Spectrum Investigation TRIZ Cases
- UV-IR Ellipsometer Collimator with Dual Off-Axis Mirrors
Two off-axis concave spherical mirrors cancel total off-axis astigmatism across 190 nm to 5.5 microns, enabling precise infrared measurements.
- Dual-Channel Optical Interference Signal Separation
K-means clustering and L1 norm algorithms separate overlapping interference signals in the frequency domain to improve depth profile resolution.
- Portable Plasma Detection Device for Heavy Metal Ion Analysis
A portable detection device uses a mobile electronic device to analyze spectral data from plasma generated by a sample.
- All-Solid-State Lock-In Imager for Fluorescence Lifetime Imaging
Replacing expensive multi-channel-plate detectors with solid-state sensors reduces system noise and cost while maintaining nanosecond precision.
- Adaptive Wavelength Light Source for Inspection Image Consistency
A processor controls a light source device to emit low-intensity illumination in a specific wavelength band matching ambient conditions.
- Compressive Imaging Using Photonic Time-Stretch and Spectral Encoding
Photonic time-stretch system encodes unique spectral patterns onto laser pulses for ultrafast image reconstruction.
- Optical Signal Detection via Nonlinear Conversion and Sparse PCA
Nonlinear converter transforms optical signals into spectral data for rapid identification using sparse principal component analysis.
- Linear Array Calibration Using Hybrid Dark and Light Response Measurements
Hybrid calibration method corrects linear array sensor responses using dark and light measurements, maintaining accuracy without full-length strips.
- VUV Reflectometer Calibration Using Dual-Channel Silicon Reference
A dual-channel VUV reflectometer uses a stable silicon reference above 250 nm to calibrate measurements below that threshold.