3D Measuring Device Dynamic Brightness Control
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Solution Overview
Problem
Three-dimensional measuring devices face challenges in achieving accurate measurements due to varying reflection rates across different regions of a printed substrate, leading to issues like brightness saturation and reduced measurement precision, especially when using the phase shift method.
Innovation Solution
A three-dimensional measuring device that switches between pattern lights of varying brightness and acquires image data sets with phase shifts, determines the effective brightness range for each pixel, and extracts suitable image data sets for precise three-dimensional measurements, using a combination of an irradiation unit, imaging unit, image data acquisition unit, determination unit, extraction unit, and three-dimensional measurement unit.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the brightness of the pattern light is increased to improve measurement in high reflection rate regions, then the brightness saturation state occurs in pixels corresponding to the solder print region, but measurement precision deteriorates
Solution Approach 1:
The patent applies dynamics by making the irradiation brightness adjustable and switchable between multiple levels. The irradiation unit can dynamically change the brightness of the pattern light based on the reflection rate characteristics of different regions, allowing the system to adapt to varying measurement conditions without being fixed at a single brightness level.
Solution Approach 2:
The patent implements parameter changes by varying the irradiation brightness as a controllable parameter. The system changes the brightness parameter of the pattern light to match the reflection rate characteristics of different regions (solder print region vs. background region), thereby optimizing measurement conditions for each region and avoiding brightness saturation while maintaining measurement precision.
2Object-affected harmful factors
If the brightness of the pattern light is decreased to avoid brightness saturation in high reflection rate regions, then the brightness difference in the pattern light is reduced in low reflection rate regions, but measurement precision deteriorates
Solution Approach 1:
The patent applies local quality by providing different irradiation brightness levels for different regions of the object. The system identifies regions with different reflection rate characteristics (solder print region with high reflection rate and background region with low reflection rate) and applies locally optimized brightness levels to each region, ensuring that each region receives appropriate illumination for accurate measurement without causing brightness saturation or insufficient brightness difference.
3Measurement precision
If a single irradiation brightness is used for the entire printed substrate, then the device complexity is reduced, but measurement precision deteriorates due to varying reflection rates across different regions
Solution Approach 1:
The patent resolves the contradiction between measurement precision and device complexity by implementing a dynamic brightness control system. The irradiation unit can switch between multiple brightness levels based on the detected reflection rate characteristics of different regions, providing region-specific optimization without requiring completely separate imaging systems for each region.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for improved measurement precision by ensuring image data is captured within optimal brightness ranges, reducing the impact of brightness saturation and enhancing the accuracy of three-dimensional measurements across varying substrate regions.
Implementation Method 1
a pattern light having a light intensity distribution in a sine wave shape (banded shape) is irradiated to an object to be measured (in this case, the printed substrate) by an irradiation means configured by a combination of a light source and a filter of a sine wave pattern
Implementation Method 2
The object is then observed using an imaging means disposed directly above a point on the substrate. As the imaging means, a CCD camera or the like configured by a lens, an imaging element, and the like is used
Data Source
AI summary
A three-dimensional measuring device includes an extraction unit that extracts an image data set with a brightness value of each of pixels in image data within an effective range from among a plurality of image data sets at each of coordinate positions of an object to be measured, and a three-dimensional measurement unit that performs three-dimensional measurement relating to each of the coordinate positions of the object to be measured based on the extracted image data set. The extraction unit extracts the image data set imaged under a pattern light with the highest irradiation brightness among a plurality of types of pattern lights when there is a plurality of sets of the image data sets with the brightness value of each of the pixels in the image data within the effective range from among the plurality of the image data sets.