A hypervalent iodine compound and carboxy polymer form a non-amplified resist film for high-energy radiation patterning.
A light-sensitive negative photoresist composition enables single-step imaging of thick films up to 200 µm with vertical sidewalls.
Charged particle beams pattern conductive polymer layers via shadow masks, eliminating wave guiding effects and contamination while lowering power consumption.
An organometallic resist composition changes solubility directly upon light exposure to enable high-resolution patterning.
A photosensitive resin composition forms high-resolution cured film patterns using specific photopolymerization initiators.
Photonic curing of metallic inks uses copper nanocluster phase transitions to achieve low resistivity.