit 12 includes, but is not limited to, a voltage sampling module, a differential operational amplifier, and a signal driving unit. The voltage sampling module acquires the small voltage drop signal (i.e., the sampling voltage) corresponding to the actual current flowing through the load via a detection point connected across the sampling resistor in the power circuit 13. The differential operational amplifier amplifies and conditions the sampling voltage through multiple stages and performs differential calculations with the reference voltage output from the main control circuit to generate a control voltage characterizing the error. The control voltage, after having its driving capability enhanced by the signal driving unit (e.g., a voltage follower composed of transistors), is transmitted to the power circuit 13 to adjust the on-resistance in the power circuit. Through a closed-loop feedback mechanism, the dynamic difference between the sampling voltage and the reference voltage is corrected in real time, ensuring accurate tracking of the output current.

[0046] The power circuit 13 consists of parallel-connected power metal-oxide-semiconductor field-effect transistors (MOS), sampling resistors, and a gate control network. The MOS acts as a variable load device, and its on-resistance is controlled by the gate voltage. When a control voltage is applied to the gate of the MOS, its on-resistance dynamically adjusts with the voltage change, thereby altering the current flowing through the MOS. The sampling resistor, connected in series in the load circuit, has a resistance in the milliohm range and is used to convert the current value into a measurable voltage signal for feedback calculation by the current sampling and control circuit 12. The parallel design of multiple MOS transistors not only expands the system's maximum current carrying capacity but also enables fine-tuning of the on-resistance through independent gate control. The current change rate set in the load current parameters is programmed and controlled by the main control circuit 11 to the reference voltage change rate, ultimately translating into the adjustment speed of the on-resistance in the power circuit 13, thus achieving controllable output current slope.

[0047] The power supply circuit 14 is the system's energy supply unit, and its functions include, but are not limited to: converting the external input voltage into a stable low-voltage DC power supply to provide an appropriate operating voltage for the main control circuit 11 and other functional modules. The operating voltage typically includes multi-stage voltage outputs, such as generating 5V and 3.3V power supplies through a low-dropout linear regulator (LDO) to drive the digital control unit and analog signal processing circuit, respectively, ensuring that each module operates in a low-noise, high-stability power supply environment.

[0048] Pre-configured load current parameters include, but are not limited to: minimum load current, maximum load current, maximum current duration, minimum current duration, and current change rate (A / µs). Simultaneously, the load current parameters, as externally input control variables, encompass dimensions such as target current extremes, change rate, and duration. The change rate is defined as the amount of current change per unit time (e.g., A / µs), and is mapped to the slope of a reference voltage signal by the main control circuit 11, thereby controlling the adjustment step interval and amplitude of the on-resistance in the power circuit 13. For example, during the phase where the current rises from the minimum to the maximum value, the system decomposes the target current into multiple discrete steps, each step corresponding to an incremental change in the reference voltage, and achieves precise control of the overall slope through preset time intervals. This parameterized control mechanism enables the electronic load system to simulate the transient current characteristics of digital chip loads, making it suitable for demanding scenarios such as power supply dynamic response testing.

[0049] The electronic load system of this application provides a reference voltage to the current sampling and control circuit, and also acquires the load current setting parameters. The current sampling and control circuit determines the control voltage by comparing the sampled voltage with the reference voltage. This control voltage then controls the on-resistance in the power circuit, thereby controlling the magnitude of the current flowing through the on-resistance. Furthermore, since the load current parameters can control the rate of current change, rapid changes in the load current can be achieved. Therefore, this solves the technical problem of how to achieve rapid current changes and improve the accuracy of test results, thus meeting the requirements for rapid current changes and improving the technical effect of test results.

[0050] In one possible embodiment of this application, the main control circuit 11 includes: a main control chip 111 and a communication interface 112.

[0051] The communication interface 112 is used to obtain configuration instructions for pre-configured load current parameters from a preset host computer device; wherein the configuration instructions include parameter information of the load current parameters.

[0052] The main control chip 111 is used to perform parameter configuration processing in the electronic load system according to configuration instructions and parameter information to obtain load current parameters.

[0053] The main control chip 111 is also used to perform voltage conversion processing on the operating voltage based on the load current parameter through the digital-to-analog conversion function, and output the reference voltage through the first preset pin of the main control chip.

[0054] The main control circuit 11 hardware includes, but is not limited to: main control chip 111, crystal oscillator, status indicator light, program burning interface, communication interface 112 (such as: Universal Asynchronous Receiver / Transmitter (URAT) interface, Inter-Integrated Circuit (I2C) interface, Controller Area Network (CAN) interface), load switch, etc. The main control chip 111 is the control center of the device and is responsible for the normal operation of the device. After the device is powered on, the main control chip 111 first receives the instructions sent by the host computer through the URAT interface and completes the setting of load current related parameters (i.e., load current parameters). The DAC function of the main control chip 111 can output different voltages (i.e., reference voltage) from 0-3V through the first preset pin to control the current value through the MOS. By controlling the rate of change of the output voltage value of the first preset pin of the main control chip 111, the rate of change of current (A / us) can be controlled. Multiple devices can be interconnected through the I2C interface to realize the parallel operation of multiple machines and increase the upper limit of the maximum load current. The load switch can control the load when a single machine is connected or realize the common load of each device when multiple machines are connected in parallel.

[0055] The main control chip 111, as the core processing unit of the main control circuit 11, integrates a digital-to-analog converter (DAC), multi-task scheduling function, and high-speed computing capability, and is responsible for performing parameter configuration processing and voltage conversion processing. The communication interface 112 is the data interaction channel between the main control circuit 11 and external devices, supporting multiple industrial standard protocols. It can receive configuration commands from a preset host computer device (such as a computer or industrial control computer) and transmit the parameter information in the command to the main control chip 111. Regarding the host computer device, this application provides a schematic diagram of the host computer page, as shown in Figure 3. Through the host computer device, the load current parameter information can be provided.

[0056] The first preset pin is the physical output port of the main control chip 111, which transmits the generated reference voltage signal to the current sampling and control circuit 12. The first preset pin is connected to an external filter network through a low-impedance drive circuit to reduce noise interference and voltage drop during signal transmission. For example, pin 20 of the STM32F103 chip is configured as the first preset pin, and its output voltage range covers 0-3.3V, corresponding to the preset extreme range of the load current.

[0057] The collaborative design of the main control chip 111 and the communication interface 112 enables the flexible configuration and high dynamic response capability of the electronic load system, allowing the system to adapt to different host computer environments and support remote control and automated testing scenarios. The main control chip 111 transforms complex load current requirements into executable voltage control sequences through parameter configuration processing, and combines digital-to-analog conversion function to achieve high-precision reference voltage output, ensuring the controllability and repeatability of the current adjustment process. This enables the electronic load system to quickly respond to host computer commands, accurately simulate various load transient characteristics, and provide highly reliable dynamic load simulation capabilities for power supply testing.

[0058] In one possible embodiment of this application, the power circuit 13 includes: a sampling resistor 131,

[0059] The sampling resistor 131 is used to determine the sampling position of the current sampling and control circuit 12 in the voltage sampling process of the power circuit 13.

[0060] The sampling resistor 131 is a key sensing element in the power circuit. It is made of low-resistance, high-precision materials (such as manganese-copper alloy) and is connected in series in the main current path of the load circuit. The resistance of the sampling resistor 131 is designed to be in the milliohm range (e.g., 1mΩ), generating a small voltage drop linearly related to the current value when carrying large currents, while avoiding significant additional power consumption. The two ends of the sampling resistor 131 form the physical sampling location for voltage sampling processing; that is, when current flows through the resistor, the voltage difference across the resistor directly reflects the instantaneous current value. By placing the sampling resistor 131 on the main current path of the power circuit, it is ensured that all current flowing through the load is accurately captured, providing a true feedback signal for closed-loop control.

[0061] The precise layout and parameter design of the sampling resistor 131 significantly improves the reliability of current detection and the stability of system control. By placing the sampling resistor 131 at a critical position in the main current path, the system can capture the real value of the load current in real time, providing a high-fidelity signal source for closed-loop feedback.

[0062] In one possible embodiment of this application, the current sampling and control circuit 12 is further used for:

[0063] The current is sampled from the position of the sampling resistor 131 in the power circuit 13 to obtain the sampled current.

[0064] The voltage is calculated based on the sampling current and the sampling resistor 131 in the power circuit 13 to obtain the sampling voltage.

[0065] The sampled current is the output of the current sampling process, and its value represents the actual load current flowing through the power circuit 13. The acquisition of the sampled current depends on the synergistic optimization of the physical characteristics of the sampling resistor 131 and the circuit design: the low resistance of the sampling resistor 131 ensures that its power loss is controllable in high current scenarios, while the high-precision materials and temperature compensation design (such as copper-manganese alloy and thermistor compensation network) ensure the stability of the resistance value, thereby making the calculation result of the sampled current unaffected by ambient temperature fluctuations.

[0066] Voltage calculation processing is the step of converting the sampled current into an equivalent voltage signal. The current sampling and control circuit 12, based on Ohm's law, multiplies the sampled current by the known resistance value of the sampling resistor 131 to generate the corresponding sampled voltage. The sampled voltage, as the output of the voltage calculation processing, is the core feedback variable of the closed-loop control circuit. The sampled voltage and the reference voltage output from the main control circuit 11 are input together to the differential operational amplifier to generate a control voltage characterizing the deviation between the target current and the actual current.

[0067] The current sampling and control circuit achieves high-fidelity capture and accurate conversion of current signals by combining physical sampling with algorithm calculation. The current sampling processing is directly related to the main current path of the power circuit 13, ensuring the real-time performance and authenticity of the feedback signal. The voltage calculation processing converts the current value into a voltage signal, which is compared with the reference voltage of the main control circuit 11 in the same dimension, simplifying the design complexity of the closed-loop control logic.

[0068] In one possible embodiment of this application, the current sampling and control circuit 12 includes: an operational amplifier 121,

[0069] Operational amplifier 121 includes a first differential amplifier circuit 1211 and a second differential amplifier circuit 1212;

[0070] The first differential amplifier circuit 1211 is used to amplify the sampled voltage to obtain the amplified sampled voltage, and to compare the amplified sampled voltage with the reference voltage to obtain the voltage comparison result.

[0071] The first differential amplifier circuit 1211 is also used to perform proportional and integral calculations based on the voltage comparison results to obtain the initial control voltage.

[0072] The second differential amplifier circuit 1212 is used to amplify the initial control voltage to obtain the control voltage.

[0073] The current sampling and control circuit 12 includes, but is not limited to, an operational amplifier 121 and a transistor. The operational amplifier 121 is (e.g., LM358), and internally contains two differential operational amplifier circuits (a first differential amplifier circuit 1211 and a second differential amplifier circuit 1212). One of the differential operational amplifier circuits (the first differential amplifier circuit 1211) connects to the voltage across the sampling resistor 131 through two pins (e.g., pin 3 and pin 2), and then amplifies the voltage signal across the sampling resistor 131 by a preset factor (e.g., 30 times) before outputting it to the subsequent operational circuit. Another differential amplifier circuit (second differential amplifier circuit 1212) is connected to the output of the preceding operational amplifier via another pin (e.g., pin 6) of operational amplifier 121. One pin (e.g., pin 5) of operational amplifier 121 is connected to the first preset pin of the main control chip 111. After differential amplification via the two pins (pins 5 and 6), the control voltage is amplified by a preset factor (e.g., 100 times) and output to a pin (e.g., pin 7) of operational amplifier 121. The voltage output from pin 7 of operational amplifier 121 acts on the base of the transistor through a resistor. Here, the transistor and resistor form a voltage follower circuit, primarily to improve the driving capability of the output voltage from pin 7 of operational amplifier 121.

[0074] The current sampling and control circuit 12 collects the voltage across the sampling resistor 131, amplifies the voltage across the sampling resistor 131 by 30 times using a differential operation circuit, and then performs differential operation with the voltage value (reference voltage) output by the first preset pin of the main control chip 111 to obtain the control voltage. The control voltage enhances the driving capability of the transistor to control the on-resistance of the MOS, thereby achieving the purpose of controlling the current flowing through the MOS.

[0075] The cascaded design of the first differential amplifier circuit 1211 and the second differential amplifier circuit 1212 achieves hierarchical optimization of signal conditioning and error correction. The first differential amplifier circuit 1211 converts the weak current feedback signal into an error correction quantity through high-precision differential amplification and proportional-integral operation, effectively suppressing external interference and improving system stability. The second differential amplifier circuit 1212 ensures that the amplitude and purity of the control voltage meet the driving requirements of the power devices through secondary gain enhancement and noise filtering.

[0076] In one possible embodiment of this application, the current sampling and control circuit 12 is further used for:

[0077] If the amplified sampling voltage is determined to be greater than the reference voltage based on the voltage comparison results, the difference between the amplified sampling voltage and the reference voltage is calculated to obtain the first voltage difference.

[0078] The first initial control voltage is obtained by performing proportional and integral operations based on the first voltage difference, and then the first initial control voltage is amplified to obtain the first control voltage; wherein, the first control voltage is used to increase and adjust the on-resistance in the power circuit.

[0079] If the amplified sampling voltage is determined to be less than the reference voltage based on the voltage comparison results, the difference between the amplified sampling voltage and the reference voltage is calculated to obtain the second voltage difference.

[0080] The second initial control voltage is obtained by performing proportional and integral operations based on the second voltage difference, and then amplified to obtain the second control voltage. The second control voltage is used to reduce the on-resistance in the power circuit.

[0081] The voltage comparison result is the logic output of the first differential amplifier circuit, which compares the amplified sampled voltage with the reference voltage. When the amplified sampled voltage is greater than the reference voltage, it indicates that the actual load current exceeds the target set value, and the current needs to be reduced by adjusting the on-resistance of the power device; conversely, if the amplified sampled voltage is less than the reference voltage, it indicates that the actual current has not reached the target value, and the on-resistance needs to be reduced to increase the current.

[0082] The difference calculation process quantifies the deviation between the sampled voltage and the reference voltage based on the voltage comparison results. When the amplified sampled voltage is greater than the reference voltage, the positive difference between the two (i.e., the first voltage difference) is calculated. This difference is a positive voltage signal, reflecting the severity of current overshoot. When the amplified sampled voltage is less than the reference voltage, the negative difference between the two (i.e., the second voltage difference) is calculated. This difference is a negative voltage signal, reflecting the deviation of insufficient current.

[0083] The proportional and integral operation processes apply control algorithms to the first voltage difference and the second voltage difference respectively. For the first voltage difference (positive deviation), the proportional operation module generates a correction amount proportional to the deviation based on a preset proportional coefficient, while the integral operation module accumulates and integrates the duration of the deviation. The two are superimposed to form the first initial control voltage. This voltage is a negative signal, which is amplified by the second differential amplifier circuit to generate the first control voltage. Its high level drives the gate voltage of the MOS device in the power circuit 13 to increase, thereby increasing the on-resistance and forcing the load current to decrease to approach the target value. For the second voltage difference (negative deviation), the proportional and integral operation generates a positive second initial control voltage, which is amplified to form the second control voltage. Its low level drives the gate voltage of the MOS device to decrease, reducing the on-resistance and causing the load current to rise to the set range.

[0084] The dual-path differential processing mechanism of the current sampling and control circuit 12 enables bidirectional precise control of the load current. By distinguishing between overshoot and undershoot states and applying differentiated control strategies, the system can quickly respond to current deviations and avoid oscillation or overshoot problems that may be caused by unidirectional adjustment. The introduction of proportional-integral operation not only improves the dynamic response speed, but also effectively suppresses steady-state error through the cumulative effect of integral terms, ensuring strict tracking of the current value during long-term operation.

[0085] In one possible embodiment of this application, the power circuit 13 is further configured to transmit the target current to the device under test;

[0086] The power circuit 13 is also used to adjust the magnitude of the current according to the adjusted on-resistance and the preset current change slope included in the load current parameters, so as to obtain the target current.

[0087] The system employs a closed-loop control and dynamic adjustment mechanism to apply a precisely programmed target current to the device under test, and achieves controllable changes in the current waveform based on a preset current change slope. The power circuit 13, as the final execution unit for the load current, combines current transmission and dynamic adjustment functions.

[0088] The power circuit 13 significantly improves the reliability and scenario adaptability of power supply testing through precise transmission and dynamic adjustment of the target current.

[0089] In one possible embodiment of this application, the power circuit 13 is further used for:

[0090] The on-resistance in the power circuit is increased based on the first control voltage, and the current is reduced based on the adjusted on-resistance and load current parameters.

[0091] The on-resistance in the power circuit is reduced based on the second control voltage, and the current is increased based on the adjusted on-resistance and load current parameters.

[0092] The bidirectional dynamic adjustment capability of the power circuit endows the electronic load system with extremely high scene adaptability and control precision. Through precise driving of the first and second control voltages, the system can complete the current rise and fall regulation within a microsecond time scale, accurately reproducing the transient current characteristics of the digital chip load. The closed-loop adjustment mechanism of the on-resistance effectively suppresses the influence of non-ideal factors such as device parameter dispersion and temperature drift on current control, ensuring that linear regulation characteristics are maintained within a wide current range (e.g., 0A to 30A).

[0093] In one feasible embodiment of this application, in order to understand the current control process of this application, this application also provides a schematic diagram of the current control loop, as shown in Figure 4. In this diagram, the sampling resistor and MOS are resistors in the power circuit 13, the MOS is the on-resistance, the differential amplifier circuit is the circuit in the current sampling and control circuit 12 (including the first differential amplifier circuit 1211 and the second differential amplifier circuit 1212), the microcontroller output represents the microcontroller digital-to-analog (DA) output, i.e., the working voltage output in the working power supply circuit 14, the proportional-integral-derivative (PID) algorithm represents the process of generating the control voltage based on the sampled voltage and the reference voltage through the PID algorithm, and the gate-source voltage (VGS) is the control voltage.

[0094] The embodiments of this application provide a method for scaling up and updating, and the method is described in detail below in conjunction with the execution flow of the scaling up and updating method.

[0095] As shown in Figure 5, Figure 5 is a flowchart illustrating a power supply testing method provided in this application. The power supply testing method is applied to the electronic load system described in Figure 1 and includes:

[0096] Step 501: Obtain the pre-configured load current parameters, and convert the operating voltage into a reference voltage based on the load current parameters; wherein, the reference voltage is a stable voltage value used as a reference standard in the electronic load system.

[0097] In the embodiments of this application, the device under test is connected to the electronic load system. Before the electronic load system is put into operation, the host computer needs to set the parameters of the device under test according to the test requirements of the device under test. After the load switch of the electronic load system is turned on, the electronic load system will perform current pulling processing according to the set load current parameters.

[0098] The load current parameters are pre-configured by the host computer and transmitted to the main control circuit of the electronic load system. The main control circuit converts the digital load current parameters into an analog voltage signal, i.e., the reference voltage, through the digital-to-analog converter (DAC) function.

[0099] The reference voltage serves as the setting benchmark for closed-loop control, and its amplitude is linearly proportional to the target current value. For example, in a current-voltage mapping table, a target current of 30A corresponds to a reference voltage of 3V. The stability of the reference voltage is ensured by the high-precision reference source and low-noise power supply circuit of the main control circuit, guaranteeing that the voltage value used as the reference standard does not drift or fluctuate during dynamic testing. Simultaneously, the rate of change in the load current parameter is interpreted by the main control chip as a slope control command for the reference voltage. By adjusting the step interval and amplitude of the DAC output value, the linear rise or fall of the reference voltage is achieved, thereby indirectly controlling the rate of current change.

[0100] Step 502: Voltage sampling is performed on the power circuit of the electronic load system to obtain the sampled voltage, and differential operation is performed on the sampled voltage and the reference voltage to obtain the control voltage; wherein, the electronic load system is a pre-built system for power supply testing.

[0101] In the embodiments of this application, the sampling resistor connected in series in the power circuit of the electronic load system converts the current flowing through the load into a millivolt-level voltage drop signal. The current sampling and control circuit acquires and amplifies the voltage across the sampling resistor through a high-precision differential amplifier to obtain a sampling voltage characterizing the actual current value. After filtering and conditioning, the sampling voltage is input together with the reference voltage to the differential operational amplifier for difference calculation. The essence of differential operation is to calculate the algebraic difference between the reference voltage and the sampling voltage to generate an error signal (i.e., control voltage) reflecting the direction and amplitude of the current deviation. For example, when the sampling voltage is lower than the reference voltage, the difference calculation result is a positive polarity signal, indicating that the actual current has not reached the target value and the load current needs to be increased; conversely, it is a negative polarity signal, indicating that the current needs to be reduced. During this process, the high common-mode rejection ratio of the differential operational amplifier effectively filters out ground noise and common-mode interference, ensuring the accuracy of error extraction.

[0102] Step 503: Adjust the magnitude of the on-resistance in the power circuit according to the control voltage, and adjust the magnitude of the current according to the adjusted on-resistance and load current parameters to obtain the target current. The load current parameters are used to control at least the rate at which the magnitude of the current is adjusted.

[0103] In the embodiments of this application, the control voltage is amplified and applied to the gate of the parallel-connected MOS device in the power circuit. The on-resistance of the MOS is changed by adjusting the gate voltage. When the control voltage increases, the conductive channel of the MOS narrows, the on-resistance increases, and the current flowing through the load decreases; conversely, when the control voltage decreases, the on-resistance decreases, and the load current increases accordingly.

[0104] The adjustment process is combined with the preset rate of change in the load current parameters. For example, in a scenario where the current increases at a rate of 10A / μs, the system increases the target current value every microsecond. The adjusted on-resistance and the real-time current value form a negative feedback loop, so that the load current eventually stabilizes in the target range, thus completing the dynamic load test of the device under test.

[0105] The electronic load system, power supply testing method, electronic device, and storage medium of this application provide a reference voltage to the current sampling and control circuit, and also acquire load current setting parameters. The current sampling and control circuit determines the control voltage by comparing the sampled voltage with the reference voltage. This control voltage controls the on-resistance in the power circuit, thereby controlling the magnitude of the current flowing through the on-resistance. Furthermore, since the load current parameters can control the rate of current change, rapid changes in the load current can be achieved. Therefore, this invention solves the technical problem of achieving rapid current changes and improving the accuracy of test results, thus meeting the requirements for rapid current changes and improving the technical effect of test results.

[0106] In one feasible embodiment of this application, differential operation processing is performed based on the sampled voltage and the reference voltage. This can also be achieved in the following ways, but not limited to: voltage amplification processing is performed on the sampled voltage to obtain an amplified sampled voltage, and voltage comparison processing is performed on the amplified sampled voltage and the reference voltage to obtain a voltage comparison result; proportional and integral operation processing is performed based on the voltage comparison result to obtain an initial control voltage, and voltage amplification processing is performed on the initial control voltage to obtain a control voltage.

[0107] In the embodiments of this application, the synergistic design of multi-stage voltage amplification and proportional-integral (PI) regulation endows differential operation processing with high accuracy and strong robustness. Voltage amplification processing transforms weak current signals into usable feedback quantities with high signal-to-noise ratios through gain enhancement and common-mode rejection; voltage comparison processing enables real-time dynamic calibration of target and actual values, providing accurate error input for closed-loop control; PI regulation, through algorithm fusion, balances transient response speed and long-term adjustment accuracy; secondary voltage amplification ensures that the control signal has the voltage and current margin to drive power devices.

[0108] This process enables electronic load systems to quickly converge to the target current under complex operating conditions and maintain stable output under load changes or external disturbances, providing a highly reliable methodological basis for dynamic performance testing of power supplies.

[0109] In one feasible embodiment of this application, the control voltage can be acquired in the following ways, but is not limited to: when the amplified sampled voltage is determined to be greater than the reference voltage based on the voltage comparison result, a first voltage difference is obtained by performing a difference calculation based on the amplified sampled voltage and the reference voltage; a first initial control voltage is obtained by performing proportional and integral operations based on the first voltage difference, and the first initial control voltage is amplified to obtain a second control voltage; wherein the first control voltage is used to increase the magnitude of the on-resistance in the power circuit; when the amplified sampled voltage is determined to be less than the reference voltage based on the voltage comparison result, a second voltage difference is obtained by performing a difference calculation based on the amplified sampled voltage and the reference voltage; a second initial control voltage is obtained by performing proportional and integral operations based on the second voltage difference, and the second initial control voltage is amplified to obtain a second control voltage; wherein the second control voltage is used to decrease the magnitude of the on-resistance in the power circuit.

[0110] In the embodiments of this application, the bidirectional adjustment mechanism based on voltage comparison results significantly improves the dynamic performance and steady-state accuracy of the power supply testing method. The independent handling strategy for overshoot and undershoot states enables the system to apply optimal adjustment parameters for different deviation characteristics, avoiding response hysteresis or overshoot oscillation caused by unidirectional adjustment. The differentiated configuration of proportional-integral operation parameters ensures rapid correction while effectively suppressing integral saturation, ensuring stable convergence of the system under sudden load changes. The directional adjustment of the on-resistance, combined with the nonlinear electrical characteristics of MOS devices, achieves efficient linear control of the current, enabling the device under test to expose its true performance characteristics in various dynamic testing scenarios.

[0111] The bidirectional control voltage generation and driving mechanism provides underlying support for the accurate reproduction of complex load waveforms, meeting the diverse needs of high-precision power supply verification.

[0112] In one feasible embodiment of this application, the current adjustment can also be achieved in the following ways, but not limited to: increasing the on-resistance in the power circuit according to the first control voltage, and decreasing the current according to the adjusted on-resistance and load current parameters to obtain the target current; or, decreasing the on-resistance in the power circuit according to the second control voltage, and increasing the current according to the adjusted on-resistance and load current parameters to obtain the target current.

[0113] In the embodiments of this application, the bidirectional current adjustment mechanism endows the power supply testing method with extremely high scenario adaptability and control flexibility. The independent driving logic of the first control voltage and the second control voltage enables the system to quickly respond to current overshoot and undershoot states, avoiding response hysteresis or steady-state error accumulation caused by unidirectional adjustment.

[0114] In summary, this application can achieve the following technical effects:

[0115] This application provides a reference voltage to the current sampling and control circuit via a main control circuit, and also acquires load current setting parameters. The current sampling and control circuit primarily determines the control voltage by comparing the sampled voltage with the reference voltage. This control voltage then controls the on-resistance in the power circuit, thereby controlling the magnitude of the current flowing through the on-resistance. Furthermore, since the load current parameters can control the rate of current change, rapid changes in the load current can be achieved. Therefore, this application solves the technical problem of how to achieve rapid current changes and improve the accuracy of test results, thus meeting the requirements for rapid current changes and enhancing the technical effectiveness of test results.

[0116] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods according to the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method.

[0117] An embodiment of this application also provides a power supply testing device. Figure 6 is a schematic diagram of the structure of a power supply testing device provided in this application. As shown in Figure 6, it includes:

[0118] The acquisition unit 61 is used to acquire pre-configured load current parameters and convert the operating voltage into a reference voltage based on the load current parameters; wherein, the reference voltage is a stable voltage value used as a reference standard in the electronic load system;

[0119] Sampling unit 62 is used to perform voltage sampling processing from the power circuit of the electronic load system to obtain the sampled voltage;

[0120] The arithmetic unit 63 is used to perform differential arithmetic processing based on the sampled voltage and the reference voltage to obtain the control voltage; wherein, the electronic load system is a pre-built system for power supply testing;

[0121] The adjustment unit 64 is used to adjust the magnitude of the on-resistance in the power circuit according to the control voltage, and to adjust the magnitude of the current according to the adjusted on-resistance and the load current parameter to obtain the target current. The load current parameter is used to control at least the rate at which the magnitude of the current is adjusted.

[0122] In one embodiment of this application, the arithmetic unit 63 is further configured to:

[0123] The sampled voltage is amplified to obtain the amplified sampled voltage. The amplified sampled voltage and the reference voltage are then compared to obtain the voltage comparison result.

[0124] Based on the voltage comparison results, proportional and integral calculations are performed to obtain the initial control voltage. The initial control voltage is then amplified to obtain the final control voltage.

[0125] In one embodiment of this application, the arithmetic unit 63 is further configured to:

[0126] If the amplified sampling voltage is determined to be greater than the reference voltage based on the voltage comparison results, the difference between the amplified sampling voltage and the reference voltage is calculated to obtain the first voltage difference.

[0127] The first initial control voltage is obtained by performing proportional and integral operations based on the first voltage difference, and then the first initial control voltage is amplified to obtain the first control voltage; wherein, the first control voltage is used to increase and adjust the magnitude of the on-resistance in the power circuit.

[0128] If the amplified sampling voltage is determined to be less than the reference voltage based on the voltage comparison results, the difference between the amplified sampling voltage and the reference voltage is calculated to obtain the second voltage difference.

[0129] The second initial control voltage is obtained by performing proportional and integral operations based on the second voltage difference, and then amplified to obtain the second control voltage. The second control voltage is used to reduce the magnitude of the on-resistance in the power circuit.

[0130] In one embodiment of this application, the adjustment unit 64 is further configured to:

[0131] The on-resistance in the power circuit is increased based on the first control voltage. Then, the current is decreased based on the adjusted on-resistance and load current parameters to obtain the target current; or...

[0132] The on-resistance in the power circuit is reduced based on the second control voltage, and the current is increased based on the adjusted on-resistance and load current parameters to obtain the target current.

[0133] For a description of the features in the embodiment corresponding to the power supply testing device, please refer to the relevant description in the embodiment corresponding to the power supply testing method, which will not be repeated here.

[0134] Embodiments of this application also provide an electronic device, including a memory and a processor, wherein the memory stores a computer program and the processor is configured to run the computer program to perform the steps in any of the above-described power supply testing method embodiments.

[0135] Embodiments of this application also provide a computer non-volatile readable storage medium storing a computer program, wherein the computer program is configured to execute the steps in any of the above-described power supply testing method embodiments when running.

[0136] In one exemplary embodiment, the aforementioned non-volatile readable storage medium may include, but is not limited to, various media capable of storing computer programs, such as USB flash drives, read-only memory (ROM), random access memory (RAM), portable hard drives, magnetic disks, or optical disks.

[0137] Embodiments of this application also provide a computer program product, which includes a computer program that, when executed by a processor, implements the steps in any of the above-described power supply testing method embodiments.

[0138] Embodiments of this application also provide another computer program product, including a non-volatile computer non-volatile readable storage medium, which stores a computer program. When the computer program is executed by a processor, it implements the steps in any of the above-described power supply testing method embodiments.

[0139] Those skilled in the art will further recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of the various examples have been generally described in terms of functionality in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0140] The above provides a detailed description of an electronic load system, power supply testing method, electronic device, and storage medium provided in this application. Specific examples have been used to illustrate the principles and implementation methods of this application. The descriptions of the embodiments above are merely for the purpose of helping to understand the method and core ideas of this application. It should be noted that those skilled in the art can make various improvements and modifications to this application without departing from its principles, and these improvements and modifications also fall within the protection scope of the claims of this application.

Claims

1. An electronic load system, characterized in that, include: Main control circuit, current sampling and control circuit, power circuit, operating power supply circuit. The power supply circuit is configured to provide operating voltage to the main control circuit; The main control circuit is configured to acquire pre-configured load current parameters, convert the operating voltage into a reference voltage based on the load current parameters, and transmit the reference voltage to the current sampling and control circuit. The current sampling and control circuit is configured to perform voltage sampling processing from the power circuit to obtain a sampled voltage, and perform differential operation processing based on the sampled voltage and the reference voltage to obtain a control voltage, and transmit the control voltage to the power circuit. The power circuit is configured to adjust the magnitude of the on-resistance in the power circuit according to the control voltage, and to adjust the magnitude of the current according to the adjusted on-resistance and the load current parameter to obtain a target current, wherein the load current parameter is configured to at least control the rate at which the magnitude of the current is adjusted.

2. The electronic load system according to claim 1, characterized in that, The load current parameters include the minimum load current, the maximum load current, the duration of the maximum current, the duration of the minimum current, and the rate of change of the current.

3. The electronic load system according to claim 1, characterized in that, The main control circuit includes: a main control chip and a communication interface. The communication interface is configured to obtain a configuration instruction for pre-configuring the load current parameters from a preset host computer device; wherein the configuration instruction includes parameter information of the load current parameters; The main control chip is configured to perform parameter configuration processing in the electronic load system according to the configuration instructions and the parameter information to obtain the load current parameters; The main control chip is also configured to perform voltage conversion processing on the operating voltage based on the load current parameter through a digital-to-analog conversion function, and output the reference voltage through the first preset pin of the main control chip.

4. The electronic load system according to claim 1, characterized in that, The first preset pin is connected to an external filter network through a low-impedance drive circuit.

5. The electronic load system according to claim 1, characterized in that, The power circuit includes: a sampling resistor, The sampling resistor is configured to determine the sampling position from which the current sampling and control circuit performs voltage sampling processing from the power circuit.

6. The electronic load system according to claim 5, characterized in that, The current sampling and control circuit is further configured to: The current is sampled from the location of the sampling resistor in the power circuit to obtain the sampled current. The voltage is obtained by performing voltage calculation based on the sampling current and the sampling resistor in the power circuit.

7. The electronic load system according to claim 6, characterized in that, The sampled current represents the actual load current currently flowing through the power circuit.

8. The electronic load system according to claim 7, characterized in that, The current sampling and control circuit includes: a voltage sampling module, The voltage sampling module obtains the sampling voltage corresponding to the actual load current by means of a detection point connected across the sampling resistor in the power circuit.

9. The electronic load system according to claim 6, characterized in that, The current sampling and control circuit includes: an operational amplifier, The operational amplifier includes a first differential amplifier circuit and a second differential amplifier circuit; The first differential amplifier circuit is configured to amplify the sampled voltage to obtain an amplified sampled voltage, and to perform a voltage comparison between the amplified sampled voltage and the reference voltage to obtain a voltage comparison result. The first differential amplifier circuit is further configured to perform proportional and integral operations based on the voltage comparison result to obtain an initial control voltage; The second differential amplifier circuit is configured to amplify the initial control voltage to obtain the control voltage.

10. The electronic load system according to claim 9, characterized in that, The current sampling and control circuit is further configured to: If the amplified sampled voltage is determined to be greater than the reference voltage based on the voltage comparison result, a first voltage difference is obtained by performing a difference calculation based on the amplified sampled voltage and the reference voltage. Based on the first voltage difference, proportional and integral operations are performed to obtain a first initial control voltage, and the first initial control voltage is amplified to obtain a first control voltage; wherein, the first control voltage is configured to increase the on-resistance in the power circuit. If the amplified sampling voltage is determined to be less than the reference voltage based on the voltage comparison result, a second voltage difference is obtained by performing a difference calculation based on the amplified sampling voltage and the reference voltage. The second initial control voltage is obtained by performing proportional and integral operations based on the second voltage difference, and then amplified to obtain the second control voltage; wherein the second control voltage is configured to reduce the on-resistance in the power circuit.

11. The electronic load system according to claim 10, characterized in that, The fact that the amplified sampling voltage is less than the reference voltage indicates that the actual load current exceeds the target set value, and the fact that the amplified sampling voltage is less than the reference voltage indicates that the actual load current does not exceed the target set value.

12. The electronic load system according to claim 1, characterized in that, The power circuit is also configured to transmit the target current to the device under test; The power circuit is further configured to adjust the magnitude of the current based on the adjusted on-resistance and the preset current change slope included in the load current parameters, to obtain the target current.

13. The electronic load system according to claim 10, characterized in that, The power circuit is also configured to: The on-resistance in the power circuit is increased according to the first control voltage, and the current is reduced according to the adjusted on-resistance and the load current parameters. The on-resistance in the power circuit is reduced according to the second control voltage, and the current is increased according to the adjusted on-resistance and the load current parameters.

14. A power supply testing method, characterized in that, The power supply testing method is applied to the electronic load system according to any one of claims 1 to 13, comprising: Obtain pre-configured load current parameters, and convert the operating voltage into a reference voltage based on the load current parameters; wherein, the reference voltage is a stable voltage value used as a reference standard in the electronic load system; Voltage sampling is performed on the power circuit of the electronic load system to obtain a sampled voltage, and a differential operation is performed between the sampled voltage and the reference voltage to obtain a control voltage; wherein, the electronic load system is a pre-built system configured for power supply testing; The on-resistance in the power circuit is adjusted according to the control voltage, and the current is adjusted according to the adjusted on-resistance and the load current parameter to obtain the target current. The load current parameter is configured to control the rate at which the current is adjusted.

15. The power supply testing method according to claim 14, characterized in that, The step of performing differential calculations based on the sampled voltage and the reference voltage to obtain the control voltage includes: The sampled voltage is amplified to obtain an amplified sampled voltage, and the amplified sampled voltage and the reference voltage are compared to obtain a voltage comparison result. Based on the voltage comparison results, proportional and integral operations are performed to obtain the initial control voltage, and the initial control voltage is then amplified to obtain the final control voltage.

16. The power supply testing method according to claim 15, characterized in that, The process of performing proportional and integral calculations based on the voltage comparison results to obtain an initial control voltage, and then amplifying the initial control voltage to obtain the control voltage includes: If the amplified sampled voltage is determined to be greater than the reference voltage based on the voltage comparison result, a first voltage difference is obtained by performing a difference calculation based on the amplified sampled voltage and the reference voltage. Based on the first voltage difference, proportional and integral operations are performed to obtain a first initial control voltage, and the first initial control voltage is amplified to obtain a first control voltage; wherein, the first control voltage is configured to increase the magnitude of the on-resistance in the power circuit. If the amplified sampling voltage is determined to be less than the reference voltage based on the voltage comparison result, a second voltage difference is obtained by performing a difference calculation based on the amplified sampling voltage and the reference voltage. The second initial control voltage is obtained by performing proportional and integral operations based on the second voltage difference, and then amplified to obtain the second control voltage; wherein the second control voltage is configured to reduce the magnitude of the on-resistance in the power circuit.

17. The power supply testing method according to claim 16, characterized in that, The step of adjusting the on-resistance in the power circuit according to the control voltage, and adjusting the current based on the adjusted on-resistance and the load current parameters to obtain the target current includes: The on-resistance in the power circuit is increased according to the first control voltage, and the current is decreased according to the adjusted on-resistance and the load current parameter to obtain the target current; or, the on-resistance in the power circuit is decreased according to the second control voltage, and the current is increased according to the adjusted on-resistance and the load current parameter to obtain the target current.

18. An electronic device, characterized in that, include: Memory, configured to store computer programs; The processor is configured to implement the steps of the power supply test method as described in any one of claims 14 to 17 when executing the computer program.

19. A computer non-volatile readable storage medium, characterized in that, The computer non-volatile readable storage medium stores a computer program, wherein the computer program, when executed by a processor, implements the steps of the power supply testing method as described in any one of claims 14 to 17.

20. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the power supply testing method as described in any one of claims 14 to 17.

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