3D IC Semiconductor Package Stacking for Higher POP Yield

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Solution Overview

Problem

Existing package-on-package (POP) technology requires discarding entire system-on-chip (SOC) when individual semiconductors are defective, leading to reduced yield and increased manufacturing costs, as it does not allow for the differentiation and stacking of individual semiconductors as 3D IC structures.

Innovation Solution

A semiconductor package and method that involves forming a 3D IC structure by stacking individual semiconductors on a front side redistribution layer using through-silicon vias and connection members, with an insulating member and molding material to encapsulate the chips, allowing for the implementation of SOC as 3D IC structures within the POP process, thereby reducing the need for separate 3D IC fabrication and minimizing epoxy molding compound usage.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If individual semiconductors are differentiated and stacked as 3D IC structures in the POP process, then manufacturing yield is improved and costs are reduced, but device complexity and fabrication process complexity increase

Engineering Contradiction:
Improvemanufacturing yieldVSAvoidfabrication process complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The system-on-chip is segmented into multiple individual semiconductor chips, each fabricated separately and then stacked vertically to form a 3D IC structure. This segmentation allows each chip to be independently tested and replaced if defective, eliminating the need to discard the entire SOC and thereby improving manufacturing yield.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transitions from a traditional planar 2D SOC layout to a vertical 3D stacked architecture. Individual semiconductor chips are stacked in the vertical dimension, enabling better heat dissipation, reduced inter-chip connectivity complexity, and improved manufacturing yield through selective replacement of defective chips.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Area of moving object

If 3D IC structures are fabricated separately before POP assembly, then integration density is improved, but manufacturing cost and process time increase due to separate fabrication

Engineering Contradiction:
Improveintegration densityVSAvoidmanufacturing cost
Core Design Contradiction:
Area of moving objectVSEase of manufacture

Solution Approach 1:

The patent merges the 3D IC structure fabrication process with the existing POP assembly process. Instead of fabricating 3D IC structures separately and then assembling them into POP packages, the individual semiconductors are differentiated and stacked directly within the POP fabrication flow, eliminating redundant process steps and reducing manufacturing cost.

Inventive Principle:
Principle #5Merging (Combining)

3Ease of manufacture

If traditional POP technology is used without 3D IC structure integration, then fabrication process is simpler, but epoxy molding compound usage increases and yield is reduced

Engineering Contradiction:
Improvefabrication process simplicityVSAvoidepoxy molding compound usage
Core Design Contradiction:
Ease of manufactureVSLoss of substance

Solution Approach 1:

By transitioning to a 3D stacked architecture, the patent reduces the horizontal footprint of the package, thereby minimizing the amount of epoxy molding compound required for encapsulation. The vertical stacking allows more efficient use of package volume and reduces material consumption.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS20240258277A1Semiconductor packages and method for fabricating the same
Publication Date: 2024.08.01 SAMSUNG ELECTRONICS CO LTD
  • US20240258277A1 patent drawing
  • US20240258277A1 patent drawing
  • US20240258277A1 patent drawing

AI summary

A semiconductor package includes: a front side redistribution layer; a three-dimensional integrated circuit (3D IC) structure on the front side redistribution layer, the 3D IC structure including a first semiconductor chip die having through-silicon vias (TSVs) and a second semiconductor chip die disposed on the first semiconductor chip die, and the second semiconductor chip die being electrically coupled with the front side redistribution layer by the through-silicon vias (TSVs); a plurality of connection members between the first semiconductor chip die and the second semiconductor chip die; an insulating member disposed between the first semiconductor chip die and the second semiconductor chip die to surround the plurality of connection members; a molding material disposed on the front side redistribution layer to encapsulate the first semiconductor chip die, the second semiconductor chip die, and the insulating member; and a back side redistribution layer disposed on the molding material.