3D Printed CMP Pads With RFID Wear Monitoring

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional chemical mechanical polishing (CMP) systems and pads lack effective data collection and sensing capabilities, leading to inconsistent polishing results and inadequate process control, particularly in advanced technology integrated circuit nodes.

Innovation Solution

The integration of 3D printed polymeric polishing pads with RFID tags and wireless communication systems, allowing for real-time data collection and process control through communication between the RFID tags and interrogators, enabling improved monitoring and metrology functions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional molding or casting methods are used to manufacture polishing pads, then the pads can be produced, but the manufacturing process is expensive and time consuming, and the polishing results are non-uniform

Engineering Contradiction:
Improvepolishing uniformityVSAvoidmanufacturing complexity
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent changes the manufacturing method from conventional molding/casting to additive manufacturing (3D printing), which allows for precise control of pad geometry and material distribution. This enables uniform polishing characteristics while reducing manufacturing time and cost through digital modeling and layer-by-layer construction.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent incorporates RFID tags and sensing elements within the polishing pad structure, creating a composite system that combines polishing functionality with monitoring and tracking capabilities. This integrated approach enables real-time data collection on pad wear and polishing conditions without adding separate external components.

Inventive Principle:
Principle #40Composite materials

2Loss of information

If conventional CMP systems are used, then the basic polishing function is provided, but the systems lack effective data collection and sensing capabilities for process control

Engineering Contradiction:
Improveprocess data collectionVSAvoidsystem complexity
Core Design Contradiction:
Loss of informationVSDevice complexity

Solution Approach 1:

The patent merges the polishing pad with integrated sensing and RFID tracking capabilities into a single unified component. This combination eliminates the need for separate external monitoring systems while enabling comprehensive data collection on pad wear, polishing conditions, and process parameters.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The polishing pad is designed to self-monitor its own condition through embedded sensors and RFID tags that automatically track wear, usage, and performance characteristics. This self-service capability provides continuous process data without requiring external intervention or complex additional instrumentation.

Inventive Principle:
Principle #25Self-service

3Reliability

If polishing pads are used without integrated sensing, then the apparatus is simpler, but the polishing results are inconsistent and process control is inadequate

Engineering Contradiction:
Improvepolishing consistencyVSAvoidpad structure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent incorporates sensors and RFID tags that provide real-time feedback on pad wear, polishing conditions, and substrate processing status. This feedback enables dynamic adjustment of polishing parameters to maintain consistent results and predict when pad replacement is needed, improving reliability through data-driven process control.

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enhances polishing performance by providing real-time data for process adjustments, ensuring consistent and uniform substrate polishing, and extending the life of polishing pads through wear monitoring.

Implementation Method 1

The RFID tag and the interrogator are configured to communicate with one another using a wireless communication technique

Methodology Applied
Scientific EffectRFID wireless communication: Electromagnetic Induction

Data Source

PatentUS11986922B2Techniques for combining CMP process tracking data with 3D printed CMP consumables
Publication Date: 2024.05.21 APPLIED MATERIALS INC
  • US11986922B2 patent drawing
  • US11986922B2 patent drawing
  • US11986922B2 patent drawing

AI summary

Chemical mechanical polishing (CMP) apparatus and methods for manufacturing CMP apparatus are provided herein. CMP apparatus may include polishing pads, polishing head retaining rings, and polishing head membranes, among others, and the CMP apparatus may be manufactured via additive manufacturing processes, such as three dimensional (3D) printing processes. The CMP apparatus may include wireless communication apparatus components integrated therein. Methods of manufacturing CMP apparatus include 3D printing wireless communication apparatus into a polishing pad and printing a polishing pad with a recess configured to receive a preformed wireless communication apparatus.