3D Flash Memory Channel Structures with Enlarged Portions for Alignment

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Solution Overview

Problem

As the integration of three-dimensional flash memory devices increases, there is a need for techniques to effectively form stacked units without encountering misalignment issues that could lead to word line bridging or channel cut phenomena.

Innovation Solution

The design incorporates a three-dimensional flash memory device with a cell area and an extension area, featuring channel structures with enlarged portions, including a cell channel structure and a dummy channel structure, where the dummy channel structure has a wider horizontal width than the cell channel structure, and both structures penetrate through word line stacks connected to a substrate, with a vertical contact structure connecting to word lines, facilitating alignment and preventing misalignment-related issues.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If channel structures are formed with standard dimensions in stacked three-dimensional flash memory devices, then device integration is achieved, but misalignment occurs leading to word line bridging or channel cut phenomena

Engineering Contradiction:
Improvealignment precision of channel structuresVSAvoiddevice performance stability
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The patent applies preliminary action by forming enlarged portions at the lower ends of channel structures before stacking word line stacks. This pre-enlargement creates a tolerance buffer that compensates for potential misalignment during subsequent stacking processes, preventing word line bridging and channel cut phenomena without requiring perfect alignment precision.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent implements local quality by creating non-uniform channel structures with enlarged portions specifically at the lower ends where alignment criticality is highest. The channel structures have different dimensions at different locations: enlarged at the bottom for alignment tolerance, and standard at the top for functional performance. This localized modification addresses the alignment issue without affecting overall device functionality.

Inventive Principle:
Principle #3Local quality

2Manufacturing precision

If dummy channel structures with larger dimensions are formed in extension areas, then alignment tolerance is improved, but device area increases

Engineering Contradiction:
Improvealignment toleranceVSAvoiddevice area
Core Design Contradiction:
Manufacturing precisionVSArea of stationary object

Solution Approach 1:

The patent applies segmentation by dividing the device into cell areas and extension areas with different channel structure configurations. Cell areas contain standard channel structures for memory functionality, while extension areas contain dummy channel structures with enlarged portions solely for alignment tolerance. This spatial segmentation allows alignment compensation without increasing the functional cell area.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent uses dummy channel structures in extension areas as sacrificial alignment features. These dummy structures serve only the alignment function and do not participate in memory operations. By confining enlarged alignment-tolerant structures to non-functional extension areas, the patent achieves alignment tolerance without increasing the area of functional memory cells.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

Data Source

PatentUS11678489B2Three-dimensional flash memory device including channel structures having enlarged portions
Publication Date: 2023.06.13 SAMSUNG ELECTRONICS CO LTD
  • US11678489B2 patent drawing
  • US11678489B2 patent drawing
  • US11678489B2 patent drawing

AI summary

A three-dimensional flash memory device including a lower and upper word line stack; a cell channel structure; and a dummy channel structure, wherein the cell channel structure includes a lower cell channel structure; an upper cell channel structure; and a cell channel enlarged portion between the lower and upper cell channel structures and having a width greater than that of the lower cell channel structure, wherein the dummy channel structure includes a lower dummy channel structure; an upper dummy channel structure; and a dummy channel enlarged portion between the lower and upper dummy channel structures, the dummy channel enlarged portion having a width greater than that of the lower dummy channel structure, wherein a difference between the width of the dummy channel enlarged portion and the lower dummy channel structure is greater than a difference between the width of the cell channel enlarged portion and the lower cell channel structure.