2T2R RRAM Bit Line Layout to Prevent Transistor Breakdown

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Solution Overview

Problem

Existing 2T2R resistive random access memory (RRAM) structures face issues with transistor breakdown due to high leakage voltage when a single RRAM is operated, as both RRAMs share a bit line, leading to potential breakdown of the other transistor.

Innovation Solution

The semiconductor structure connects first and second memristors in each memory cell to different bit lines, with adjacent rows of memristors sharing the same bit line, allowing independent voltage control and reducing leakage, while maintaining the same array density without increasing cell area.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If two RRAMs in a 2T2R structure are connected to the same bit line, then the array density is maintained, but the transistor faces the risk of breakdown caused by high leakage voltage when a single RRAM is operated

Engineering Contradiction:
Improvetransistor breakdown riskVSAvoidleakage voltage
Core Design Contradiction:
ReliabilityVSLoss of energy

Solution Approach 1:

The bit lines are segmented into first bit lines and second bit lines. First memristors connect to first bit lines while second memristors connect to second bit lines, separating the voltage paths and preventing leakage voltage from affecting transistors in adjacent memory cells. This segmentation resolves the contradiction by maintaining array density while eliminating the breakdown risk.

Inventive Principle:
Principle #1Segmentation

2Ease of operation

If first memristors in one row and second memristors in adjacent row are connected to the same bit line, then the array density is maintained, but voltage control independence is lost

Engineering Contradiction:
Improvevoltage control independenceVSAvoidtransistor breakdown protection
Core Design Contradiction:
Ease of operationVSReliability

Solution Approach 1:

The bit line segmentation allows independent voltage control of first and second memristors through separate first and second bit lines, while still maintaining array density by connecting memristors from adjacent rows to the same bit line type. This resolves the contradiction between operational independence and reliability.

Inventive Principle:
Principle #1Segmentation

3Reliability

If separate bit lines are used for all memristors, then transistor breakdown is prevented, but the cell area increases

Engineering Contradiction:
Improvetransistor breakdown preventionVSAvoidcell area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The segmentation into first and second bit lines provides separate voltage paths for different memristor types, preventing transistor breakdown while maintaining compact cell area. The segmented architecture allows efficient space utilization by assigning specific bit lines to specific memristor rows.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS20250384902A1Semiconductor structure and preparation method thereof
Publication Date: 2025.12.18 XIAMEN IND TECH RES INST CO LTD
  • US20250384902A1 patent drawing
  • US20250384902A1 patent drawing
  • US20250384902A1 patent drawing

AI summary

A semiconductor structure and a preparation method thereof are provided. The semiconductor structure includes: a substrate; a plurality of memory cells arranged in a first direction and a second direction, each of the memory cells including a first transistor, a first memristor, a second transistor, and a second memristor; where the first and second directions are parallel to a plane of the substrate and intersect; and a plurality of first and second bit lines extending in the first direction. In every two adjacent rows of memory cells arranged in the first direction, all the first memristors in a first row and all the second memristors in a second row are connected to a same first bit line, and all the second memristors in the first row and all the first memristors in the second row are connected to a same second bit line.