Burn-in test fixture and burn-in test system

Abstract

A burn-in test fixture and a burn-in test system, which relate to the technical field of chip testing. In the present invention, a main drawer is inserted into a test box body, a first PCB of the main drawer is connected to a driver board device in the test box body, and a second PCB is connected to the first PCB and is connected to a probe board. A sub drawer comprises a mounting board, and the mounting board is provided with at least one mounting position for placing a tested chip. The second PCB is configured to float relative to the first PCB under an acting force, so as to drive a test probe on the probe board to come into contact with the tested chip. The above technical solution is equivalent to splitting an integral drawer in the prior art into a main drawer and a sub drawer. The main drawer can always be inserted into the test box body without being transferred, and only the sub drawer needs to be transferred, thereby reducing the space occupied during the transfer process and making the weight relatively light. In addition, during transfer, the PCBs and the probe board do not need to be removed as in the prior art, and the tested chip can be directly replaced, thereby improving the test efficiency.

Description

An aging test fixture and aging test system Technical Field

[0001] This invention relates to the field of chip testing technology, and in particular to an aging test fixture and aging test system. Background Technology

[0002] Chip-on-Carrier (COC) aging test aims to stabilize the performance of COC chips. This requires pre-existing high-temperature, high-current operation to age the chip to a more stable region of its performance curve. Current COC aging test methods involve fixing the chip under test onto a herringbone fixture, which is then placed on a heat sink for temperature control. Probes are used to contact the pads on the chip under test and the pads on the PCB board of the fixture, converting current, voltage, or signals to achieve the aging test.

[0003] In existing technologies, the fishbone fixture and probe plate are typically integrated into a single drawer for transfer. This overall structure occupies a large amount of space and is inconvenient for transfer. Furthermore, the above solution suffers from slow disassembly speed, affecting testing efficiency. Therefore, there is an urgent need to design an aging test fixture that facilitates transfer and improves testing efficiency. Summary of the Invention

[0004] One objective of this invention is to provide an aging test fixture that solves the technical problem that existing aging test fixtures are inconvenient to transfer and affect testing efficiency.

[0005] A further objective of this invention is to reduce the risk of electrical performance failure.

[0006] Another object of the present invention is to provide an aging test system having the above-described aging test fixture.

[0007] Specifically, the present invention provides an aging test fixture, comprising:

[0008] The sub-drawer includes at least one mounting plate, each of the mounting plates having at least one mounting position for placing the chip under test;

[0009] A mother drawer is inserted into the test chamber, and a first insertion space is formed inside the mother drawer. The child drawer is inserted into the first insertion space. The mother drawer includes a first PCB board, at least one second PCB board, and at least one probe board. The first PCB board is connected to a drive board device inside the test chamber, and the probe board has multiple test probes and is connected to the corresponding first PCB board.

[0010] Each of the second PCB boards is electrically connected to the first PCB board and is configured to float relative to the first PCB board under external force, so as to drive the test probe to contact the chip under test on the corresponding mounting position, thereby performing functional testing on the chip under test.

[0011] Optionally, the mother drawer further includes:

[0012] The base plate is arranged at a distance from the probe plate;

[0013] At least one first floating mechanism, each first floating mechanism corresponding to a second PCB board, and including a first floating plate and a plurality of first elastic components. The first floating plate is disposed on the side of the second PCB board away from the first insertion space and is connected to the second PCB board. The two ends of each first elastic component are respectively connected to the base plate and the first floating plate, so that the first floating plate can float relative to the base plate under external force, thereby driving the probe plate to float.

[0014] Optionally, the sub-drawer further includes:

[0015] A mounting plate has at least one first through hole along the vertical direction. Each mounting plate is mounted at one of the first through holes and is configured such that the test probes on the probe plate abut against the chip under test and can float relative to the mounting plate under external force to abut against the heat sink temperature control assembly inside the test chamber.

[0016] Optionally, the fixing plate is provided with limiting grooves at both ends of each of the first through holes; the sub-drawer further includes:

[0017] At least one second floating mechanism, each second floating mechanism corresponding to one mounting plate, and including multiple second floating plates and multiple second elastic members, the mounting plate overlapping the second floating plates, the multiple second floating plates being respectively disposed in the limiting groove, one end of each second elastic member being connected or snapped to the second floating plate, and the other end being connected or abutting against the bottom wall of the limiting groove, so that when the mounting plate is subjected to external force, the second floating plate floats in the limiting groove.

[0018] Optionally, the first PCB board has a second through hole along the vertical direction, and each second PCB board is installed at the second through hole; the mother drawer further includes:

[0019] Multiple flexible connectors, each of which has one end connected to the second PCB board and the other end connected to the first PCB board.

[0020] In particular, the present invention also provides an aging test system, comprising:

[0021] At least one aging test fixture as described above;

[0022] The test chamber has multiple second insertion spaces, and the female drawer of each of the aging test fixtures is inserted into one of the second insertion spaces;

[0023] Multiple drive board devices are removably installed inside the test chamber. Each drive board device is connected to a first PCB board of at least one of the mother drawers for performing functional tests on the chip under test within the aging test fixture.

[0024] Optionally, the aging test system further includes:

[0025] At least one first drive mechanism is provided, and at least one first drive mechanism is installed in each second insertion space. Each first drive mechanism is configured to apply a controlled force to the second PCB board of the mother drawer to drive the second PCB board to float relative to the first PCB board.

[0026] At least one heat sink temperature control component, each of the heat sink temperature control components corresponding to one of the mounting plates and installed at the second insertion space, is used to perform heat exchange on the mounting plate.

[0027] Optionally, the aging test system further includes at least one sensing component, each sensing component being installed at a corresponding location in the second insertion space, and each sensing component comprising:

[0028] A first presence sensor is installed at the opening of the second insertion space to sense whether the sub-drawer exists in the second insertion space;

[0029] A second presence sensor is installed at the opening of the second insertion space to sense whether the mother drawer exists in the second insertion space.

[0030] A positioning sensor is installed at the end of the second insertion space away from the opening to sense whether the sub-drawer is inserted into place.

[0031] Optionally, both the mother drawer and the child drawer are provided with positioning holes, and the aging test system further includes:

[0032] Multiple second drive mechanisms are provided, with two second drive mechanisms installed in each second insertion space. The two second drive mechanisms correspond to the mother drawer and the child drawer, respectively, and each includes a second drive member and a first positioning post. The first positioning post is connected to the second drive member and is configured to pass through the corresponding positioning hole under the drive of the second drive member, thereby locking the mother drawer and the child drawer.

[0033] Optionally, each of the drive board devices includes:

[0034] The driver board is connected to the first PCB board;

[0035] The heat dissipation assembly includes heat dissipation fins, a shroud, and a plurality of first cooling fans. The heat dissipation fins are mounted on the drive plate, the shroud covers the heat dissipation fins, and the first cooling fans are mounted at the air outlet of the shroud. The shroud has a plurality of air inlets arranged in an array, each air inlet being aligned with one fin of the heat dissipation fins.

[0036] The aging test fixture of this invention includes a sub-drawer and a main drawer. The main drawer is inserted into the test chamber. The first PCB board of the main drawer is connected to a drive board device inside the test chamber, and the second PCB board is connected to the first PCB board and also to a probe board. The sub-drawer includes a mounting plate with at least one mounting position for placing the chip under test. The second PCB board is configured to float relative to the first PCB board under external force, thereby causing the test probes on the probe board to contact the chip under test. This technical solution is equivalent to splitting the overall drawer in the prior art into a main drawer and a sub-drawer. The main drawer can be inserted into the test chamber without needing to be moved around; only the sub-drawer needs to be moved around, reducing the space occupied during the movement process and making it lighter. In addition, unlike the prior art, the PCB board and probe board do not need to be disassembled during movement, and the chip under test can be directly replaced, thereby improving testing efficiency.

[0037] Furthermore, in this invention, the first PCB board is provided with a second through hole running vertically, and each second PCB board is installed at the second through hole. The mother drawer also includes multiple flexible connectors, one end of which is connected to the second PCB board and the other end of which is connected to the first PCB board. The above technical solution eliminates the need for adapter probes to transfer electrical signals between the probe board and the test board. By using flexible connectors, it avoids performance failure of the adapter probes after prolonged use, reducing the risk of electrical performance failure.

[0038] The above and other objects, advantages and features of the present invention will become more apparent to those skilled in the art from the following detailed description of specific embodiments of the invention in conjunction with the accompanying drawings. Attached Figure Description

[0039] The following sections will describe some specific embodiments of the invention in detail by way of example and not limitation, with reference to the accompanying drawings. The same reference numerals in the drawings denote the same or similar parts or portions. Those skilled in the art should understand that these drawings are not necessarily drawn to scale. In the drawings:

[0040] Figure 1 is a schematic structural diagram of an aging test fixture inserted into a test chamber according to an embodiment of the present invention;

[0041] Figure 2 is a schematic structural diagram of the mother drawer and the first drive mechanism according to an embodiment of the present invention;

[0042] Figure 3 is a schematic cross-sectional view of a child drawer inserted into a mother drawer at an angle according to an embodiment of the present invention;

[0043] Figure 4 is a schematic cross-sectional view of a child drawer inserted into a mother drawer from another angle according to an embodiment of the present invention;

[0044] Figure 5 is a schematic structural diagram of a sub-drawer according to an embodiment of the present invention;

[0045] Figure 6 is a schematic structural diagram of the mother drawer from another angle according to an embodiment of the present invention;

[0046] Figure 7 is a schematic enlarged view of part A in Figure 6;

[0047] Figure 8 is a schematic structural diagram of a second floating mechanism according to an embodiment of the present invention;

[0048] Figure 9 is a schematic structural diagram of a positioning sensor according to an embodiment of the present invention;

[0049] Figure 10 is a schematic structural diagram of a drive board device according to an embodiment of the present invention;

[0050] Figure 11 is a schematic structural diagram of a drive board device with the wind shield concealed according to an embodiment of the present invention.

[0051] Reference numerals: 1000-Aging test system, 100-Aging test fixture, 200-First drive mechanism, 300-Bearing plate, 400-Drive plate device, 210-First drive component, 21-Fixing plate, 211-Base plate, 212-Limiting plate, 213-Limiting groove, 214-First through hole, 220-Linear bearing, 230-Pressure plate, 231-Second floating plate, 232-Second elastic element, 240-Pressure block, 410-Fan shroud, 420-Drive plate, 411-Air inlet, 430-First cooling fan, 440-Heat sink fins, 500-Heat sink temperature control assembly, 60 0-Test chamber, 10-Mother drawer, 20-Daughter drawer, 111-First floating plate, 112-First elastic component, 12-Second PCB board, 13-First PCB board, 14-Flexible connector, 15-Probe board, 151-Test probe, 152-Second positioning post, 16-Base plate, 22-Mounting plate, 221-Mounting position, 510-Water cooling component, 520-Heat sink, 530-Cooling element, 113-Bushing, 114-Guide post, 115-First elastic component, 161-Slide rail, 61-Second driving component, 62-First positioning post, 71-Position sensor. Detailed Implementation

[0052] Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain the present invention, and should not be construed as limiting the present invention.

[0053] In this description, it should be understood that the terms "upper" and "lower" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of the present invention.

[0054] The terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature, that is, include one or more of that feature. In this description, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified. When a feature "includes or contains" one or more of the features it encompasses, unless otherwise specifically stated, this indicates that other features are not excluded and may be further included.

[0055] Unless otherwise expressly specified and limited, the terms "connection," "installation," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art should be able to understand the specific meaning of the above terms in this document according to the specific circumstances.

[0056] Unless otherwise specified, all terms (including technical and scientific terms) used in the description of this embodiment have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains.

[0057] Figure 1 is a schematic structural diagram of an aging test fixture 100 inserted into a test chamber 600 according to an embodiment of the present invention. Figure 2 is a schematic structural diagram of a mother drawer 10 and a first drive mechanism 200 according to an embodiment of the present invention. Figure 3 is a schematic cross-sectional view of a child drawer 20 inserted into a mother drawer 10 at one angle according to an embodiment of the present invention. Figure 4 is a schematic cross-sectional view of a child drawer 20 inserted into a mother drawer 10 at another angle according to an embodiment of the present invention. Figure 5 is a schematic structural diagram of a child drawer 20 according to an embodiment of the present invention. Figure 6 is a schematic structural diagram of a mother drawer 10 at another angle according to an embodiment of the present invention. Figure 7 is a schematic enlarged view of part A in Figure 6. As shown in Figures 1 to 7, in a specific embodiment, the aging test fixture 100 includes a child drawer 20 and a mother drawer 10. The child drawer 20 includes at least one mounting plate 22, and each mounting plate 22 is provided with at least one mounting position 221 for placing the chip under test. The mother drawer 10 is inserted into the test chamber 600, and a first insertion space is formed inside the mother drawer 10. The child drawer 20 is inserted into the first insertion space. The mother drawer 10 includes a first PCB board 13, at least one second PCB board 12, and at least one probe board 15. The first PCB board 13 is connected to the drive board device 400 inside the test chamber 600. The probe board 15 has multiple test probes 151 and is connected to the corresponding first PCB board 13. Each second PCB board 12 is electrically connected to the first PCB board 13 and is configured to float relative to the first PCB board 13 under external force, so as to drive the test probe 151 to contact the chip under test on the corresponding mounting position 221, thereby performing functional testing on the chip under test. Here, the first PCB board 13 and the drive board device 400 are connected by a connector.

[0058] This embodiment is equivalent to splitting the overall drawer in the prior art into a mother drawer 10 and a daughter drawer 20. The mother drawer 10 can be inserted into the test chamber 600 without needing to be moved around; only the daughter drawer 20 needs to be moved around, reducing the space occupied during the movement process and making it lighter. In addition, unlike the prior art, the PCB board and probe board do not need to be disassembled during movement, and the chip under test can be directly replaced, thereby improving testing efficiency.

[0059] In this embodiment, the female drawer 10 can remain inserted inside the test chamber 600. When periodic testing of the female drawer 10 is required or when a different type of female drawer 10 needs to be replaced, the female drawer 10 can be removed from the test chamber 600. When testing the chip under test, the female drawer 20 is simply inserted into the first insertion space of the female drawer 10 and connected to the female drawer 10. Then, the second PCB board 12 of the female drawer 10 moves downward under external force, causing the test probes 151 of the probe board 15 to move downward and contact the corresponding chip under test. The first PCB board 13 of the female drawer 10 is connected to the drive board device 400 inside the test chamber 600, thereby forming an electrical signal transmission path to acquire the signal of the chip under test and perform functional testing on the chip under test. After the testing of the chip under test is completed, the female drawer 20 can be removed to proceed to the next process, while the female drawer 10 remains inside the test chamber 600.

[0060] In some embodiments, a first magnet is installed at the end of the sub-drawer 20 and a second magnet is installed on the mother drawer 10. After the sub-drawer 20 is inserted into the mother drawer 10, the first magnet and the second magnet attract each other, thereby making the sub-drawer 20 and the mother drawer 10 detachably connected and preventing the sub-drawer 20 from moving during the test.

[0061] In some embodiments, the probe plate 15 of the mother drawer 10 is provided with a second positioning post 152, and the mounting plate 22 of the child drawer 20 is provided with a guide hole. During the floating process of the probe plate 15, the second positioning post 152 is inserted into the guide hole of the mounting plate 22, thereby realizing the positioning of the mother drawer 10 and the child drawer 20.

[0062] In some embodiments, the sub-drawer 20 is provided with a handle to facilitate pulling out the sub-drawer 20.

[0063] In some embodiments, the mother drawer 10 further includes a base plate 16 and at least one first floating mechanism. The base plate 16 is arranged spaced apart from the probe plate 15. Each first floating mechanism corresponds to a second PCB board 12 and includes a first floating plate 111 and a plurality of first elastic components 112. The first floating plate 111 is disposed on the side of the second PCB board 12 away from the first insertion space and is connected to the second PCB board 12. The two ends of each first elastic component 112 are respectively connected to the base plate 16 and the first floating plate 111, so that the first floating plate 111 can float relative to the base plate 16 under external force, thereby driving the probe plate 15 to float.

[0064] In some embodiments, the number of first elastic components 112 is four, and the four first elastic components 112 are respectively disposed at the four corners of the first floating plate 111. In other embodiments, the number of first elastic components 112 can be determined according to specific design requirements.

[0065] Referring to Figures 4 and 7, in some embodiments, the first elastic component 112 includes a bushing 113, a guide post 114, and a first elastic element 115. The guide post 114 is mounted on the base plate 16 and passes through the first floating plate 111. The first elastic element 115 is sleeved on the guide post 114, and the bushing 113 is sleeved on the outside of the first elastic element 115.

[0066] In some embodiments, a pair of slide rails 161 are mounted on the base plate 16, and the sub-drawer 20 can be inserted into the first insertion space of the mother drawer 10 along the pair of slide rails 161. In addition, the test chamber 600 is also provided with slide rails for pulling out the mother drawer 10.

[0067] Figure 8 is a schematic structural diagram of a second floating mechanism according to an embodiment of the present invention. As shown in Figure 8, and referring to Figure 5, in some embodiments, the sub-drawer 20 further includes a fixing plate 21 having at least one first through hole 214 along the vertical direction. Each mounting plate 22 is mounted at one of the first through holes 214 and is configured to float relative to the fixing plate 21 when the test probe 151 of the probe plate 15 abuts against the chip under test and under external force, so as to abut against the heat sink temperature control assembly 500 inside the test chamber 600. That is, in this embodiment, not only the probe plate 15 can float up and down, but the mounting plate 22 can also float up and down. The purpose of the probe plate 15 floating up and down is to connect the test probe 151 with the chip under test, and the purpose of the mounting plate 22 floating up and down is to contact the heat sink temperature control assembly 500 to exchange heat with the chip under test. Here, the heat sink temperature control component 500 is located below the first through hole 214. In addition, referring to Figure 3, the two sides of the sub-drawer 20 are equivalent to overlapping the slide rail 16 of the base plate 16, which means that there are no parts below the mounting plate 22. Therefore, when the mounting plate 22 floats, it can directly contact the heat sink temperature control component.

[0068] In some embodiments, the fixing plate 21 is provided with limiting grooves 213 at both ends of each first through hole 214. The sub-drawer 20 also includes at least one second floating mechanism, each second floating mechanism corresponding to a first through hole 214 of the mounting plate 22, and including multiple second floating plates 231 and multiple second elastic members 232. The mounting plate 22 overlaps the second floating plates 231, and the multiple second floating plates 231 are respectively disposed in the limiting grooves 213 of the first through hole 214. One end of each second elastic member 232 is connected or engaged with the second floating plate 231, and the other end is connected or abuts against the bottom wall of the limiting groove 213, so that when the mounting plate 22 is subjected to external force, the second floating plates 231 float within the limiting grooves 213. Since the mounting plate 22 overlaps the second floating plates 231, the mounting plate 22 also floats. In other words, by applying an external force to the first floating plate 111, both the probe plate 15 and the mounting plate 22 can be floated. The same driving mechanism can be used to float both components, which can save layout space.

[0069] In some embodiments, each second floating mechanism includes two second floating plates 231 and four second elastic members 232. The two second floating plates 231 are respectively disposed in the limiting grooves 213 at both ends of the first through hole 214, and each second floating plate 231 corresponds to two second elastic members 232. In other embodiments, the number of second floating plates 231 and second elastic members 232 can be determined according to specific design requirements.

[0070] In some embodiments, the fixed plate 21 includes a base plate 211 and a limiting plate 212. The limiting plate 212 is bolted to the base plate 211 and together with the base plate 211 forms a limiting groove 213. The second floating plate 231 is located within the limiting groove 213 and can float up and down within the limiting groove 213. Specifically, the bottom of the second floating plate 231 has multiple grooves, and a portion of the second elastic member 232 is located within the grooves and a portion protrudes from the grooves. The limiting plate 212 is positioned above the second floating plate 231 to limit its movement. This embodiment, through a clever design of the structure of the fixed plate 21, effectively places the second floating mechanism inside the fixed plate 21, achieving the floating of the mounting plate 22 without occupying space, resulting in a more compact structure.

[0071] In some embodiments, the first PCB board 13 has a second through hole running vertically, and each second PCB board 12 is mounted at the second through hole. The female drawer 10 also includes a plurality of flexible connectors 14, one end of each flexible connector 14 being connected to the second PCB board 12 and the other end being connected to the first PCB board 13. This embodiment eliminates the need for adapter probes that transfer electrical signals between the probe board and the test board, and uses flexible connectors 14 for connection, which can avoid performance failure of the adapter probes after long-term use and reduce the risk of electrical performance failure. In addition, there is no need to purchase a batch of probe boards, resulting in lower costs.

[0072] Referring to Figure 1, the present invention also provides an aging test system 1000, which includes at least one aging test fixture 100, a test chamber 600, and multiple drive board devices 400 according to any of the above embodiments. The test chamber 600 has multiple second insertion spaces, and the female drawer 10 of each aging test fixture 100 is inserted into one of the second insertion spaces. Multiple drive board devices 400 are removably installed within the test chamber 600, and each drive board device 400 is connected to a first PCB board 13 of at least one female drawer 10 for performing functional tests on the chip under test within the aging test fixture 100. It can be understood that the test chamber 600 can simultaneously perform functional tests on the chips under test on multiple sub-drawers 20, thereby improving testing efficiency.

[0073] In some embodiments, the test housing 600 has four second insertion spaces. In other embodiments, the number of second insertion spaces in the test housing 600 may be determined according to specific design requirements.

[0074] In some embodiments, the aging test system 1000 further includes at least one first drive mechanism 200, with at least one first drive mechanism 200 installed in each second insertion space. Each first drive mechanism 200 is configured to apply a controlled force to the second PCB board 12 of the mother drawer 10 to drive the second PCB board 12 to float relative to the first PCB board 13. In some embodiments, two first drive mechanisms 200 are installed in each second insertion space, with each first drive mechanism 200 corresponding to one second PCB board 12.

[0075] In some embodiments, the aging test system 1000 includes a plurality of support plates 300, each support plate 300 being installed at a corresponding second insertion space. Referring to FIG4, the first drive mechanism 200 includes a first drive member 210, a pressure plate 230, and two linear bearings 220. The first drive member 210 is mounted on the support plate 300, the pressure plate 230 is disposed between the support plate 300 and the first floating plate 111, and is connected to the first drive member 210. The linear bearings 220 pass through the support plate 300 and the pressure plate 230. The first drive member 210 can drive the pressure plate 230 to move, thereby applying pressure to the first floating plate 111, which in turn drives the probe plate 15 to float. In a preferred embodiment, the pressure plate 230 is provided with a pressure block 240 protruding toward the first floating plate 111. By abutting against the first floating plate 111 with the pressure block 240, the contact area with the first floating plate 111 can be reduced.

[0076] In some embodiments, the aging test system 1000 further includes at least one heat sink temperature control component 500, each heat sink temperature control component 500 corresponding to a mounting plate 22 and installed at the second insertion space for heat exchange with the mounting plate 22. Referring to FIG4, each heat sink temperature control component 500 further includes a heat sink 520, a water cooling component 510, and at least one cooling chip 530. This embodiment, by setting the heat sink temperature control component 500, can achieve heat exchange with the chip under test.

[0077] Figure 9 is a schematic structural diagram of a positioning sensor 71 according to an embodiment of the present invention. As shown in Figure 9, in some embodiments, the aging test system 1000 further includes at least one sensing component, each sensing component being installed at a corresponding second insertion space. Each sensing component includes a first in-situ sensor, a second in-situ sensor, and a positioning sensor 71. The first in-situ sensor is installed at the opening of the second insertion space to sense whether a child drawer 20 exists in the second insertion space. The second in-situ sensor is installed at the opening of the second insertion space to sense whether a mother drawer 10 exists in the second insertion space. The positioning sensor 71 is installed at the end of the second insertion space away from the opening to sense whether the child drawer 20 is inserted into place. This embodiment, by designing the first in-situ sensor, the second in-situ sensor, and the positioning sensor 71, can detect the positions of the mother drawer 10 and the child drawer 20. If the first in-situ sensor does not sense the child drawer 20, it means that no child drawer 20 is inserted in this second insertion space, and it is not necessary to control the operation of the corresponding first drive mechanism 200; only the operation of the first drive mechanism 200 corresponding to the inserted child drawer 20 is required.

[0078] In some embodiments, both the mother drawer 10 and the child drawer 20 are provided with positioning holes. The aging test system 1000 also includes a plurality of second drive mechanisms. Each second insertion space is equipped with two second drive mechanisms, which correspond to the mother drawer 10 and the child drawer 20 respectively. Each second drive mechanism includes a second drive member 61 and a first positioning post 62. The first positioning post 62 is connected to the second drive member 61 and is configured to pass through the corresponding positioning hole under the drive of the second drive member 61, thereby locking the mother drawer 10 and the child drawer 20. It can be understood that when the child drawer 20 is inserted into place, the mother drawer 10 and the child drawer 20 can be locked by the two second drive mechanisms respectively, preventing movement of the mother drawer 10 and the child drawer 20. Specifically, the first positioning post 62 of one second drive mechanism is inserted into the positioning hole of the mother drawer 10, and the first positioning post 62 of the other second drive mechanism is inserted into the positioning hole of the child drawer 20. In some embodiments, the second drive mechanism is a cylinder. In other embodiments, the second drive mechanism can also be other drive components.

[0079] Figure 10 is a schematic structural diagram of a drive board device 400 according to an embodiment of the present invention, and Figure 11 is a schematic structural diagram of a drive board device 400 according to an embodiment of the present invention with the fan shroud 410 hidden. As shown in Figures 10 and 11, in some embodiments, each drive board device 400 includes a drive board 420 and a heat dissipation assembly, the drive board 420 being connected to a first PCB board 13. The heat dissipation assembly includes heat dissipation fins 440, a fan shroud 410, and a plurality of first cooling fans 430. The heat dissipation fins 440 are mounted on the drive board 420, the fan shroud 410 covers the heat dissipation fins 440, and the first cooling fans 430 are mounted at the air outlet of the fan shroud 410. The fan shroud 410 has a plurality of air inlets 411 arranged in an array, each air inlet 411 being aligned with one fin of the heat dissipation fins 440. This embodiment adds a fan shroud 410 to the heat dissipation fins 440 to guide airflow. In addition, multiple second cooling fans are provided on both sides of the test chamber 600. The airflow generated enters through multiple air inlets 411 of the fan shroud 410, dissipating heat from the heat dissipation fins 440 inside the fan shroud 410, and then is blown out from the air outlet. In this embodiment, each air inlet 411 is aligned with the fins, thereby improving the heat dissipation effect. In addition, the test chamber 600 also houses a power supply, multiple temperature controllers, multiple relays, and multiple solenoid valves.

[0080] Therefore, those skilled in the art should recognize that although numerous exemplary embodiments of the present invention have been shown and described in detail herein, many other variations or modifications conforming to the principles of the present invention can be directly determined or derived from the disclosure of the present invention without departing from the spirit and scope of the invention. Thus, the scope of the present invention should be understood and construed as covering all such other variations or modifications.

Claims

1. An aging test fixture, comprising: The sub-drawer includes at least one mounting plate, each of the mounting plates having at least one mounting position for placing the chip under test; A mother drawer is inserted into the test chamber, and a first insertion space is formed inside the mother drawer. The child drawer is inserted into the first insertion space. The mother drawer includes a first PCB board, at least one second PCB board, and at least one probe board. The first PCB board is connected to a drive board device inside the test chamber, and the probe board has multiple test probes and is connected to the corresponding first PCB board. Each of the second PCB boards is electrically connected to the first PCB board and is configured to float relative to the first PCB board under external force, so as to drive the test probe to contact the chip under test on the corresponding mounting position, thereby performing functional testing on the chip under test.

2. The burn-in test fixture of claim 1, wherein, The mother drawer also includes: The base plate is arranged at a distance from the probe plate; At least one first floating mechanism, each first floating mechanism corresponding to a second PCB board, and including a first floating plate and a plurality of first elastic components. The first floating plate is disposed on the side of the second PCB board away from the first insertion space and is connected to the second PCB board. The two ends of each first elastic component are respectively connected to the base plate and the first floating plate, so that the first floating plate can float relative to the base plate under external force, thereby driving the probe plate to float.

3. The burn-in test fixture of claim 2, wherein, The sub-drawer also includes: A mounting plate has at least one first through hole along the vertical direction. Each mounting plate is mounted at one of the first through holes and is configured such that the test probes on the probe plate abut against the chip under test and can float relative to the mounting plate under external force to abut against the heat sink temperature control assembly inside the test chamber.

4. The burn-in test fixture of claim 3, wherein, The fixing plate is provided with limiting grooves at both ends of each of the first through holes; the sub-drawer further includes: At least one second floating mechanism, each second floating mechanism corresponding to one mounting plate, and including multiple second floating plates and multiple second elastic members, the mounting plate overlapping the second floating plates, the multiple second floating plates being respectively disposed in the limiting groove, one end of each second elastic member being connected or snapped to the second floating plate, and the other end being connected or abutting against the bottom wall of the limiting groove, so that when the mounting plate is subjected to external force, the second floating plate floats in the limiting groove.

5. The burn-in test fixture of any of claims 1-4, wherein, The first PCB board has a second through hole along the vertical direction, and each second PCB board is installed at the second through hole; the mother drawer further includes: Multiple flexible connectors, each of which has one end connected to the second PCB board and the other end connected to the first PCB board.

6. An aging test system, comprising: At least one aging test fixture as described in any one of claims 1-5; The test chamber has multiple second insertion spaces, and the female drawer of each of the aging test fixtures is inserted into one of the second insertion spaces; Multiple drive board devices are removably installed inside the test chamber. Each drive board device is connected to a first PCB board of at least one of the mother drawers for performing functional tests on the chip under test within the aging test fixture.

7. The aging test system according to claim 6, further comprising: At least one first drive mechanism is provided, and at least one first drive mechanism is installed in each second insertion space. Each first drive mechanism is configured to apply a controlled force to the second PCB board of the mother drawer to drive the second PCB board to float relative to the first PCB board. At least one heat sink temperature control component, each of the heat sink temperature control components corresponding to one of the mounting plates and installed at the second insertion space, is used to perform heat exchange on the mounting plate.

8. The aging test system according to claim 6, further comprising at least one sensing component, each sensing component being installed at a corresponding location in the second insertion space, each sensing component comprising: A first presence sensor is installed at the opening of the second insertion space to sense whether the sub-drawer exists in the second insertion space; A second presence sensor is installed at the opening of the second insertion space to sense whether the mother drawer exists in the second insertion space. A positioning sensor is installed at the end of the second insertion space away from the opening to sense whether the sub-drawer is inserted into place.

9. The aging test system of claim 8, wherein, Both the mother drawer and the child drawer are provided with positioning holes, and the aging test system further includes: Multiple second drive mechanisms are provided, with two second drive mechanisms installed in each second insertion space. The two second drive mechanisms correspond to the mother drawer and the child drawer, respectively, and each includes a second drive member and a first positioning post. The first positioning post is connected to the second drive member and is configured to pass through the corresponding positioning hole under the drive of the second drive member, thereby locking the mother drawer and the child drawer.

10. The aging test system of any of claims 7-9, wherein, Each of the drive board devices includes: The driver board is connected to the first PCB board; The heat dissipation assembly includes heat dissipation fins, a shroud, and a plurality of first cooling fans. The heat dissipation fins are mounted on the drive plate, the shroud covers the heat dissipation fins, and the first cooling fans are mounted at the air outlet of the shroud. The shroud has a plurality of air inlets arranged in an array, each air inlet being aligned with one fin of the heat dissipation fins.

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