Probe pin for integrated circuit testing
WO245314SActive Publication Date: 2026-02-20HICON CO LTD +2
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Patent Information
- Application Number
- WO245314
- Authority / Receiving Office
- WO · WO
- Patent Type
- Designs
- Current Assignee / Owner
- Priority Date
- 2024-08-21
- Filing Date
- 2025-02-18
- Publication Date
- 2026-02-20
- Estimated Expiration
- 2050-02-18
Smart Images
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Abstract
The material of this design is metal; this design is a probe pin that contacts the electrodes, terminals, pads, etc. of the subject, and is used to inspect electronic components such as semiconductor devices, semiconductor packages, integrated circuits, and printed circuit boards; the main point of this design is based on the combination of the shape and structure of a 'probe pin for integrated circuit (IC) testing'.
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