Probe pin for integrated circuit testing

Abstract

The material of this design is metal; this design is a probe pin that makes contact with the electrodes, terminals, pads, etc. of the subject, and is used to inspect electronic components such as semiconductor devices, semiconductor packages, integrated circuits, and printed circuit boards; this design increases the stability of contact with the IC's terminals by forming a crown-shaped contact terminal at the top; in this design, electrical signals flow from the upper probe in contact with the substrate and the IC to the counterpart through the lower probe during the inspection; in maximum compression, the upper probe and the lower probe directly contact the IC and the substrate simultaneously to flow current; the main point of the design is the shape of the "Probe pin for integrated circuit testing".

Images