3D Memory Wordline Sharing Reduces RC Delay

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Solution Overview

Problem

Conventional two-dimensional semiconductor memories face issues with increased power consumption and performance degradation due to longer wordline lengths, which affect resistance and capacitance.

Innovation Solution

The implementation of three-dimensional semiconductor memories with wordline sharing across vertically stacked layers reduces wordline lengths, thereby decreasing resistance and capacitance, and improves area efficiency, power, and speed performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If wordline length is increased to accommodate wider memory arrays in two-dimensional layouts, then memory capacity is improved, but power consumption increases and performance degrades

Engineering Contradiction:
Improvememory capacityVSAvoidpower consumption
Core Design Contradiction:
Quantity of substanceVSUse of energy by moving object

Solution Approach 1:

The patent transitions from a two-dimensional memory layout to a three-dimensional stacked architecture where multiple memory layers are vertically stacked. This dimensional change allows wordlines to be shared across layers, significantly reducing the effective wordline length in each individual layer while maintaining the overall memory capacity through vertical stacking of multiple layers.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Quantity of substance

If wordline length is increased in two-dimensional memories, then memory capacity is improved, but performance degrades due to increased resistance and capacitance

Engineering Contradiction:
Improvememory capacityVSAvoidmemory access speed
Core Design Contradiction:
Quantity of substanceVSSpeed

Solution Approach 1:

By implementing vertical stacking of multiple memory layers, the patent reduces the horizontal wordline length in each layer. This dimensional reorganization decreases the total resistance and capacitance along wordlines, thereby improving signal integrity and memory access speed while maintaining high capacity through the stacked architecture.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent implements wordline sharing where a single wordline serves multiple memory cells across different vertical layers. This multi-functionality allows one wordline to control access to memory cells in multiple layers simultaneously, reducing the overall wordline length required in each individual layer and improving performance characteristics.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Ease of manufacture

If two-dimensional memory layout is used, then manufacturing simplicity is maintained, but area efficiency and performance are limited

Engineering Contradiction:
Improvemanufacturing simplicityVSAvoidmemory area efficiency
Core Design Contradiction:
Ease of manufactureVSArea of stationary object

Solution Approach 1:

The patent extends the memory architecture from two to three dimensions by stacking multiple memory layers vertically. This approach significantly improves area efficiency by utilizing the vertical dimension, allowing much higher storage capacity within a smaller footprint while maintaining compatibility with existing semiconductor manufacturing processes through standardized stacking techniques.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS9711209B2Three-dimensional wordline sharing memory
Publication Date: 2017.07.18 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US9711209B2 patent drawing
  • US9711209B2 patent drawing
  • US9711209B2 patent drawing

AI summary

A semiconductor memory includes a first layer including at least a first memory cell, a second layer including at least a second memory cell, and a wordline shared by the first memory cell and the second memory cell. The first and second memory cells can be above or below the wordline and be coupled to different bit lines.