3D Memory Semiconductor Structure With Aluminum Soldering Contacts

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

3D semiconductor memories face high complexity and cost due to the special requirements of conductive via structures and solder pads, which complicate the manufacturing process.

Innovation Solution

A semiconductor structure with a stack structure, channel structure, and soldering structures that include a first and second portion with specific size ratios, using aluminum as material, and an isolating structure to simplify the process and reduce costs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If tungsten-filled contact structures and special conductive via structures are used to meet the requirements of 3D memory, then the reliability and electrical performance are improved, but the device complexity and manufacturing cost increase significantly

Engineering Contradiction:
Improveelectrical performanceVSAvoidstructure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent replaces expensive tungsten-filled contact structures with aluminum-based soldering structures that can be formed using standard CMOS-compatible processes. The aluminum material is less expensive and allows for simpler fabrication, achieving the same electrical connection function without the complexity of tungsten deposition and filling processes.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

Solution Approach 2:

The patent changes the material parameter from tungsten to aluminum, and modifies the geometric parameters of the contact structures by introducing specific size ratios (first portion and second portion with defined dimensional relationships). These parameter changes enable the structures to be formed using standard semiconductor manufacturing processes while maintaining electrical performance.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If multiple specialized conductive via structures and solder pads with specific material requirements are implemented, then the electrical connectivity and signal integrity are improved, but the manufacturing process complexity and production cost increase

Engineering Contradiction:
Improveelectrical connectivityVSAvoidmanufacturing process simplicity
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent designs the soldering structure to serve multiple functions: it acts as a contact structure, a via structure, and a solder pad simultaneously. The aluminum-based structure can be formed using the same deposition and patterning processes as standard interconnect layers, eliminating the need for separate specialized processing steps for different conductive elements.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent merges the functions of separate contact structures, via structures, and solder pads into a unified aluminum-based soldering structure. This consolidation allows all these elements to be formed in the same process step using standard CMOS-compatible aluminum deposition, significantly simplifying the manufacturing process.

Inventive Principle:
Principle #5Merging (Combining)

3Ease of manufacture

If standard CMOS-compatible processes are used for forming contact structures, then the manufacturing cost and process complexity are reduced, but the ability to meet special electrical performance requirements deteriorates

Engineering Contradiction:
Improveprocess compatibilityVSAvoidelectrical performance
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent modifies the geometric parameters of the aluminum contact structures, specifically defining relationships between the dimensions of the first portion and second portion. These parameter optimizations ensure that the standard CMOS-compatible aluminum structures achieve the same electrical performance characteristics as specialized tungsten structures, including resistance and current carrying capacity.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentEP4657515A1Semiconductor structure and method for forming same, and semiconductor device
Publication Date: 2025.12.03 YANGTZE MEMORY TECH CO LTD
  • EP4657515A1 patent drawingFigure 1
  • EP4657515A1 patent drawingFigure 2A~2B
  • EP4657515A1 patent drawingFigure 3A~3B

AI summary

The present disclosure relates to a semiconductor structure, a forming method thereof and a semiconductor device. The semiconductor structure includes: a stack structure; a semiconductor layer on the stack structure; a channel structure extending through the stack structure and into the semiconductor layer; a contact structure extending along a stacking direction of the stack structure; and a first soldering structure and a second soldering structure, wherein the first soldering structure penetrates through the semiconductor layer and is connected with the contact structure and the second soldering structure is connected with the semiconductor layer.