Probe pin for integrated circuits testing

Abstract

The material of this design is metal; this design is a probe pin that makes contact with the electrodes, terminals, pads, etc. of the subject, and is used to inspect electronic components such as semiconductor devices, semiconductor packages, integrated circuits (IC), and printed circuit boards; electrical signals flow from the upper probe in contact with the substrate and IC to the counterpart through the lower probe during the inspection; in maximum compression, the upper probe and lower probes directly make contact with IC and the substrate simultaneously to flow current; the main point of the design creation is the shape of the probe pin for IC testing.

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