Probe pin for integrated circuits testing
WO244689SActive Publication Date: 2025-07-18HICON CO LTD +2
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Patent Information
- Application Number
- WO244689
- Authority / Receiving Office
- WO · WO
- Patent Type
- Designs
- Current Assignee / Owner
- Priority Date
- 2024-01-18
- Filing Date
- 2024-07-17
- Publication Date
- 2025-07-18
- Estimated Expiration
- 2049-07-17
Smart Images
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Abstract
The material of this design is metal; this design is a probe pin that makes contact with the electrodes, terminals, pads, etc. of the subject, and is used to inspect electronic components such as semiconductor devices, semiconductor packages, integrated circuits, and printed circuit boards; the main point of the design creation is the shape of the probe pin for integrated circuits testing.
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