3D Interferometer Phase Measurement
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Solution Overview
Problem
Existing methods for measuring light fields, such as two-dimensional interferometers and holographic systems, are limited in their ability to determine the local phase of an incident wave with high resolution, especially for virtual objects and incoherent light sources.
Innovation Solution
A compact, cost-effective three-dimensional interferometer is used to measure light fields by determining the phase difference between electric fields in the interference region, allowing for precise measurement of the phase and amplitude of the light field.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If two-dimensional interferometers are used for light field measurement, then the device structure is simple, but the measurement precision of local phase is insufficient
Solution Approach 1:
The patent transitions from two-dimensional interferometer configurations to a three-dimensional interferometer setup. This dimensional change enables the system to capture and measure the local phase of light fields with high resolution by utilizing spatial coherence information in three dimensions, thereby resolving the limitation of conventional two-dimensional approaches
2Adaptability or versatility
If holographic measurement systems are used, then amplitude and phase information can be stored, but real objects are required and virtual objects cannot be imaged
Solution Approach 1:
The interferometer uses the light field itself as the reference beam through self-coherence. By utilizing the spatial coherence inherent in the light field from virtual objects, the system eliminates the need for separate reference beam paths that require real objects, enabling measurement of both real and virtual objects while maintaining high local phase precision
3Measurement precision
If reference beam extraction is implemented, then interferometric measurement can be performed, but the spatial configuration requirements increase system complexity
Solution Approach 1:
The patent extracts and utilizes the spatial coherence information directly from the light field without requiring separate reference beam extraction paths. This approach eliminates complex spatial configuration requirements while maintaining the ability to perform precise phase measurements through self-coherence of the light field
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The method enables high-resolution interferometric determination of the local phase of an incident wave, suitable for both real and virtual objects, and can handle coherent and partially coherent light sources.
Implementation Method 1
a beam splitter (101) which divides the light field into a first interference arm and a second interference arm
Implementation Method 2
an overlap device (106) which causes a first electric field, which originates from the first interference arm, and a second electric field, which originates from the second interference arm, to interfere and overlap in an interference region of a detection plane (131)
Data Source
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AI summary
The invention relates to a three-dimensional interferometer (100) for measuring a light field produced by an object (110), having a first interferometer arm (150), a second interferometer arm (152), a beam splitter (101) which is arranged between an object point (112) of the object (110), on the one hand, and the first interferometer arm (150) and the second interferometer arm (152), on the other hand, and is set up to split a beam coming from the object point (112) at the beam splitter (101) into the first beam and the second beam, a detection plane (131) or a detection surface which is arranged downstream of the first interferometer arm (150) and the second interferometer arm (152) and is set up in such a manner that the first beam and the second beam are made to interfere in an interference region (132) on said plane or surface, and an overlapping device (106) which is arranged between the detection plane (131), on the one hand, and the first interferometer arm (150) and the second interferometer arm (152), on the other hand.