3D Memory Array With Lateral Access Transistors for Lower Latency

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Solution Overview

Problem

The existing three-dimensional memory devices suffer from the vertical channels and the vertical channels and the vertical channels and the vertical channels, which increase memory latency as the number of layers in NAND memory devices increases.

Innovation Solution

A three-dimensional array of unit cells is formed with vertically-extending semiconductor channels and storage devices, supported by sacrificial rails, and gate dielectrics and electrodes are patterned to create a three-dimensional array of unit cells, and gate dielectrics and electrodes are patterned to create a three-dimensional array of gate dielectrics and word lines.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If the number of layers in NAND memory devices increases to achieve higher memory cell density, then memory cell density increases, but the length of vertical channels increases and memory latency increases

Engineering Contradiction:
Improvememory cell densityVSAvoidmemory latency
Core Design Contradiction:
Quantity of substanceVSLoss of time

Solution Approach 1:

The patent transitions from conventional vertical channel structures to laterally-extending semiconductor channels arranged in a three-dimensional array. By changing the channel orientation from vertical to lateral and organizing multiple channels in horizontal stacks, the design achieves high memory cell density without increasing vertical channel length, thereby reducing memory latency while maintaining high capacity

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Quantity of substance

If vertically-extending semiconductor channels are used to achieve three-dimensional memory structure, then memory cell density increases, but manufacturing complexity increases

Engineering Contradiction:
Improvememory cell densityVSAvoidmanufacturing complexity
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The patent employs sacrificial rails that are formed in advance to provide structural support during the manufacturing process. These sacrificial rails are positioned beforehand to hold the horizontally-extending semiconductor channels in their intended three-dimensional configuration, simplifying the assembly process and enabling complex 3D structures to be manufactured with greater ease

Inventive Principle:
Principle #10Preliminary action

3Loss of time

If horizontally-extending semiconductor channels are used instead of vertical channels, then memory latency is reduced, but structural support requirements increase

Engineering Contradiction:
Improvememory latencyVSAvoidstructural support
Core Design Contradiction:
Loss of timeVSStrength

Solution Approach 1:

The patent introduces sacrificial rails as intermediary structures that provide temporary structural support to the horizontally-extending semiconductor channels during manufacturing. These sacrificial rails act as mediators that enable the lateral channel configuration to be maintained in three-dimensional space, after which they are removed and replaced with functional storage devices

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS20250380423A1Three-dimensional memory device with laterally integrated access transistors and method of making the same
Publication Date: 2025.12.11 SANDISK TECHNOLOGIES LLC
  • US20250380423A1 patent drawing
  • US20250380423A1 patent drawing
  • US20250380423A1 patent drawing

AI summary

A device structure includes a three-dimensional array of unit cells containing vertical stacks of the unit cells arranged along a vertical direction. Each of the unit cells includes an access field effect transistor containing a set of semiconductor material portions that includes a horizontally-extending semiconductor channel and a storage device having a first electrode electrically connected to a sidewall of the set of semiconductor material portions, a second electrode that is spaced from the access field effect transistor, and a memory layer located between the first electrode and the second electrode. Alternatively, the storage device may be a memory field effect transistor containing a ferroelectric or charge trapping gate dielectric layer.