2D Multilayer Thickness Mapping with Frequency and Model Analysis
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current technologies for measuring tear film layer thickness, particularly the lipid and muco-aqueous layers, are limited by phase ambiguity, require expensive equipment, and lack precision in absolute thickness estimation.
Innovation Solution
A method utilizing fringe images and frequency analysis to determine the thickness of both lipid and muco-aqueous layers through a modified theoretical model that accounts for scattering and optical alignment, employing discrete narrow spectral bands and Fourier transforms to generate thickness maps.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If interferometric techniques with image color correlation are used for lipid layer thickness measurement, then the measurement can be performed non-invasively and quickly, but the measurement precision is limited due to phase ambiguity and can only provide average thickness over large areas
Solution Approach 1:
The patent segments the tear film into multiple layers (lipid layer, aqueous layer, mucus layer) and applies different analysis methods to each layer. By segmenting the measurement approach, the system can determine absolute thickness for each layer separately rather than providing only an average thickness, thereby resolving the phase ambiguity issue while maintaining non-invasive rapid measurement capability
Solution Approach 2:
The patent transitions from two-dimensional image analysis to three-dimensional thickness mapping by incorporating optical coherence tomography data. This dimensional enhancement allows the system to provide absolute thickness measurements at multiple locations across the tear film surface, eliminating phase ambiguity while maintaining measurement speed
2Measurement precision
If spectrometer-based Fourier transform techniques are used for rigorous numerical analysis, then the measurement precision is improved, but the device complexity and cost increase significantly
Solution Approach 1:
The patent merges interferometric imaging with optical coherence tomography into a single integrated system. This combination allows the system to achieve rigorous numerical analysis precision for absolute thickness measurement while avoiding the need for separate spectrometer equipment, thereby reducing device complexity and cost
Solution Approach 2:
The patent creates a multi-functional system that can perform both interferometric imaging and optical coherence tomography measurements using the same hardware platform. This universality allows the system to achieve high measurement precision without requiring additional specialized equipment, thus reducing overall system complexity
3Measurement precision
If ultrahigh resolution OCT with scanning mechanism is used for 2D thickness measurement, then the measurement precision is improved, but the device cost increases significantly
Solution Approach 1:
The patent combines interferometric imaging and optical coherence tomography into a single integrated system that shares common hardware components. This merging eliminates the need for separate ultrahigh resolution OCT systems with expensive scanning mechanisms, while still achieving 2D thickness measurement precision through the synergistic use of both techniques
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Provides accurate, real-time measurements of tear film layer thickness with improved precision and reduced equipment cost, enabling clinical evaluation of tear film health and potential indicators for dry eye syndrome.
Implementation Method 1
obtain a fringe image of a multilayer object using an interferometric imaging system
Implementation Method 2
perform a frequency analysis of the reflectance information; determining a total thickness of the object based on the frequency analysis
Data Source
AI summary
A method for thickness measurement of a multi-layer object combines frequency analysis and a theoretical model. The frequency analysis is used to determine the thickness of a thicker layer of the object. The theoretical model is used to determine the thickness of the thinner layer of the object.