3D Ion Trap Trench Electrodes for Scalable Quantum Trapping

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Solution Overview

Problem

Existing ion traps for quantum computing face challenges in ease of fabrication and superior trap performance, with 2D surface-electrode traps having lower trapping efficiency, depth, and harmonicity, and 3D wafer traps being difficult to scale and integrate functional elements.

Innovation Solution

The development of 3D-printed ion traps with trench geometries that combine the advantages of both 2D and 3D structures, using additive manufacturing to create electrodes with hyperbolic cross-sections and improved trapping properties, allowing for better integration and scalability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If 2D surface-electrode traps are used, then fabrication is easier, but trapping efficiency and depth are lower

Engineering Contradiction:
Improvefabrication easeVSAvoidtrapping efficiency
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent transitions from 2D surface-electrode geometry to a 3D trench geometry, creating vertical electrode structures that extend into the substrate. This dimensional change allows the trap to achieve both improved trapping efficiency through enhanced electric field confinement and maintained fabrication simplicity through planar processing techniques.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The electrode structures are nested within trenches etched into the substrate, with conductive materials deposited inside the trench cavities. This nesting approach creates compact 3D trap geometries that improve trapping depth while using standard planar fabrication steps.

Inventive Principle:
Principle #7Nested doll (Nesting)

2Reliability

If 3D wafer traps are used, then trapping performance is superior, but scalability and integration are difficult

Engineering Contradiction:
Improvetrapping performanceVSAvoidintegration complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent creates 3D trap geometries through vertical trench structures that can be integrated with planar circuit elements, bridging the gap between high-performance 3D traps and scalable 2D integrated systems. The trenches provide vertical confinement while remaining compatible with standard semiconductor integration processes.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The trap electrodes are segmented into multiple discrete regions within the trench structures, allowing independent voltage control and integration with external circuitry. This segmentation enables scalable fabrication and complex functional integration while maintaining superior trapping performance.

Inventive Principle:
Principle #1Segmentation

3Ease of manufacture

If conventional ion trap geometries are used, then fabrication is straightforward, but trap harmonicity is poor leading to higher errors

Engineering Contradiction:
Improvefabrication simplicityVSAvoidtrap harmonicity
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The patent employs curved or rounded electrode geometries within the trench structures, particularly at the trap bottom and electrode interfaces. These curved surfaces create more uniform electric field distributions that improve trap harmonicity and reduce heating rates, while still being manufacturable using standard lithography and deposition techniques.

Inventive Principle:
Principle #14Spheroidality (Curvature)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The 3D-printed ion traps offer enhanced trapping efficiency and harmonicity, reducing errors and ion losses, while maintaining integration advantages of 2D traps and overcoming the complexity of 3D wafer traps.

Implementation Method 1

The plurality of electrodes can be configured to generate an electric field to trap an ion at a trapping position located between the first wall and the second wall

Methodology Applied
Scientific EffectElectric field: Electric Field

Data Source

PatentUS20250344416A13D printed ion trap
Publication Date: 2025.11.06 UNIVERSITY OF OREGON
  • US20250344416A1 patent drawing
  • US20250344416A1 patent drawing
  • US20250344416A1 patent drawing

AI summary

An apparatus includes a first wall and a second wall extending from a planar surface of a substrate to a wall height, and a plurality of electrodes disposed on the first wall and the second wall. The first wall and the second wall can be spaced apart from one another along a first axis on the planar surface. The plurality of electrodes can be configured to generate an electric field to trap an ion at a trapping position located between the first wall and the second wall. A vertical distance between the trapping position and the planar surface of the substrate can be smaller than the wall height.