3D Measurement Device Overlapping Grid Phase Shifts
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Solution Overview
Problem
Existing three-dimensional measurement devices using the phase shift method require a large number of imaging processes, leading to increased measurement time, especially when measuring multiple areas on a printed circuit board, as they need to change the phase of light patterns in multiple stages and take multiple images from different directions, resulting in inefficiencies and longer processing times.
Innovation Solution
A three-dimensional measurement device configuration that includes two irradiators with different grid controllers to change the phase of light patterns in fewer stages, allowing for simultaneous or overlapping imaging processes without waiting for grid transfer or changeover, thereby reducing the total number of imaging processes and shortening the measurement time by using the relationship between gain and offset to enhance measurement accuracy and completeness.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple imaging processes are performed with phase changes in multiple stages, then measurement accuracy is improved, but measurement time increases
Solution Approach 1:
The patent applies dynamics by making the grid movable rather than static. The grid can be dynamically repositioned between different locations during the measurement process, allowing the system to adapt its configuration based on measurement requirements without requiring complete remeasurement, thus reducing total measurement time while maintaining accuracy.
Solution Approach 2:
The patent implements preliminary action by performing a first measurement with the grid at an initial location before the solder paste dries. This preliminary measurement captures height information early in the process, and the grid position is then adjusted for subsequent measurements, eliminating the need to wait for complete drying and reducing overall measurement time.
2Reliability
If grid transfer or changeover is performed between imaging processes, then measurement completeness is improved, but imaging time increases
Solution Approach 1:
The grid is designed to be movable between different locations, allowing dynamic reconfiguration during measurement. This enables the system to capture complete measurement data from multiple positions without requiring lengthy changeover procedures, as the grid can be efficiently repositioned between the first and second locations during the measurement sequence.
3Measurement precision
If phase of light pattern is changed in multiple stages, then measurement accuracy is improved, but device complexity increases
Solution Approach 1:
The patent segments the measurement process into distinct phases: first measurement at the initial grid location, grid repositioning to a second location, and second measurement. This segmentation allows each phase to be optimized independently, maintaining measurement accuracy through multi-stage phase changes while managing overall system complexity through structured process division.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration reduces the total number of imaging processes, enhances measurement accuracy, and significantly shortens the measurement time by overlapping grid transfer processes, ensuring comprehensive data collection without deficiencies, thus improving the efficiency and precision of three-dimensional measurements.
Implementation Method 1
a light source configured to emit a predetermined light
Implementation Method 2
a grid configured to convert the light emitted from the light source into a light pattern having a sinusoidal (striped) light intensity distribution
Implementation Method 3
an imaging unit configured to take an image of reflected light from the measurement object that is irradiated with the first light pattern or the second light pattern
Implementation Method 4
The phase of the light pattern is changed in, for example four different stages (φ+0, φ+90°, φ+180° and φ+270°) by transfer or changeover control of the above grid, and image data having intensity distributions I0, I1, I2 and I3 corresponding to these phases are taken
Data Source
AI summary
A three-dimensional measurement device includes: a first irradiator that radiates a first light pattern from a first position toward an object; a first grid controller that controls a first grid to change phases of the first light pattern; a second irradiator that radiates a second light pattern from a second position toward the object; a second grid controller that controls the second grid to change phases of the second light pattern; a camera that takes an image of reflected light from the object; and a processor that: performs one of a first imaging process of imaging processes performed by radiation of the first light pattern and a second imaging process of imaging processes performed by radiation of the second light pattern; and subsequently performs the other imaging process without waiting for completion of the transfer or changeover of the first or the second grid involved in the one imaging process.