Probe pin for integrated circuits testing

Abstract

The material of this design is metal; this design is a probe pin that makes contact with the electrodes, terminals, pads, etc. of the subject, and is used to inspect electronic components such as semiconductor devices, semiconductor packages, integrated circuits and printed circuit boards; this design increases the stability of contact with the integrated circuits' terminals by forming a crown-shaped contact terminal at the top; a shoulder (protruding part) is formed on the upper and lower pins to adjust the part where the pin is exposed to the outside of the socket, and the probe can be prevented from leaving the socket; the main point of the design creation is the shape of the probe pin for integrated circuits testing.

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