Power supply device and semiconductor device

Abstract

The present invention enables detection of the state of an external capacitance within a power supply device to which the external capacitance is connected.　This power supply device comprises: a terminal to which an external capacitor can be connected; a voltage generation unit that generates a voltage to be applied to a terminal; and a monitoring unit that monitors the voltage generated by the voltage generation unit. The monitoring unit may comprise: a voltage detection unit that detects whether the voltage generated by the voltage generation unit matches a target value; a counter that measures a time corresponding to a detection timing in the voltage detection unit; a comparison unit that compares a count value of the counter with a threshold value; and a determination unit that determines a state of the external capacitance on the basis of the count value when the count value reaches the threshold value.

Description

Power supply device and semiconductor device

[0001] The present technology relates to a power supply device and a semiconductor device. More specifically, the present technology relates to a power supply device to which an external capacitor can be connected and a semiconductor device.

[0002] In order to stabilize the internal voltage of a semiconductor device, there is a technology of connecting an external capacitor. In this case, from the viewpoint of safety, detection of open circuit and short circuit of the external capacitor may be performed. For example, a regulator IC capable of accurately detecting an abnormality such as an open circuit or a short circuit of a load connected to an output terminal has been proposed (see, for example, Patent Document 1).

[0003] Japanese Unexamined Patent Application Publication No. 2017-45096

[0004] However, in the above-described conventional technology, since current is converted into voltage and compared with a reference voltage, open circuit and short circuit of the external capacitor cannot be detected.

[0005] The present technology has been developed in view of such circumstances, and an object of the present technology is to enable detection of the state of an external capacitor in a power supply device to which the external capacitor is connected.

[0006] The present technology has been made to solve the above-mentioned problems, and a first aspect of the present technology is a power supply device including: a terminal to which an external capacitor can be connected; a voltage generation unit that generates a voltage applied to the terminal; and a monitoring unit that monitors the voltage generated by the voltage generation unit. This brings about an effect that the state of the external capacitor is monitored based on the voltage generated by the voltage generation unit.

[0007] Furthermore, in the first aspect, the monitoring unit may monitor a time period from when the voltage generation unit starts voltage generation until the voltage is stabilized. This brings about an effect that the state of the external capacitor is monitored based on the time until the voltage is stabilized.

[0008] Furthermore, in the first aspect, the monitoring unit may include a voltage detection unit that detects whether the voltage generated by the voltage generation unit matches a target value, a counter that measures time according to the detection timing of the voltage detection unit, a comparison unit that compares the count value of the counter with a threshold, and a determination unit that determines the state of the external capacitor based on the count value when the threshold is reached. This results in the state of the external capacitor being monitored based on the count value of the counter based on the state of the external capacitor.

[0009] Furthermore, the first aspect may include a notification unit that notifies the status of the external capacitance. This allows the status of the external capacitance detected within the power supply unit to be recognized outside the power supply unit.

[0010] Furthermore, in the first aspect, the threshold value may be set based on the voltage supply capacity of the voltage generation unit and the capacity value of the external capacitor. This results in the detection of the state of the external capacitor according to its capacity value.

[0011] Furthermore, in the first aspect, the threshold may be changed based on the capacity value of the external capacity. This results in the threshold being optimized according to the capacity value of the external capacity.

[0012] Furthermore, in the first aspect, the threshold may comprise a plurality of thresholds. This results in the detection of multiple states of the external capacity.

[0013] Furthermore, in the first aspect, the thresholds may include a first threshold, a second threshold, a third threshold, and a fourth threshold (first threshold < second threshold < third threshold < fourth threshold), and the determination unit may determine that the external capacity is open when the count value ≤ first threshold, that the external capacity is degraded when the first threshold < count value ≤ second threshold, that the external capacity is normal when the second threshold < count value ≤ third threshold, that the external capacity is degraded when the third threshold < count value ≤ fourth threshold, and that the external capacity is short-circuited when the fourth threshold < count value. This results in the detection of multiple abnormalities in the external capacity.

[0014] Furthermore, the second aspect is a semiconductor device comprising a semiconductor element formed on a semiconductor chip and a power supply unit formed on the semiconductor chip, wherein the power supply unit comprises a terminal to which an external capacitor can be connected, a voltage generation unit that generates a voltage applied to the terminal, and a monitoring unit that monitors the voltage generated by the voltage generation unit. This ensures the safety of the semiconductor device while stabilizing the internal voltage of the semiconductor device.

[0015] This is a block diagram showing an example configuration of a power supply according to the first embodiment. This diagram shows the time it takes for the generated voltage to reach the target value depending on whether or not an external capacitor is connected to the power supply according to the first embodiment. This diagram shows the relationship between the capacity value and the count value of the external capacitor connected to the power supply according to the first embodiment. This is a block diagram showing an example configuration of a power supply according to the second embodiment. This diagram shows the relationship between the state of the external capacitor and the time it takes for the generated voltage to reach the target value when multiple thresholds are set for the power supply according to the second embodiment. This is a block diagram showing a schematic example configuration of a vehicle control system. This is an explanatory diagram showing an example of the installation position of the imaging unit.

[0016] The following describes the embodiments for implementing this technology (hereinafter referred to as embodiments). The explanation will proceed in the following order: 1. First embodiment (an example in which the state of an external capacitor is determined based on the counter's count value when the voltage generated by the voltage generation unit reaches a target value) 2. Second embodiment (an example in which the state of an external capacitor is determined based on the counter's count value when the voltage generated by the voltage generation unit reaches a target value, and multiple thresholds are set to determine the state of the external capacitor) 3. Application example to a mobile device

[0017] <1. First Embodiment> Figure 1 is a block diagram showing an example of the configuration of a power supply device according to the first embodiment.

[0018] In the figure, a semiconductor chip 100 has a semiconductor element 101, a power supply 102, and a pad electrode 103 formed on it. An external capacitor 104 is provided outside the semiconductor chip 100. The external capacitor 104 can be attached to the semiconductor chip 100 externally. In this case, the pad electrode 103 is electrically connected to the external capacitor 104. Note that the pad electrode 103 is an example of a terminal as described in the claims.

[0019] The semiconductor element 101 may also be an optical element. The optical element may be an image sensor such as a CCD (Charged Coupled Device) sensor, a CMOS (Complementary Metal-Oxide Semiconductor) sensor, or an event-based vision sensor. The light received by the image sensor may be visible light, near-infrared light (NIR), short-wavelength infrared light (SWIR), ultraviolet light, or X-rays. The optical element may be a photodetector such as a PD (Photo Diode), or a light-emitting element such as an LD (Laser Diode), LED (Light Emitting Diode), or VCSEL (Vertical Cavity Surface Emitting Laser). The optical element may also be an optical switch or a DMD (Digital Micromirror Device). The optical element may also be a display element such as a liquid crystal element or an organic EL (Electro Luminescence) element. The material used in the optical element may be a semiconductor such as Si, GaAs, or InGaAs, or LiNbO ３ It may also be a dielectric such as glass or transparent resin.

[0020] The semiconductor elements may include ICs (Integrated Circuits), transistors, resistors, capacitors, etc. The semiconductor elements may form a memory, a processor, a signal processing circuit, a data processing circuit, or an interface circuit. The semiconductor elements may also form hardware circuits such as FPGAs (Field-Programmable Gate Arrays) or ASICs (Application Specific Integrated Circuits). The materials used for the semiconductor elements may include Si, GaAs, SiC, GaN, InGaAs, InP, or InGaAsP. They may also form MEMS (Micro Electro Mechanical Systems).

[0021] The power supply unit 102 supplies power to the semiconductor element 101. The power supply unit 102 can monitor the status of the external capacitor 104. The power supply unit 102 includes a voltage generation unit 111, a monitoring unit 105, and a notification unit 116. The monitoring unit 105 includes a voltage detection unit 112, a counter 113, a comparison unit 114, and a determination unit 115.

[0022] The voltage generation unit 111 generates a voltage to be applied to the pad electrode 103. At this time, the voltage generation unit 111 can charge the external capacitor 104 via the pad electrode 103. Here, the voltage generated by the voltage generation unit 111 can change transiently depending on the charge state of the external capacitor 104.

[0023] The monitoring unit 105 monitors the voltage generated by the voltage generation unit 111. For example, the monitoring unit 105 can detect a voltage that transiently changes according to the state of the external capacitor 104 and determine the state of the external capacitor 104 based on that voltage. At this time, the monitoring unit 105 can monitor the time from when the voltage generation unit 111 starts generating voltage until the voltage stabilizes. The state of the external capacitor 104 may be, for example, open or short. The state of the external capacitor 104 may also include states such as degradation of the external capacitor 104.

[0024] The voltage detection unit 112 detects whether the voltage generated by the voltage generation unit 111 matches the target value TG. At this time, the voltage detection unit 112 can notify the counter 113 of the detection timing when the voltage generated by the voltage generation unit 111 matches the target value TG.

[0025] The counter 113 measures time according to the detection timing of the voltage detection unit 112 and outputs the count value to the comparison unit 114. At this time, the counter 113 can start counting when the power supply unit 102 is started and stop counting when the detection timing is notified from the voltage detection unit 112. The counter 113 may be a ring counter, a binary counter, or a Gray code counter.

[0026] The comparison unit 114 compares the count value of the counter 113 with a threshold value SH. The threshold value SH can be set based on the voltage supply capacity of the voltage generation unit 111 and the capacity value of the external capacitor 104. The threshold value SH may also be changed based on the capacity value of the external capacitor 104.

[0027] The determination unit 115 determines the state of the external capacity 104 based on the count value of the counter 113 when the threshold SH is reached. At this time, the determination unit 115 can determine that the external capacity 104 is open or short-circuited based on the relationship between the count value and the threshold SH.

[0028] The notification unit 116 notifies the external system of the status of the external capacity 104. The notification unit 116 may generate an alarm or generate display data according to the status of the external capacity 104.

[0029] When the power supply unit 102 is started, the voltage generation unit 111 starts generating voltage. At the same time, the voltage detection unit 112 starts detecting the voltage generated by the voltage generation unit 111, and the counter 113 starts counting. The power supply unit 102 may also be started when an external power supply is supplied to the semiconductor chip 100.

[0030] Then, when the voltage generated by the voltage generation unit 111 matches the target value TG, the voltage detection unit 112 notifies the counter 113 of the detection timing. When the counter 113 receives the detection timing from the voltage detection unit 112, it stops its counting operation and notifies the comparison unit 114 of the count value at that time.

[0031] When the comparison unit 114 receives the count value from the counter 113, it compares the counter 113 with the threshold SH and notifies the determination unit 115 of the comparison result. The determination unit 115 then determines whether the external capacity 104 is open or short based on the comparison result from the comparison unit 114 and outputs the determination result to the notification unit 116. The notification unit 116 then notifies the outside of whether the external capacity 104 is open or short based on the determination result from the determination unit 115.

[0032] Figure 2 shows the time it takes for the generated voltage to reach the target value, depending on whether or not an external capacitor is connected to the power supply device according to the first embodiment. In the figure, a shows the relationship between the output of the comparison unit 114 after the power supply device 102 is started up and time. In the figure, b shows the relationship between the generated voltage of the voltage generation unit 111 after the power supply device 102 is started up and time.

[0033] In figure b, when the external capacitor 104 is open, it is not charged. As a result, the fluctuation of the voltage V1 generated by the voltage generation unit 111 becomes steeper, and the voltage V1 generated by the voltage generation unit 111 reaches the target value TG faster when the external capacitor 104 is open compared to when it is short-circuited (t1). When the voltage V1 generated by the voltage generation unit 111 reaches the target value TG, the output F1 of the voltage detection unit 112 rises, as shown in figure a, and the counting operation of the counter 113 stops. At this time, the counting operation of the counter 113 stops faster when the external capacitor 104 is open compared to when it is short-circuited, and the count value of the counter 113 becomes smaller.

[0034] On the other hand, when the external capacitor 104 is short-circuited, current flows through the external capacitor 104. As a result, the fluctuation of the voltage V2 generated by the voltage generation unit 111 is slowed down, and the voltage V2 generated by the voltage generation unit 111 reaches the target value TG later when the external capacitor 104 is short-circuited compared to when it is open (t2). When the voltage V2 generated by the voltage generation unit 111 reaches the target value TG, the output F2 of the voltage detection unit 11 rises, as shown in a in the figure, and the counting operation of the counter 113 stops. At this time, the counting operation of the counter 113 stops later when the external capacitor 104 is short-circuited compared to when it is open, and the count value of the counter 113 becomes larger.

[0035] Figure 3 is a diagram showing the relationship between the capacity value and count value of an external capacitor connected to the power supply device according to the first embodiment.

[0036] In the figure, as the capacitance value of the external capacitor 104 increases, the time it takes for the voltage generated by the voltage generation unit 111 to reach the target value TG increases. For this reason, the determination unit 115 may change the ranges H1 and H2 of the count values ​​of the counter 113 that determines the state of the external capacitor 104 according to the capacitance value of the external capacitor 104.

[0037] As described above, in the first embodiment, the state of the external capacitor 104 is determined based on the count value of the counter 113 when the voltage generated by the voltage generation unit 111 matches the target value TG. This makes it possible to determine the state of the external capacitor 104 based on the count value of the counter 113, which is determined by the state of the external capacitor 104. Therefore, the internal voltage of the semiconductor element 101 can be stabilized while ensuring the safety of the semiconductor element 101.

[0038] <2. Second Embodiment> In the first embodiment described above, the state of the external capacitor 104 was determined based on the count value of the counter 113 when the voltage generated by the voltage generation unit 111 matched the target value TG. In this second embodiment, the state of the external capacitor 104 is determined based on the count value of the counter 113 when the voltage generated by the voltage generation unit 111 matched the target value TG, and a plurality of threshold values ​​are set to determine the state of the external capacitor 104.

[0039] FIG. 4 is a block diagram showing a configuration example of a power supply device according to a second embodiment.

[0040] In this figure, a semiconductor chip 200 includes a power supply device 202 instead of the power supply device 102 of the first embodiment described above. Other configurations of the semiconductor chip 200 according to the second embodiment are the same as those of the semiconductor chip 100 according to the first embodiment described above.

[0041] The power supply device 202 includes a monitoring unit 205 instead of the monitoring unit 105 of the first embodiment described above. Other configurations of the power supply device 202 according to the second embodiment are the same as those of the power supply device 102 according to the first embodiment described above.

[0042] The monitoring unit 205 includes a comparison unit 214 and a determination unit 215 instead of the comparison unit 114 and the determination unit 115 of the first embodiment described above. Other configurations of the monitoring unit 205 according to the second embodiment are the same as those of the monitoring unit 105 according to the first embodiment described above.

[0043] The monitoring unit 205 monitors the voltage generated by the voltage generation unit 111. At this time, the monitoring unit 205 detects a voltage that changes transiently according to the state of the external capacitor 104, and can determine a plurality of states of the external capacitor 104 based on the voltage. The plurality of states of the external capacitor 104 include, for example, normal, open, short-circuited, degraded, and out-of-specification.

[0044] The comparison unit 214 compares the count value of the counter 113 with a plurality of threshold values SH1 to SH4. The threshold values SH1 to SH4 can satisfy the relationship of SH1 < SH2 < SH3 < SH4.

[0045] The determination unit 215 determines a plurality of states of the external capacitor 104 based on the count value of the counter 113 when the count value reaches the threshold SH. At this time, the determination unit 215 may determine that the external capacitor 104 is open when the count value ≤ threshold SH1, determine that the external capacitor 104 is degraded when threshold SH1 < count value ≤ threshold SH2, determine that the external capacitor 104 is normal when threshold SH2 < count value ≤ threshold SH3, determine that the external capacitor 104 is degraded when threshold SH3 < count value ≤ threshold SH4, and determine that the external capacitor 104 is short-circuited when the count value > threshold SH4.

[0046] FIG. 5 is a diagram showing the relationship between the state of an external capacitor and the time it takes for a generated voltage to reach a target value when a plurality of thresholds are set in the power supply device according to the second embodiment.

[0047] In this figure, when the external capacitor 104 is normal, the charging time of the external capacitor 104 is determined based on the voltage supply capability of the voltage generation unit 111 and the capacitance value of the external capacitor 104. The voltage supply capability of the voltage generation unit 111 and the capacitance value of the external capacitor 104 can be set in advance. Therefore, the thresholds SH2 and SH3 can be set based on the charging time of the external capacitor 104 when the external capacitor 104 is normal. At this time, the determination unit 215 can determine that the external capacitor 104 is normal when the count value of the counter 113 satisfies threshold SH2 < count value ≤ threshold SH3.

[0048] Furthermore, when the external capacitor 104 is open or short-circuited, the transient state of the voltage of the voltage generation unit 111 is determined based on the voltage supply capability of the voltage generation unit 111. Therefore, the threshold SH1 can be set based on the transient state of the voltage of the voltage generation unit 111 when the external capacitor 104 is open. At this time, the determination unit 215 can determine that the external capacitor 104 is open when the count value of the counter 113 satisfies count value ≤ threshold SH1. Furthermore, the threshold SH4 can be set based on the transient state of the voltage of the voltage generation unit 111 when the external capacitor 104 is short-circuited. At this time, the determination unit 215 can determine that the external capacitor 104 is short-circuited when the count value of the counter 113 satisfies count value > threshold SH4.

[0049] Furthermore, when the external capacitor 104 is neither normal, open, nor short-circuited, it can be considered that the external capacitor 104 is degraded. In this case, the determination unit 215 can determine that the external capacitor 104 is degraded when threshold SH1 < count value ≤ threshold SH2 or threshold SH3 < count value ≤ threshold SH4.

[0050] As described above, in the second embodiment, the state of the external capacitor 104 is determined based on the count value of the counter 113 when the voltage generated by the voltage generation unit 111 matches the target value TG, and SH4 is set from a plurality of thresholds SH1 to determine the state of the external capacitor 104. This makes it possible to determine multiple states of the external capacitor 104 based on the count value of the counter 113 based on the state of the external capacitor 104. Therefore, it is possible to stabilize the internal voltage of the semiconductor element 101 while ensuring the safety of the semiconductor element 101, and it is also possible to recognize when the external capacitor 104 needs to be replaced.

[0051] <3. Examples of Application to Mobile Devices> The technology disclosed herein (the technology) can be applied to various products. For example, the technology disclosed herein may be implemented as a device mounted on any type of mobile device such as automobiles, electric vehicles, hybrid electric vehicles, motorcycles, bicycles, personal mobility devices, airplanes, drones, ships, and robots.

[0052] Figure 6 is a block diagram showing a schematic configuration example of a vehicle control system, which is an example of a mobile control system to which the technology described herein may be applied.

[0053] The vehicle control system 12000 comprises a plurality of electronic control units connected via a communication network 12001. In the example shown in Figure 6, the vehicle control system 12000 includes a drive system control unit 12010, a body system control unit 12020, an external information detection unit 12030, an internal information detection unit 12040, and an integrated control unit 12050. The functional configuration of the integrated control unit 12050 is shown in the figure, which includes a microcomputer 12051, an audio / image output unit 12052, and an in-vehicle network interface 12053.

[0054] The drivetrain control unit 12010 controls the operation of devices related to the vehicle's drivetrain according to various programs. For example, the drivetrain control unit 12010 functions as a control device for a drivetrain generating device that generates driving force for the vehicle, such as an internal combustion engine or a drive motor; a drivetrain transmission mechanism that transmits driving force to the wheels; a steering mechanism that adjusts the steering angle of the vehicle; and a braking device that generates braking force for the vehicle.

[0055] The body system control unit 12020 controls the operation of various devices mounted on the vehicle body according to various programs. For example, the body system control unit 12020 functions as a control device for a keyless entry system, a smart key system, a power window system, or various lamps such as headlights, reverse lights, brake lights, turn signals, or fog lights. In this case, the body system control unit 12020 may receive radio waves transmitted from a portable device that replaces a key or signals from various switches. The body system control unit 12020 receives these radio waves or signals and controls the vehicle's door lock system, power window system, lamps, etc.

[0056] The external information detection unit 12030 detects information from outside the vehicle equipped with the vehicle control system 12000. For example, an imaging unit 12031 is connected to the external information detection unit 12030. The external information detection unit 12030 causes the imaging unit 12031 to capture images of the outside of the vehicle and receives the captured images. Based on the received images, the external information detection unit 12030 may perform object detection processing such as detecting people, cars, obstacles, signs, or characters on the road surface, or distance detection processing.

[0057] The imaging unit 12031 is a light sensor that receives light and outputs an electrical signal corresponding to the amount of light received. The imaging unit 12031 can output the electrical signal as an image or as distance measurement information. The light received by the imaging unit 12031 may be visible light or invisible light such as infrared light.

[0058] The in-vehicle information detection unit 12040 detects information inside the vehicle. The in-vehicle information detection unit 12040 is connected to, for example, a driver status detection unit 12041 that detects the driver's state. The driver status detection unit 12041 includes, for example, a camera that captures images of the driver, and the in-vehicle information detection unit 12040 may calculate the driver's level of fatigue or concentration, or determine whether the driver is drowsy, based on the detection information input from the driver status detection unit 12041.

[0059] The microcomputer 12051 can calculate control target values ​​for the drive force generator, steering mechanism, or braking device based on information inside and outside the vehicle acquired by the external information detection unit 12030 or the internal information detection unit 12040, and output control commands to the drive system control unit 12010. For example, the microcomputer 12051 can perform cooperative control aimed at realizing ADAS (Advanced Driver Assistance System) functions, including collision avoidance or impact mitigation, following driving based on distance between vehicles, maintaining vehicle speed, vehicle collision warning, or vehicle lane departure warning.

[0060] Furthermore, the microcomputer 12051 can perform cooperative control for purposes such as autonomous driving, where the vehicle drives autonomously without driver intervention, by controlling the drive force generating device, steering mechanism, or braking device, etc., based on information about the vehicle's surroundings acquired by the external information detection unit 12030 or the internal information detection unit 12040.

[0061] Furthermore, the microcomputer 12051 can output control commands to the body system control unit 12020 based on external information acquired by the external information detection unit 12030. For example, the microcomputer 12051 can control the headlights according to the position of a preceding or oncoming vehicle detected by the external information detection unit 12030, and perform coordinated control aimed at reducing glare, such as switching from high beams to low beams.

[0062] The audio-image output unit 12052 transmits at least one of audio and image output signals to an output device capable of visually or audibly notifying information to the vehicle's occupants or to those outside the vehicle. In the example in Figure 6, the output devices are exemplified as an audio speaker 12061, a display unit 12062, and an instrument panel 12063. The display unit 12062 may include, for example, at least one of an onboard display and a head-up display.

[0063] Figure 7 shows an example of the installation position of the imaging unit 12031.

[0064] In Figure 7, the imaging unit 12031 includes imaging units 12101, 12102, 12103, 12104, and 12105.

[0065] The imaging units 12101, 12102, 12103, 12104, and 12105 are installed, for example, on the front nose, side mirrors, rear bumper, back door, and the upper part of the windshield inside the vehicle 12100. The imaging unit 12101 installed on the front nose and the imaging unit 12105 installed on the upper part of the windshield inside the vehicle mainly acquire images of the front of the vehicle 12100. The imaging units 12102 and 12103 installed on the side mirrors mainly acquire images of the sides of the vehicle 12100. The imaging unit 12104 installed on the rear bumper or back door mainly acquires images of the rear of the vehicle 12100. The imaging unit 12105 installed on the upper part of the windshield inside the vehicle is mainly used for detecting preceding vehicles, pedestrians, obstacles, traffic lights, traffic signs, or lanes.

[0066] Figure 7 shows an example of the imaging range of imaging units 12101 to 12104. Imaging range 12111 indicates the imaging range of imaging unit 12101 located on the front nose, imaging ranges 12112 and 12113 indicate the imaging ranges of imaging units 12102 and 12103 located on the side mirrors, respectively, and imaging range 12114 indicates the imaging range of imaging unit 12104 located on the rear bumper or back door. For example, by superimposing the image data captured by imaging units 12101 to 12104, an overhead view image of the vehicle 12100 can be obtained.

[0067] At least one of the imaging units 12101 to 12104 may have a function for acquiring distance information. For example, at least one of the imaging units 12101 to 12104 may be a stereo camera consisting of multiple image sensors, or an image sensor having pixels for phase difference detection.

[0068] For example, the microcomputer 12051, based on distance information obtained from the imaging units 12101 to 12104, can determine the distance to each object within the imaging range 12111 to 12114 and the temporal change of this distance (relative speed to the vehicle 12100). In particular, it can extract the closest object on the vehicle 12100's path that is traveling in approximately the same direction as the vehicle 12100 at a predetermined speed (e.g., 0 km / h or more) as the preceding vehicle. Furthermore, the microcomputer 12051 can set a predetermined distance to be maintained before the preceding vehicle and perform automatic braking control (including follow-and-stop control) and automatic acceleration control (including follow-and-start control), etc. In this way, cooperative control aimed at autonomous driving, etc., that drives autonomously without driver operation, can be performed.

[0069] For example, the microcomputer 12051 can use distance information obtained from imaging units 12101 to 12104 to classify and extract three-dimensional object data related to three-dimensional objects, such as motorcycles, passenger cars, large vehicles, pedestrians, utility poles, and other three-dimensional objects, and use this data for automatic obstacle avoidance. For example, the microcomputer 12051 identifies obstacles around the vehicle 12100 into obstacles that are visible to the driver of the vehicle 12100 and obstacles that are difficult to see. The microcomputer 12051 then determines the collision risk, which indicates the degree of risk of collision with each obstacle. If the collision risk is above a set value and there is a possibility of collision, the microcomputer 12051 can provide driving assistance to avoid collisions by outputting a warning to the driver via the audio speaker 12061 or the display unit 12062, or by performing forced deceleration or evasive steering via the drive system control unit 12010.

[0070] At least one of the imaging units 12101 to 12104 may be an infrared camera that detects infrared light. For example, the microcomputer 12051 can recognize pedestrians by determining whether or not pedestrians are present in the images captured by the imaging units 12101 to 12104. Such pedestrian recognition is performed, for example, by a procedure to extract feature points from the images captured by the imaging units 12101 to 12104 as infrared cameras, and a procedure to perform pattern matching on a series of feature points that indicate the contour of an object to determine whether or not it is a pedestrian. When the microcomputer 12051 determines that a pedestrian is present in the images captured by the imaging units 12101 to 12104 and recognizes a pedestrian, the audio-image output unit 12052 controls the display unit 12062 to superimpose a rectangular contour line for emphasis on the recognized pedestrian. The audio-image output unit 12052 may also control the display unit 12062 to display an icon indicating a pedestrian at a desired position.

[0071] The above describes an example of a vehicle control system to which the technology described herein can be applied. The technology described herein can be applied to the drive system control unit 12010, the body system control unit 12020, the external information detection unit 12030, the internal information detection unit 12040, the integrated control unit 12050, and the imaging unit 12031 among the configurations described above. Specifically, for example, the power supply device of the above embodiment can be applied to the drive system control unit 12010, the body system control unit 12020, the external information detection unit 12030, the internal information detection unit 12040, the integrated control unit 12050, and the imaging unit 12031. By applying the technology described herein to the vehicle control system 12000, the internal voltage of the vehicle control system can be stabilized while ensuring the safety of the vehicle control system.

[0072] In addition to being applicable to imaging devices, either of the power supply devices in the first and second embodiments described above may also be applied to electronic circuits and semiconductor devices used in communication devices, display devices, data processing devices, control devices, measuring devices, or printing devices.

[0073] Furthermore, the embodiments described above are merely examples of how to realize the present technology, and there is a corresponding relationship between the matters in the embodiments and the inventive features in the claims. Similarly, there is a corresponding relationship between the inventive features in the claims and the matters in the embodiments of the present technology that bear the same name. However, the present technology is not limited to the embodiments and can be realized by making various modifications to the embodiments without departing from the gist of the present technology. Also, the effects described herein are merely examples and are not limiting, and there may be other effects.

[0074] Furthermore, this technology can also be configured as follows: (1) A power supply device comprising a terminal to which an external capacitor can be connected, a voltage generation unit that generates a voltage applied to the terminal, and a monitoring unit that monitors the voltage generated by the voltage generation unit. (2) The power supply device according to (1), wherein the monitoring unit monitors the time from when the voltage generation unit starts generating a voltage until the voltage stabilizes. (3) The power supply device according to (1) or (2), wherein the monitoring unit comprises a voltage detection unit that detects whether the voltage generated by the voltage generation unit matches a target value, a counter that measures a time corresponding to the detection timing of the voltage detection unit, a comparison unit that compares the count value of the counter with a threshold value, and a determination unit that determines the state of the external capacitor based on the count value when the threshold value is reached. (4) The power supply device according to (3), further comprising a notification unit that notifies the state of the external capacitor. (5) The power supply device according to (3) or (4), wherein the threshold value is set based on the voltage supply capacity of the voltage generation unit and the capacity value of the external capacitor. (6) The power supply device according to (5), wherein the threshold is changed based on the capacity value of the external capacity. (7) The power supply device according to any one of (2) to (6), wherein the threshold comprises a plurality of thresholds. (8) The power supply device according to (7), wherein the threshold comprises a first threshold, a second threshold, a third threshold and a fourth threshold (first threshold < second threshold < third threshold < fourth threshold), and the determination unit determines that the external capacity is open when the count value ≤ first threshold, determines that the external capacity is degraded when the first threshold < count value ≤ second threshold, determines that the external capacity is normal when the second threshold < count value ≤ third threshold, determines that the external capacity is degraded when the third threshold < count value ≤ fourth threshold, and determines that the external capacity is short when the fourth threshold < count value. (9) A semiconductor device comprising a semiconductor element formed on a semiconductor chip and a power supply device formed on the semiconductor chip, wherein the power supply device comprises a terminal to which an external capacitor can be connected, a voltage generation unit that generates a voltage applied to the terminal, and a monitoring unit that monitors the voltage generated by the voltage generation unit.

[0075] 100 Semiconductor chip 101 Semiconductor element 102 Power supply unit 103 Pad electrode 104 External capacitor 105 Monitoring unit 111 Voltage generation unit 112 Comparison unit 113 Counter 114 Judgment unit 115 Notification unit

Claims

1. A power supply device comprising: a terminal to which an external capacitor can be connected; a voltage generation unit that generates a voltage applied to the terminal; and a monitoring unit that monitors the voltage generated by the voltage generation unit.

2. The power supply device according to claim 1, wherein the monitoring unit monitors the time from when the voltage generation unit starts generating voltage until the voltage stabilizes.

3. The power supply device according to claim 1, wherein the monitoring unit comprises a voltage detection unit that detects whether the voltage generated by the voltage generation unit matches a target value; a counter that measures time according to the detection timing of the voltage detection unit; a comparison unit that compares the count value of the counter with a threshold value; and a determination unit that determines the state of the external capacitor based on the count value when the threshold value is reached.

4. The power supply device according to claim 3, further comprising a notification unit for notifying the status of the external capacity.

5. The power supply device according to claim 3, wherein the threshold is set based on the voltage supply capacity of the voltage generation unit and the capacity value of the external capacitor.

6. The power supply device according to claim 5, wherein the threshold is changed based on the capacity value of the external capacity.

7. The power supply device according to claim 3, wherein the threshold is a plurality of thresholds.

8. The power supply device according to claim 7, wherein the thresholds include a first threshold, a second threshold, a third threshold, and a fourth threshold (first threshold < second threshold < third threshold < fourth threshold), and the determination unit determines that the external capacity is open when the count value ≤ first threshold, determines that the external capacity is degraded when the first threshold < count value ≤ second threshold, determines that the external capacity is normal when the second threshold < count value ≤ third threshold, determines that the external capacity is degraded when the third threshold < count value ≤ fourth threshold, and determines that the external capacity is short when the fourth threshold < count value.

9. A semiconductor device comprising a semiconductor element formed on a semiconductor chip and a power supply unit formed on the semiconductor chip, wherein the power supply unit comprises a terminal to which an external capacitor can be connected, a voltage generation unit that generates a voltage applied to the terminal, and a monitoring unit that monitors the voltage generated by the voltage generation unit.

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