Measuring device for x-ray fluorescence analysis

WO252734SActive Publication Date: 2025-12-26RIGAKU CORP
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Patent Information

Application Number
WO252734
Authority / Receiving Office
WO · WO
Patent Type
Designs
Current Assignee / Owner
Priority Date
2025-08-22
Filing Date
2025-12-11
Publication Date
2025-12-26
Estimated Expiration
2050-12-11

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Abstract

The ornamental design for a measuring device for x-ray fluorescence analysis, for analyzing a micro area of a sample by irradiating x-rays onto the micro area and using fluorescent x-rays obtained therefrom, as shown and described; parts shown by solid lines are the parts for which protection is sought; dash-dotted lines indicate only a boundary between the part for which protection is sought and other parts; the characteristic features of the design lie in the shape as shown in the reproductions; 1.5: enlarged cross-sectional view taken along the D–D line in the top plan view for the portion defined by the A–A line in the front view and the C–C line in the top plan view; 1.6: enlarged cross-sectional view taken along the B–B line in the front view for the portion defined by the C–C line in the top plan view; 1.7: perspective view showing a state in which the door is closed.
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