Probe pin for integrated circuits testing

Abstract

The material of this design is metal; this design is a probe pin that makes contact with the electrodes, terminals, pads, etc. of the subject, and is used to inspect electronic components such as semiconductor devices, semiconductor packages, integrated circuits (IC) and printed circuit boards; this design increases the stability of contact with the IC terminals by forming a crown-shaped contact terminal at the top; a shoulder (protruding part) is formed on the upper and lower pins, so the degree to which the pin is exposed to the outside of the socket can be adjusted; the main point of the creation is the combination of shape and the shape of the probe pin for IC testing.

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