3D Chip Package with Non-Vertical Side Walls for Batch Singulation

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Solution Overview

Problem

Existing chip packaging technologies face challenges in maintaining high-bandwidth, low-power, and low-cost interconnects between chips as they scale to smaller dimensions, particularly due to difficulties in accurate mechanical alignment and increased complexity in three-dimensional integration.

Innovation Solution

A chip package design featuring chips with non-vertical side-wall angles, facilitated by a batch processing technique that includes wet or dry etching and thinning of wafers, allowing for precise mechanical and electrical coupling using proximity-communication connectors and underfill materials, which reduces chipping damage during the singulation process.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If conventional individually packaged chips are used with printed circuit board connections, then manufacturing is simpler, but inter-chip communication bandwidth and data rate deteriorate at higher operating frequencies

Engineering Contradiction:
Improvemanufacturing simplicityVSAvoidinter-chip communication performance
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

Multiple chips are integrated into a single multi-chip module package, merging individual chip functions into a unified 3D structure. This combines the manufacturing simplicity of individual chips with the high-performance interconnects of direct chip-to-chip coupling, eliminating the need for external PCB traces while maintaining ease of module-level manufacturing.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent transitions from planar 2D chip arrangements on PCBs to three-dimensional vertical stacking of chips. This dimensional change enables significantly shorter inter-chip interconnect paths, reducing signal propagation delays and allowing high-bandwidth communication at higher frequencies while maintaining compact form factor.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If dense inter-chip connections are implemented in MCM with pitch of 10-100 μm, then inter-chip communication bandwidth is improved, but mechanical alignment precision requirements worsen

Engineering Contradiction:
Improveinter-chip communication bandwidthVSAvoidmechanical alignment precision
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

Alignment features and bonding structures are prepared in advance during chip fabrication, with pre-defined pad geometries and positioning structures. This preliminary preparation of alignment references enables accurate positioning during assembly, achieving the required mechanical alignment precision for dense inter-chip connections without requiring complex real-time adjustment mechanisms.

Inventive Principle:
Principle #10Preliminary action

3Productivity

If chips are singulated using conventional dicing process, then manufacturing throughput is maintained, but chipping damage to dielectric layers increases

Engineering Contradiction:
Improvemanufacturing throughputVSAvoidchip integrity
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent replaces the mechanical dicing process with a chemical etching process for chip singulation. This substitution eliminates the mechanical contact and vibration that cause chipping damage to dielectric layers, while maintaining high manufacturing throughput through batch processing of multiple chips simultaneously. The chemical process provides cleaner separation without physical trauma to the chip structures.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances manufacturing throughput and yield, reduces costs, and enables dense 3D integration of disparate technology platforms, while minimizing chipping damage and improving alignment accuracy, thus addressing the limitations of conventional packaging methods.

Implementation Method 1

facilitated by a batch processing technique that includes wet or dry etching

Methodology Applied
Scientific EffectWet etching:

Implementation Method 2

facilitated by a batch processing technique that includes wet or dry etching

Methodology Applied
Scientific EffectDry etching:

Implementation Method 3

thinning of wafers

Methodology Applied
Scientific EffectThinning:

Implementation Method 4

The mechanical coupling may include an underfill material that selectively couples the first surface to the second surface

Methodology Applied
Scientific EffectAdhesive bonding: Adhesive

Data Source

PatentUS9082808B2Batch process for three-dimensional integration
Publication Date: 2015.07.14 ORACLE INT CORP
  • US9082808B2 patent drawing
  • US9082808B2 patent drawing
  • US9082808B2 patent drawing

AI summary

A chip package is described which includes a first chip having a first surface and first sides having a first side-wall angle, and a second chip having a second surface and second sides having a second side-wall angle, which faces and is mechanically coupled to the first chip. The chip package is fabricated using a batch process, and the chips in the chip package were singulated from their respective wafers after the chip package is assembled. This is accomplished by etching the first and second side-wall angles and thinning the wafer thicknesses prior to assembling the chip package. For example, the first and/or the second side walls can be fabricated using wet etching or dry etching. Therefore, the first and/or the second side-wall angles may be other than vertical or approximately vertical.