2D Semiconductor Channel With Metallic Nanoparticles for Scaling

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Solution Overview

Problem

Conventional semiconductor devices face performance degradation as they shrink in size due to increased mobility loss and short channel effects, particularly when using silicon-based materials, which limits the reduction in channel thickness.

Innovation Solution

A semiconductor device utilizing a two-dimensional semiconductor material with a polycrystalline structure and metallic nanoparticles deposited on defects and grain boundaries, combined with a gate insulating layer and electrodes, to enhance electrical conductivity and control doping levels.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If the size of semiconductor devices is reduced, then more devices can be integrated and driving speed increases, but performance degradation occurs due to increased mobility loss and short channel effects

Engineering Contradiction:
Improvedevice integration densityVSAvoiddevice performance
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent changes the material parameter from conventional silicon-based materials to two-dimensional semiconductor materials with atomic-level thickness (1 nm or less). This fundamental material parameter change enables continued scaling while maintaining performance by eliminating short channel effects and reducing mobility loss, thus resolving the contradiction between device miniaturization and performance maintenance

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent employs composite material structures including two-dimensional semiconductor material layers combined with metallic nanoparticles and gate insulating layers. This composite approach enhances electrical conductivity and controls doping levels, allowing high-performance devices at reduced sizes by combining the advantages of different materials to overcome the limitations of individual materials

Inventive Principle:
Principle #40Composite materials

2Speed

If the channel thickness is reduced to increase driving speed, then device performance improves, but mobility loss increases causing performance degradation

Engineering Contradiction:
Improvedriving speedVSAvoidcarrier mobility
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

The patent changes the channel thickness parameter to atomic-level dimensions (1 nm or less) using two-dimensional materials. This extreme thinning reduces the channel length and increases driving speed while the two-dimensional material structure maintains high carrier mobility by eliminating bulk defects and phonon scattering, thus resolving the contradiction between speed enhancement and mobility loss

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enables improved electrical conductivity and reduced contact resistance, maintaining high performance even at small thicknesses, overcoming short channel effects and mobility loss, thus allowing for smaller device sizes without performance degradation.

Implementation Method 1

metallic nanoparticles partially on the two-dimensional material layer... improved electrical conductivity and reduced contact resistance

Methodology Applied
Scientific EffectElectrical conduction: Conduction (electrical)

Data Source

PatentUS20240021679A1Semiconductor device including two-dimensional material and method of fabricating the same
Publication Date: 2024.01.18 SAMSUNG ELECTRONICS CO LTD
  • US20240021679A1 patent drawing
  • US20240021679A1 patent drawing
  • US20240021679A1 patent drawing

AI summary

A semiconductor device may include a two-dimensional material layer including a two-dimensional semiconductor material having a polycrystalline structure; metallic nanoparticles partially on the two-dimensional material layer; a source electrode and a drain electrode respectively on both sides of the two-dimensional material layer; and a gate insulating layer and a gate electrode on the two-dimensional material layer between the source electrode and the drain electrode.