Apparatus for calibrating curing degree measurement equipment

Abstract

The present invention relates to an apparatus for calibrating curing degree measurement equipment. The apparatus for calibrating curing degree measurement equipment according to the present invention may comprise: a housing; a holder extending through the housing and into which a first probe of the curing degree measurement equipment is inserted; and a planar reflector disposed at a predetermined distance from a first optical port of the probe, wherein the housing seals a space including the first optical port and the reflector in a dustproof structure, and the reflector may include a reflective layer having a predetermined reflectance in a near-infrared (NIR) region. According to the present invention, reliable calibration may be ensured by providing measurement conditions that are free from contamination and remain constant, and calibration may be readily performed at an installation site of the curing degree measurement equipment, without need to move the equipment for calibration.

Description

Hardness measurement and correction device

[0001] The present invention relates to a curing degree measurement correction device, and more specifically, to a curing degree measurement correction device that enables direct on-site correction of curing degree measuring equipment requiring correction without separating or moving it from the process line.

[0002] In order to measure the degree of curing of curable materials such as epoxy used in electronic products, conventional methods have involved physically collecting samples and then performing analysis using Differential Scanning Calorimetry (DSC).

[0003] However, DSC-based hardness analysis had problems such as significant deviations in measured hardness values ​​depending on the sample collection location or analysis area, and difficulty in meaningfully distinguishing subtle differences in hardness between samples with different curing times. Additionally, since DSC is inherently a destructive analysis, it has the limitation that it is virtually impossible to measure the hardness of samples being manufactured in real time by directly linking it to the process line.

[0004] Accordingly, an analysis method based on Near-infrared spectroscopy (NIR) was introduced, which irradiates a sample with near-infrared light to measure the absorbance of specific chemical bonds, such as epoxides, and then quantitatively calculates the curing characteristics. This method has the advantages of enabling non-destructive analysis, significantly reducing measurement time, and allowing for high-reliability measurements even for localized areas in the μm range.

[0005] Methods for analyzing hardness using near-infrared radiation include dispersive near-infrared spectroscopy and measurement methods using Fourier-transform near-infrared spectroscopy (FT-NIR).

[0006] In particular, the FT-NIR method has the advantage of being able to collect light of all wavelengths simultaneously, allowing for the simultaneous analysis of various components at high speed. Accordingly, the applicant has also developed a curing degree measuring device using the FT-NIR method and introduced it into a production process line.

[0007] However, as the lifespan of the light source used in the curability measurement equipment decreases, the light intensity gradually changes, which necessitates periodic calibration. To perform such calibration, a reference reflector must be used in a contamination-free environment that has reflective characteristics similar to the sample being measured and whose reflectivity does not change over time.

[0008] Therefore, a dedicated hardness measurement calibration device that can be connected to and used with the hardness measurement equipment is required so that calibration can be performed directly on-site without separating or moving the measurement equipment from the process line.

[0009] The technical problem that the present invention aims to solve is to provide a curing degree measurement calibration device that is free from external contamination, provides optical conditions similar to those when measuring curing degree with an actual sample, and is directly connected to an existing curing degree measurement device to perform calibration work immediately on-site, so as to facilitate periodic calibration of the curing degree measurement device in response to light intensity fluctuations caused by changes in the light source lifespan of the curing degree measurement device.

[0010] The technical problems of the present invention are not limited to those mentioned above, and other unmentioned technical problems will be clearly understood by those skilled in the art from the description below.

[0011] The curing degree measurement correction device of the present invention for solving the above technical problem is a curing degree measurement correction device connected to a curing degree measurement device, comprising a housing, a holder penetrating the housing into which a first probe of the curing degree measurement device is inserted, and a reflector provided in a right-angled plane spaced apart from a first light entry port of the probe by a predetermined distance, wherein the housing seals the space including the first light entry port and the reflector with a dustproof structure, and the reflector may include a reflective layer having a predetermined reflectance in the NIR region.

[0012] In some embodiments of the present invention, the reflective layer may be formed of at least one metal among gold, silver, or aluminum.

[0013] In some embodiments of the present invention, the purity of the metal may be 99.9% or higher.

[0014] In some embodiments of the present invention, the reflectance may be 70% or more.

[0015] In some embodiments of the present invention, the housing may be formed of a transparent plastic material.

[0016] In some embodiments of the present invention, an IR reflective or blocking coating may be formed on the surface of the housing.

[0017] In some embodiments of the present invention, the holder may include a holder bolt inserted from the side to secure the probe.

[0018] In some embodiments of the present invention, the holder may have threads formed therein to which the holder bolt is fastened.

[0019] In some embodiments of the present invention, the holder may include a holder ring that contacts the inner surface of the first probe and the holder.

[0020] In some embodiments of the present invention, the distance between the first light entry port and the reflector may be equal to the distance between the second light entry port of the second probe and the measurement sample.

[0021] In some embodiments of the present invention, the housing may include a fixing part on the side for fixing the housing to a manufacturing facility.

[0022] According to the curing degree measurement correction device of the present invention, by sealing a space including a light entry port and a reflector with a dustproof structure and providing measurement conditions that exclude contamination and remain unchanged, periodic corrections caused by changes in light intensity can be easily performed. In addition, since the curing degree measurement correction device is connected to and fixedly installed on a measuring device, correction can be conveniently performed at the installed location without the need to move the curing degree measuring device for correction.

[0023] Figure 1 is a drawing illustrating a hardness measuring device.

[0024] Figure 2 is a diagram illustrating the configuration of a probe of a hardness measuring device according to Figure 1.

[0025] FIG. 3 is a drawing illustrating a curing degree measurement correction device according to one embodiment of the present invention.

[0026] Figure 4 is a front view of a hardness measurement correction device according to Figure 3.

[0027] Figure 5 is a plan view of a curing degree measurement correction device according to Figure 3.

[0028] Figure 6 is a diagram showing the results of the initial hardening measurement.

[0029] Figure 7 is a diagram showing the results of measuring the degree of hardness before and after correction.

[0030] Figure 8 is a diagram showing the real-time correction results.

[0031] The advantages and features of the present invention and the methods for achieving them will become clear by referring to the embodiments described below in detail together with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below but may be implemented in various different forms. These embodiments are provided merely to ensure that the disclosure of the present invention is complete and to fully inform those skilled in the art of the scope of the invention, and the present invention is defined only by the scope of the claims. Throughout the specification, the same reference numerals refer to the same components.

[0032] "And / or" includes each of the mentioned items and all combinations of one or more.

[0033] The terms used herein are for describing embodiments and are not intended to limit the invention. In this specification, the singular form includes the plural form unless specifically stated otherwise in the text. As used herein, "comprising" and / or "comprising" does not exclude the presence or addition of one or more other components, steps, actions, and / or elements to the mentioned components, steps, actions, and / or elements.

[0034] Furthermore, throughout the specification, when a part is described as being "connected" to another part, this includes not only cases where they are "directly connected," but also cases where they are "indirectly" or "electrically connected" with other members or elements interposed between them.

[0035] Additionally, throughout the specification, the description that each layer (film), region, pattern, or structure is formed "on" or "under" the substrate, each layer (film), region, pad, or pattern includes both direct formation and formation through another layer. The criteria for "on" or "under" each layer are described based on the drawings.

[0036] Furthermore, expressions such as 'first, second,' etc., are used solely to distinguish multiple compositions and do not limit the order or other characteristics between the compositions.

[0037] Unless otherwise defined, all terms used in this specification (including technical and scientific terms) may be used in a meaning commonly understood by those skilled in the art to which the present invention pertains. Additionally, terms defined in commonly used dictionaries are not to be interpreted ideally or excessively unless explicitly and specifically defined otherwise.

[0038] Hereinafter, a curing degree measurement correction device according to the present invention will be described with reference to the drawings.

[0039] First, a hardness measuring device to which the hardness measuring correction device according to the present invention is connected will be described.

[0040] FIG. 1 is a drawing illustrating a hardness measuring device, and FIG. 2 is a drawing for explaining the configuration of a probe of the hardness measuring device according to FIG. 1.

[0041] Referring to FIG. 1, a curing degree measuring device (10) according to an embodiment of the present invention may include a light source (100), a probe (201, 202), a detector (400), and a computer (500), etc.

[0042] The light source (100) can emit near-infrared light to supply light to a reflector (750) or a measurement sample (900) through a probe (201, 202). The light source (100) may include, for example, a halogen lamp, an LED, etc. that emits light with a wavelength of 750 nm to 1400 nm.

[0043] A light source (100) can be packaged together with a power supply unit that supplies power, an input unit that can operate to turn the light source (100) on / off, and a control unit that controls the operation of the light source (100), and housed inside a case. The case may be provided with a connector terminal so that a light source (100) emitting near-infrared rays can be connected to a probe (201, 202). In an embodiment of the present invention, two probes (201, 202), namely a first probe (201) and a second probe (202), can be simultaneously connected to the connector terminal of a hardness measurement device (10) and selectively switched for use.

[0044] The light source (100) can reach the reflector (750) or the measurement sample (900) through the probe (201, 202), and can emit near-infrared light with an output that does not damage the measurement sample (900). In some embodiments of the present invention, the output of the light source (100) may be 4.7W to 30W.

[0045] For hardness analysis, an absorbance graph with a good signal-to-noise ratio is required for peak analysis. Since a large amount of noise is mixed in due to insufficient light intensity, it is essential to use a light source (100) with sufficient output for good measurement results.

[0046] Therefore, the output of the light source (100) can be configured to be 4.7W or higher, but can be limited to 30W or lower so as not to damage the measurement sample (900).

[0047] The near-infrared light supplied by the light source (100) is focused to have a straight line and emitted outward, and the light source (100) can supply near-infrared light by being connected to the probe (201, 202) through a connector.

[0048] The probe (201, 202) may include a transmission signal line (210) that transmits light emitted from a light source (100) to a sample, and a receiving signal line (220) that collects light reflected from a measurement sample (900) and transmits it to a detector (400). The configuration of the probe of the curing degree measuring equipment according to an embodiment of the present invention will be explained in detail using FIG. 2.

[0049] The configuration and operation of the first probe (201) and the second probe (202) are identical.

[0050] Referring to FIG. 2, the probe (201, 202) may include a transmission signal line (210) including a plurality of first optical fibers (211) and a reception signal line (220) including a plurality of second optical fibers (221). Near-infrared light emitted from a light source (100) is transmitted to a light entry port (230) through the transmission signal line (210) including a plurality of first optical fibers (211) and is transmitted to a reflector (750) or a measurement sample (900).

[0051] Near-infrared light that is partially absorbed and reflected by a reflector (750) or a measurement sample (900) is again incident on the light inlet / outlet (230) and can be transmitted to a detector (400) through a receiving signal line (220) including a second optical fiber (221). As shown in FIG. 2, the transmission signal line (210) and the receiving signal line (220) are each separated at one end from the branching section (240), and one end of the transmission signal line (210) is connected to a light source (100) and one end of the receiving signal line (220) is connected to a detector (400). The section from the branch section (240) to the light entry / exit (230) is a section where the transmission signal line (210) and the reception signal line (220) are covered by a single outer sheath, and a plurality of first optical fibers (211) and a plurality of second optical fibers (221) may be mixed and arranged on the cross-section of the light entry / exit (230).

[0052] The number of multiple first optical fibers (211) may be greater than the number of multiple second optical fibers (221). When transmitting near-infrared light emitted from the light source (100) by the first probe (201) to the sample, securing a sufficient amount of light is an important requirement. Accordingly, even when the transmission signal line (210) and the reception signal line (220) are covered by a single outer sheath, it is necessary to configure the number of first optical fibers (211) of the transmission signal line (210) to be as large as possible. In the embodiment, the number of multiple first optical fibers may be 39 and the number of multiple second optical fibers may be 5.

[0053] The plurality of first optical fibers (211) and second optical fibers (221) may include silica, but are not limited thereto, and may include plastic optical fiber materials such as perfluorinated polymers.

[0054] When near-infrared light reflected from a reflector (750) or a measurement sample (900) is transmitted through a receiving signal line (220), the detector (400) receives it and can detect the absorption rate by wavelength using a dispersive spectral method.

[0055] The detector may include an image sensor, and the image sensor may include, for example, a CMOS (Complementary Metal Oxide Semiconductor) or a CCD (Charge Coupled Device), and in particular, can detect light in the near-infrared wavelength band to generate an electrical signal.

[0056] The light signal recognized through the image sensor can be transmitted to a computer (500) to perform software processing for hardness measurement. In particular, energy levels by wavelength (wavenumber), i.e., absorbance, can be obtained through the image sensor, and the computer (500) can measure the hardness of the measurement sample (900) through the shape and value of the peaks and valleys of the obtained absorbance graph.

[0057] FIG. 3 is a drawing illustrating a curing degree measurement correction device (700) according to an embodiment of the present invention, FIG. 4 is a front view of the curing degree measurement correction device according to FIG. 3, and FIG. 5 is a plan view of the curing degree measurement correction device according to FIG. 3.

[0058] Referring to FIGS. 3 to 5, the curing degree measurement correction device (700) according to the present invention is a curing degree measurement correction device (700) connected to a curing degree measurement equipment (10), and comprises a housing (710), a holder (730) that penetrates the housing (710) and into which a first probe (201) of the curing degree measurement equipment (10) is inserted, and a reflector (750) provided as a right-angled plane spaced apart from a first light entry port (231) of the first probe (201) by a predetermined distance, wherein the housing (710) seals the space including the first light entry port (231) and the reflector (750) with a dustproof structure, and the reflector (750) may include a reflective layer having a predetermined reflectance in the NIR region.

[0059] The hardness measuring device (10) includes a first probe (201) and a second probe (202). The first probe (201) is connected to a hardness measuring correction device (700) to incident light on a reflector (750) of the hardness measuring correction device (700) and to receive reflected light. The second probe (202) can incident light on a measurement sample (900) mounted on a conveyor belt (1001) installed in a manufacturing process and to receive reflected light.

[0060] The first probe (201) and the second probe (202) are connected to the connector terminal of the curing degree measuring equipment (10) and can be selectively switched and operated depending on the case during calibration or sample measurement in the process.

[0061] For example, the surface of the measurement sample (900) mounted on the conveyor belt (1001) may be a surface formed of an epoxy material during the electronic component manufacturing process, and may be for measuring the degree of curing of the epoxy material laminated in the process.

[0062] When calibrating, the first probe (201) is selected and connected to the light source (100) and detector (400) of the curing degree measuring equipment (10), and during manufacturing process operation, the second probe (202) is selected and connected to the light source (100) and detector (400) of the curing degree measuring equipment (10).

[0063] When measuring the degree of hardness of a measurement sample (900) repeatedly over a long period during the manufacturing process, periodic correction is required because the light intensity changes depending on the lifespan of the light source (100) of the hardness measuring equipment (10). To perform the correction, the correction must be carried out using a device that excludes contamination, includes a reference reflector having a reflectivity similar to that of the sample measuring the degree of hardness, and ensures conditions where the reflectivity does not change.

[0064] In order to enable correction without moving the hardness measuring equipment (10), the hardness measuring equipment (10) is installed adjacent to the conveyor belt (1001) of the manufacturing process where the hardness measuring is performed, and a hardness measuring correction device (700) can be connected to the hardness measuring equipment (10).

[0065] The above housing (710) may be formed of a transparent plastic material. The plastic material may be one of polycarbonate (PC), acrylic (PMMA, Polymethyl Methacrylate, Plexiglass), or polystyrene (PS).

[0066] Polycarbonate has impact resistance and heat resistance, acrylic is transparent, lightweight, and has excellent processability, and polystyrene is lightweight, relatively inexpensive, and has excellent optical properties.

[0067] Additionally, an IR reflection or blocking coating may be formed on the surface of the housing (710). For example, an IR reflection or absorption function may be added to a polyester (PET)-based film and attached to the surface of the housing (710). This is because, since the degree of curing is measured based on light in the NIR band that is output and incident through the first light entry port (231), an error occurs during correction if light in the NIR band is incident from outside the first light entry port (231).

[0068] The above housing (710) can seal the space including the first light inlet (231) and the reflector (750) with a dustproof structure. This is because if dust or the like accumulates between the first light inlet (231) and the reflector (750), an error may occur during calibration.

[0069] The above housing (710) can be formed as a cuboid box and can be connected to the outside through a holder (730) that penetrates the upper surface of the cuboid. A hollow space in the shape of a cylinder is formed in the holder (730) so that the first probe (201) can be inserted and fixed therein. Since the first probe (201) must be formed perpendicular to the reflector (750) so that the light from the first light inlet / outlet (231) can be incident on the reflector (750) to the maximum extent, the holder (730) can be formed by penetrating the upper surface of the housing (710) vertically.

[0070] The above housing (710) may include a fixing part (720) for fixing the housing (710) somewhere.

[0071] The fixing part (720) may be an L-shaped hinge and may include screw fixing holes on one side formed vertically and the other side formed horizontally.

[0072] The fixing part (720) is installed on the left side and the right side of the housing (710), respectively, and at this time, one side of the fixing part (720) is fixed to the housing (710), and the other side can be fixed to the manufacturing equipment adjacent to the measurement sample (900).

[0073] The holder (730) may include a holder bolt (735) inserted from the side to secure the first probe (201).

[0074] A screw hole is formed penetrating the holder (730) so that the holder bolt (735) can be inserted or removed from the side of the holder (730), and a screw thread may be formed on the holder bolt (735) corresponding to this screw hole. When the holder bolt (735) is in a locked state, the first probe (201) can be fixed, or when the holder bolt (735) is in an unlocked state, the first probe (201) can be moved up and down.

[0075] In order to seal the space formed between the outer diameter of the first probe (201) and the inner diameter of the holder (730) with a dustproof structure, the holder (730) may have a holder ring (731) attached around the hole into which the first probe (201) is inserted. In order for the first probe (201) to slide through the holder ring (731), the holder ring may be manufactured from a non-woven fabric that is formed into a fine fiber mesh structure and can effectively block fine particles.

[0076] Since the above reflector (750) is formed on the bottom surface of the housing (710), the light output of the first probe (201) can be incident on the reflector (750) at a right angle.

[0077] The reflector (750) may include a reflective layer having a predetermined reflectance in the NIR region.

[0078] Since it is desirable for the reflective layer to have a small change in reflectance over time, it may be formed from at least one metal among gold, silver, or aluminum as a pure metal free of organic matter. That is, the reflector (750) may include a reflective layer coated with at least one metal among gold, silver, or aluminum. In this case, it is desirable for the purity of the metal to satisfy a value of 99.9% or higher.

[0079] In addition, since a higher reflectivity is less affected by noise during measurement, it is desirable for the reflectivity of the metal to satisfy a value of 70% or higher.

[0080] Gold maintains a high reflectance of over 95% from 700 nm in the NIR frequency band of 450 to 2500 nm, and especially after 1000 nm (1 μm), it maintains a level of 98 to 99% almost consistently.

[0081] Silver has a reflectance of over 97% in the NIR frequency band of 450 to 2500 nm.

[0082] Aluminum has a reflectance of more than 70% in the NIR frequency band of 450 to 2500 nm.

[0083] The distance between the first light entry port (231) and the reflector (750) may be equal to the distance between the second light entry port (232) of the second probe (202) and the measurement sample (900).

[0084] This is because it is desirable to match the measurement conditions in the manufacturing process with the measurement conditions of the calibration device.

[0085] In the embodiment, the separation distance can be set to 18mm + / - 1mm.

[0086] Figure 6 is a diagram showing the results of the initial hardness measurement, and Figure 7 is a diagram showing the results of the hardness measurement before and after correction. In each figure, the horizontal axis represents the sample number, and the vertical axis represents the hardness (%).

[0087] Referring to FIG. 6, ABF material applied in an actual manufacturing process was used as the measurement sample (900), and when the degree of curing was measured at 180 degrees Celsius, the average of the measurement values ​​of each sample was distributed at 90.4%.

[0088] Referring to Fig. 7, when measuring the degree of hardening using the same sample after operating the manufacturing process for a long time, it can be seen that the average of the measurement values ​​of each sample before correction, marked with '■', is distributed at 88.7%, indicating that correction is necessary.

[0089] When measuring the degree of curing after performing correction using the degree of curing measurement correction device (700) according to an embodiment of the present invention, it can be confirmed that the average of the measured values ​​of each sample after correction marked with '●' is distributed at 92.3%, which is similar to the initial degree of curing.

[0090] Figure 8 is a diagram showing the real-time correction results, where the horizontal axis represents the sample number and the vertical axis represents the degree of hardening (%).

[0091] ABF material applied in an actual manufacturing process was used as a sample, and when the degree of curing is measured upon pre-curing at 180 degrees Celsius, it can be confirmed that the deviation between the measurement value of each sample before correction, indicated by '■', and the measurement value of each sample after correction, indicated by '●', is distributed within 0.4%. Therefore, it can be confirmed that the reliability of the degree of curing measurement value using the degree of curing correction device according to the embodiment of the present invention is secured.

[0092] As described above, according to the curing degree measurement correction device of the present invention, a space including a light entry port and a reflector is sealed with a dustproof structure, and the reflector includes a reflective layer having a reflectivity similar to that of a measurement sample in the NIR region, thereby providing measurement conditions that are free from contamination and unchanging, which allows for easy periodic correction due to changes in light intensity.

[0093] In addition, since the hardness measurement correction device is connected to the measuring equipment and fixedly installed, correction can be easily performed at the location where the measuring equipment is installed without the need to move the measuring equipment for correction.

[0094] Although the present invention has been described above, those skilled in the art will recognize that the invention may be implemented in other forms while maintaining the technical concept and essential features of the invention.

[0095] The scope of the present invention shall be defined by the claims, but all modifications or variations derived from configurations directly derived from the descriptions in the claims, as well as configurations equivalent thereto, shall be interpreted as being included within the scope of the present invention.

Claims

1. A hardness measurement correction device connected to a hardness measurement device, Housing; A holder that penetrates the above housing and into which the first probe of the hardness measuring device is inserted; A planar reflector positioned at a predetermined distance from the first light entry / exit port of the probe; comprising A curing degree measurement correction device, wherein the above housing seals the space including the first light entry / exit port and the reflector plate with a dustproof structure, and the reflector plate includes a reflective layer having a predetermined reflectance in the NIR region.

2. In Paragraph 1, A hardness measurement correction device in which the above-mentioned reflective layer is formed of at least one metal among gold, silver, or aluminum.

3. In Paragraph 2, A hardness measurement correction device having a purity of 99.9% or higher of the above metal.

4. In Paragraph 1, A curing degree measurement correction device having a reflectance of 70% or more.

5. In Paragraph 1, The above housing is formed of a transparent plastic material, a curing degree measurement correction device.

6. In Paragraph 5, A curing degree measurement correction device having an IR reflection or blocking coating formed on the surface of the above housing.

7. In Paragraph 1, A hardness measurement correction device, wherein the holder includes a holder bolt inserted from the side to fix the probe, and the holder has a thread formed therein for fastening the holder bolt.

8. In Paragraph 1, A hardness measurement correction device comprising the holder including the first probe and a holder ring in contact with the inner surface of the holder.

9. In Paragraph 1, A hardness measurement correction device in which the distance between the first light entry port and the reflector is the same as the distance between the second light entry port of the second probe and the measurement sample.

10. In Paragraph 1, The above housing is a curing degree measurement correction device comprising a fixing part for fixing the housing to a manufacturing facility.

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