3D Measuring Apparatus Dual-Irradiation Efficiency
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Solution Overview
Problem
Conventional three-dimensional measuring apparatuses face challenges in improving measurement accuracy while maintaining efficiency, particularly when measuring multiple targets on a single printed substrate, as they often require extended time for acquiring image data and struggle with varying light conditions, leading to reduced measurement efficiency and accuracy.
Innovation Solution
A three-dimensional measuring apparatus that includes a first irradiating unit for a light pattern with banded intensity, a second irradiating unit for uniform light, and an imaging unit that acquires image data continuously, allowing for simultaneous three-dimensional measurement and separate acquisition of data for different purposes, such as phase shift method measurements and luminance data, without extending the measurement time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If separate imaging is performed under different irradiating light after acquiring one set of image data for three-dimensional measuring, then measurement accuracy is improved, but measurement time is extended
Solution Approach 1:
The patent combines multiple imaging operations into a single integrated process. The imaging unit simultaneously captures image data under different irradiating light conditions (first light pattern for 3D measurement, second light pattern for additional measurement) during the same measurement cycle, eliminating the need for separate imaging steps and thus reducing total measurement time while maintaining improved measurement accuracy
Solution Approach 2:
The imaging unit operates continuously without interruption to acquire both the first image data (under first irradiating light) and the second image data (under second irradiating light) in sequence within a single measurement process. This continuous operation eliminates idle time between separate imaging operations, maintaining high productivity while achieving enhanced measurement accuracy through multiple light conditions
2Area of stationary object
If multiple measurement target scopes are set on a single printed substrate, then comprehensive measurement coverage is improved, but measurement time is increased remarkably
Solution Approach 1:
The patent merges the measurement processes for multiple target scopes into a single integrated operation. The imaging unit captures image data for all measurement target scopes simultaneously under both first and second irradiating light conditions, eliminating the need for sequential separate measurements and thus reducing total measurement time while maintaining comprehensive coverage
Solution Approach 2:
The imaging unit is designed to perform multiple functions: it simultaneously serves as the imaging device for both the first image data acquisition (under first light pattern) and the second image data acquisition (under second light pattern) across multiple measurement target scopes. This multi-functionality eliminates the need for separate imaging devices or repeated imaging operations, reducing measurement time while maintaining comprehensive measurement coverage
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances measurement accuracy and efficiency by acquiring all necessary data without increasing the measurement time, enabling combined measurements and improved accuracy through the use of varying light modes and luminance adjustments.
Implementation Method 1
a first irradiating unit which can irradiate a light pattern, onto a continuously conveyed measured object, having a banded light intensity distribution in a conveying direction of the measured object
Implementation Method 2
an imaging unit which can image the measured object irradiated by the various light
Implementation Method 3
Three-dimensional measuring apparatuses that use a phase shift method irradiate a light pattern having a sinusoidal (banded) light intensity distribution
Data Source
AI summary
A three-dimensional measuring apparatus includes a first irradiating unit, a second irradiating unit, imaging unit that can image a measured object, a first image data acquiring unit that acquires a plurality of image data imaged by the imaging unit under the light pattern irradiated from the first irradiating unit for each predetermined amount of conveyance by the measured object, a three-dimensional measuring unit that three dimensionally measures based on a plurality of image data acquired by the first image data acquiring unit, and a second image data acquiring unit that acquires image data imaged by the imaging unit under the second light irradiated from the second irradiating unit between after predetermined image data from among the plurality of image data acquired by the first image data acquiring unit is imaged and until the next image data is imaged.