2D Material Selector for MRAM Leakage and Density

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Solution Overview

Problem

Current Magnetic Random Access Memory (MRAM) technologies face challenges in achieving high density integration, low power consumption, and reducing leakage current, particularly in Spin-Orbit Torque MRAM (SOT-MRAM) with a three-terminal structure.

Innovation Solution

A two-dimensional material-based selector with a metal-two-dimensional semiconductor-metal structure, comprising a stack unit with Schottky diode structures connected in reverse series, is introduced. This selector is integrated with a magnetic tunnel junction to form a selection storage unit, optimizing the structure for high-speed, low-power, and high-density memory applications.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If SOT-MRAM with three-terminal structure is used, then data writing speed and reading/writing times are improved, but unit area increases making high density integration difficult

Engineering Contradiction:
Improvedata writing speedVSAvoidunit area
Core Design Contradiction:
SpeedVSArea of moving object

Solution Approach 1:

The patent merges the selector and memory functions into a single integrated structure where the two-dimensional material selector is formed directly over the magnetic tunnel junction, eliminating the need for separate three-terminal SOT-MRAM structure and reducing unit area while maintaining high-speed performance

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent transitions from planar two-terminal structure to vertical stacking architecture, arranging the two-dimensional material selector, magnetic tunnel junction, and electrode structures in vertical layers to achieve high-density integration while preserving fast switching characteristics

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If conventional transistors or diodes are used as selectors, then selection function is achieved, but device size is large and integration density is reduced

Engineering Contradiction:
Improveselection functionVSAvoiddevice size
Core Design Contradiction:
ReliabilityVSArea of moving object

Solution Approach 1:

The patent employs an ultrathin two-dimensional semiconductor material film as the selector, which provides reliable selection functionality while occupying minimal area due to its atomic-layer thickness and compact structure

Inventive Principle:
Principle #30Flexible shells and thin films

Solution Approach 2:

The patent creates a composite structure combining two-dimensional semiconductor material with magnetic tunnel junction and metal electrodes, achieving both selection function and small device footprint through the synergistic integration of different functional materials

Inventive Principle:
Principle #40Composite materials

3Reliability

If chalcogenide ovonic threshold switching selector is used, then selection function is achieved, but thickness is large and mobility is low affecting storage speed

Engineering Contradiction:
Improveselection functionVSAvoidthickness
Core Design Contradiction:
ReliabilityVSLength of moving object

Solution Approach 1:

The patent replaces thick chalcogenide selector with an ultrathin two-dimensional semiconductor material film that provides equivalent or superior selection functionality while reducing thickness to atomic layers, thereby improving carrier mobility and storage speed

Inventive Principle:
Principle #30Flexible shells and thin films

4Reliability

If variable-resistance type selector is used, then selection function is achieved, but on-resistance is too high to match existing MTJ

Engineering Contradiction:
Improveselection functionVSAvoidon-resistance matching
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent adjusts the electrical parameters of the two-dimensional material selector through material selection and structure optimization to achieve on-resistance values that are well-matched with existing magnetic tunnel junction devices, enabling effective integration

Inventive Principle:
Principle #35Parameter changes

5Quantity of substance

If memory units are arranged in cross array, then storage density is increased, but leakage current in unselected units increases

Engineering Contradiction:
Improvestorage densityVSAvoidleakage current
Core Design Contradiction:
Quantity of substanceVSLoss of energy

Solution Approach 1:

The patent implements local quality control by designing the two-dimensional material selector to exhibit highly nonlinear current-voltage characteristics with sharp turn-on behavior, enabling effective suppression of leakage current in unselected memory units while maintaining low standby power consumption

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The two-dimensional material-based selector achieves high-speed and reliable ovonic conduction with a turn-on voltage less than 1 V, low leakage current, and a high turn-on current density, enhancing the switching speed and reducing power consumption in MRAM devices.

Implementation Method 1

each stack unit includes two Schottky diode structures connected in reverse series

Methodology Applied
Scientific EffectSchottky diode structure: Conduction (electrical)

Implementation Method 2

achieves high-speed and reliable ovonic conduction with a turn-on voltage less than 1 V

Methodology Applied
Scientific EffectOvonic conduction: Conduction (electrical)

Implementation Method 3

an electron spin injection is performed by a polarized current, and an information writing is completed by driving the free layer to switch the magnetization direction based on spin transfer torque

Methodology Applied
Scientific EffectSpin transfer torque:

Implementation Method 4

when magnetization directions between the reference layer and the free layer are anti-parallel, the MTJ exhibits a high resistance state '1'; and when the magnetization directions of the reference layer and the free layer are parallel, the MTJ exhibits a low resistance state '0'

Methodology Applied
Scientific EffectMagnetization switching: Ferromagnetism

Implementation Method 5

uses an Oersted field generated by a pulse current to realize the magnetization switching of the free layer

Methodology Applied
Scientific EffectOersted field: Electromagnetic Induction

Implementation Method 6

a spin injection is realized by a spin-orbit coupling effect, and the material in the free layer is driven to switch the magnetization direction

Methodology Applied
Scientific EffectSpin-orbit coupling effect:

Data Source

PatentUS12336188B2Two-dimensional material-based selector with stack unit, memory unit, array, and method of operating the same
Publication Date: 2025.06.17 INST OF MICROELECTRONICS CHINESE ACAD OF SCI LTD
  • US12336188B2 patent drawing
  • US12336188B2 patent drawing
  • US12336188B2 patent drawing

AI summary

A two-dimensional material-based selector includes: a stack unit, wherein the stack unit has a metal-two-dimensional semiconductor-metal structure comprising a two-dimensional semiconductor layer, and metal layers arranged on an upper surface and a lower surface of the two-dimensional semiconductor layer, respectively. The number of the stack units is N, where N≥1. In each stack unit, a Schottky contact is formed on two metal-two-dimensional conductor interfaces, and the stack unit includes two Schottky diode structures connected in reverse series in response to the two-dimensional material-based selector being turned on. Alternatively, the number of the stack units is M, where M≥2. In each stack unit, a Schottky contact and an Ohmic contact are formed the two metal-two-dimensional conductor interfaces, respectively. The M stack units include M Schottky diode structures connected in reverse series in response to the two-dimensional material-based selector being turned on.