3D Measurement Device Phase Deviation Elimination
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Solution Overview
Problem
Existing three-dimensional measurement devices using stripe patterns face challenges in eliminating initial phase deviations caused by positional shifts of light source units, leading to measurement inaccuracies and increased device size, limiting their application in compact spaces.
Innovation Solution
The use of S-iPMSELs oscillating at an M-point, which output light images with reduced 0-order light and allow for compact design, combined with stripe patterns like gray code and sinusoidal patterns, helps eliminate phase deviations and improve measurement accuracy, enabling smaller device sizes and broader application ranges.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple light source units are used to project stripe patterns for three-dimensional measurement, then measurement coverage and capability are improved, but initial phase deviations occur due to positional shifts between light source units
Solution Approach 1:
Instead of trying to precisely position multiple light source units and eliminate positional shifts, the invention inverts the approach by using a single light source unit that sequentially projects multiple stripe patterns with different initial phases. This eliminates the need for precise spatial positioning of multiple light sources while achieving the same measurement capability through temporal multiplexing of patterns.
Solution Approach 2:
The invention employs dynamic switching of stripe patterns with different initial phases from a single light source unit. By dynamically changing the phase of stripe patterns projected over time, the system achieves multiple measurement perspectives without requiring multiple physically positioned light sources, thereby eliminating positional shift issues.
2Measurement precision
If traditional light sources and imaging devices are used for three-dimensional measurement, then measurement functionality is achieved, but device size becomes large
Solution Approach 1:
The invention merges the functions of multiple light source units into a single light source unit that can sequentially project multiple stripe patterns with different phases. This consolidation reduces the number of optical components and overall device size while maintaining the measurement capability that would otherwise require multiple spatially distributed light sources.
Solution Approach 2:
The invention uses periodic projection of stripe patterns with different initial phases from a single light source unit. By implementing time-multiplexed periodic projection of multiple patterns, the system achieves the functional equivalent of multiple simultaneous light sources without the physical space requirements, thereby reducing device size.
Data Source
AI summary
A three-dimensional measurement device includes a plurality of light source units configured to irradiate the object to be measured with measurement light having predetermined patterns, an image capture unit configured to capture an image of the object to be measured which is irradiated with the measurement light, and a measurement unit configured to measure a three-dimensional shape of the object to be measured based on results of image capture performed by the image capture unit. The predetermined patterns of the measurement light include stripe patterns, respectively. The stripe patterns radiated from the plurality of light source units have respective patterns different from each other. The plurality of light source units are arrayed in a direction parallel to stripes in the stripe patterns. The measurement unit measures the three-dimensional shape of the object to be measured based on a three-dimensional shape measurement method using the stripe pattern.