Noise suppression test method and apparatus for automotive chip, electronic device, and medium
Patent Information
- Application Number
- PCT/CN2026/075494
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2025-04-14
- Filing Date
- 2026-01-28
- Publication Date
- 2026-10-22
Smart Images
Figure CN2026075494_22102026_PF_FP_ABST
Abstract
Description
Noise suppression test methods, devices, electronic equipment and media for automotive chips
[0001] This disclosure is based on and claims priority to Chinese Patent Application No. 202510464255.1, filed on April 14, 2025, entitled "Noise Suppression Test Method, Apparatus, Electronic Device and Medium for Vehicle Chips", the entire contents of which are incorporated herein by reference. Technical Field
[0002] This application relates to the field of chip testing technology, and in particular to a noise suppression testing method, apparatus, electronic device and medium for automotive chips. Background Technology
[0003] With the development of automotive intelligence, the demand for high-speed data transmission in in-vehicle systems is increasing. SerDes (SERializer / DESerializer) technology has become one of the key technologies in in-vehicle networks due to its efficient data transmission capabilities and low pin count. However, the in-vehicle environment is complex and variable, with various noise sources such as electromagnetic interference, power supply noise, and mechanical vibration. These noises may cause data transmission errors in SerDes chips, thereby affecting the stability and reliability of the in-vehicle system. Therefore, evaluating the ability of SerDes chips to suppress noise in noisy environments has become an important step in ensuring their reliability and stability.
[0004] In related technologies, the testing methods for SerDes chips are mainly based on standard laboratory testing environments. However, these methods cannot fully simulate the complex noise interference in real vehicle environments, which can lead to discrepancies between test results and actual performance. Consequently, it is impossible to accurately assess the suppression capability of SerDes chips in extreme noise environments, which urgently needs to be addressed. Summary of the Invention
[0005] This application provides a noise suppression test method, apparatus, electronic device, and medium for automotive chips, in order to solve the problem that the test results deviate from the actual performance due to the inability to fully simulate the complex noise interference in the real automotive environment, and thus the inability to accurately evaluate the noise suppression capability of SerDes chips in extreme noise environments.
[0006] The first aspect of this application provides a noise suppression testing method for an automotive chip, comprising the following steps:
[0007] Acquire at least one type of noise information from the vehicle, and generate a noise waveform based on each type of noise information;
[0008] A test noise signal is generated based on each noise waveform to simulate the real noise signal of the vehicle, thereby obtaining the target noise signal of the vehicle. The target noise signal is then injected into the vehicle chip data link using a noise injection module.
[0009] The error status of the vehicle chip data link is identified, and it is determined whether there are errors in the vehicle chip data link. If there are no errors in the vehicle chip data link, the resistance value of the digital potentiometer of the noise injection module is adjusted, and the initial resistance value of the digital potentiometer of the noise injection module is reset. The step of injecting the target noise signal into the vehicle chip data link using the noise injection module is continued until the vehicle chip data link has errors, and the noise suppression test result of the vehicle chip is generated.
[0010] According to one embodiment of this application, before obtaining at least one noise information of the vehicle, the method further includes:
[0011] Construct the test environment for the vehicle-mounted chip;
[0012] Start the test program for the vehicle chip, initialize the configuration parameters of the vehicle chip, and after initializing the configuration parameters of the vehicle chip, check the connection status of the test interface of the vehicle chip.
[0013] Determine whether there are any errors in the connection status of the test interface. If there are no errors in the connection status of the test interface, set the initial digital potentiometer resistance value of the noise injection module.
[0014] According to one embodiment of this application, determining whether there are bit errors in the vehicle-mounted chip data link includes:
[0015] Obtain the bit error rate of the vehicle chip data link and determine whether the bit error rate is greater than a preset bit error rate;
[0016] If the bit error rate is greater than the preset bit error rate, then it is determined that there is a bit error in the vehicle chip data link.
[0017] According to one embodiment of this application, adjusting the resistance value of the digital potentiometer of the noise injection module includes:
[0018] The resistance of the digital potentiometer is reduced based on a preset adjustment sequence, and the bit error rate corresponding to the reduced resistance value is recorded.
[0019] According to one embodiment of this application, after the bit error occurs in the vehicle-mounted chip data link, the method further includes:
[0020] The resistance value of the digital potentiometer is increased based on a preset adjustment sequence, and the error status of the vehicle chip data link is determined based on the increased resistance value of the digital potentiometer.
[0021] If the vehicle chip data link has the bit error, the step of increasing the resistance of the digital potentiometer based on the preset adjustment sequence continues until the vehicle chip data link no longer has the bit error.
[0022] According to the noise suppression test method for automotive chips in this application, a noise waveform and a noise signal to be tested are generated based on each noise information of the acquired vehicle. The target noise signal of the vehicle is obtained by simulating the real noise signal of the vehicle based on the noise signal to be tested. The target noise signal is injected into the automotive chip data link, and its error state is identified. If there are no errors in the automotive chip data link, the resistance value of the digital potentiometer of the noise injection module is adjusted, and the initial resistance value of the digital potentiometer of the noise injection module is reset. The step of injecting the target noise signal into the automotive chip data link using the noise injection module continues until there are errors in the automotive chip data link, generating the noise suppression test result of the automotive chip. This solves the problem that the test results deviate from the actual performance due to the inability to fully simulate the complex noise interference in the real automotive environment, thus making it impossible to accurately evaluate the suppression capability of the SerDes chip in extreme noise environments. It collects real-vehicle interference noise not covered by conventional test standards based on real-vehicle scenarios, and simulates the collected noise through the test system and injects it into the SerDes test platform to evaluate the noise suppression performance of the SerDes chip, further obtaining its reliability and stability in practical applications.
[0023] A second aspect of this application provides a noise suppression testing apparatus for an automotive chip, comprising:
[0024] The acquisition module is used to acquire at least one type of noise information of the vehicle and generate a noise waveform based on each type of noise information.
[0025] The signal simulation module is used to generate a test noise signal based on each noise waveform, to simulate the real noise signal of the vehicle based on the test noise signal, to obtain the target noise signal of the vehicle, and to inject the target noise signal into the vehicle chip data link using the noise injection module.
[0026] The generation module is used to identify the error status of the vehicle chip data link and determine whether there are errors in the vehicle chip data link. If there are no errors in the vehicle chip data link, the digital potentiometer resistance value of the noise injection module is adjusted, and the initial digital potentiometer resistance value of the noise injection module is reset. The step of injecting the target noise signal into the vehicle chip data link using the noise injection module is continued until the vehicle chip data link has errors, and the noise suppression test result of the vehicle chip is generated.
[0027] According to one embodiment of this application, before acquiring at least one noise information of the vehicle, the acquisition module is further configured to:
[0028] Construct the test environment for the vehicle-mounted chip;
[0029] Start the test program for the vehicle chip, initialize the configuration parameters of the vehicle chip, and after initializing the configuration parameters of the vehicle chip, check the connection status of the test interface of the vehicle chip.
[0030] Determine whether there are any errors in the connection status of the test interface. If there are no errors in the connection status of the test interface, set the initial digital potentiometer resistance value of the noise injection module.
[0031] According to one embodiment of this application, the generation module is specifically used for:
[0032] Obtain the bit error rate of the vehicle chip data link and determine whether the bit error rate is greater than a preset bit error rate;
[0033] If the bit error rate is greater than the preset bit error rate, then it is determined that there is a bit error in the vehicle chip data link.
[0034] According to one embodiment of this application, the generation module is specifically used for:
[0035] The resistance of the digital potentiometer is reduced based on a preset adjustment sequence, and the bit error rate corresponding to the reduced resistance value is recorded.
[0036] According to one embodiment of this application, after the bit error occurs in the vehicle-mounted chip data link, the generation module is further configured to:
[0037] The resistance value of the digital potentiometer is increased based on a preset adjustment sequence, and the error status of the vehicle chip data link is determined based on the increased resistance value of the digital potentiometer.
[0038] If the vehicle chip data link has the bit error, the step of increasing the resistance of the digital potentiometer based on the preset adjustment sequence continues until the vehicle chip data link no longer has the bit error.
[0039] According to the noise suppression testing device for automotive chips in this application, a noise waveform and a noise signal to be tested are generated based on each noise information of the acquired vehicle. The target noise signal of the vehicle is obtained by simulating the real noise signal of the vehicle based on the noise signal to be tested. The target noise signal is injected into the automotive chip data link, and its error state is identified. If there are no errors in the automotive chip data link, the resistance value of the digital potentiometer of the noise injection module is adjusted, and the initial resistance value of the digital potentiometer of the noise injection module is reset. The step of injecting the target noise signal into the automotive chip data link using the noise injection module continues until there are errors in the automotive chip data link, generating the noise suppression test result of the automotive chip. This solves the problem that the test results deviate from the actual performance due to the inability to fully simulate the complex noise interference in the real automotive environment, thus making it impossible to accurately evaluate the suppression capability of the SerDes chip in extreme noise environments. It collects real-vehicle interference noise not covered by conventional test standards based on real-vehicle scenarios, and simulates the collected noise through the test system and injects it into the SerDes test platform to evaluate the noise suppression performance of the SerDes chip, further obtaining its reliability and stability in practical applications.
[0040] A third aspect of this application provides an electronic device, including: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the noise suppression test method for an automotive chip as described in the above embodiments.
[0041] A fourth aspect of this application provides a computer-readable storage medium storing computer instructions for causing the computer to perform the noise suppression test method for an automotive chip as described in the above embodiments.
[0042] A fifth aspect of this application provides a computer program product, including a computer program that is executed to implement the noise suppression test method for an automotive chip described in the above embodiments.
[0043] Additional aspects and advantages of this application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of this application. Attached Figure Description
[0044] The above and / or additional aspects and advantages of this application will become apparent and readily understood from the following description of the embodiments taken in conjunction with the accompanying drawings, wherein:
[0045] Figure 1 is a flowchart of a noise suppression test method for an automotive chip according to an embodiment of this application;
[0046] Figure 2 is a flowchart of a system for noise suppression capability of a SerDes chip according to an embodiment of this application;
[0047] Figure 3 is a schematic diagram of the structure of a real vehicle SerDes transmission link interference noise acquisition system according to an embodiment of this application;
[0048] Figure 4 is a schematic diagram of a noise injection test system according to an embodiment of this application;
[0049] Figure 5 is a schematic diagram of the hardware architecture of a noise injection module according to an embodiment of this application;
[0050] Figure 6 is an example diagram of a noise suppression testing device for an on-board chip according to an embodiment of this application;
[0051] Figure 7 is a schematic diagram of the structure of an electronic device according to an embodiment of this application;
[0052] Figure 8 is a schematic diagram of an implementation environment provided in an embodiment of this application. Detailed Implementation
[0053] The embodiments of this application are described in detail below. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain this application, and should not be construed as limiting this application.
[0054] The following description, with reference to the accompanying drawings, outlines a noise suppression testing method, apparatus, electronic device, and medium for automotive chips according to embodiments of this application. Addressing the problem mentioned in the background art where the inability to fully simulate the complex noise interference in a real automotive environment leads to discrepancies between test results and actual performance, thus hindering accurate evaluation of the SerDes chip's noise suppression capability under extreme noise conditions, this application provides a noise suppression testing method for automotive chips. In this method, a noise waveform and a test noise signal are generated based on each acquired noise information of the vehicle. The target noise signal of the vehicle is obtained by simulating the vehicle's actual noise signal using the test noise signal. This target noise signal is injected into the automotive chip data link, and its error state is identified. If there are no errors in the automotive chip data link, the resistance value of the digital potentiometer in the noise injection module is adjusted, and the initial resistance value of the digital potentiometer in the noise injection module is reset. The process of injecting the target noise signal into the automotive chip data link using the noise injection module continues until errors exist in the automotive chip data link, generating a noise suppression test result for the automotive chip. This solves the problem that the test results deviate from the actual performance due to the inability to fully simulate the complex noise interference in the real vehicle environment, thus making it impossible to accurately evaluate the noise suppression capability of the SerDes chip in extreme noise environments. Based on real vehicle scenarios, real vehicle interference noise not covered by conventional test standards is collected, and the collected noise is simulated and generated by the test system and injected into the SerDes test platform to evaluate the noise suppression performance of the SerDes chip, and further obtain its reliability and stability in practical applications.
[0055] This disclosure provides a noise suppression testing method for automotive chips. This method can be implemented using a computer device, which can be a terminal device or a server. The terminal device can be a desktop computer, laptop computer, or host computer testing system with signal analysis capabilities, such as a signal analyzer. The server can be an application server, a cloud service server, or a server used to perform certain computing tasks, etc. This disclosure uses the example of a terminal device as the computer device for detailed explanation; other cases are similar and will not be described in detail.
[0056] As shown in Figure 8, the terminal device may include a processor 110, a memory 120, and a communication component 130, etc.
[0057] The processor 110 may be a central processing unit (CPU), which can be used to execute various operation instructions, such as adjusting the digital potentiometer resistance value of the noise injection module.
[0058] The memory 120 can be various volatile or non-volatile memory, such as solid-state disk (SSD), dynamic random access memory (DRAM), etc. The memory can be used to store pre-stored data, intermediate data, and result data related to the processing.
[0059] The communication component 130 can be a wired network connector, a wireless fidelity (WiFi) module, a Bluetooth module, a cellular communication module, etc. The communication component can be used for data transmission with other devices, such as serializer test platforms, deserializer test platforms, arbitrary waveform signal generators, and noise injection modules.
[0060] Specifically, Figure 1 is a flowchart illustrating a noise suppression test method for an automotive chip provided in an embodiment of this application.
[0061] As shown in Figure 1, the noise suppression test method for this automotive chip includes the following steps:
[0062] In step S101, at least one type of noise information of the vehicle is acquired, and a noise waveform is generated based on each type of noise information.
[0063] According to one embodiment of this application, before acquiring at least one type of noise information of the vehicle, the method further includes: constructing a test environment for the vehicle chip; starting the test program of the vehicle chip and initializing the configuration parameters of the vehicle chip; and after initializing the configuration parameters of the vehicle chip, detecting the test interface connection status of the vehicle chip; determining whether there are any errors in the test interface connection status; and if there are no errors in the test interface connection status, setting the initial digital potentiometer resistance value of the noise injection module.
[0064] Specifically, to address the issue that existing technologies cannot fully simulate the complex noise interference in real vehicle environments, leading to discrepancies between test results and actual performance, and consequently, an inability to accurately assess the noise suppression capabilities of automotive chips (such as SerDes chips) in extreme noise environments, this application's embodiments collect real-vehicle interference noise not covered by conventional testing standards based on real-vehicle scenarios. The collected noise is then simulated and generated through a testing system and injected into the SerDes testing platform to evaluate the noise suppression performance of the SerDes chip, thereby assessing its reliability and stability in practical applications.
[0065] Specifically, as shown in Figure 2, before conducting the noise suppression test of the SerDes chip, it is first necessary to construct the test environment for the automotive chip, install the SerDes chip on the test platform, ensure correct electrical connections, and check whether the serializer and deserializer establish a normal link after powering on the digital power supply. Secondly, start the host computer test system test program, that is, start the SerDes chip test program, and initialize the configuration parameters of the SerDes chip. After initializing the configuration parameters of the SerDes chip, check the connection status of the SerDes chip test interface. If there are no errors in the test interface connection status, the host computer control system controls and adjusts the initial digital potentiometer resistance value in the noise injection module to adjust the target noise signal injection current.
[0066] Furthermore, the main testing system involved in the SerDes chip noise suppression testing method of this application embodiment includes a real vehicle SerDes transmission link interference noise acquisition system, a noise injection testing system, and a noise injection module hardware architecture. As shown in Figure 3, the real vehicle SerDes transmission link interference noise acquisition system is a noise acquisition board, which mainly includes a noise acquisition port, a high-speed connector, a high-speed signal line, vehicle components (including a serializer end and a deserializer end), and a high-speed oscilloscope. The noise acquisition board is connected in series to the vehicle component link. A high-speed oscilloscope is connected to the noise acquisition port of the noise acquisition board. The noise acquisition port is used to acquire at least one noise information of the vehicle and capture the corresponding noise waveform according to the at least one noise information of the vehicle. The captured noise waveform is sent to the high-speed oscilloscope, which stores the noise waveform in the real vehicle interference noise signal waveform library.
[0067] In step S102, a test noise signal is generated based on each noise waveform to simulate the real noise signal of the vehicle, thereby obtaining the target noise signal of the vehicle. The target noise signal is then injected into the vehicle chip data link using the noise injection module.
[0068] Specifically, as shown in Figure 4, the noise injection test system of this application embodiment mainly includes a digital power supply, a noise injection module, a serializer test platform, a deserializer test platform, a host computer control system, cables, control signals, and an arbitrary waveform signal generator. The serializer test platform is used to install the serializer chip under test; the deserializer test platform is used to install the deserializer chip under test; the noise injection module is connected in series between the serializer test platform and the deserializer test platform via cables, used to inject the target noise signal into the high-speed communication link between the serializer and the deserializer, and supports single-ended / differential noise injection, with the noise current intensity adjusted by a digital potentiometer; the host computer control system includes system control software and status data acquisition software, used to control the arbitrary waveform signal generator to generate the target noise signal, acquire the SerDes chip status (such as bit error rate, lockout status, etc.), and record the status signals of the serializer and deserializer; the arbitrary waveform generator is used to generate arbitrary waveform signals to simulate the noise signals of the newly added environment in the vehicle, and is adjustable; the cables are commonly used SerDes transmission connection cables in vehicles, such as coaxial cables, shielded twisted-pair cables, etc.
[0069] Specifically, based on the captured noise waveform, a test noise signal is generated by an arbitrary waveform generator to simulate the real noise signal of the vehicle, thereby obtaining the target noise signal of the vehicle. The target noise signal is then injected into the vehicle chip data link using a noise injection module.
[0070] The digital power supply is supplied to the serializer and deserializer test platforms, featuring at least two channels, a supply voltage of at least 12V, and a supply current of at least 1A. It can generate arbitrary waveform noise signals programmable via a host computer control system, with an output signal frequency of at least 10MHz, adjustable rise and fall edges down to 1ns, and an output amplitude adjustable from -6V to 12V. The serializer test platform features a high-speed connector interface with an operating frequency of at least 6GHz, external 12V power supply, and supports USB-to-I2C communication with an I2C rate of 100Kbps to 1Mbps. The deserializer test platform features a high-speed connector interface with an operating frequency of at least 6GHz, external 12V power supply, and supports USB-to-I2C communication with an I2C rate of 100Kbps to 1Mbps. The noise injection module has a high-speed connector interface with an operating frequency of at least 6GHz and an I2C control interface. The high-speed oscilloscope has a bandwidth of at least 500MHz, a sampling rate of at least 10GSa / s, a storage depth of at least 500Mpts, and is programmable and controllable.
[0071] It should be noted that the serializer test platform and the deserializer can both be powered by an external digital power supply, or the serializer test platform can be powered by the deserializer test platform via a cable, or the deserializer test platform can be powered by the serializer test platform via a cable. The power supply of the serializer test platform and the deserializer test platform can be configured according to the actual application.
[0072] Further, as shown in Figure 5, the hardware architecture of the noise injection module in this embodiment mainly includes a power module, a digital potentiometer, a noise injection interface, a control interface, a high-speed connector, a high-speed signal line, a serializer test platform, and a deserializer test platform. The noise injection interface is used to connect an arbitrary waveform signal generator to receive noise. The digital potentiometer is connected in series between the noise injection interface and the SerDes high-speed signal line, and its resistance value is adjustable to limit the current intensity of the injected noise. The control interface is used to connect to a host computer control system, and the system control software can control the resistance of the digital potentiometer. The noise injection module can receive both single-ended signal noise and differential signal noise.
[0073] In step S103, the error status of the vehicle chip data link is identified, and it is determined whether there are errors in the vehicle chip data link. If there are no errors in the vehicle chip data link, the digital potentiometer resistance value of the noise injection module is adjusted, and the initial digital potentiometer resistance value of the noise injection module is reset. The step of injecting the target noise signal into the vehicle chip data link using the noise injection module continues until there are errors in the vehicle chip data link, and the noise suppression test result of the vehicle chip is generated.
[0074] According to one embodiment of this application, determining whether there are bit errors in the vehicle chip data link includes: obtaining the bit error rate of the vehicle chip data link and determining whether the bit error rate is greater than a preset bit error rate; if the bit error rate is greater than the preset bit error rate, it is determined that there are bit errors in the vehicle chip data link; if the bit error rate is not greater than the preset bit error rate, it is determined that there are no bit errors in the vehicle chip data link.
[0075] According to one embodiment of this application, adjusting the resistance value of the digital potentiometer of the noise injection module includes: reducing the resistance value of the digital potentiometer based on a preset adjustment sequence, and recording the bit error rate corresponding to the reduced resistance value of the digital potentiometer.
[0076] According to one embodiment of this application, after a bit error occurs in the vehicle chip data link, the method further includes: increasing the resistance value of a digital potentiometer based on a preset adjustment sequence, and determining the bit error status of the vehicle chip data link based on the increased digital potentiometer resistance value; if a bit error occurs in the vehicle chip data link, the step of increasing the resistance value of the digital potentiometer based on the preset adjustment sequence is continued until there are no bit errors in the vehicle chip data link.
[0077] The preset bit error rate and preset adjustment sequence can be set by those skilled in the art according to actual testing needs, or they can be obtained through a limited number of computer simulations, and are not specifically limited here.
[0078] Specifically, as shown in Figure 2, after injecting the target noise signal into the vehicle chip data link using the noise injection module, it is necessary to further analyze the stability of the target noise signal. First, the error state of the vehicle chip data link is identified, and it is determined whether there are errors in the vehicle chip data link. If the error rate of the vehicle chip data link is greater than the preset error rate, it can be determined that there are errors in the vehicle chip data link. If there are errors in the vehicle chip data link, it indicates that the currently injected target noise signal has exceeded the range that the chip under test can effectively suppress. Therefore, in order to evaluate the performance of the SerDes chip under lower noise conditions or to find the maximum noise threshold that it can withstand, it is necessary to increase the resistance of the digital potentiometer of the noise injection module based on the preset adjustment sequence, thereby reducing the noise current injected into the vehicle chip data link, that is, reducing the noise intensity until the error disappears. This can reduce the impact on the SerDes chip, and thus approach the actual noise tolerance of the SerDes chip, helping to determine its accurate noise suppression capability boundary.
[0079] Furthermore, if there are no bit errors in the automotive chip data link, it indicates that the currently injected target noise signal has not exceeded the range that the chip under test can effectively suppress. Therefore, in order to evaluate the performance of the SerDes chip under higher noise conditions, it is necessary to reduce the digital potentiometer resistance value based on a preset adjustment sequence (e.g., from 50kΩ to 30kΩ), and record the bit error rate corresponding to the reduced digital potentiometer resistance value. At the same time, it is necessary to adjust the starting resistance value and other relevant parameters for the next round of testing, that is, to reset the initial digital potentiometer resistance value of the noise injection module, so as to facilitate testing from different starting points, thereby comprehensively understanding the performance of the SerDes chip throughout the noise range, and continuing to execute the step of injecting the target noise signal into the automotive chip data link using the noise injection module until... The automotive chip data link contains bit errors. After these errors occur, the resistance of the digital potentiometer in the noise injection module is increased based on the aforementioned preset adjustment sequence. This fine-tuning of the digital potentiometer reduces the noise current injected into the automotive chip data link, eventually eliminating the bit errors. This ensures that each test provides valuable data, helping to comprehensively understand the noise suppression capability of the SerDes chip. Ultimately, this generates the noise suppression test results for the automotive chip. For example, the noise suppression test results could be the value of the digital potentiometer when the automotive chip data link changes from a state with bit errors to one where the errors have disappeared; or the value of the digital potentiometer when the automotive chip data link changes from a state without bit errors to one with bit errors. Therefore, it can be understood that a larger digital potentiometer resistance results in a smaller noise current in the automotive chip data link, i.e., a lower noise reduction intensity, and a worse noise suppression capability of the SerDes chip; conversely, a smaller digital potentiometer resistance results in a larger noise current in the automotive chip data link, i.e., a higher noise reduction intensity, and a stronger noise suppression capability of the SerDes chip.
[0080] According to the noise suppression test method for automotive chips in this application, a noise waveform and a noise signal to be tested are generated based on each noise information of the acquired vehicle. The target noise signal of the vehicle is obtained by simulating the real noise signal of the vehicle based on the noise signal to be tested. The target noise signal is injected into the automotive chip data link, and its error state is identified. If there are no errors in the automotive chip data link, the resistance value of the digital potentiometer of the noise injection module is adjusted, and the initial resistance value of the digital potentiometer of the noise injection module is reset. The step of injecting the target noise signal into the automotive chip data link using the noise injection module continues until there are errors in the automotive chip data link, generating the noise suppression test result of the automotive chip. This solves the problem that the test results deviate from the actual performance due to the inability to fully simulate the complex noise interference in the real automotive environment, thus making it impossible to accurately evaluate the suppression capability of the SerDes chip in extreme noise environments. It collects real-vehicle interference noise not covered by conventional test standards based on real-vehicle scenarios, and simulates the collected noise through the test system and injects it into the SerDes test platform to evaluate the noise suppression performance of the SerDes chip, further obtaining its reliability and stability in practical applications.
[0081] Next, referring to the accompanying drawings, a noise suppression test apparatus for an on-board chip according to an embodiment of this application is described.
[0082] Figure 6 is a block diagram of the noise suppression test device for an on-board chip according to an embodiment of this application.
[0083] As shown in Figure 6, the noise suppression test device 10 for the vehicle chip includes: an acquisition module 100, a signal simulation module 200, and a generation module 300.
[0084] The acquisition module 100 is used to acquire at least one type of noise information of the vehicle and generate a noise waveform based on each type of noise information.
[0085] The signal simulation module 200 is used to generate a noise signal to be tested based on each noise waveform, to simulate the real noise signal of the vehicle based on the noise signal to be tested, to obtain the target noise signal of the vehicle, and to inject the target noise signal into the vehicle chip data link using the noise injection module.
[0086] The generation module 300 is used to identify the error status of the vehicle chip data link and determine whether there are errors in the vehicle chip data link. If there are no errors in the vehicle chip data link, the digital potentiometer resistance value of the noise injection module is adjusted and the initial digital potentiometer resistance value of the noise injection module is reset. The step of injecting the target noise signal into the vehicle chip data link using the noise injection module continues until there are errors in the vehicle chip data link, and the noise suppression test result of the vehicle chip is generated.
[0087] According to one embodiment of this application, before acquiring at least one type of noise information of the vehicle, the acquisition module 100 is further configured to:
[0088] Construct the test environment for the automotive chip;
[0089] Start the test program for the automotive chip, initialize the configuration parameters of the automotive chip, and after initializing the configuration parameters of the automotive chip, check the connection status of the test interface of the automotive chip.
[0090] Determine if there are any errors in the test interface connection status. If there are no errors in the test interface connection status, set the initial digital potentiometer resistance value of the noise injection module.
[0091] According to one embodiment of this application, the generation module 300 is specifically used for:
[0092] Obtain the bit error rate of the vehicle chip data link and determine whether the bit error rate is greater than the preset bit error rate;
[0093] If the bit error rate is greater than the preset bit error rate, it is determined that there are bit errors in the vehicle chip data link.
[0094] According to one embodiment of this application, the generation module 300 is specifically used for:
[0095] The resistance of the digital potentiometer is reduced based on a preset adjustment sequence, and the bit error rate corresponding to the reduced resistance value is recorded.
[0096] According to one embodiment of this application, after a bit error occurs in the vehicle-mounted chip data link, the generation module 300 is further configured to:
[0097] The digital potentiometer resistance is increased based on a preset adjustment sequence, and the bit error status of the vehicle chip data link is determined based on the increased digital potentiometer resistance.
[0098] If there are errors in the vehicle chip data link, continue to execute the step of increasing the resistance of the digital potentiometer based on the preset adjustment sequence until there are no errors in the vehicle chip data link.
[0099] According to the noise suppression testing device for automotive chips in this application, a noise waveform and a noise signal to be tested are generated based on each noise information of the acquired vehicle. The target noise signal of the vehicle is obtained by simulating the real noise signal of the vehicle based on the noise signal to be tested. The target noise signal is injected into the automotive chip data link, and its error state is identified. If there are no errors in the automotive chip data link, the resistance value of the digital potentiometer of the noise injection module is adjusted, and the initial resistance value of the digital potentiometer of the noise injection module is reset. The step of injecting the target noise signal into the automotive chip data link using the noise injection module continues until there are errors in the automotive chip data link, generating the noise suppression test result of the automotive chip. This solves the problem that the test results deviate from the actual performance due to the inability to fully simulate the complex noise interference in the real automotive environment, thus making it impossible to accurately evaluate the suppression capability of the SerDes chip in extreme noise environments. It collects real-vehicle interference noise not covered by conventional test standards based on real-vehicle scenarios, and simulates the collected noise through the test system and injects it into the SerDes test platform to evaluate the noise suppression performance of the SerDes chip, further obtaining its reliability and stability in practical applications.
[0100] Figure 7 is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. The electronic device may include:
[0101] The memory 701, the processor 702, and the computer program stored on the memory 701 and executable on the processor 702.
[0102] When the processor 702 executes the program, it implements the noise suppression test method for the vehicle chip provided in the above embodiments.
[0103] Furthermore, electronic devices also include:
[0104] Communication interface 703 is used for communication between memory 701 and processor 702.
[0105] The memory 701 is used to store computer programs that can run on the processor 702.
[0106] The memory 701 may include high-speed RAM memory, and may also include non-volatile memory, such as at least one disk storage device.
[0107] If the memory 701, processor 702, and communication interface 703 are implemented independently, they can be interconnected via a bus to communicate with each other. The bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus, etc. Buses can be categorized as address buses, data buses, control buses, etc. For ease of representation, only one thick line is used in Figure 7, but this does not imply that there is only one bus or one type of bus.
[0108] Optionally, in a specific implementation, if the memory 701, processor 702, and communication interface 703 are integrated on a single chip, then the memory 701, processor 702, and communication interface 703 can communicate with each other through an internal interface.
[0109] The processor 702 may be a central processing unit (CPU), an application specific integrated circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of this application.
[0110] This embodiment also provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the noise suppression test method for the vehicle-mounted chip described above.
[0111] This embodiment also provides a computer program product, including a computer program that is executed to implement the noise suppression test method for the vehicle-mounted chip described in the above embodiment.
[0112] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.
[0113] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "N" means at least two, such as two, three, etc., unless otherwise explicitly specified.
[0114] Any process or method described in the flowchart or otherwise herein can be understood as representing a module, segment, or portion of code comprising one or more N executable instructions for implementing custom logic functions or processes, and the scope of the preferred embodiments of this application includes additional implementations in which functions may be performed not in the order shown or discussed, including substantially simultaneously or in reverse order depending on the functions involved, as should be understood by those skilled in the art to which embodiments of this application pertain.
[0115] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as a sequenced list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by, or in conjunction with, an instruction execution system, apparatus, or device (such as a computer-based system, a processor-included system, or other system that can fetch and execute instructions from, an instruction execution system, apparatus, or device). For the purposes of this specification, "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transmit programs for use by, or in conjunction with, an instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of computer-readable media include: an electrical connection having one or more wires (electronic device), a portable computer disk drive (magnetic device), random access memory (RAM), read-only memory (ROM), erasable and editable read-only memory (EPROM or flash memory), fiber optic devices, and portable optical disc read-only memory (CDROM). Furthermore, computer-readable media can even be paper or other suitable media on which programs can be printed, because programs can be obtained electronically, for example, by optically scanning the paper or other media, followed by editing, interpreting, or otherwise processing as necessary, and then stored in computer memory.
[0116] It should be understood that the various parts of this application can be implemented using hardware, software, firmware, or a combination thereof. In the above embodiments, the N steps or methods can be implemented using software or firmware stored in memory and executed by a suitable instruction execution system. For example, if implemented in hardware as in another embodiment, it can be implemented using any one or a combination of the following techniques known in the art: discrete logic circuits having logic gates for implementing logical functions on data signals, application-specific integrated circuits (ASICs) having suitable combinational logic gates, programmable gate arrays (PGAs), field-programmable gate arrays (FPGAs), etc.
[0117] Those skilled in the art will understand that all or part of the steps of the methods described in the above embodiments can be implemented by a program instructing related hardware, and the program can be stored in a computer-readable storage medium. When executed, the program includes one or a combination of the steps of the method embodiments.
[0118] Furthermore, the functional units in the various embodiments of this application can be integrated into a processing module, or each unit can exist physically separately, or two or more units can be integrated into a module. The integrated module can be implemented in hardware or as a software functional module. If the integrated module is implemented as a software functional module and sold or used as an independent product, it can also be stored in a computer-readable storage medium.
[0119] The storage medium mentioned above can be a read-only memory, a disk, or an optical disk, etc. Although embodiments of this application have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting this application. Those skilled in the art can make changes, modifications, substitutions, and variations to the above embodiments within the scope of this application.
Claims
1. A noise suppression test method for an automotive chip, wherein, Includes the following steps: Acquire at least one type of noise information from the vehicle, and generate a noise waveform based on each type of noise information; A test noise signal is generated based on each noise waveform to simulate the real noise signal of the vehicle, thereby obtaining the target noise signal of the vehicle. The target noise signal is then injected into the vehicle chip data link using a noise injection module. The error status of the vehicle chip data link is identified, and it is determined whether there are errors in the vehicle chip data link. If there are no errors in the vehicle chip data link, the resistance value of the digital potentiometer of the noise injection module is adjusted, and the initial resistance value of the digital potentiometer of the noise injection module is reset. The step of injecting the target noise signal into the vehicle chip data link using the noise injection module is continued until the vehicle chip data link has errors, and the noise suppression test result of the vehicle chip is generated.
2. The method according to claim 1, wherein, Before acquiring at least one noise information of the vehicle, the method further includes: Construct the test environment for the vehicle-mounted chip; Start the test program for the vehicle chip, initialize the configuration parameters of the vehicle chip, and after initializing the configuration parameters of the vehicle chip, check the connection status of the test interface of the vehicle chip. Determine whether there are any errors in the connection status of the test interface. If there are no errors in the connection status of the test interface, set the initial digital potentiometer resistance value of the noise injection module.
3. The method according to claim 1, wherein, The determination of whether there are bit errors in the vehicle-mounted chip data link includes: Obtain the bit error rate of the vehicle chip data link and determine whether the bit error rate is greater than a preset bit error rate; If the bit error rate is greater than the preset bit error rate, then it is determined that the on-board chip data link has bit errors. If the bit error rate is not greater than the preset bit error rate, it is determined that there are no bit errors in the vehicle chip data link.
4. The method according to claim 1, wherein, Adjusting the resistance value of the digital potentiometer in the noise injection module includes: The resistance of the digital potentiometer is reduced based on a preset adjustment sequence, and the bit error rate corresponding to the reduced resistance value is recorded.
5. The method according to claim 1, wherein, After the bit error occurs in the vehicle-mounted chip data link, the following is also included: The resistance value of the digital potentiometer is increased based on a preset adjustment sequence, and the error status of the vehicle chip data link is determined based on the increased resistance value of the digital potentiometer. If the vehicle chip data link has the bit error, the step of increasing the resistance of the digital potentiometer based on the preset adjustment sequence continues until the vehicle chip data link no longer has the bit error.
6. A noise suppression testing device for an automotive chip, wherein, include: The acquisition module is used to acquire at least one type of noise information of the vehicle and generate a noise waveform based on each type of noise information. The signal simulation module is used to generate a test noise signal based on each noise waveform, to simulate the real noise signal of the vehicle based on the test noise signal, to obtain the target noise signal of the vehicle, and to inject the target noise signal into the vehicle chip data link using the noise injection module. The generation module is used to identify the error status of the vehicle chip data link and determine whether there are errors in the vehicle chip data link. If there are no errors in the vehicle chip data link, the digital potentiometer resistance value of the noise injection module is adjusted, and the initial digital potentiometer resistance value of the noise injection module is reset. The step of injecting the target noise signal into the vehicle chip data link using the noise injection module is continued until the vehicle chip data link has errors, and the noise suppression test result of the vehicle chip is generated.
7. The apparatus according to claim 6, wherein, Before acquiring at least one noise information of the vehicle, the acquisition module is further configured to: Construct the test environment for the vehicle-mounted chip; Start the test program for the vehicle chip, initialize the configuration parameters of the vehicle chip, and after initializing the configuration parameters of the vehicle chip, check the connection status of the test interface of the vehicle chip. Determine whether there are any errors in the connection status of the test interface. If there are no errors in the connection status of the test interface, set the initial digital potentiometer resistance value of the noise injection module.
8. The apparatus according to claim 6, wherein, The generation module is specifically used for: Obtain the bit error rate of the vehicle chip data link and determine whether the bit error rate is greater than a preset bit error rate; If the bit error rate is greater than the preset bit error rate, then it is determined that the on-board chip data link has bit errors. If the bit error rate is not greater than the preset bit error rate, it is determined that there are no bit errors in the vehicle chip data link.
9. An electronic device, wherein, include: The device includes a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the noise suppression test method for an automotive chip as described in any one of claims 1-5.
10. A computer-readable storage medium having a computer program stored thereon, wherein, The program is executed by the processor to implement the noise suppression test method for the automotive chip as described in any one of claims 1-5.
11. A computer program product, wherein, The product stores at least one piece of program code, which is loaded and executed by a processor to implement the vehicle positioning method in a complex environment as described in any one of claims 1-5.