Electronic module
Patent Information
- Application Number
- PCT/JP2025/012544
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2025-03-27
- Publication Date
- 2026-10-01
Smart Images

Figure JP2025012544_01102026_PF_FP_ABST
Abstract
Description
Electronic Module
[0001] The present invention relates to an electronic module.
[0002] Conventionally, an electronic module in which pin terminals are erected on a substrate is known (see, for example, Patent Document 1).
[0003] For example, as shown in FIGS. 9 and 10, an electronic module 900 described in Patent Document 1 includes a substrate 910, a semiconductor element 920, and a gate pin terminal 940. A power wiring portion 912 and a gate wiring portion 914 are formed on a surface of the substrate 910. The semiconductor element 920 is disposed on the substrate 910, and a main electrode 922 and a gate electrode portion 924 are formed on a surface of the semiconductor element 920. The gate pin terminal 940 is erected on the gate wiring portion 914.
[0004] A lead frame LF is disposed on the main electrode 922 of the semiconductor element 920, and the lead frame LF is connected to an internal connection terminal 966 erected from the semiconductor element 920. A lead frame 963 is also disposed at an intermediate position of the gate pin terminal 940. The gate electrode portion 924 and the gate wiring portion 914 are connected via a wire 980.
[0005] International Publication No. 2020 / 208741
[0006] However, in the conventional electronic module 900, the power wiring portion 912 and the gate wiring portion 914 are wired on a single substrate 910. Since it is necessary to wire the gate wiring portion 914 so as to bypass the power wiring portion 912 in order to avoid interference from the current flowing through the power wiring portion 912, there is a problem that the wiring length from the gate pin terminal 940 to the gate electrode portion 924 becomes long, and it is not easy to reduce inductance.
[0007] Incidentally, with the increasing currents of electronic devices in recent years, multiple semiconductor elements are connected in parallel to reduce the load on a single semiconductor element. In this case, it is necessary to switch each semiconductor element simultaneously, and it is desirable that the wiring length to the gate electrode portion of each semiconductor element be equal. However, in conventional electronic modules 900, as described above, it is necessary to wire the gate wiring portion 914 in a way that bypasses the power wiring portion 912. Therefore, when multiple semiconductor elements are connected in parallel, it is difficult to make the wiring length to the gate electrode portion 924 of the semiconductor element 920 equal, and it is difficult to synchronize the switching timing of the semiconductor elements 920. This problem is particularly pronounced when performing high-speed switching control.
[0008] Therefore, the present invention has been made to solve the above-mentioned problems, and aims to provide an electronic module that makes it easy to reduce inductance and can synchronize the switching timing even when multiple semiconductor elements are connected in parallel.
[0009] The electronic module of the present invention comprises a substrate having a power wiring section, a plurality of semiconductor elements arranged side by side on the substrate and having gate electrodes formed on their surfaces, a signal substrate disposed on the substrate and having an insulating substrate and gate wiring sections formed on the surface of the insulating substrate, and gate pin terminals erected on the gate wiring sections, wherein the wiring length from the gate pin terminals to the gate electrodes of each semiconductor element is equal.
[0010] According to the electronic module of the present invention, since it comprises a substrate having a power wiring section, an insulating substrate, and a signal substrate having a gate wiring section, the power wiring section and the gate wiring section can be formed on separate substrates. Therefore, it is not necessary to route the gate wiring section to bypass the power wiring section, and the wiring length from the gate pin terminal to the gate electrode section does not tend to become long. As a result, it becomes easier to lower the inductance of the gate wiring section.
[0011] Furthermore, the electronic module of the present invention comprises a substrate having a power wiring section and a signal substrate having a gate wiring section. Since the wiring length from the gate pin terminal to the gate electrode section of each semiconductor element is equal, the switching timing of each semiconductor element can be synchronized even when multiple semiconductor elements are connected in parallel.
[0012] In conventional electronic modules, when power wiring and gate wiring are formed on the same substrate, a metal film is generally formed uniformly on an insulating substrate, and then the power wiring and gate wiring are formed together by etching or other methods. However, because the relatively thick power wiring and the relatively thin gate wiring are formed simultaneously from the same metal film, there is a risk that the power wiring may not be completely etched if etching is done to match the gate wiring, or that the gate wiring may be etched too much if etching is done to match the power wiring, potentially causing variations in the shape and dimensions of the gate wiring's ends, making it difficult to form the gate wiring with high precision. Even when attempting to place small components, such as small chip resistors, on such gate wiring, it is difficult to position them with high accuracy. In contrast, the electronic module of the present invention comprises a substrate having power wiring and a signal substrate having gate wiring, so the power wiring and gate wiring are formed separately. Therefore, the gate wiring can be formed with high precision without being affected by the formation of the power wiring, and even when small chip resistors or other components are placed on the gate wiring, they can be positioned with high accuracy.
[0013] This is a plan view showing an electronic module 1 according to Embodiment 1. This is a cross-sectional view of an electronic module 1 according to Embodiment 1. This is a perspective view showing an electronic module 1 according to Embodiment 2. This is a diagram illustrating the outer lead frame 70 in Embodiment 2. This is a cross-sectional view illustrating the electronic module 2 according to Embodiment 2. This is a diagram illustrating the inner lead frame 60 in Embodiment 2. This is a diagram illustrating the semiconductor elements 20a to 20h, signal boards 30a to 30d, gate pin terminals 40a to 40h, and sense pin terminals 50a to 50d in Embodiment 2. This is a diagram illustrating the gate wiring sections 34a to 34h and sense wiring sections 36a to 36d in Embodiment 2. This is a plan view illustrating a conventional electronic module 900. Reference numeral 950 indicates a pin terminal. This is a schematic enlarged cross-sectional view of a main part illustrating a conventional electronic module 900.
[0014] The electronic module of the present invention will be described below based on the embodiments shown in the figures. Note that the embodiments described below do not limit the invention as defined in the claims. Furthermore, not all of the elements and combinations thereof described in the embodiments are necessarily essential to the solution of the present invention.
[0015] [Embodiment 1] 1. Configuration of the electronic module 1 according to Embodiment 1 The electronic module 1 according to Embodiment 1, as shown in Figures 1 and 2, comprises a substrate 10, semiconductor elements 20a and 20b, a signal board 30, gate pin terminals 40a and 40b, sense pin terminals 50, a lead frame LF, and connecting members 80 and 81, and is sealed with a molded resin (not shown). On the surface of the substrate 10, as shown in Figure 1, two semiconductor elements 20a and 20b are arranged side by side, and a rectangular signal board 30 is arranged parallel to the direction in which the semiconductor elements 20a and 20b are arranged.
[0016] In the electronic module 1, two semiconductor elements 20a and 20b are connected in parallel. Specifically, the two semiconductor elements 20a and 20b are arranged on a common power wiring section 14 of the substrate 10, and their respective drain electrodes (not shown) are connected to the common power wiring section 14 and have the same potential. In addition, the respective source electrode sections 22a and 22b of the two semiconductor elements 20a and 20b are connected via an internal connection terminal 66 by a common lead frame LF, and these also have the same potential. A portion of the lead frame LF extends outside the mold resin (not shown) and constitutes an external terminal.
[0017] The substrate 10 is a DCB (Direct Copper Bonding) substrate having an insulating substrate 12 (ceramic substrate), a power wiring section 14 formed on one side (upper surface) of the insulating substrate 12, and a heat dissipation metal plate 16 formed on the other side (lower surface) of the insulating substrate 12. In Embodiment 1, a DCB substrate was used as the substrate 10, but any suitable substrate such as a printed circuit board may be used. The power wiring section 14 is made of a metal film. The power wiring section 14 has two die pads on which semiconductor elements 20a and 20b are mounted, respectively.
[0018] The semiconductor elements 20a and 20b are vertical MOSFETs (Metal-Oxide-Semiconductor Field-Effect Transistors) with source electrode portions 22a and 22b (main electrodes), gate electrode portions 24a and 24b, and sense electrode portions 26a and 26b formed on the front surface (the surface opposite to the substrate 10), and a drain electrode formed on the back surface (the surface facing the substrate 10). Note that the semiconductor elements 20a and 20b may be the same or different. Furthermore, the semiconductor elements 20a and 20b are not limited to MOSFETs; suitable semiconductor elements with gate electrodes such as IGBTs, thyristors, and triacs can be used.
[0019] The source electrode portions 22a and 22b occupy most of the surface of the semiconductor elements 20a and 20b and, as shown in Figure 1, are divided into two sections in a plan view. The gate electrode portions 24a and 24b are formed on the outer edge of one side of the rectangle of the semiconductor elements 20a and 20b (the lower side in Figure 1) and are positioned near the center of that outer edge. The sense electrode portions 26a and 26b are also formed on the outer edge of one side of the rectangle of the semiconductor elements 20a and 20b (the lower side in Figure 1) and are positioned at the corners, flanking the gate electrode portions 24a and 24b. The drain electrode is formed across the entire back surface and is connected to the power wiring 14 via a conductive bonding material. The sense electrode portions 26a and 26b are connected to the source electrode portions 22a and 22b and are used to detect the current flowing through the source electrode portions 22a and 22b.
[0020] The two semiconductor elements 20a and 20b are arranged side by side such that the side on which the gate electrode portions 24a and 24b and the sense electrode portions 26a and 26b are formed (one side of the rectangle) is located on the signal substrate 30 side.
[0021] The signal board 30 is a substantially rectangular substrate having an insulating substrate 32, gate wiring sections 34a, 34b and sense wiring section 36 formed on one side (top surface) of the insulating substrate 32, and a back electrode 38 formed on the other side (bottom surface) of the insulating substrate 32. For the signal board 30, for example, a glass epoxy substrate can be used, but any suitable substrate that can insulate one side from the other can be used. The signal board 30 is arranged parallel to the semiconductor elements 20a, 20b such that the direction in which the semiconductor elements 20a, 20b are aligned is the longitudinal direction. The signal board 30 is placed on the power wiring section 14, and the back electrode 38 and the power wiring section 14 are joined via a conductive bonding material (for example, solder).
[0022] The gate wiring sections 34a and 34b are positioned opposite each other, with the sense wiring section 36 in between. The gate wiring sections 34a and 34b extend to the vicinity of the gate electrode sections 24a and 24b of the semiconductor elements 20a and 20b, and are connected to the gate electrode sections 24a and 24b via the connecting member 80. In addition, gate pin terminals 40a and 40b are erected at predetermined positions on the gate wiring sections 34a and 34b, respectively.
[0023] The wiring length WLG1 from the gate pin terminal 40a to the gate electrode portion 24a of the semiconductor element 20a via the gate wiring section 34a and the connecting member 80 is the same length as the wiring length WLG2 from the gate pin terminal 40b to the gate electrode portion 24b of the semiconductor element 20b via the gate wiring section 34b and the connecting member 80. Furthermore, the gate wiring sections 34a and 34b are arranged symmetrically with respect to a straight line passing through the sense pin terminal 50 (a straight line passing through the center of the signal board 30).
[0024] The sense wiring section 36 extends from near the center of the signal board 30 to the vicinity of the sense electrode sections 26a and 26b of the semiconductor elements 20a and 20b, and is connected to one of the sense electrode sections 26a and 26b (the central sense electrode section) via a connecting member 81. A sense pin terminal 50 is erected near the center of the sense wiring section 36.
[0025] The wiring length WLS1 from the sense pin terminal 50 to the sense electrode portion 26a of the semiconductor element 20a via the sense wiring section 36 and connecting member 81 is the same length as the wiring length WLS2 from the sense pin terminal 50 to the sense electrode portion 26b of the semiconductor element 20b via the sense wiring section 36 and connecting member 81. The sense wiring section 36 is arranged symmetrically with respect to a straight line passing through the sense pin terminal 50. The sense wiring section 36 has a separated portion between the sense pin terminal 50 and each connecting member 81, and this portion is connected via a resistor R.
[0026] The gate pin terminals 40a, 40b and the sense pin terminal 50 are columnar members made of a conductive material (e.g., a metal material), with their tips exposed to the outside of the molded resin, thus forming the terminals. The gate pin terminals 40a, 40b (and the sense pin terminal 50) have a main body portion 41 (51) and a ring-shaped flange portion 42 (52) provided at an intermediate position in the height direction. Below the flange portion 42 (52) is a pin terminal fixing portion 63 made of a lead frame, and the gate pin terminals 40a, 40b (and the sense pin terminal 50) are joined to the pin terminal fixing portion 63 via the flange portion 42 (52).
[0027] The gate pin terminals 40a and 40b are erected on the two gate wiring sections 34a and 34b, respectively. The sense pin terminal 50 is erected on the sense wiring section 36.
[0028] The lead frame LF is a flat conductive member placed on the semiconductor elements 20a and 20b. The lead frame LF is connected to the source electrode portions 22a and 22b of the semiconductor elements 20a and 20b via internal connection terminals 66. The ends of the lead frame LF extend to the outside of the molded resin, and these ends constitute external terminals.
[0029] The connecting members 80 and 81 are formed by cutting and bending a plate-shaped conductive member.
[0030] 2. Effects of the Electronic Module 1 According to Embodiment 1 The electronic module 1 according to Embodiment 1 comprises a substrate 10 having a power wiring section 14 and a signal substrate 30 having gate wiring sections 34a and 34b. Therefore, the power wiring section 14 and the gate wiring sections 34a and 34b can be formed on separate substrates. Consequently, it is not necessary to route the gate wiring sections to bypass the power wiring section 14, and the wiring length is less likely to become long. As a result, it becomes easier to lower the inductance of the gate wiring sections 34a and 34b.
[0031] Furthermore, according to the first embodiment of the electronic module 1, which comprises a substrate 10 having a power wiring section 14 and a signal substrate 30 having gate wiring sections 34a and 34b, the wiring lengths WLG1 and WLG2 from the gate pin terminals 40a and 40b to the gate electrode sections 24a and 24b of each semiconductor element 20a and 20b are equal. Therefore, even when the semiconductor elements 20a and 20b are connected in parallel, the switching timing of each semiconductor element 20a and 20b can be synchronized.
[0032] Furthermore, according to the first embodiment of the electronic module 1, since it comprises a substrate 10 having a power wiring section 14 and a signal substrate 30 having gate wiring sections 34a and 34b, the power wiring section 14 and the gate wiring sections 34a and 34b can be formed separately. Therefore, the gate wiring sections 34a and 34b can be formed with high precision, and even when small chip resistors or the like are placed on the gate wiring sections 34a and 34b, they can be positioned with high positional accuracy.
[0033] Furthermore, according to the electronic module 1 of Embodiment 1, the wiring lengths WLS1 and WLS2 from the sense pin terminal 50 to the sense electrode portions 26a and 26b of each semiconductor element 20a and 20b are equal. Therefore, it is not necessary to route the sense wiring to bypass the power wiring, and the wiring length is less likely to become long. As a result, it becomes easier to lower the inductance of the sense wiring portion 36.
[0034] Furthermore, according to the electronic module 1 of Embodiment 1, since the multiple semiconductor elements 20a and 20b are connected in parallel with each other, the current flowing through each semiconductor element and the heat generated can be reduced, making it possible to create an electronic module that can use high currents and an electronic module with a relatively long lifespan due to the reduced burden on the semiconductor elements.
[0035] Furthermore, according to the electronic module 1 of Embodiment 1, since the signal board 30 is arranged on the power wiring section 14, the contact area of the signal board and wiring can be reduced, resulting in a miniaturized electronic module. In addition, since the signal board 30 has an insulating substrate 32, even if the power wiring section 14 and the signal board 30 overlap, the impact on the gate wiring sections 34a, 34b and the sense wiring section 36 can be reduced.
[0036] Furthermore, according to the electronic module 1 of Embodiment 1, the module includes an even number (2) pairs of semiconductor elements 20a, 20b, and the gate electrode portions 24a, 24b of the paired semiconductor elements 20a, 20b are positioned symmetrically with respect to a straight line passing through the sense pin terminal 50 (or a straight line passing through the center of the signal board). This makes it easier to make the wiring lengths from the gate pin terminals 40a, 40b to the gate electrode portions 24a, 24b of each semiconductor element 20a, 20b equal.
[0037] Furthermore, according to the electronic module 1 of Embodiment 1, the gate wiring section 34a from the gate pin terminal 40a to the gate electrode portion 24a of one semiconductor element 20a is arranged to be symmetric with respect to a straight line passing through the midpoint between the semiconductor elements 20a and 20b, and the gate wiring section 34b from the gate pin terminal 40b to the gate electrode portion 24b of the other semiconductor element 20b. From this viewpoint as well, it is easier to make the wiring lengths equal from the gate pin terminals 40a and 40b to the gate electrode portions 24a and 24b of each semiconductor element 20a and 20b.
[0038] Furthermore, according to the electronic module 1 of Embodiment 1, the sense wiring section 36 from the sense pin terminal 50 to the sense electrode portion 26a of one semiconductor element 20a is arranged to be symmetric with respect to a straight line passing through the midpoint between the semiconductor elements 20a and 20b, and the sense wiring section 36 from the sense pin terminal 50 to the sense electrode portion 26b of the other semiconductor element 20b. This makes it easier to make the wiring lengths equal from the sense pin terminal 50 to the sense electrode portions 26a and 26b of each semiconductor element 20a and 20b.
[0039] Furthermore, according to the electronic module 1 of Embodiment 1, the thickness of the gate wiring sections 34a and 34b and the thickness of the sense wiring section 36 are thinner than the thickness of the power wiring section 14. Therefore, the gate wiring sections 34a and 34b and the sense wiring section 36 can be formed with high precision, and small chip resistors and the like can be placed on the gate wiring sections 34a and 34b with high positional accuracy.
[0040] [Embodiment 2] The electronic module 2 according to Embodiment 2 has basically the same configuration as the electronic module 1 according to Embodiment 1, but differs from the electronic module 1 according to Embodiment 1 in that it has multiple semiconductor element groups, each having an even number of semiconductor elements paired together.
[0041] As shown in Figure 3, the electronic module 2 according to Embodiment 2 is resin-sealed with molded resin 90, with terminals T1, T2, and T3 protruding from one side and terminal T4 protruding from the other side opposite to the first side. In addition, gate pin terminals 40a to 40h, sense pin terminals 50a to 50d, and other pin terminals 46 protrude from one main surface.
[0042] To simplify the explanation below, the direction from the side with external terminal T1 to the side with external terminal T3 (among the sides without external terminals T1 to T4) will be defined as the +X direction, the direction from the side with external terminal T4 to the side with external terminals T1 to T3 will be defined as the +Y direction, and the direction from the opposite main surface of one main surface to the main surface on which the pin terminals are located will be defined as the +Z direction.
[0043] As shown in Figures 4 to 8, the electronic module 2 according to Embodiment 2 comprises a substrate 10, eight semiconductor elements 20a to 20h, signal boards 30a to 30d, gate pin terminals 40a to 40h, sense pin terminals 50a to 50d, an inner lead frame 60, an outer lead frame 70, and connecting members 80 and 81. In the electronic module 2 according to Embodiment 2, the semiconductor elements 20a to 20d are connected in parallel, and the semiconductor elements 20e to 20h are also connected in parallel, forming a half-bridge circuit in which the semiconductor elements 20a to 20d and the semiconductor elements 20e to 20h are connected in series.
[0044] As shown in FIG. 7, two power wiring portions 14a and 14b are spaced apart from each other on the surface side of a substrate 10. Semiconductor elements 20a to 20d are arranged along the -X direction on the power wiring portion 14a, and rectangular signal substrates 30a and 30b are arranged along the X direction on the external terminal T4 side (-Y direction side) of the semiconductor elements 20a to 20d. Semiconductor elements 20e to 20h are arranged along the -X direction on the power wiring portion 14b, and rectangular signal substrates 30c and 30d are arranged along the X direction on the external terminal T2 side (+Y direction side) of the semiconductor elements 20e to 20h.
[0045] As shown in FIG. 7 and FIG. 8, the signal substrates 30a to 30d have a rectangular shape, and are arranged such that the longitudinal direction thereof is along the X direction. The signal substrates 30a and 30b are arranged side by side with the semiconductor elements 20a to 20d, and the signal substrates 30c and 30d are arranged side by side with the semiconductor elements 20e to 20h. The signal substrates 30a and 30b are arranged on the power wiring portion 14a, and the signal substrates 30c and 30d are arranged on the power wiring portion 14b. Gate wiring portions 34a to 34h and sense wiring portions 36a to 36d are formed on the signal substrates 30a to 30d. The gate wiring portions 34a to 34h and the sense wiring portions 36a to 36d are formed so as to be line-symmetric with respect to a line passing through the center of the rectangle of the signal substrates 30a to 30d.
[0046] As shown in FIG. 7 and FIG. 8, the sense wiring portions 36a to 36d extend from the vicinity of the center of each of the signal substrates 30a to 30d to the vicinity of sense electrode portions 26a to 26d of each semiconductor element, and are connected to the sense electrode portions 26a and 26b via connection members 81. Sense pin terminals 50a to 50d are erected near the center of each of the sense wiring portions 36a to 36d. Note that the sense wiring portions 36a to 36d are spaced apart between the terminal side and the semiconductor element side, and are connected via a resistor R.
[0047] Two of each of the gate wiring portions 34a to 34h are arranged on one signal substrate, and are arranged at positions facing each other across the sense wiring portions 36a to 36d. The gate wiring portions 34a to 34h extend to the vicinity of the gate electrode portions 24a to 24h of the semiconductor elements 20a to 20d, and are connected to the gate electrode portions 24a to 24h via the connecting member 80. Further, gate pin terminals 40a to 40h are respectively erected at predetermined positions on the gate wiring portions 34a to 34h.
[0048] In the electronic module 2 according to the second embodiment, one semiconductor element group is formed by two semiconductor elements, one signal substrate, two gate pin terminals, one sense pin terminal, and connecting members 80 and 81. In the second embodiment, as shown in Fig. 7, there are a semiconductor element group G1 associated with semiconductor elements 20a and 20b, a semiconductor element group G2 associated with semiconductor elements 20c and 20d, a semiconductor element group G3 associated with semiconductor elements 20e and 20f, and a semiconductor element group G4 associated with semiconductor elements 20g and 20h, forming four semiconductor element groups.
[0049] All of the groups G1 to G4 have the same shape, and are each configured to be line-symmetric with respect to a straight line passing through the sense pin terminals 50a to 50d. Therefore, the wiring lengths from the respective gate pin terminals 40a to 40h to the gate electrode portions 24a to 24h of the respective semiconductor elements 20a to 20h are equal. Further, the wiring lengths from the respective sense pin terminals 50a to 50d to the sense electrode portions 26a to 26h of the respective semiconductor elements 20a to 20h are equal.
[0050] The groups G1 to G4 are arranged at positions that are line-symmetric with respect to a straight line passing through the center of the substrate 10. That is, group G1 and group G2, as well as group G3 and group G4, are located at positions that are line-symmetric with respect to a straight line passing through the center of the substrate 10 and extending vertically in Fig. 7; group G1 and group G3, as well as group G2 and group G4, are located at positions that are line-symmetric with respect to a straight line passing through the center of the substrate 10 and extending horizontally in Fig. 7; and group G1 and group G4, as well as group G2 and group G3, are located at positions that are rotationally symmetric with respect to the center of the substrate 10.
[0051] As shown in Figures 5 and 6, the source electrodes 22a to 22d of semiconductor elements 20a to 20d are connected by a common long connector 62, which will be described later. In addition, the source electrodes 22e to 22h of semiconductor elements 20e to 20h are connected by a common inner lead portion 61, which will be described later.
[0052] As shown in Figures 5 and 6, an inner lead frame 60 is positioned above the substrate 10. The inner lead frame 60 has an inner lead portion 61, a long connector 62, and a pin terminal fixing portion 63, and the inner lead portion 61, the long connector 62, and the pin terminal fixing portion 63 are formed at the same height.
[0053] Each component of the inner lead frame 60 is provided with a lead portion L extending in either the +X direction or the -X direction. During the manufacturing process, the lead portion L constituted a suspension lead that connected to a frame portion (not shown). The tips of the lead portions L are all located inside the molded resin 90.
[0054] The inner lead portion 61 is connected to the source electrode portions 22e to 22h of the semiconductor elements 20e to 20h. The inner lead portion 61 extends toward the power wiring portion 14a and is connected to the power wiring portion 14a via the internal connection terminal 64.
[0055] The elongated connector 62 is connected to the source electrode portions 22a to 22d of the semiconductor elements 20a to 20d. The elongated connector 62 extends along the X direction when viewed in plan, and although not shown in the figure, it has a shape that protrudes in the -Z direction at a position where it overlaps with the semiconductor elements 20a to 20d.
[0056] The first outer lead portion 71 and the long connector 62, which will be described later, are connected by an internal connection terminal 72. The internal connection terminal 72 is located in a position that does not overlap with the positions of the semiconductor elements 20a to 20d when viewed in plan view. Specifically, it is located midway between the electrodes of adjacent semiconductor elements 20a to 20d when viewed in plan view.
[0057] The pin terminal fixing portion 63 is positioned at an intermediate position between each gate pin terminal 40a to 40h and each sense pin terminal 50a to 50d. Each pin terminal fixing portion 63 has a through hole through which the pin terminal passes.
[0058] As shown in Figures 4 and 5, an outer lead frame 70 is positioned above the substrate 10 and the inner lead frame 60. The outer lead frame 70 has a first outer lead portion 71, a second outer lead portion 73 (external terminal T2), and a third outer lead portion 74 (external terminal T4), each formed at the same height. The first outer lead portion 71 of the outer lead frame 70 overlaps with the inner lead frame 60 (specifically, the inner lead portion 61) in a planar view, and as shown in Figure 5, current flows in opposite directions (in the -Y direction for the inner lead portion 61 and in the +Y direction for the first outer lead portion 71) at relatively close positions.
[0059] The first outer lead portion 71 is a flat, roughly U-shaped member, with an elongated hole formed in the region where the internal connection terminal 64 is formed (the region where the inner lead portion 61 and the power wiring portion 14a are connected). The first outer lead portion 71 extends in the +Y direction on both the +X and -X sides, and extends to the outside of the molded resin 90. The portions extending to the outside of the molded resin 90 constitute the external terminals T1 and T3, respectively.
[0060] The second outer lead portion 73 is connected to the power wiring portion 14a via an internal connection terminal 75, extends in the +Y direction, and extends to the outside of the molded resin 90. The portion extending to the outside of the molded resin 90 constitutes the external terminal T2.
[0061] The third outer lead portion 74 is connected to the power wiring portion 14b via an internal connection terminal 76, extends in the -Y direction, and extends to the outside of the molded resin 90. The portion extending to the outside of the molded resin 90 constitutes the external terminal T4.
[0062] Thus, the electronic module 2 according to Embodiment 2 differs from the electronic module 1 according to Embodiment 1 in that it has multiple semiconductor element groups, each having an even number of semiconductor elements paired together. However, similar to the electronic module 1 according to Embodiment 1, it comprises a substrate 10 having power wiring sections 14a and 14b and signal substrates 30a to 30d having gate wiring sections 34a to 34h. Therefore, the power wiring sections 14a and 14b and the gate wiring sections 34a to 34h can be formed on separate substrates. Consequently, it is not necessary to route the gate wiring sections 34a to 34h around the power wiring sections 14a and 14b, making it easier to reduce the wiring length. As a result, it becomes easier to lower the inductance of the gate wiring sections 34a to 34h.
[0063] Furthermore, according to the electronic module 2 of Embodiment 2, the module comprises a substrate 10 having power wiring sections 14a and 14b, and a signal substrate 30 having gate wiring sections 34a to 34h. Since the wiring lengths from the gate pin terminals 40a to 40h to the gate electrode sections 24a to 24h of each semiconductor element 20a to 20h are equal, the switching timing of each semiconductor element 20a to 20d and 20e to 20h can be synchronized even when semiconductor elements 20a to 20d and 20e to 20h are connected in parallel.
[0064] Furthermore, according to the electronic module 2 of Embodiment 2, there are semiconductor element groups G1 to G4, each having two semiconductor elements paired together, and the semiconductor element groups G1 to G4 are arranged symmetrically with respect to a straight line passing through the center of the substrate 10. As a result, the bias in inductance is small, and the switching timing of each semiconductor element can be synchronized. In addition, because each component is arranged symmetrically, there is less bias in the heat dissipation from the semiconductor elements, etc., and it is possible to prevent localized high temperatures.
[0065] Furthermore, the electronic module 2 according to Embodiment 2 has the same configuration as the electronic module 1 according to Embodiment 1, except that it has multiple semiconductor element groups, each having an even number of semiconductor elements paired together. Therefore, it has the corresponding effects of the electronic module 1 according to Embodiment 1.
[0066] Although the present invention has been described above based on the embodiments described above, the present invention is not limited to the embodiments described above. It can be implemented in various forms without departing from the spirit of the invention, and for example, the following modifications are also possible.
[0067] (1) The positions, connections, number, circuit configuration, terminals, etc. described in each of the above embodiments are illustrative examples and can be changed within the scope that does not impair the effects of the present invention.
[0068] (2) In each of the above embodiments, one sense pin terminal and two gate pin terminals are provided on one signal board, but the present invention is not limited thereto. There may be two sense pin terminals or one gate pin terminal.
[0069] (3) In each of the above embodiments, two semiconductor elements are connected to one signal board, but the present invention is not limited thereto. Three or more semiconductor elements may be connected to one signal board. In order to make the wiring length between the gate pin terminal and the gate electrode portion of each semiconductor element equal, it is preferable to have multiple semiconductor elements.
[0070] (4) In the above embodiment 2, two of the four parallel-connected semiconductor elements were connected to one signal board, but the present invention is not limited thereto. All four parallel-connected semiconductor elements may be connected to one signal board.
[0071] 1, 2... Electronic module, 10... Substrate, 14, 14a, 14b... Power wiring section, 20, 20a, 20b, 20c, 20d, 20e, 20f, 20g, 20h... Semiconductor element, 24a-24h... Gate electrode section, 26a-26h... Sense electrode section, 30, 30a, 30b, 30c, 30d... Signal board, 32... Insulating substrate, 34a-34f... Gate wiring section, 36, 36a-36d... Sense wiring section, 40a-40h... Gate pin terminals, 50, 50a-50d... Sense pin terminals, G1-G4... Semiconductor element group
Claims
1. An electronic module comprising: a substrate having a power wiring section; a plurality of semiconductor elements arranged side by side on the substrate, each having a gate electrode section formed on its surface; a signal substrate arranged on the substrate and having an insulating substrate and a gate wiring section formed on the surface of the insulating substrate; and gate pin terminals erected on the gate wiring section, wherein the wiring length from the gate pin terminals to the gate electrode section of each semiconductor element is equal.
2. The electronic module according to claim 1, wherein a sense electrode portion is further formed on the surface of the semiconductor element, the signal substrate further has a sense wiring portion formed on the surface of the insulating substrate and connected to the sense electrode portion, and further comprises a sense pin terminal erected on the sense wiring portion, and the wiring length from the sense pin terminal to the sense electrode portion of each semiconductor element is equal.
3. The electronic module according to claim 1 or 2, characterized in that the plurality of semiconductor elements are connected in parallel with each other.
4. The electronic module according to claim 1 or 2, characterized in that the signal board is arranged on the power wiring section.
5. The electronic module according to claim 1 or 2, wherein the plurality of semiconductor elements comprises an even number of semiconductor elements paired together, and the gate electrodes of each paired semiconductor element are positioned symmetrically with respect to a straight line passing through the center of the signal substrate.
6. The electronic module according to claim 1 or 2, characterized in that the gate wiring portion from the gate pin terminal to the gate electrode portion of one of the semiconductor elements is arranged symmetrically with respect to a straight line passing through the midpoint between the semiconductor elements with respect to the gate wiring portion from the gate pin terminal to the gate electrode portion of the other semiconductor element.
7. The electronic module according to claim 2, characterized in that the sense wiring portion from the sense pin terminal to the sense electrode portion of one of the semiconductor elements is arranged symmetrically with respect to a straight line passing through the midpoint between the two semiconductor elements with respect to the sense wiring portion from the sense pin terminal to the sense electrode portion of the other semiconductor element.
8. The electronic module according to claim 1 or 2, wherein the plurality of semiconductor elements include a plurality of semiconductor element groups, each group having an even number of semiconductor elements paired together, and the plurality of semiconductor element groups are arranged in positions symmetrical with respect to a straight line passing through the center of the substrate.
9. The electronic module according to claim 2, characterized in that the thickness of the gate wiring section and the thickness of the sense wiring section are thinner than the thickness of the power wiring section.