3D Memory Controller Segmentation for Concurrent Failure Prevention
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Solution Overview
Problem
Concurrent failures occur in memory systems when programming data into memory cells coupled to component word lines within a group word line, leading to unreliable data storage due to structural characteristics of the memory block, where a failure in one memory cell affects other programmed data.
Innovation Solution
A memory system with a 3D cell array is implemented, where memory cells of the same height are coupled to component word lines, and a controller manages program and dummy data operations to prevent concurrent failures by distributing data across multiple group word lines, allowing for selective programming and error handling.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If data is programmed into memory cells coupled to component word lines within a group word line, then data storage capacity is improved, but concurrent failures occur leading to reduced reliability
Solution Approach 1:
The patent divides the group word line into multiple component word lines and further segments data into multiple pieces, distributing each piece to different memory cells coupled to different component word lines. This segmentation prevents concurrent failures because a failure in one component word line does not affect other component word lines within the same group, thereby maintaining data reliability while preserving storage capacity.
2Productivity
If programming operations are performed on multiple component word lines simultaneously, then programming speed is improved, but failure propagation increases
Solution Approach 1:
The patent segments data into multiple pieces and assigns each piece to different component word lines within the group word line. By distributing data pieces across multiple component word lines rather than concentrating them on a single line, the system achieves parallel programming (improving speed) while preventing failure propagation (since a failure on one component word line isolates only the affected data piece).
Solution Approach 2:
The patent applies local quality by treating different component word lines as independent units with differentiated functions. Each component word line handles specific data pieces, and failures are contained to local regions (individual component word lines) rather than affecting the entire group word line. This localized approach allows simultaneous programming operations while limiting the scope of potential failures.
Data Source
AI summary
A memory system includes: a memory device including a three dimensional (3D) cell array, in which memory cells having the same height are coupled to a component word line by units of rows and component word lines having the same height are coupled to a group word line; and a controller suitable for controlling the memory device to perform a program operation with a program data into memory cells coupled to a data component word line selected from a plurality of component word line included in a single group word line and to perform a dummy program operation with dummy data into memory cells coupled to remaining dummy component word lines among the plurality of component word lines.