Material Analysis Using Wave/Particle Radiation TRIZ Cases
- Multi-Source X-Ray Imaging Without Mechanical Movement
Stationary X-ray sources eliminate motion artifacts and reduce recording time by replacing mechanical rotation with electronic switching.
- Differential Amplifier Probe Setup for Absorbed Current Imaging
A differential amplifier probe setup generates clear absorbed current images from electron beam irradiation.
- Optochemical Sensor Element with Regenerable Singlet Oxygen Scavenger
Regenerable scavenger units bind singlet oxygen to prevent luminescence indicator degradation, maintaining signal stability during high-intensity irradiation.
- Native Bitumen Markers for Solvent Ratio Control
Native bitumen markers replace density measurements to control solvent-to-bitumen ratios, reducing hydrocarbon loss and asphaltenes rejection.
- Radiation Backscatter Detector Using Multi-Energy Source Arrays
A radiation backscatter detector uses a multi-energy source array and segmented detector elements to identify material groups via pulse count ratios.
- Carbon Nanotube Characterization via SEM Voltage Adjustment
Adjusting scanning electron microscope accelerating voltage to 5-20 kV differentiates metallic and semiconducting carbon nanotubes by color.
- X-ray CT Dimension Measurement Using CAD Registration
Aligning projection images with CAD models eliminates time-consuming CT reconstruction while maintaining high measurement precision for single-material objects.
- Automated XRR Location Selection for Semiconductor Wafer Inspection
Algorithm evaluates X-ray spectra figures-of-merit to select high-quality measurement locations, avoiding surface feature distortion.
- Electron Microscope Specimen Mount for In Situ Analysis
Integrated mount and stage allow in situ specimen manipulation, eliminating ex-situ transfer delays and ambiguous results.