A space-time calibration system and method for whole-plate high-throughput combined photoelectric detection

ZA202606806BActive Publication Date: 2026-08-26HENAN BEIWEI TECHNOLOGY CO LTD +1
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Patent Information

Application Number
ZA202606806
Authority / Receiving Office
ZA · ZA
Patent Type
Patents
Current Assignee / Owner
Priority Date
2026-02-10
Filing Date
2026-07-01
Publication Date
2026-08-26
Estimated Expiration
2046-07-01

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Abstract

The present invention relates to the technical field of photoelectric measurement and calibration, in particular to a space-time calibration system and method for whole-plate high-throughput combined photoelectric detection. The system comprises: a time alignment module, which is used for accurately determining and aligning exposure windows; a spatial alignment module, which is used for multi-level dynamic focal plane compensation; an adaptive light source shaping system, which is used for realizing pixel-level uniformity of excitation light; and an electrode artifact positioning and correction system, which is used for eliminating optical artifacts of electrodes. The present invention provides a space-time calibration system and method for whole-plate high-throughput combined photoelectric detection, which solves or at least alleviates the problems such as time synchronization, focal plane drift, illumination uniformity and electrode artifacts existing in whole-plate high-throughput photoelectric detection in the prior art, realizes comprehensive focal plane compensation and signal fidelity, effectively addresses the challenges of space-time accuracy and uniformity, and provides an efficient and accurate technical foundation for biomedical detection.
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