ML-based image analysis highlights microscope regions worth enlarging, reducing operator burden while improving examination accuracy.
ML image signatures let microscopes detect focus drift and restore target structures in thick, time-variable samples without added hardware.
Uniform LED current control keeps sensor detection values in range, limiting luminance errors and preserving lensless imaging accuracy after LED failure.
A single DNN combines optical, XPL, and electron microscopy data to identify minerals and grain boundaries faster and more consistently.