Measuring device for x-ray fluorescence analysis
WO252735SActive Publication Date: 2025-12-26RIGAKU CORP
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Patent Information
- Application Number
- WO252735
- Authority / Receiving Office
- WO · WO
- Patent Type
- Designs
- Current Assignee / Owner
- Priority Date
- 2025-08-22
- Filing Date
- 2025-12-11
- Publication Date
- 2025-12-26
- Estimated Expiration
- 2050-12-11
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Abstract
The ornamental design for a measuring device for x-ray fluorescence analysis, for analyzing a micro area of a sample by irradiating x-rays onto the micro area and using fluorescent x-rays obtained therefrom, as shown and described; parts shown by solid lines are the parts for which protection is sought; the characteristic features of the design lie in the shape and pattern as shown in the reproductions; 1.7: enlarged cross-sectional view taken along the C–C line in the top plan view for the portion defined by the A–A line in the front view and the B–B line in the top plan view.
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