Material Analysis Using Radiation Diffraction TRIZ Cases
- X-ray Analysis Apparatus Beam Mask Reconfiguration
Dynamic beam mask positioning minimizes parasitic scatter from sample stages while enabling rapid reconfiguration for diverse measurement techniques.
- 2D X-ray Diffraction Crystallite Size Distribution Analysis
Segmenting 2D diffraction spots and merging rocking angle data determines crystallite volume distributions lost in conventional average measurements.
- X-ray Baggage Scanner Crystallinity Analysis for Material Discrimination
Processor determines substance crystallinity via x-ray photon histogram analysis to reduce false alarms in baggage scanning.
- X-ray Detector Module Curved Sensor Array Parallax Reduction
Curved sensor array eliminates parallax errors in x-ray diffraction by positioning detector centroids at equal distance from specimen.
- Methylcellulose Powder Dissolution Temperature Control
Controlled drying alters methylcellulose crystal structure to raise dissolution temperature, removing cooling equipment needs.
- X-ray Diffraction Gap Adjustment Mechanism
A gap adjusting unit moves an X-ray shielding member to match the incident beam width.